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Number	Cited by Other Article(s)
1	Shulakov AS. X-ray emission depth-resolved spectroscopy for investigation of nanolayers. J STRUCT CHEM+ 2012. [DOI: 10.1134/s0022476611070018] [Citation(s) in RCA: 3] [Impact Index Per Article: 0.3] [Reference Citation Analysis] [What about the content of this article? (0)] [Track Full Text] [Journal Information] [Subscribe] [Scholar Register] [Indexed: 11/23/2022] Abstract Collapse Key Words Collapse MESH Headings Collapse Grants Collapse Affiliation(s) Collapse
2	Shulakov AS, Bukin SV, Zdanchuk EV, Tveryanovich SY. X-ray emission spectroscopy of solids in the depth-resolution mode: Investigation of a-Si/Al/c-Si nanolayers. ACTA ACUST UNITED AC 2008. [DOI: 10.3103/s1062873808040047] [Citation(s) in RCA: 2] [Impact Index Per Article: 0.1] [Reference Citation Analysis] [What about the content of this article? (0)] [Track Full Text] [Journal Information] [Subscribe] [Scholar Register] [Indexed: 11/30/2022] Abstract Collapse Key Words Collapse MESH Headings Collapse Grants Collapse Affiliation(s) Collapse
3	Shulakov AS. Application of ultra-soft X-ray emission spectroscopy for solid surfaces studies. Cryst Res Technol 1988. [DOI: 10.1002/crat.2170230623] [Citation(s) in RCA: 16] [Impact Index Per Article: 0.4] [Reference Citation Analysis] [What about the content of this article? (0)] [Track Full Text] [Subscribe] [Scholar Register] [Indexed: 11/06/2022] Abstract Collapse Key Words Collapse MESH Headings Collapse Grants Collapse Affiliation(s) Collapse