• Reference Citation Analysis
  • v
  • v
  • Find an Article
Find an Article PDF (5073089)   Today's Articles (92)
For: Stevens-Kalceff MA, Levick KJ. The assessment of microscopic charging effects induced by focused electron and ion beam irradiation of dielectrics. Microsc Res Tech 2007;70:195-204. [PMID: 17279517 DOI: 10.1002/jemt.20399] [Citation(s) in RCA: 10] [Impact Index Per Article: 0.6] [Reference Citation Analysis] [What about the content of this article? (0)] [Track Full Text] [Journal Information] [Subscribe] [Scholar Register] [Indexed: 11/11/2022]
Number Cited by Other Article(s)
1
Khan Y, Butt MA, Kazanskiy NL, Khonina SN. Numerical Study of Fabrication-Related Effects of the Structural-Profile on the Performance of a Dielectric Photonic Crystal-Based Fluid Sensor. MATERIALS 2022;15:ma15093277. [PMID: 35591609 PMCID: PMC9104057 DOI: 10.3390/ma15093277] [Citation(s) in RCA: 2] [Impact Index Per Article: 0.7] [Reference Citation Analysis] [Abstract] [Key Words] [Track Full Text] [Download PDF] [Figures] [Subscribe] [Scholar Register] [Received: 03/19/2022] [Revised: 04/28/2022] [Accepted: 04/29/2022] [Indexed: 02/06/2023]
2
Sannomiya T, Junesch J, Hosokawa F, Nagayama K, Arai Y, Kayama Y. Multi-pore carbon phase plate for phase-contrast transmission electron microscopy. Ultramicroscopy 2014;146:91-6. [PMID: 25129640 DOI: 10.1016/j.ultramic.2014.07.008] [Citation(s) in RCA: 2] [Impact Index Per Article: 0.2] [Reference Citation Analysis] [Abstract] [Key Words] [Track Full Text] [Journal Information] [Subscribe] [Scholar Register] [Received: 03/20/2014] [Revised: 07/11/2014] [Accepted: 07/21/2014] [Indexed: 11/29/2022]
3
Hristu R, Tranca DE, Stanciu SG, Gregor M, Plecenik T, Truchly M, Roch T, Tofail SAM, Stanciu GA. Surface charge and carbon contamination on an electron-beam-irradiated hydroxyapatite thin film investigated by photoluminescence and phase imaging in atomic force microscopy. MICROSCOPY AND MICROANALYSIS : THE OFFICIAL JOURNAL OF MICROSCOPY SOCIETY OF AMERICA, MICROBEAM ANALYSIS SOCIETY, MICROSCOPICAL SOCIETY OF CANADA 2014;20:586-595. [PMID: 24717172 DOI: 10.1017/s1431927614000191] [Citation(s) in RCA: 1] [Impact Index Per Article: 0.1] [Reference Citation Analysis] [Abstract] [MESH Headings] [Track Full Text] [Subscribe] [Scholar Register] [Indexed: 06/03/2023]
PrevPage 1 of 1 1Next
© 2004-2025 Baishideng Publishing Group Inc. All rights reserved. 7041 Koll Center Parkway, Suite 160, Pleasanton, CA 94566, USA