Evolution of a Novel Ribbon Phase in Optimally Doped Bi2Sr2CaCu2O8+δ at High Pressure and Its Implication to High- TC Superconductivity

One challenge in studying high-temperature superconductivity (HTSC) stems from a lack of direct experimental evidence linking lattice inhomogeneity and superconductivity. Here, we apply synchrotron hard X-ray nanoimaging and small-angle scattering to reveal a novel micron-scaled ribbon phase in optimally doped Bi₂Sr₂CaCu₂O_8+δ (Bi-2212, with δ = 0.1). The morphology of the ribbon-like phase evolves simultaneously with the dome-shaped T_C behavior under pressure. X-ray absorption studies show that the increasing of T_C is associated with oxygen-hole redistribution in the CuO₂ plan, while T_C starts to decrease with pressure when oxygen holes become immobile. Additional X-ray irradiation experiments reveal that nanoscaled short-range ordering of oxygen vacancies could further lower T_C, which indicates that the optimal T_C is affected not only by an optimal morphology of the ribbon phase, but also an optimal distribution of oxygen vacancies. Our studies thereby provide for the first time compelling experimental evidence correlating the T_C with micron to nanoscale inhomogeneity.

Sub-nanometre resolution of atomic motion during electronic excitation in phase-change materials

Phase-change materials based on Ge-Sb-Te alloys are widely used in industrial applications such as nonvolatile memories, but reaction pathways for crystalline-to-amorphous phase-change on picosecond timescales remain unknown. Femtosecond laser excitation and an ultrashort x-ray probe is used to show the temporal separation of electronic and thermal effects in a long-lived (>100 ps) transient metastable state of Ge2Sb2Te5 with muted interatomic interaction induced by a weakening of resonant bonding. Due to a specific electronic state, the lattice undergoes a reversible nondestructive modification over a nanoscale region, remaining cold for 4 ps. An independent time-resolved x-ray absorption fine structure experiment confirms the existence of an intermediate state with disordered bonds. This newly unveiled effect allows the utilization of non-thermal ultra-fast pathways enabling artificial manipulation of the switching process, ultimately leading to a redefined speed limit, and improved energy efficiency and reliability of phase-change memory technologies.

Diffraction imaging forin situcharacterization of double-crystal X-ray monochromators

Imaging of the Bragg-reflected X-ray beam is proposed and validated as anin situmethod for characterization of the performance of double-crystal monochromators under the heat load of intense synchrotron radiation. A sequence of images is collected at different angular positions on the reflectivity curve of the second crystal and analyzed. The method provides rapid evaluation of the wavefront of the exit beam, which relates to local misorientation of the crystal planes along the beam footprint on the thermally distorted first crystal. The measured misorientation can be directly compared with the results of finite element analysis. The imaging method offers an additional insight into the local intrinsic crystal quality over the footprint of the incident X-ray beam.

Fast Detection Allows Analysis of the Electronic Structure of Metalloprotein by X-ray Emission Spectroscopy at Room Temperature

The paradigm of "detection-before-destruction" was tested for a metalloprotein complex exposed at room temperature to the high x-ray flux typical of third generation synchrotron sources. Following the progression of the x-ray induced damage by Mn Kβ x-ray emission spectroscopy, we demonstrated the feasibility of collecting room temperature data on the electronic structure of native Photosystem II, a trans-membrane metalloprotein complex containing a Mn(4)Ca cluster. The determined non-damaging observation timeframe (about 100 milliseconds using continuous monochromatic beam, deposited dose 1*10(7) photons/µm(2) or 1.3*10(4) Gy, and 66 microseconds in pulsed mode using pink beam, deposited dose 4*10(7) photons/µm(2) or 4.2*10(4) Gy) is sufficient for the analysis of this protein's electron dynamics and catalytic mechanism at room temperature. Reported time frames are expected to be representative for other metalloproteins. The described instrumentation, based on the short working distance dispersive spectrometer, and experimental methodology is broadly applicable to time-resolved x-ray emission analysis at synchrotron and x-ray free-electron laser light sources.

Direct determination of epitaxial interface structure in Gd2O3 passivation of GaAs

Obtaining accurate structural information on epitaxial films and interfaces is nowhere more critical than in semiconductor passivation layers, where details of the atomic structure and bonding determine the nature of the interface electronic states. Various non-destructive methods have been used to investigate the structure of films and interfaces, but their interpretation is model-dependent, leading occasionally to wrong conclusions. We have developed a new X-ray method for the direct determination of epitaxial structures, coherent Bragg rod analysis (COBRA). The usefulness of our technique is demonstrated by mapping, with atomic precision, the structure of the interfacial region of a Gd2O3 film grown epitaxially on a (100) GaAs substrate. Our findings reveal interesting behaviour not previously suggested by existing structural methods, in particular a lock-in of the in-plane Gd atomic positions to those of the Ga/As atoms of the substrate. Moreover, we find that the bulk stacking of the Gd2O3 atomic layers is abandoned in favour of a new structure that is directly correlated with the stacking sequence of the substrate. These results have important implications for Gd2O3 as an effective passivation layer for GaAs (ref. 7). Our work shows that the COBRA technique, taking advantage of the brilliance of insertion device synchrotron X-ray sources, is widely applicable to epitaxial films and interfaces.

XAFS at the Pacific Northwest Consortium-Collaborative Access Team undulator beamline

The Pacific Northwest Consortium-Collaborative Access Team (PNC-CAT) has begun operating an insertion device beamline at the Advanced Photon Source. The beamline has been extensively used for XAFS studies. This paper summarizes its capabilities, and our initial operational experience. The beamline is based on APS undulator A, and incorporates full undulator scanning. The monochromator is liquid nitrogen cooled and has both Si(111) and Si(311) crystals in a side-by-side configuration. Crystal changes only take a few minutes. The crystals cover the energy range from 3-50 keV with fluxes as high as 2x10(13) ph/sec. Microbeams can be produced using Kirkpatrick-Baez mirrors (spot size 1-3 microm) or tapered capillaries (sub-microm spots). When these optics are combined with a 13-element Ge detector, the beamline provides powerful microbeam imaging and spectroscopy capabilities. Experimental examples from the environmental field and in-situ UHV film growth will be discussed.

Simplified Solution for Stresses and Deformations

A shortcut to the classical Hertzian solution for local stress and deformation of two elastic bodies in contact is presented. The shortcut is accomplished by using simplified forms for the ellipticity and for the complete elliptic integrals of the first and second kinds as a function of the geometry. Thus the interdependence of these variables can be uncoupled, and the resulting transcendental equation, which must be solved through use of the computer or design charts, avoided. Simplified formulas that make the elastic deformation at the center of contact easy to calculate have been previously reported by the authors. However, the range of applicability was limited to ellipticities greater than or equal to 1. This paper extends the range of validity to include ellipticities less than 1, that is, where the semimajor axis in the elliptical contact lies in a direction parallel to the rolling direction rather than being perpendicular as in previous studies. Furthermore an auxiliary shear stress parameter is expressed in simplified form as a function of the geometry. This enables a shortcut calculation to be made for the location and magnitude of the maximum subsurface shear stress.