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For: Subramanian A, Marks LD. Surface crystallography via electron microscopy. Ultramicroscopy 2004;98:151-7. [PMID: 15046794 DOI: 10.1016/j.ultramic.2003.08.008] [Citation(s) in RCA: 13] [Impact Index Per Article: 0.7] [Reference Citation Analysis] [What about the content of this article? (0)] [Track Full Text] [Journal Information] [Subscribe] [Scholar Register] [Received: 03/05/2003] [Revised: 07/08/2003] [Indexed: 10/27/2022]
Number Cited by Other Article(s)
1
You R, Wu Z, Yu J, Wang F, Chen S, Han ZK, Yuan W, Yang H, Wang Y. Revealing Surface Restraint-Induced Hexagonal Pd Nanocrystals via In Situ Transmission Electron Microscopy. NANO LETTERS 2022;22:4333-4339. [PMID: 35584407 DOI: 10.1021/acs.nanolett.2c00411] [Citation(s) in RCA: 5] [Impact Index Per Article: 2.5] [Reference Citation Analysis] [Abstract] [Key Words] [MESH Headings] [Track Full Text] [Subscribe] [Scholar Register] [Indexed: 06/15/2023]
2
Yoon J, Cao Z, Raju RK, Wang Y, Burnley R, Gellman AJ, Barati Farimani A, Ulissi ZW. Deep reinforcement learning for predicting kinetic pathways to surface reconstruction in a ternary alloy. MACHINE LEARNING: SCIENCE AND TECHNOLOGY 2021. [DOI: 10.1088/2632-2153/ac191c] [Citation(s) in RCA: 4] [Impact Index Per Article: 1.3] [Reference Citation Analysis] [Abstract] [Track Full Text] [Journal Information] [Subscribe] [Scholar Register] [Indexed: 12/29/2022]  Open
3
Li C, Zhang L, Gong T, Cheng Y, Li L, Li L, Jia S, Qi Y, Wang J, Gao Y. Study of the Growth Mechanism of Solution-Synthesized Symmetric Tellurium Nanoflakes at Atomic Resolution. SMALL (WEINHEIM AN DER BERGSTRASSE, GERMANY) 2021;17:e2005801. [PMID: 33470501 DOI: 10.1002/smll.202005801] [Citation(s) in RCA: 2] [Impact Index Per Article: 0.7] [Reference Citation Analysis] [Abstract] [Key Words] [Track Full Text] [Subscribe] [Scholar Register] [Received: 09/17/2020] [Revised: 12/20/2020] [Indexed: 06/12/2023]
4
Tang M, Yuan W, Ou Y, Li G, You R, Li S, Yang H, Zhang Z, Wang Y. Recent Progresses on Structural Reconstruction of Nanosized Metal Catalysts via Controlled-Atmosphere Transmission Electron Microscopy: A Review. ACS Catal 2020. [DOI: 10.1021/acscatal.0c03335] [Citation(s) in RCA: 37] [Impact Index Per Article: 9.3] [Reference Citation Analysis] [Track Full Text] [Journal Information] [Subscribe] [Scholar Register] [Indexed: 12/14/2022]
5
Howie A. New instrumentation and cutting edge research. Ultramicroscopy 2017;180:52-58. [PMID: 28258870 DOI: 10.1016/j.ultramic.2016.11.006] [Citation(s) in RCA: 5] [Impact Index Per Article: 0.7] [Reference Citation Analysis] [Abstract] [Key Words] [Track Full Text] [Journal Information] [Subscribe] [Scholar Register] [Received: 09/16/2016] [Revised: 11/04/2016] [Accepted: 11/15/2016] [Indexed: 11/16/2022]
6
Yuan W, Wang Y, Li H, Wu H, Zhang Z, Selloni A, Sun C. Real-Time Observation of Reconstruction Dynamics on TiO2(001) Surface under Oxygen via an Environmental Transmission Electron Microscope. NANO LETTERS 2016;16:132-7. [PMID: 26652061 DOI: 10.1021/acs.nanolett.5b03277] [Citation(s) in RCA: 37] [Impact Index Per Article: 4.6] [Reference Citation Analysis] [Abstract] [Key Words] [MESH Headings] [Track Full Text] [Subscribe] [Scholar Register] [Indexed: 05/10/2023]
7
Zhu GZ, Botton GA. A "thickness series": weak signal extraction of ELNES in EELS spectra from surfaces. MICROSCOPY AND MICROANALYSIS : THE OFFICIAL JOURNAL OF MICROSCOPY SOCIETY OF AMERICA, MICROBEAM ANALYSIS SOCIETY, MICROSCOPICAL SOCIETY OF CANADA 2014;20:649-657. [PMID: 24345376 DOI: 10.1017/s1431927613013676] [Citation(s) in RCA: 1] [Impact Index Per Article: 0.1] [Reference Citation Analysis] [Abstract] [Track Full Text] [Subscribe] [Scholar Register] [Indexed: 06/03/2023]
8
Wu J, Sheng Zhao Y, Hu H, Huang J, Zuo JM, Dravid VP. Construction of an organic crystal structural model based on combined electron and powder X-ray diffraction data and the charge flipping algorithm. Ultramicroscopy 2011;111:812-6. [DOI: 10.1016/j.ultramic.2010.09.004] [Citation(s) in RCA: 4] [Impact Index Per Article: 0.3] [Reference Citation Analysis] [Track Full Text] [Journal Information] [Subscribe] [Scholar Register] [Received: 06/30/2010] [Revised: 09/07/2010] [Accepted: 09/09/2010] [Indexed: 11/30/2022]
9
Kilaas R, Marks LD, Own CS. EDM 1.0: Electron direct methods. Ultramicroscopy 2005;102:233-7. [PMID: 15639355 DOI: 10.1016/j.ultramic.2004.10.004] [Citation(s) in RCA: 21] [Impact Index Per Article: 1.1] [Reference Citation Analysis] [Abstract] [MESH Headings] [Track Full Text] [Journal Information] [Subscribe] [Scholar Register] [Received: 07/21/2004] [Revised: 09/30/2004] [Accepted: 10/12/2004] [Indexed: 11/24/2022]
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