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Characterization of a sCMOS-based high-resolution imaging system. JOURNAL OF SYNCHROTRON RADIATION 2017;24:1226-1236. [PMID: 29091066 DOI: 10.1107/s160057751701222x] [Citation(s) in RCA: 20] [Impact Index Per Article: 2.9] [Reference Citation Analysis] [Abstract] [Key Words] [Track Full Text] [Subscribe] [Scholar Register] [Received: 05/10/2017] [Accepted: 08/23/2017] [Indexed: 05/21/2023]
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