Spectroscopic Signatures of Electronic Excitations in Raman Scattering in Thin Films of Rhombohedral Graphite.
NANO LETTERS 2019;
19:6152-6156. [PMID:
31361497 PMCID:
PMC7007278 DOI:
10.1021/acs.nanolett.9b02196]
[Citation(s) in RCA: 1] [Impact Index Per Article: 0.2] [Reference Citation Analysis] [Abstract] [Key Words] [Track Full Text] [Figures] [Subscribe] [Scholar Register] [Received: 05/29/2019] [Revised: 07/22/2019] [Indexed: 06/10/2023]
Abstract
Rhombohedral graphite features peculiar electronic properties, including persistence of low-energy surface bands of a topological nature. Here, we study the contribution of electron-hole excitations toward inelastic light scattering in thin films of rhombohedral graphite. We show that, in contrast to the featureless electron-hole contribution toward Raman spectrum of graphitic films with Bernal stacking, the inelastic light scattering accompanied by electron-hole excitations in crystals with rhombohedral stacking produces distinct features in the Raman signal which can be used both to identify the stacking and to determine the number of layers in the film.
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