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For: Siddiqui A, Zia MYI, Otero P. A Universal Machine-Learning-Based Automated Testing System for Consumer Electronic Products. Electronics 2021;10:136. [DOI: 10.3390/electronics10020136] [Citation(s) in RCA: 1] [Impact Index Per Article: 0.3] [Reference Citation Analysis] [What about the content of this article? (0)] [Track Full Text] [Subscribe] [Scholar Register] [Indexed: 08/30/2023]
Number Cited by Other Article(s)
1
A Novel System to Increase Yield of Manufacturing Test of an RF Transceiver through Application of Machine Learning. SENSORS (BASEL, SWITZERLAND) 2023;23:705. [PMID: 36679504 PMCID: PMC9861238 DOI: 10.3390/s23020705] [Citation(s) in RCA: 0] [Impact Index Per Article: 0] [Reference Citation Analysis] [Abstract] [Key Words] [MESH Headings] [Track Full Text] [Figures] [Subscribe] [Scholar Register] [Received: 11/16/2022] [Revised: 12/28/2022] [Accepted: 01/06/2023] [Indexed: 06/17/2023]
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