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For: Fowler JW, Alpert BK, O’Neil GC, Swetz DS, Ullom JN. Energy Calibration of Nonlinear Microcalorimeters with Uncertainty Estimates from Gaussian Process Regression. J Low Temp Phys 2022;209:10.1007/s10909-022-02740-w. [PMID: 37427309 PMCID: PMC10327436 DOI: 10.1007/s10909-022-02740-w] [Citation(s) in RCA: 1] [Impact Index Per Article: 0.5] [Reference Citation Analysis] [What about the content of this article? (0)] [Track Full Text] [Subscribe] [Scholar Register] [Received: 10/09/2021] [Accepted: 04/21/2022] [Indexed: 07/11/2023]

For:	Fowler JW, Alpert BK, O’Neil GC, Swetz DS, Ullom JN. Energy Calibration of Nonlinear Microcalorimeters with Uncertainty Estimates from Gaussian Process Regression. J Low Temp Phys 2022;209:10.1007/s10909-022-02740-w. [PMID: 37427309 PMCID: PMC10327436 DOI: 10.1007/s10909-022-02740-w] [Citation(s) in RCA: 1] [Impact Index Per Article: 0.5] [Reference Citation Analysis] [What about the content of this article? (0)] [Track Full Text] [Subscribe] [Scholar Register] [Received: 10/09/2021] [Accepted: 04/21/2022] [Indexed: 07/11/2023]

Number

Cited by Other Article(s)

Nakamura N, Szypryt P, Dagel AL, Alpert BK, Bennett DA, Doriese WB, Durkin M, Fowler JW, Fox DT, Gard JD, Goodner RN, Harris JZ, Hilton GC, Jimenez ES, Kernen BL, Larson KW, Levine ZH, McArthur D, Morgan KM, O’Neil GC, Ortiz NJ, Pappas CG, Reintsema CD, Schmidt DR, Schultz PA, Thompson KR, Ullom JN, Vale L, Vaughan CT, Walker C, Weber JC, Wheeler JW, Swetz DS. Nanoscale Three-Dimensional Imaging of Integrated Circuits Using a Scanning Electron Microscope and Transition-Edge Sensor Spectrometer. SENSORS (BASEL, SWITZERLAND) 2024;24:2890. [PMID: 38732996 PMCID: PMC11086152 DOI: 10.3390/s24092890] [Citation(s) in RCA: 0] [Impact Index Per Article: 0] [Reference Citation Analysis] [Abstract] [Key Words] [Grants] [Track Full Text] [Subscribe] [Scholar Register] [Received: 03/04/2024] [Revised: 04/27/2024] [Accepted: 04/30/2024] [Indexed: 05/13/2024]

Affiliation(s)

Nathan Nakamura National Institute of Standards and Technology, Boulder, CO 80305, USA; (P.S.); (B.K.A.); (D.A.B.); (W.B.D.); (M.D.); (J.W.F.); (J.D.G.); (K.M.M.); (G.C.O.); (N.J.O.); (C.D.R.); (D.R.S.); (J.N.U.); (L.V.); (J.C.W.); (D.S.S.) Department of Physics, University of Colorado, Boulder, CO 80309, USA
Paul Szypryt National Institute of Standards and Technology, Boulder, CO 80305, USA; (P.S.); (B.K.A.); (D.A.B.); (W.B.D.); (M.D.); (J.W.F.); (J.D.G.); (K.M.M.); (G.C.O.); (N.J.O.); (C.D.R.); (D.R.S.); (J.N.U.); (L.V.); (J.C.W.); (D.S.S.) Department of Physics, University of Colorado, Boulder, CO 80309, USA
Amber L. Dagel Sandia National Laboratories, Albuquerque, NM 87123, USA; (A.L.D.); (D.T.F.); (R.N.G.); (E.S.J.); (B.L.K.); (D.M.); (P.A.S.); (K.R.T.); (C.T.V.); (C.W.); (J.W.W.)
Bradley K. Alpert National Institute of Standards and Technology, Boulder, CO 80305, USA; (P.S.); (B.K.A.); (D.A.B.); (W.B.D.); (M.D.); (J.W.F.); (J.D.G.); (K.M.M.); (G.C.O.); (N.J.O.); (C.D.R.); (D.R.S.); (J.N.U.); (L.V.); (J.C.W.); (D.S.S.)
Douglas A. Bennett National Institute of Standards and Technology, Boulder, CO 80305, USA; (P.S.); (B.K.A.); (D.A.B.); (W.B.D.); (M.D.); (J.W.F.); (J.D.G.); (K.M.M.); (G.C.O.); (N.J.O.); (C.D.R.); (D.R.S.); (J.N.U.); (L.V.); (J.C.W.); (D.S.S.)
William Bertrand Doriese National Institute of Standards and Technology, Boulder, CO 80305, USA; (P.S.); (B.K.A.); (D.A.B.); (W.B.D.); (M.D.); (J.W.F.); (J.D.G.); (K.M.M.); (G.C.O.); (N.J.O.); (C.D.R.); (D.R.S.); (J.N.U.); (L.V.); (J.C.W.); (D.S.S.)
Malcolm Durkin National Institute of Standards and Technology, Boulder, CO 80305, USA; (P.S.); (B.K.A.); (D.A.B.); (W.B.D.); (M.D.); (J.W.F.); (J.D.G.); (K.M.M.); (G.C.O.); (N.J.O.); (C.D.R.); (D.R.S.); (J.N.U.); (L.V.); (J.C.W.); (D.S.S.) Department of Physics, University of Colorado, Boulder, CO 80309, USA
Joseph W. Fowler National Institute of Standards and Technology, Boulder, CO 80305, USA; (P.S.); (B.K.A.); (D.A.B.); (W.B.D.); (M.D.); (J.W.F.); (J.D.G.); (K.M.M.); (G.C.O.); (N.J.O.); (C.D.R.); (D.R.S.); (J.N.U.); (L.V.); (J.C.W.); (D.S.S.) Department of Physics, University of Colorado, Boulder, CO 80309, USA
Dylan T. Fox Sandia National Laboratories, Albuquerque, NM 87123, USA; (A.L.D.); (D.T.F.); (R.N.G.); (E.S.J.); (B.L.K.); (D.M.); (P.A.S.); (K.R.T.); (C.T.V.); (C.W.); (J.W.W.)
Johnathon D. Gard National Institute of Standards and Technology, Boulder, CO 80305, USA; (P.S.); (B.K.A.); (D.A.B.); (W.B.D.); (M.D.); (J.W.F.); (J.D.G.); (K.M.M.); (G.C.O.); (N.J.O.); (C.D.R.); (D.R.S.); (J.N.U.); (L.V.); (J.C.W.); (D.S.S.) Department of Physics, University of Colorado, Boulder, CO 80309, USA
Ryan N. Goodner Sandia National Laboratories, Albuquerque, NM 87123, USA; (A.L.D.); (D.T.F.); (R.N.G.); (E.S.J.); (B.L.K.); (D.M.); (P.A.S.); (K.R.T.); (C.T.V.); (C.W.); (J.W.W.)
James Zachariah Harris Sandia National Laboratories, Albuquerque, NM 87123, USA; (A.L.D.); (D.T.F.); (R.N.G.); (E.S.J.); (B.L.K.); (D.M.); (P.A.S.); (K.R.T.); (C.T.V.); (C.W.); (J.W.W.)
Gene C. Hilton National Institute of Standards and Technology, Boulder, CO 80305, USA; (P.S.); (B.K.A.); (D.A.B.); (W.B.D.); (M.D.); (J.W.F.); (J.D.G.); (K.M.M.); (G.C.O.); (N.J.O.); (C.D.R.); (D.R.S.); (J.N.U.); (L.V.); (J.C.W.); (D.S.S.)
Edward S. Jimenez Sandia National Laboratories, Albuquerque, NM 87123, USA; (A.L.D.); (D.T.F.); (R.N.G.); (E.S.J.); (B.L.K.); (D.M.); (P.A.S.); (K.R.T.); (C.T.V.); (C.W.); (J.W.W.)
Burke L. Kernen Sandia National Laboratories, Albuquerque, NM 87123, USA; (A.L.D.); (D.T.F.); (R.N.G.); (E.S.J.); (B.L.K.); (D.M.); (P.A.S.); (K.R.T.); (C.T.V.); (C.W.); (J.W.W.)
Kurt W. Larson Sandia National Laboratories, Albuquerque, NM 87123, USA; (A.L.D.); (D.T.F.); (R.N.G.); (E.S.J.); (B.L.K.); (D.M.); (P.A.S.); (K.R.T.); (C.T.V.); (C.W.); (J.W.W.)
Zachary H. Levine National Institute of Standards and Technology, Gaithersburg, MD 20899, USA;
Daniel McArthur Sandia National Laboratories, Albuquerque, NM 87123, USA; (A.L.D.); (D.T.F.); (R.N.G.); (E.S.J.); (B.L.K.); (D.M.); (P.A.S.); (K.R.T.); (C.T.V.); (C.W.); (J.W.W.)
Kelsey M. Morgan National Institute of Standards and Technology, Boulder, CO 80305, USA; (P.S.); (B.K.A.); (D.A.B.); (W.B.D.); (M.D.); (J.W.F.); (J.D.G.); (K.M.M.); (G.C.O.); (N.J.O.); (C.D.R.); (D.R.S.); (J.N.U.); (L.V.); (J.C.W.); (D.S.S.) Department of Physics, University of Colorado, Boulder, CO 80309, USA
Galen C. O’Neil National Institute of Standards and Technology, Boulder, CO 80305, USA; (P.S.); (B.K.A.); (D.A.B.); (W.B.D.); (M.D.); (J.W.F.); (J.D.G.); (K.M.M.); (G.C.O.); (N.J.O.); (C.D.R.); (D.R.S.); (J.N.U.); (L.V.); (J.C.W.); (D.S.S.)
Nathan J. Ortiz National Institute of Standards and Technology, Boulder, CO 80305, USA; (P.S.); (B.K.A.); (D.A.B.); (W.B.D.); (M.D.); (J.W.F.); (J.D.G.); (K.M.M.); (G.C.O.); (N.J.O.); (C.D.R.); (D.R.S.); (J.N.U.); (L.V.); (J.C.W.); (D.S.S.) Department of Physics, University of Colorado, Boulder, CO 80309, USA
Christine G. Pappas National Institute of Standards and Technology, Boulder, CO 80305, USA; (P.S.); (B.K.A.); (D.A.B.); (W.B.D.); (M.D.); (J.W.F.); (J.D.G.); (K.M.M.); (G.C.O.); (N.J.O.); (C.D.R.); (D.R.S.); (J.N.U.); (L.V.); (J.C.W.); (D.S.S.) Department of Physics, University of Colorado, Boulder, CO 80309, USA
Carl D. Reintsema National Institute of Standards and Technology, Boulder, CO 80305, USA; (P.S.); (B.K.A.); (D.A.B.); (W.B.D.); (M.D.); (J.W.F.); (J.D.G.); (K.M.M.); (G.C.O.); (N.J.O.); (C.D.R.); (D.R.S.); (J.N.U.); (L.V.); (J.C.W.); (D.S.S.)
Daniel R. Schmidt National Institute of Standards and Technology, Boulder, CO 80305, USA; (P.S.); (B.K.A.); (D.A.B.); (W.B.D.); (M.D.); (J.W.F.); (J.D.G.); (K.M.M.); (G.C.O.); (N.J.O.); (C.D.R.); (D.R.S.); (J.N.U.); (L.V.); (J.C.W.); (D.S.S.)
Peter A. Schultz Sandia National Laboratories, Albuquerque, NM 87123, USA; (A.L.D.); (D.T.F.); (R.N.G.); (E.S.J.); (B.L.K.); (D.M.); (P.A.S.); (K.R.T.); (C.T.V.); (C.W.); (J.W.W.)
Kyle R. Thompson Sandia National Laboratories, Albuquerque, NM 87123, USA; (A.L.D.); (D.T.F.); (R.N.G.); (E.S.J.); (B.L.K.); (D.M.); (P.A.S.); (K.R.T.); (C.T.V.); (C.W.); (J.W.W.)
Joel N. Ullom National Institute of Standards and Technology, Boulder, CO 80305, USA; (P.S.); (B.K.A.); (D.A.B.); (W.B.D.); (M.D.); (J.W.F.); (J.D.G.); (K.M.M.); (G.C.O.); (N.J.O.); (C.D.R.); (D.R.S.); (J.N.U.); (L.V.); (J.C.W.); (D.S.S.) Department of Physics, University of Colorado, Boulder, CO 80309, USA
Leila Vale National Institute of Standards and Technology, Boulder, CO 80305, USA; (P.S.); (B.K.A.); (D.A.B.); (W.B.D.); (M.D.); (J.W.F.); (J.D.G.); (K.M.M.); (G.C.O.); (N.J.O.); (C.D.R.); (D.R.S.); (J.N.U.); (L.V.); (J.C.W.); (D.S.S.)
Courtenay T. Vaughan Sandia National Laboratories, Albuquerque, NM 87123, USA; (A.L.D.); (D.T.F.); (R.N.G.); (E.S.J.); (B.L.K.); (D.M.); (P.A.S.); (K.R.T.); (C.T.V.); (C.W.); (J.W.W.)
Christopher Walker Sandia National Laboratories, Albuquerque, NM 87123, USA; (A.L.D.); (D.T.F.); (R.N.G.); (E.S.J.); (B.L.K.); (D.M.); (P.A.S.); (K.R.T.); (C.T.V.); (C.W.); (J.W.W.)
Joel C. Weber National Institute of Standards and Technology, Boulder, CO 80305, USA; (P.S.); (B.K.A.); (D.A.B.); (W.B.D.); (M.D.); (J.W.F.); (J.D.G.); (K.M.M.); (G.C.O.); (N.J.O.); (C.D.R.); (D.R.S.); (J.N.U.); (L.V.); (J.C.W.); (D.S.S.) Department of Physics, University of Colorado, Boulder, CO 80309, USA
Jason W. Wheeler Sandia National Laboratories, Albuquerque, NM 87123, USA; (A.L.D.); (D.T.F.); (R.N.G.); (E.S.J.); (B.L.K.); (D.M.); (P.A.S.); (K.R.T.); (C.T.V.); (C.W.); (J.W.W.)
Daniel S. Swetz National Institute of Standards and Technology, Boulder, CO 80305, USA; (P.S.); (B.K.A.); (D.A.B.); (W.B.D.); (M.D.); (J.W.F.); (J.D.G.); (K.M.M.); (G.C.O.); (N.J.O.); (C.D.R.); (D.R.S.); (J.N.U.); (L.V.); (J.C.W.); (D.S.S.)

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Fowler J, Miaja-Avila L, O’Neil G, Ullom J, Whitelock H, Swetz D. The potential of microcalorimeter X-ray spectrometers for measurement of relative fluorescence-line intensities. Radiat Phys Chem Oxf Engl 1993 2023. [DOI: 10.1016/j.radphyschem.2022.110487] [Citation(s) in RCA: 0] [Impact Index Per Article: 0] [Reference Citation Analysis] [Track Full Text] [Journal Information] [Subscribe] [Scholar Register] [Indexed: 11/25/2022]