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Rafique MA. Exploiting Temporal Features in Calculating Automated Morphological Properties of Spiky Nanoparticles Using Deep Learning. SENSORS (BASEL, SWITZERLAND) 2024; 24:6541. [PMID: 39460021 PMCID: PMC11511305 DOI: 10.3390/s24206541] [Citation(s) in RCA: 0] [Impact Index Per Article: 0] [Reference Citation Analysis] [Abstract] [Key Words] [Grants] [Track Full Text] [Subscribe] [Scholar Register] [Received: 09/02/2024] [Revised: 10/06/2024] [Accepted: 10/09/2024] [Indexed: 10/28/2024]
Abstract
Object segmentation in images is typically spatial and focuses on the spatial coherence of pixels. Nanoparticles in electron microscopy images are also segmented frame by frame, with subsequent morphological analysis. However, morphological analysis is inherently sequential, and a temporal regularity is evident in the process. In this study, we extend the spatially focused morphological analysis by incorporating a fusion of hard and soft inductive bias from sequential machine learning techniques to account for temporal relationships. Previously, spiky Au nanoparticles (Au-SNPs) in electron microscopy images were analyzed, and their morphological properties were automatically generated using a hourglass convolutional neural network architecture. In this study, recurrent layers are integrated to capture the natural, sequential growth of the particles. The network is trained with a spike-focused loss function. Continuous segmentation of the images explores the regressive relationships among natural growth features, generating morphological statistics of the nanoparticles. This study comprehensively evaluates the proposed approach by comparing the results of segmentation and morphological properties analysis, demonstrating its superiority over earlier methods.
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Affiliation(s)
- Muhammad Aasim Rafique
- Department of Information Systems, College of Computer Sciences & Information Technology, King Faisal University, P.O. Box 400, Al-Ahsa 31982, Saudi Arabia
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2
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Zhang W, Wang Z. An approach of separating the overlapped cells or nuclei based on the outer Canny edges and morphological erosion. Cytometry A 2024; 105:266-275. [PMID: 38111162 DOI: 10.1002/cyto.a.24819] [Citation(s) in RCA: 0] [Impact Index Per Article: 0] [Reference Citation Analysis] [Abstract] [Key Words] [MESH Headings] [Grants] [Track Full Text] [Journal Information] [Subscribe] [Scholar Register] [Received: 06/08/2023] [Revised: 11/23/2023] [Accepted: 11/27/2023] [Indexed: 12/20/2023]
Abstract
In biomedicine, the automatic processing of medical microscope images plays a key role in the subsequent analysis and diagnosis. Cell or nucleus segmentation is one of the most challenging tasks for microscope image processing. Due to the frequently occurred overlapping, few segmentation methods can achieve satisfactory segmentation accuracy yet. In this paper, we propose an approach to separate the overlapped cells or nuclei based on the outer Canny edges and morphological erosion. The threshold selection is first used to segment the foreground and background of cell or nucleus images. For each binary connected domain in the segmentation image, an intersection based edge selection method is proposed to choose the outer Canny edges of the overlapped cells or nuclei. The outer Canny edges are used to generate a binary cell or nucleus image that is then used to compute the cell or nucleus seeds by the proposed morphological erosion method. The nuclei of the Human U2OS cells, the mouse NIH3T3 cells and the synthetic cells are used for evaluating our proposed approach. The quantitative quantification accuracy is computed by the Dice score and 95.53% is achieved by the proposed approach. Both the quantitative and the qualitative comparisons show that the accuracy of the proposed approach is better than those of the area constrained morphological erosion (ACME) method, the iterative erosion (IE) method, the morphology and watershed (MW) method, the Generalized Laplacian of Gaussian filters (GLGF) method and ellipse fitting (EF) method in separating the cells or nuclei in three publicly available datasets.
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Affiliation(s)
- Wenfei Zhang
- College of Electrical and Electronic Engineering, Shandong University of Technology, Zibo, China
| | - Zhenzhou Wang
- School of Computer Science and Technology, Huaibei Normal University, Huaibei, China
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3
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Chatzigeorgiou M, Constantoudis V, Katsiotis M, Beazi-Katsioti M, Boukos N. Segmentability evaluation of back-scattered SEM images of multiphase materials. Ultramicroscopy 2024; 257:113892. [PMID: 38065012 DOI: 10.1016/j.ultramic.2023.113892] [Citation(s) in RCA: 0] [Impact Index Per Article: 0] [Reference Citation Analysis] [Abstract] [Key Words] [Track Full Text] [Journal Information] [Subscribe] [Scholar Register] [Received: 07/14/2022] [Revised: 08/22/2023] [Accepted: 11/23/2023] [Indexed: 01/05/2024]
Abstract
Segmentation methods are very useful tools in the Electron Microscopy inspection of materials, enabling the extraction of quantitative results from microscopy images. Back-Scattered Electron (BSE) images carry information of the mean atomic number in the interaction volume and hence can be used to quantify the phase composition in multiphase materials. Since phase composition and proportion affects the material properties and hence its applications, the segmentation accuracy of such images rendered of critical importance for material science. In this work, the notion of segmentability for BSE images is proposed to define the ability of an image to be segmented accurately. This notion can be used to guide the image acquisition process so that segmentability is maximized and segmentation accuracy is ensured. An index is devised to quantify segmentability based on a combination of the modified Fisher Discrimination Ratio and of the second Minkowski functional capturing intensity and spatial aspects of BSE images respectively. The suggested Segmentability Index (SI) is validated in synthetic BSE images which are generated with a novel algorithm allowing the independent control of spatial distribution of phases and their grayscale intensity histograms. Additionally, SI is applied in real-synthetic BSE images, where the real greyscale distributions of Ordinary Portland Cement (OPC) clinker crystallographic phases are used, to demonstrate the ability of SI to indicate the optimum choice of critical image acquisition settings leading to the more accurate segmentation output.
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Affiliation(s)
- Manolis Chatzigeorgiou
- Institute of Nanoscience and Nanotechnology, National Centre for Scientific Research "Demokritos", Patriarchou Grigoriou E' & Neapoleos Str., Agia Paraskevi Attikis, Greece; School of Chemical Engineering, National Technical University of Athens, 9 Iroon Polytechniou Street, Athens, Zografou 15780, Greece.
| | - Vassilios Constantoudis
- Institute of Nanoscience and Nanotechnology, National Centre for Scientific Research "Demokritos", Patriarchou Grigoriou E' & Neapoleos Str., Agia Paraskevi Attikis, Greece
| | - Marios Katsiotis
- Group Innovation & Technology, TITAN Cement S.A., 22A Halkidos Street, Athens 111 43, Greece
| | - Margarita Beazi-Katsioti
- School of Chemical Engineering, National Technical University of Athens, 9 Iroon Polytechniou Street, Athens, Zografou 15780, Greece
| | - Nikos Boukos
- Institute of Nanoscience and Nanotechnology, National Centre for Scientific Research "Demokritos", Patriarchou Grigoriou E' & Neapoleos Str., Agia Paraskevi Attikis, Greece
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4
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Leth Larsen MH, Lomholdt WB, Nuñez Valencia C, Hansen TW, Schiøtz J. Quantifying noise limitations of neural network segmentations in high-resolution transmission electron microscopy. Ultramicroscopy 2023; 253:113803. [PMID: 37499574 DOI: 10.1016/j.ultramic.2023.113803] [Citation(s) in RCA: 1] [Impact Index Per Article: 0.5] [Reference Citation Analysis] [Abstract] [Key Words] [Track Full Text] [Journal Information] [Subscribe] [Scholar Register] [Received: 02/03/2023] [Revised: 05/29/2023] [Accepted: 06/30/2023] [Indexed: 07/29/2023]
Abstract
Motivated by the need for low electron dose transmission electron microscopy imaging, we report the optimal frame dose (i.e.e-/Å2) range for object detection and segmentation tasks with neural networks. The MSD-net architecture shows promising abilities over the industry standard U-net architecture in generalising to frame doses below the range included in the training set, for both simulated and experimental images. It also presents a heightened ability to learn from lower dose images. The MSD-net displays mild visibility of a Au nanoparticle at 20-30 e-/Å2, and converges at 200 e-/Å2 where a full segmentation of the nanoparticle is achieved. Between 30 and 200 e-/Å2 object detection applications are still possible. This work also highlights the importance of modelling the modulation transfer function when training with simulated images for applications on images acquired with scintillator based detectors such as the Gatan Oneview camera. A parametric form of the modulation transfer function is applied with varying ranges of parameters, and the effects on low electron dose segmentation is presented.
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Affiliation(s)
- Matthew Helmi Leth Larsen
- Computational Atomic-scale Materials Design (CAMD), Department of Physics, Technical University of Denmark, DK-2800 Kgs. Lyngby, Denmark
| | - William Bang Lomholdt
- National Center for Nano Fabrication and Characterization, Technical University of Denmark, DK-2800 Kgs. Lyngby, Denmark
| | - Cuauhtemoc Nuñez Valencia
- Computational Atomic-scale Materials Design (CAMD), Department of Physics, Technical University of Denmark, DK-2800 Kgs. Lyngby, Denmark
| | - Thomas W Hansen
- National Center for Nano Fabrication and Characterization, Technical University of Denmark, DK-2800 Kgs. Lyngby, Denmark
| | - Jakob Schiøtz
- Computational Atomic-scale Materials Design (CAMD), Department of Physics, Technical University of Denmark, DK-2800 Kgs. Lyngby, Denmark.
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Kaphle A, Jayarathna S, Moktan H, Aliru M, Raghuram S, Krishnan S, Cho SH. Deep Learning-Based TEM Image Analysis for Fully Automated Detection of Gold Nanoparticles Internalized Within Tumor Cell. MICROSCOPY AND MICROANALYSIS : THE OFFICIAL JOURNAL OF MICROSCOPY SOCIETY OF AMERICA, MICROBEAM ANALYSIS SOCIETY, MICROSCOPICAL SOCIETY OF CANADA 2023; 29:1474-1487. [PMID: 37488822 PMCID: PMC10433944 DOI: 10.1093/micmic/ozad066] [Citation(s) in RCA: 1] [Impact Index Per Article: 0.5] [Reference Citation Analysis] [Abstract] [Key Words] [MESH Headings] [Grants] [Track Full Text] [Subscribe] [Scholar Register] [Received: 02/07/2023] [Revised: 04/28/2023] [Accepted: 05/22/2023] [Indexed: 07/26/2023]
Abstract
Transmission electron microscopy (TEM) imaging can be used for detection/localization of gold nanoparticles (GNPs) within tumor cells. However, quantitative analysis of GNP-containing cellular TEM images typically relies on conventional/thresholding-based methods, which are manual, time-consuming, and prone to human errors. In this study, therefore, deep learning (DL)-based methods were developed for fully automated detection of GNPs from cellular TEM images. Several models of "you only look once (YOLO)" v5 were implemented, with a few adjustments to enhance the model's performance by applying the transfer learning approach, adjusting the size of the input image, and choosing the best optimization algorithm. Seventy-eight original (12,040 augmented) TEM images of GNP-laden tumor cells were used for model implementation and validation. A maximum F1 score (harmonic mean of the precision and recall) of 0.982 was achieved by the best-trained models, while mean average precision was 0.989 and 0.843 at 0.50 and 0.50-0.95 intersection over union threshold, respectively. These results suggested the developed DL-based approach was capable of precisely estimating the number/position of internalized GNPs from cellular TEM images. A novel DL-based TEM image analysis tool from this study will benefit research/development efforts on GNP-based cancer therapeutics, for example, by enabling the modeling of GNP-laden tumor cells using nanometer-resolution TEM images.
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Affiliation(s)
- Amrit Kaphle
- Department of Radiation Physics, The University of Texas MD Anderson Cancer Center, Houston, TX 77030, USA
| | - Sandun Jayarathna
- Department of Radiation Physics, The University of Texas MD Anderson Cancer Center, Houston, TX 77030, USA
| | - Hem Moktan
- Department of Radiation Physics, The University of Texas MD Anderson Cancer Center, Houston, TX 77030, USA
| | - Maureen Aliru
- Department of Radiation Physics, The University of Texas MD Anderson Cancer Center, Houston, TX 77030, USA
| | - Subhiksha Raghuram
- Department of Radiation Physics, The University of Texas MD Anderson Cancer Center, Houston, TX 77030, USA
| | - Sunil Krishnan
- Vivian L. Smith Department of Neurosurgery, The University of Texas Health Science Center, Houston, TX 77030, USA
| | - Sang Hyun Cho
- Department of Radiation Physics, The University of Texas MD Anderson Cancer Center, Houston, TX 77030, USA
- Department of Imaging Physics, The University of Texas MD Anderson Cancer Center, Houston, TX 77030, USA
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Hussain M, Rafique MA, Jung WG, Kim BJ, Jeon M. Segmentation and Morphology Computation of a Spiky Nanoparticle Using the Hourglass Neural Network. ACS OMEGA 2023; 8:17834-17840. [PMID: 37251121 PMCID: PMC10210197 DOI: 10.1021/acsomega.3c00783] [Citation(s) in RCA: 0] [Impact Index Per Article: 0] [Reference Citation Analysis] [Abstract] [Grants] [Track Full Text] [Download PDF] [Figures] [Subscribe] [Scholar Register] [Received: 02/06/2023] [Accepted: 04/28/2023] [Indexed: 05/31/2023]
Abstract
Morphological measurements of nanoparticles in electron microscopy images are tedious, laborious, and often succumb to human errors. Deep learning methods in artificial intelligence (AI) paved the way for automated image understanding. This work proposes a deep neural network (DNN) for the automated segmentation of a Au spiky nanoparticle (SNP) in electron microscopic images, and the network is trained with a spike-focused loss function. The segmented images are used for the growth measurement of the Au SNP. The auxiliary loss function captures the spikes of the nanoparticle, which prioritizes the detection of spikes in the border regions. The growth of the particles measured by the proposed DNN is as good as the measurement in manually segmented images of the particles. The proposed DNN composition with the training methodology meticulously segments the particle and consequently provides accurate morphological analysis. Furthermore, the proposed network is tested on an embedded system for integration with the microscope hardware for real-time morphological analysis.
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Affiliation(s)
- Muhammad
Ishfaq Hussain
- School
of Electrical Engineering and Computer Sciences, Gwangju Institute of Science and Technology, Gwangju 500-712, Republic of Korea
| | - Muhammad Aasim Rafique
- Department
of Information Systems, College of Computer Sciences and Information
Technology, King Faisal University, Al Ahsa 31982, Saudi Arabia
| | - Wan-Gil Jung
- Korea
Basic Science Institute, Gwangju Center, Gwangju 61186, Republic of Korea
| | - Bong-Joong Kim
- School
of Materials Science and Engineering, Gwangju
Institute of Science and Technology, Gwangju 500-712, Republic of Korea
| | - Moongu Jeon
- School
of Electrical Engineering and Computer Sciences, Gwangju Institute of Science and Technology, Gwangju 500-712, Republic of Korea
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Bals J, Epple M. Deep learning for automated size and shape analysis of nanoparticles in scanning electron microscopy. RSC Adv 2023; 13:2795-2802. [PMID: 36756420 PMCID: PMC9850277 DOI: 10.1039/d2ra07812k] [Citation(s) in RCA: 3] [Impact Index Per Article: 1.5] [Reference Citation Analysis] [Abstract] [Track Full Text] [Download PDF] [Figures] [Journal Information] [Subscribe] [Scholar Register] [Received: 12/07/2022] [Accepted: 01/10/2023] [Indexed: 01/20/2023] Open
Abstract
The automated analysis of nanoparticles, imaged by scanning electron microscopy, was implemented by a deep-learning (artificial intelligence) procedure based on convolutional neural networks (CNNs). It is possible to extract quantitative information on particle size distributions and particle shapes from pseudo-three-dimensional secondary electron micrographs (SE) as well as from two-dimensional scanning transmission electron micrographs (STEM). After separation of particles from the background (segmentation), the particles were cut out from the image to be classified by their shape (e.g. sphere or cube). The segmentation ability of STEM images was considerably enhanced by introducing distance- and intensity-based pixel weight loss maps. This forced the neural network to put emphasis on areas which separate adjacent particles. Partially covered particles were recognized by training and excluded from the analysis. The separation of overlapping particles, quality control procedures to exclude agglomerates, and the computation of quantitative particle size distribution data (equivalent particle diameter, Feret diameter, circularity) were included into the routine.
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Affiliation(s)
- Jonas Bals
- Inorganic Chemistry, Centre for Nanointegration Duisburg-Essen (CENIDE), University of Duisburg-Essen 45117 Essen Germany
| | - Matthias Epple
- Inorganic Chemistry, Centre for Nanointegration Duisburg-Essen (CENIDE), University of Duisburg-Essen 45117 Essen Germany
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8
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Full Metal Species Quantification of Metal Supported Catalysts Through Massive TEM Images Recognition. Chem Res Chin Univ 2022. [DOI: 10.1007/s40242-022-2218-3] [Citation(s) in RCA: 0] [Impact Index Per Article: 0] [Reference Citation Analysis] [Track Full Text] [Journal Information] [Subscribe] [Scholar Register] [Indexed: 11/03/2022]
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9
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Sun Z, Shi J, Wang J, Jiang M, Wang Z, Bai X, Wang X. A deep learning-based framework for automatic analysis of the nanoparticle morphology in SEM/TEM images. NANOSCALE 2022; 14:10761-10772. [PMID: 35790114 DOI: 10.1039/d2nr01029a] [Citation(s) in RCA: 2] [Impact Index Per Article: 0.7] [Reference Citation Analysis] [Abstract] [Track Full Text] [Subscribe] [Scholar Register] [Indexed: 06/15/2023]
Abstract
Scanning electron microscopy (SEM) and transmission electron microscopy (TEM) are important tools for characterizing nanomaterial morphology. Automatic analysis of the nanomaterial morphology in SEM/TEM images plays a crucial role in accelerating research on nanomaterials science. However, achieving a high-throughput automated online statistical analysis of the nanomaterial morphology in various complex SEM/TEM images is still a challenging task. In this paper, we propose a universal framework based on deep learning to perform a fast and accurate online statistical analysis of the nanoparticle morphology in complex SEM/TEM images. The proposed framework consists of three stages that are nanoparticle segmentation using a powerful light-weight deep learning network (NSNet), nanoparticle shape extraction, and statistical analysis. The experimental results show that NSNet in the proposed framework has achieved an accuracy of 86.2% and can process 11 SEM/TEM images per second on an embedded processor. Compared with other semantic segmentation models, NSNet is an optimal choice to ensure that the proposed framework still achieves accurate and fast segmentation even in SEM/TEM images with high background interference, extremely small nanoparticles and dense nanoparticles. Meanwhile, the equivalent diameter and Blaschke shape coefficient of the nanoparticle obtained by the proposed framework are 17.14 ± 5.9 and 0.18 ± 0.04, which are well consistent with those of manual statistical analysis. In short, the proposed framework has a promising future in driving the development of automatic and intelligent analysis technology for nanomaterial morphology.
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Affiliation(s)
- Zhijian Sun
- Shenyang Institute of Automation, Chinese Academy of Science, China.
- Institutes for Robotics and Intelligent Manufacturing, Chinese Academy of Sciences, China.
- University of Chinese Academy of Sciences, China
| | - Jia Shi
- Shenyang Institute of Automation, Chinese Academy of Science, China.
- Institutes for Robotics and Intelligent Manufacturing, Chinese Academy of Sciences, China.
| | - Jian Wang
- Shenyang Institute of Automation, Chinese Academy of Science, China.
- Institutes for Robotics and Intelligent Manufacturing, Chinese Academy of Sciences, China.
- University of Chinese Academy of Sciences, China
| | - Mingqi Jiang
- Shenyang Institute of Automation, Chinese Academy of Science, China.
- Institutes for Robotics and Intelligent Manufacturing, Chinese Academy of Sciences, China.
- University of Chinese Academy of Sciences, China
| | - Zhuo Wang
- Shenyang Institute of Automation, Chinese Academy of Science, China.
- Institutes for Robotics and Intelligent Manufacturing, Chinese Academy of Sciences, China.
| | - Xiaoping Bai
- Shenyang Institute of Automation, Chinese Academy of Science, China.
- Institutes for Robotics and Intelligent Manufacturing, Chinese Academy of Sciences, China.
| | - Xiaoxiong Wang
- Shenyang Institute of Automation, Chinese Academy of Science, China.
- Institutes for Robotics and Intelligent Manufacturing, Chinese Academy of Sciences, China.
- University of Chinese Academy of Sciences, China
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