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For: Ku H, Schaefer F, Valkiers S, De Bièvre P. A Three-Ratio Scheme for the Measurement of Isotopic Ratios of Silicon. J Res Natl Inst Stand Technol 1993;98:225-229. [PMID: 28053469 PMCID: PMC4909180 DOI: 10.6028/jres.098.017] [Citation(s) in RCA: 3] [Impact Index Per Article: 0.1] [Reference Citation Analysis] [What about the content of this article? (0)] [Track Full Text] [Figures] [Subscribe] [Scholar Register] [Accepted: 12/24/1992] [Indexed: 06/06/2023]
Number Cited by Other Article(s)
1
Valkiers S, Aregbe Y, Taylor P, De Bièvre P. A primary xenon isotopic gas standard with SI traceable values for isotopic composition and molar mass. ACTA ACUST UNITED AC 1998. [DOI: 10.1016/s0168-1176(97)00274-7] [Citation(s) in RCA: 28] [Impact Index Per Article: 1.1] [Reference Citation Analysis] [Track Full Text] [Journal Information] [Subscribe] [Scholar Register] [Indexed: 10/27/2022]
2
Gonfiantini R, Valkiers S, Taylor PD, De Bièvre P. Adsorption in gas mass spectrometry. I. Effects on the measurement of individual isotopic species. ACTA ACUST UNITED AC 1997. [DOI: 10.1016/s0168-1176(97)00018-9] [Citation(s) in RCA: 14] [Impact Index Per Article: 0.5] [Reference Citation Analysis] [Track Full Text] [Journal Information] [Subscribe] [Scholar Register] [Indexed: 10/18/2022]
3
Aregbe Y, Valkiers S, Mayer K, De Bièvre P. Comparative isotopic measurements on xenon and krypton. ACTA ACUST UNITED AC 1996. [DOI: 10.1016/0168-1176(96)04368-6] [Citation(s) in RCA: 15] [Impact Index Per Article: 0.5] [Reference Citation Analysis] [Track Full Text] [Journal Information] [Subscribe] [Scholar Register] [Indexed: 10/18/2022]
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