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For: Kim TH, Kim HR, Cho YJ. Product Inspection Methodology via Deep Learning: An Overview. Sensors (Basel) 2021;21:5039. [PMID: 34372276 PMCID: PMC8346960 DOI: 10.3390/s21155039] [Citation(s) in RCA: 3] [Impact Index Per Article: 1.0] [Reference Citation Analysis] [What about the content of this article? (0)] [Track Full Text] [Download PDF] [Figures] [Subscribe] [Scholar Register] [Received: 06/28/2021] [Revised: 07/21/2021] [Accepted: 07/21/2021] [Indexed: 11/16/2022]
Number Cited by Other Article(s)
1
Tran KP. Artificial Intelligence for Smart Manufacturing: Methods and Applications. SENSORS 2021;21:s21165584. [PMID: 34451024 PMCID: PMC8402272 DOI: 10.3390/s21165584] [Citation(s) in RCA: 2] [Impact Index Per Article: 0.7] [Reference Citation Analysis] [MESH Headings] [Track Full Text] [Download PDF] [Subscribe] [Scholar Register] [Received: 08/18/2021] [Accepted: 08/18/2021] [Indexed: 12/04/2022]
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