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For: Yu Q, Wang C, Zhang Y, Hu S, Liu T, Cheng F, Wang Y, Lin T, Xi L. Error Analysis and Correction of Thickness Measurement for Transparent Specimens Based on Chromatic Confocal Microscopy with Inclined Illumination. Photonics 2022;9:155. [DOI: 10.3390/photonics9030155] [Citation(s) in RCA: 1] [Impact Index Per Article: 0.3] [Reference Citation Analysis] [What about the content of this article? (0)] [Track Full Text] [Subscribe] [Scholar Register] [Indexed: 02/04/2023]

For:	Yu Q, Wang C, Zhang Y, Hu S, Liu T, Cheng F, Wang Y, Lin T, Xi L. Error Analysis and Correction of Thickness Measurement for Transparent Specimens Based on Chromatic Confocal Microscopy with Inclined Illumination. Photonics 2022;9:155. [DOI: 10.3390/photonics9030155] [Citation(s) in RCA: 1] [Impact Index Per Article: 0.3] [Reference Citation Analysis] [What about the content of this article? (0)] [Track Full Text] [Subscribe] [Scholar Register] [Indexed: 02/04/2023]

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(The first 100,000 artilces are displayed in RCA.)