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Scanning force microscope for in situ nanofocused X-ray diffraction studies. JOURNAL OF SYNCHROTRON RADIATION 2014;21:1128-33. [PMID: 25178002 PMCID: PMC4862253 DOI: 10.1107/s1600577514014532] [Citation(s) in RCA: 12] [Impact Index Per Article: 1.2] [Reference Citation Analysis] [Abstract] [Key Words] [Track Full Text] [Subscribe] [Scholar Register] [Received: 03/24/2014] [Accepted: 06/20/2014] [Indexed: 05/21/2023]
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