Schubert A, Bergamaschi A, David C, Dinapoli R, Elbracht-Leong S, Gorelick S, Graafsma H, Henrich B, Johnson I, Lohmann M, Mozzanica A, Radicci V, Rassool R, Schädler L, Schmitt B, Shi X, Sobott B. Micrometre resolution of a charge integrating microstrip detector with single photon sensitivity.
J Synchrotron Radiat 2012;
19:359-65. [PMID:
22514170 PMCID:
PMC3408957 DOI:
10.1107/s090904951200235x]
[Citation(s) in RCA: 4] [Impact Index Per Article: 0.3] [Reference Citation Analysis] [What about the content of this article? (0)] [Affiliation(s)] [Abstract] [Key Words] [Track Full Text] [Subscribe] [Scholar Register] [Received: 08/31/2011] [Accepted: 01/18/2012] [Indexed: 05/09/2023]
Abstract
A synchrotron beam has been used to test the spatial resolution of a single-photon-resolving integrating readout-chip coupled to a 320 µm-thick silicon strip sensor with a dedicated readout system. Charge interpolation methods have yielded a spatial resolution of σ(x) ≃ 1.8 µm for a 20 µm-pitch strip.
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