Magnetic-Dielectric Cantilevers for Atomic Force Microscopy

Atomic force microscopy (AFM) is a technique that relies on detecting forces at the nanonewton scale. It involves using a cantilever with a tiny tip at one end. This tip interacts with the short- and long-range forces of material surfaces. These cantilevers are typically manufactured with Si or Si3N4 and synthesized using a lithography technique, which implies a high cost. On the other hand, through simple chemical methods, it is possible to synthesize a magneto-dielectric composite made up of artificial SiO2 opals infiltrated with superparamagnetic nanoparticles of Fe3O4. From these materials, it is possible to obtain tipless cantilevers that can be used in AFM analysis. Tipless cantilevers are an alternative tool in nanoscale exploration, offering a versatile approach to surface analysis. Unlike traditional AFM probes, tipless versions eliminate the challenges associated with tip wear, ensuring prolonged stability during measurements. This makes tipless AFM particularly valuable for imaging delicate or soft samples, as it prevents sample damage and provides precise measurements of topography and mechanical and electromechanical properties. This study presents the results of the characterization of known surfaces using magneto-dielectric cantilevers and commercial cantilevers based on Si. The characterization will be carried out through contact and non-contact topography measurements.

Corrigendum to "Multiband rabi antenna using nest microstrip add-drop filter (NMADF) for relativistic sensing applications" [Heliyon 9(2) (February 2023) e13611]

[This corrects the article DOI: 10.1016/j.heliyon.2023.e13611.].

Multiband Rabi antenna using nest microstrip add-drop filter (NMADF) for relativistic sensing applications

A microstrip circuit is designed, constructed, and tested based on the nest microstrip add-drop filters (NMADF). The multi-level system oscillation is generated by the wave-particle behaviors of AC driven along the microstrip ring circular path. The continuous successive filtering is applied via the device input port. The higher-order harmonic oscillations can be filtered, from which the two-level system known as a Rabi oscillation is achieved. The outside microstrip ring energy is coupled to the inside rings, from which the multiband Rabi oscillations can be formed within the inner rings. The resonant Rabi frequencies can be applied for multi-sensing probes. The relationship between electron density and Rabi oscillation frequency of each microstrip ring output can be obtained and used for multi-sensing probe applications. The relativistic sensing probe can be obtained by the warp speed electron distribution at the resonant Rabi frequency respecting the resonant ring radii. These are available for relativistic sensing probe usage. The obtained experimental results have shown that there are 3-center Rabi frequencies obtained, which can be used for 3-sensing probes simultaneously. The sensing probe speeds of 1.1c, 1.4c, and 1.5c are obtained using the microstrip ring radii of 14.20, 20.12, and 34.49 mm, respectively. The best sensor sensitivity of 1.30 ms is achieved. The relativistic sensing platform can be used for many applications.