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For: Chen YI, Zheng YZ, Chang LC, Liu YH. Effect of Bias Voltage on Mechanical Properties of HiPIMS/RFMS Cosputtered Zr-Si-N Films. Materials (Basel) 2019;12:ma12172658. [PMID: 31438512 PMCID: PMC6747595 DOI: 10.3390/ma12172658] [Citation(s) in RCA: 3] [Impact Index Per Article: 0.6] [Reference Citation Analysis] [What about the content of this article? (0)] [Track Full Text] [Download PDF] [Figures] [Subscribe] [Scholar Register] [Received: 07/27/2019] [Revised: 08/14/2019] [Accepted: 08/20/2019] [Indexed: 11/16/2022]
Number Cited by Other Article(s)
1
Effects of the Nitrogen Flow Ratio and Substrate Bias on the Mechanical Properties of W–N and W–Si–N Films. COATINGS 2020. [DOI: 10.3390/coatings10121252] [Citation(s) in RCA: 2] [Impact Index Per Article: 0.5] [Reference Citation Analysis] [Abstract] [Track Full Text] [Subscribe] [Scholar Register] [Indexed: 11/17/2022]
2
Influence of Nitrogen Content and Bias Voltage on Residual Stress and the Tribological and Mechanical Properties of CrAlN Films. COATINGS 2020. [DOI: 10.3390/coatings10060546] [Citation(s) in RCA: 26] [Impact Index Per Article: 6.5] [Reference Citation Analysis] [Abstract] [Track Full Text] [Subscribe] [Scholar Register] [Indexed: 11/16/2022]
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