Development of scanning X-ray microscopes for materials science spectromicroscopy at the Advanced Light Source.
JOURNAL OF SYNCHROTRON RADIATION 1998;
5:1090-1092. [PMID:
15263755 DOI:
10.1107/s0909049597014283]
[Citation(s) in RCA: 4] [Impact Index Per Article: 0.2] [Reference Citation Analysis] [Abstract] [Track Full Text] [Subscribe] [Scholar Register] [Received: 08/04/1997] [Accepted: 10/21/1997] [Indexed: 05/24/2023]
Abstract
The development of two zone-plate microscopes for X-ray spectroscopic analysis of materials is described. This pair of instruments will provide imaging NEXAFS analysis of samples in transmission at atmospheric pressure and imaging XPS and NEXAFS analysis of sample surfaces in a UHV environment.
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