• Reference Citation Analysis
  • v
  • v
  • Find an Article
Find an Article PDF (4591707)   Today's Articles (248)   Subscriber (49313)
Number Citation Analysis
1
An apparatus for the continuous measurement of thickness during the electropolishing of superconducting cavities. THE REVIEW OF SCIENTIFIC INSTRUMENTS 2021;92:023307. [PMID: 33648074 DOI: 10.1063/5.0028778] [Citation(s) in RCA: 0] [Impact Index Per Article: 0] [Reference Citation Analysis] [Abstract] [Track Full Text] [Subscribe] [Scholar Register] [Received: 09/08/2020] [Accepted: 02/04/2021] [Indexed: 06/12/2023]
2
Simplified approach to the Jones calculus in retracing optical circuits. APPLIED OPTICS 1995;34:7870-7876. [PMID: 21068881 DOI: 10.1364/ao.34.007870] [Citation(s) in RCA: 3] [Impact Index Per Article: 0.1] [Reference Citation Analysis] [Abstract] [Track Full Text] [Subscribe] [Scholar Register] [Indexed: 05/30/2023]
3
Vibration-insensitive fiber-optic current sensor. OPTICS LETTERS 1993;18:314. [PMID: 19802121 DOI: 10.1364/ol.18.000314] [Citation(s) in RCA: 5] [Impact Index Per Article: 0.2] [Reference Citation Analysis] [Track Full Text] [Subscribe] [Scholar Register] [Indexed: 05/28/2023]
4
Polarization noise suppression in retracing optical fiber circuits. OPTICS LETTERS 1991;16:711-713. [PMID: 19774046 DOI: 10.1364/ol.16.000711] [Citation(s) in RCA: 2] [Impact Index Per Article: 0.1] [Reference Citation Analysis] [Abstract] [Track Full Text] [Subscribe] [Scholar Register] [Indexed: 05/28/2023]
PrevPage 1 of 1 1Next
© 2004-2024 Baishideng Publishing Group Inc. All rights reserved. 7041 Koll Center Parkway, Suite 160, Pleasanton, CA 94566, USA