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For: Tajarrod MH, Saghai HR. High I on/I off current ratio graphene field effect transistor: the role of line defect. Beilstein J Nanotechnol 2015;6:2062-8. [PMID: 26665077 PMCID: PMC4660928 DOI: 10.3762/bjnano.6.210] [Citation(s) in RCA: 1] [Impact Index Per Article: 0.1] [Reference Citation Analysis] [What about the content of this article? (0)] [Track Full Text] [Figures] [Subscribe] [Scholar Register] [Received: 03/19/2015] [Accepted: 10/05/2015] [Indexed: 06/05/2023]
Number Cited by Other Article(s)
1
Deepti, Kolay A, Majumder S, Kumar A. Low-cost graphite and double-gate FET-based label-free biosensor for dopamine sensing to detect neural diseases. Med Eng Phys 2025;136:104282. [PMID: 39979005 DOI: 10.1016/j.medengphy.2025.104282] [Citation(s) in RCA: 0] [Impact Index Per Article: 0] [Reference Citation Analysis] [Abstract] [Key Words] [MESH Headings] [Track Full Text] [Journal Information] [Subscribe] [Scholar Register] [Received: 04/10/2024] [Revised: 11/24/2024] [Accepted: 01/05/2025] [Indexed: 02/22/2025]
2
Li Y, Choe M, Jin S, Luo D, Bakharev PV, Seong WK, Ding F, Lee Z, Ruoff RS. Silica Particle-Mediated Growth of Single Crystal Graphene Ribbons on Cu(111) Foil. SMALL (WEINHEIM AN DER BERGSTRASSE, GERMANY) 2022;18:e2202536. [PMID: 35585685 DOI: 10.1002/smll.202202536] [Citation(s) in RCA: 1] [Impact Index Per Article: 0.3] [Reference Citation Analysis] [Abstract] [Key Words] [Track Full Text] [Subscribe] [Scholar Register] [Received: 04/24/2022] [Indexed: 06/15/2023]
3
Sakkaki B, Rasooli Saghai H, Darvish G, Khatir M. A new photodetector structure based on graphene nanomeshes: an ab initio study. BEILSTEIN JOURNAL OF NANOTECHNOLOGY 2020;11:1036-1044. [PMID: 32733778] [Citation(s) in RCA: 0] [Impact Index Per Article: 0] [Reference Citation Analysis] [Abstract] [Key Words] [Subscribe] [Scholar Register] [Received: 03/18/2020] [Accepted: 06/25/2020] [Indexed: 06/11/2023]
4
Taouririt TE, Meftah A, Sengouga N, Adaika M, Chala S, Meftah A. Effects of high-k gate dielectrics on the electrical performance and reliability of an amorphous indium-tin-zinc-oxide thin film transistor (a-ITZO TFT): an analytical survey. NANOSCALE 2019;11:23459-23474. [PMID: 31799575 DOI: 10.1039/c9nr03395e] [Citation(s) in RCA: 0] [Impact Index Per Article: 0] [Reference Citation Analysis] [Abstract] [Track Full Text] [Subscribe] [Scholar Register] [Indexed: 06/10/2023]
5
Luo M, Li BL, Li D. Effects of Divacancy and Extended Line Defects on the Thermal Transport Properties of Graphene Nanoribbons. NANOMATERIALS (BASEL, SWITZERLAND) 2019;9:E1609. [PMID: 31766154 PMCID: PMC6915358 DOI: 10.3390/nano9111609] [Citation(s) in RCA: 7] [Impact Index Per Article: 1.2] [Reference Citation Analysis] [Abstract] [Key Words] [Grants] [Track Full Text] [Download PDF] [Figures] [Subscribe] [Scholar Register] [Received: 10/24/2019] [Revised: 11/07/2019] [Accepted: 11/09/2019] [Indexed: 12/19/2022]
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