Novel technology for controlled fabrication of aperture cantilever sensors for scanning near-field optical microscopy

This paper presents a new technique for forming SNOM (Scanning Near-Field Optical Microscopy) cantilevers. The technique is based on the continuous growth of a conical hollow tip using local ion-induced carbon deposition on standard tipless cantilever chips. This method offers precise control of the geometric parameters of the cantilever's tip, including the angle of the tip, the probe's curvature radius, and the input and output aperture diameter. Such control allows to optimize the probe for specific tasks. The use of local structure methods based on FIB (Focused Ion Beam) enables the production of SNOM cantilevers with high radiation transmittance, tip robustness, and the capability to measure sample topography in semi-contact AFM (Atomic Force Microscopy) mode. The research focused on optimizing the technology for manufacturing tips with specific geometric characteristics, facilitating accurate navigation and positioning in the area of interest. The manufactured probe samples being tested demonstrate sufficient accuracy and mechanical durability of the tip. Overall, this technique offers a novel approach to forming SNOM cantilevers, providing precise control over geometric parameters and promising enhanced performance in various applications.

Microplotter printing of planar solid electrolytes in the CeO2-Y2O3 system

The formation process for planar solid electrolytes in the CeO₂-Y₂O₃ system has been studied using efficient, high-performance, high-resolution microplotter printing technology, using functional ink based on nanopowders (the average size of crystallites was 12-15 nm) of a similar composition obtained by programmed coprecipitation of metal hydroxides. The dependence of the microstructure of the oxide nanoparticles obtained and their crystal structure on yttrium concentration has been studied using a wide range of methods. According to X-ray diffraction (XRD), the nanopowders and coatings produced are single-phase, with a cubic crystal structure of the fluorite type, and the electronic state and content of cerium and yttrium in the printed coatings have been determined using X-ray photoelectron spectroscopy (XPS). The results of scanning electron (SEM) and atomic force microscopy (AFM) have shown that the coatings produced are homogeneous, they do not contain defects in the form of fractures and the height difference over an area of 1 µm² is 30-45 nm. The local electrophysical characteristics of the oxide coatings produced (the work function of the coating surface, capacitance values, maps of the surface potential and capacitive contrast distribution over the surface) have been studied using Kelvin-probe force microscopy (KPFM) and scanning capacitive microscopy (SCM). Using impedance spectroscopy, the dependence of the electrophysical characteristics of printed planar solid electrolytes in the CeO₂-Y₂O₃ system on yttrium content has been determined and the prospects of the technology developed for the manufacture of modern, intermediate-temperature, solid oxide fuel cells have been demonstrated.

Investigation of the light field of a semiconductor diode laser

Scanning near-field optical microscopy was applied to study, with sub-wavelength spatial resolution, the near- and the far-field distributions of propagating modes from a high-power laser diode. Simple modeling was also performed and compared with experimental results. The simulated distributions were consistent with the experiment and permitted clarification of the configuration of the transverse modes of the laser.

Tunable optical antennas based on metallic nanoshells with nanoknobs

We investigate optical properties of a new complex plasmonic nanostructure, which consists of a spherical metallic nanoshell and a small metallic nanoparticle ("nanoknob") situated on its surface. The plasmon resonance wavelength of the entire structure is guided by the geometrical and material properties of the nanoshell whereas the electromagnetic field of the incident light is localized and enhanced near the "nanoknob". The idea is supported with electromagnetic modeling and near-field optical microscopy imaging. In addition, we proposed and demonstrated a new method of nanoparticle precise manipulation under electron beam, which could be used in fabrication of such plasmonic structures and other nanosized elements.