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For: Marchiando JF. On Using Collocation in Three Dimensions and Solving a Model Semiconductor Problem. J Res Natl Inst Stand Technol 1995;100:661-676. [PMID: 29151767 PMCID: PMC4887259 DOI: 10.6028/jres.100.049] [Citation(s) in RCA: 1] [Impact Index Per Article: 0.0] [Reference Citation Analysis] [What about the content of this article? (0)] [Track Full Text] [Figures] [Subscribe] [Scholar Register] [Accepted: 08/08/1995] [Indexed: 06/07/2023]
Number Cited by Other Article(s)
1
On calculating scanning capacitance microscopy data for a dopant profile in semiconductors. ACTA ACUST UNITED AC 2004. [DOI: 10.1116/1.1619422] [Citation(s) in RCA: 8] [Impact Index Per Article: 0.4] [Reference Citation Analysis] [Track Full Text] [Journal Information] [Subscribe] [Scholar Register] [Indexed: 11/17/2022]
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