Modulating Band Gap of Boron Doping in Amorphous Carbon Nano-Film.
MATERIALS 2019;
12:ma12111780. [PMID:
31159328 PMCID:
PMC6600733 DOI:
10.3390/ma12111780]
[Citation(s) in RCA: 4] [Impact Index Per Article: 0.8] [Reference Citation Analysis] [Abstract] [Key Words] [Track Full Text] [Download PDF] [Figures] [Subscribe] [Scholar Register] [Received: 05/11/2019] [Revised: 05/27/2019] [Accepted: 05/30/2019] [Indexed: 12/05/2022]
Abstract
Amorphous carbon (a-C) films are attracting considerable attention to due their large optical band gap (Eopt) range of 1–4 eV. But the hopping conducting mechanism of boron doping a-C (a-C:B) is still mysterious. To exploring the intrinsic reasons behind the semiconductor properties of a-C:B, in this work, the boron doping a-C (a-C:B) nano-film was prepared, and the growth rate and Eopt changing were analyzed by controlling the different experimental conditions of magnetron sputtering. A rapid deposition rate of 10.55 nm/min was obtained. The Eopt is reduced from 3.19 eV to 2.78 eV by improving the substrate temperature and sputtering power. The proportion of sp2/sp3 increasing was uncovered with narrowing the Eopt. The shrinking Eopt can be attributed to the fact that boron atoms act as a fluxing agent to promote carbon atoms to form sp2 hybridization at low energy. Furthermore, boron atoms can impede the formation of σ bonds in carbon atom sp3 hybridization by forming B–C bonds with high energy, and induce the sp3 hybridization transfer to sp2 hybridization. This work is significant to further study of amorphous semiconductor films.
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