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For: Yamada J, Inoue T, Nakamura N, Kameshima T, Yamauchi K, Matsuyama S, Yabashi M. X-Ray Single-Grating Interferometry for Wavefront Measurement and Correction of Hard X-Ray Nanofocusing Mirrors. Sensors (Basel) 2020;20:s20247356. [PMID: 33371522 PMCID: PMC7767480 DOI: 10.3390/s20247356] [Citation(s) in RCA: 2] [Impact Index Per Article: 0.4] [Reference Citation Analysis] [What about the content of this article? (0)] [Track Full Text] [Download PDF] [Figures] [Subscribe] [Scholar Register] [Received: 10/29/2020] [Revised: 12/11/2020] [Accepted: 12/17/2020] [Indexed: 11/16/2022]

For:	Yamada J, Inoue T, Nakamura N, Kameshima T, Yamauchi K, Matsuyama S, Yabashi M. X-Ray Single-Grating Interferometry for Wavefront Measurement and Correction of Hard X-Ray Nanofocusing Mirrors. Sensors (Basel) 2020;20:s20247356. [PMID: 33371522 PMCID: PMC7767480 DOI: 10.3390/s20247356] [Citation(s) in RCA: 2] [Impact Index Per Article: 0.4] [Reference Citation Analysis] [What about the content of this article? (0)] [Track Full Text] [Download PDF] [Figures] [Subscribe] [Scholar Register] [Received: 10/29/2020] [Revised: 12/11/2020] [Accepted: 12/17/2020] [Indexed: 11/16/2022]

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(The first 100,000 artilces are displayed in RCA.)