• Reference Citation Analysis
  • v
  • v
  • Find an Article
Find an Article PDF (4698277)   Today's Articles (470)
For: Meyer E, Heinzelmann H, Rudin H, G�ntherodt HJ. Atomic resolution on LiF (001) by atomic force microscopy. ACTA ACUST UNITED AC 1990. [DOI: 10.1007/bf01387818] [Citation(s) in RCA: 39] [Impact Index Per Article: 1.1] [Reference Citation Analysis] [What about the content of this article? (0)] [Track Full Text] [Journal Information] [Subscribe] [Scholar Register] [Indexed: 10/25/2022]
Number Cited by Other Article(s)
1
Wastl DS, Judmann M, Weymouth AJ, Giessibl FJ. Atomic Resolution of Calcium and Oxygen Sublattices of Calcite in Ambient Conditions by Atomic Force Microscopy Using qPlus Sensors with Sapphire Tips. ACS NANO 2015;9:3858-3865. [PMID: 25816927 DOI: 10.1021/acsnano.5b01549] [Citation(s) in RCA: 11] [Impact Index Per Article: 1.1] [Reference Citation Analysis] [Abstract] [Key Words] [MESH Headings] [Track Full Text] [Subscribe] [Scholar Register] [Indexed: 06/04/2023]
2
Wastl DS, Weymouth AJ, Giessibl FJ. Atomically resolved graphitic surfaces in air by atomic force microscopy. ACS NANO 2014;8:5233-9. [PMID: 24746062 DOI: 10.1021/nn501696q] [Citation(s) in RCA: 21] [Impact Index Per Article: 1.9] [Reference Citation Analysis] [Abstract] [MESH Headings] [Track Full Text] [Subscribe] [Scholar Register] [Indexed: 05/27/2023]
3
Nanoscale measurements and manipulation. ACTA ACUST UNITED AC 2004. [DOI: 10.1116/1.1760754] [Citation(s) in RCA: 45] [Impact Index Per Article: 2.1] [Reference Citation Analysis] [Track Full Text] [Journal Information] [Subscribe] [Scholar Register] [Indexed: 11/17/2022]
4
Alkali Halides. ACTA ACUST UNITED AC 2002. [DOI: 10.1007/978-3-642-56019-4_5] [Citation(s) in RCA: 0] [Impact Index Per Article: 0] [Reference Citation Analysis] [Track Full Text] [Journal Information] [Subscribe] [Scholar Register]
5
Legge H, Manson JR, Toennies JP. Energy and momentum transfer of He atoms scattered from a lithium fluoride crystal surface. J Chem Phys 1999. [DOI: 10.1063/1.478784] [Citation(s) in RCA: 16] [Impact Index Per Article: 0.6] [Reference Citation Analysis] [Track Full Text] [Journal Information] [Subscribe] [Scholar Register] [Indexed: 11/14/2022]  Open
6
Tang H, Bouju X, Joachim C, Girard C, Devillers J. Theoretical study of the atomic-force-microscopy imaging process on the NaCl(001) surface. J Chem Phys 1998. [DOI: 10.1063/1.475383] [Citation(s) in RCA: 23] [Impact Index Per Article: 0.9] [Reference Citation Analysis] [Track Full Text] [Journal Information] [Subscribe] [Scholar Register] [Indexed: 11/14/2022]  Open
7
Ness H, Gautier F. Theoretical study of the interaction between a magnetic nanotip and a magnetic surface. PHYSICAL REVIEW. B, CONDENSED MATTER 1995;52:7352-7362. [PMID: 9979679 DOI: 10.1103/physrevb.52.7352] [Citation(s) in RCA: 23] [Impact Index Per Article: 0.8] [Reference Citation Analysis] [Track Full Text] [Subscribe] [Scholar Register] [Indexed: 04/12/2023]
8
Magnetic Force Microscopy (MFM). SCANNING TUNNELING MICROSCOPY II 1995. [DOI: 10.1007/978-3-642-79366-0_5] [Citation(s) in RCA: 4] [Impact Index Per Article: 0.1] [Reference Citation Analysis] [Track Full Text] [Subscribe] [Scholar Register] [Indexed: 01/18/2023]
9
Surface analysis with atomic force microscopy through measurement in air and under liquids. Mikrochim Acta 1994. [DOI: 10.1007/bf01243610] [Citation(s) in RCA: 11] [Impact Index Per Article: 0.4] [Reference Citation Analysis] [Track Full Text] [Journal Information] [Subscribe] [Scholar Register] [Indexed: 10/25/2022]
10
Howald L, Haefke H, Lüthi R, Meyer E, Gerth G, Rudin H, Güntherodt H. Ultrahigh-vacuum scanning force microscopy: Atomic-scale resolution at monatomic cleavage steps. PHYSICAL REVIEW. B, CONDENSED MATTER 1994;49:5651-5656. [PMID: 10011523 DOI: 10.1103/physrevb.49.5651] [Citation(s) in RCA: 28] [Impact Index Per Article: 0.9] [Reference Citation Analysis] [Track Full Text] [Subscribe] [Scholar Register] [Indexed: 04/12/2023]
11
Atomic-scale contrast mechanism in atomic force microscopy. ACTA ACUST UNITED AC 1992. [DOI: 10.1007/bf01470920] [Citation(s) in RCA: 29] [Impact Index Per Article: 0.9] [Reference Citation Analysis] [Track Full Text] [Journal Information] [Subscribe] [Scholar Register] [Indexed: 11/26/2022]
12
Haefke H, Meyer E, Howald L, Schwarz U, Gerth G, Krohn M. Atomic surface and lattice structures of AgBr thin films. Ultramicroscopy 1992. [DOI: 10.1016/0304-3991(92)90281-n] [Citation(s) in RCA: 14] [Impact Index Per Article: 0.4] [Reference Citation Analysis] [Track Full Text] [Journal Information] [Subscribe] [Scholar Register] [Indexed: 10/27/2022]
13
Giessibl F, Binnig G. Investigation of the (001) cleavage plane of potassium bromide with an atomic force microscope at 4.2 K in ultra-high vacuum. Ultramicroscopy 1992. [DOI: 10.1016/0304-3991(92)90280-w] [Citation(s) in RCA: 42] [Impact Index Per Article: 1.3] [Reference Citation Analysis] [Track Full Text] [Journal Information] [Subscribe] [Scholar Register] [Indexed: 10/27/2022]
14
Meyer E, Howald L, Overney R, Brodbeck D, Lüthi R, Haefke H, Frommer J, Güntherodt HJ. Structure and dynamics of solid surfaces observed by atomic force microscopy. Ultramicroscopy 1992. [DOI: 10.1016/0304-3991(92)90279-s] [Citation(s) in RCA: 24] [Impact Index Per Article: 0.7] [Reference Citation Analysis] [Track Full Text] [Journal Information] [Subscribe] [Scholar Register] [Indexed: 11/29/2022]
15
Giessibl FJ. Theory for an electrostatic imaging mechanism allowing atomic resolution of ionic crystals by atomic force microscopy. PHYSICAL REVIEW. B, CONDENSED MATTER 1992;45:13815-13818. [PMID: 10001493 DOI: 10.1103/physrevb.45.13815] [Citation(s) in RCA: 21] [Impact Index Per Article: 0.6] [Reference Citation Analysis] [Track Full Text] [Subscribe] [Scholar Register] [Indexed: 04/12/2023]
16
Plate-like microcrystals of silver bromide investigated by scanning force microscopy. Ultramicroscopy 1992. [DOI: 10.1016/0304-3991(92)90224-8] [Citation(s) in RCA: 3] [Impact Index Per Article: 0.1] [Reference Citation Analysis] [Track Full Text] [Journal Information] [Subscribe] [Scholar Register] [Indexed: 11/21/2022]
17
Magnetic Force Microscopy (MFM). ACTA ACUST UNITED AC 1992. [DOI: 10.1007/978-3-642-97363-5_5] [Citation(s) in RCA: 29] [Impact Index Per Article: 0.9] [Reference Citation Analysis] [Track Full Text] [Journal Information] [Subscribe] [Scholar Register] [Indexed: 04/07/2023]
18
Hansma H, Motamedi F, Smith P, Hansma P, Wittman JC. Molecular resolution of thin, highly oriented poly (tetrafluoroethylene) films with the atomic force microscope. POLYMER 1992. [DOI: 10.1016/0032-3861(92)90745-i] [Citation(s) in RCA: 85] [Impact Index Per Article: 2.6] [Reference Citation Analysis] [Track Full Text] [Journal Information] [Subscribe] [Scholar Register] [Indexed: 11/29/2022]
19
Scanning Force Microscopy (SFM). ACTA ACUST UNITED AC 1992. [DOI: 10.1007/978-3-642-97363-5_4] [Citation(s) in RCA: 18] [Impact Index Per Article: 0.5] [Reference Citation Analysis] [Track Full Text] [Journal Information] [Subscribe] [Scholar Register]
20
Molecular-resolution images of Langmuir–Blodgett films using atomic force microscopy. Nature 1991. [DOI: 10.1038/349398a0] [Citation(s) in RCA: 193] [Impact Index Per Article: 5.7] [Reference Citation Analysis] [Track Full Text] [Journal Information] [Subscribe] [Scholar Register] [Indexed: 11/08/2022]
21
Schönenberger C, Alvarado SF. Observation of single charge carriers by force microscopy. PHYSICAL REVIEW LETTERS 1990;65:3162-3164. [PMID: 10042797 DOI: 10.1103/physrevlett.65.3162] [Citation(s) in RCA: 89] [Impact Index Per Article: 2.5] [Reference Citation Analysis] [Track Full Text] [Subscribe] [Scholar Register] [Indexed: 05/23/2023]
PrevPage 1 of 1 1Next
© 2004-2025 Baishideng Publishing Group Inc. All rights reserved. 7041 Koll Center Parkway, Suite 160, Pleasanton, CA 94566, USA