1
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Song S, Kim KH, Keneipp R, Jung M, Trainor N, Chen C, Zheng J, Redwing JM, Kang J, Drndić M, Olsson Iii RH, Jariwala D. High Current and Carrier Densities in 2D MoS 2/AlScN Field-Effect Transistors via Ferroelectric Gating and Ohmic Contacts. ACS NANO 2025; 19:8985-8996. [PMID: 40009573 DOI: 10.1021/acsnano.4c17301] [Citation(s) in RCA: 0] [Impact Index Per Article: 0] [Reference Citation Analysis] [Abstract] [Key Words] [Track Full Text] [Subscribe] [Scholar Register] [Indexed: 02/28/2025]
Abstract
Ferroelectric field-effect transistors (FeFET) with two-dimensional (2D) semiconductor channels are promising low-power, embedded nonvolatile memory (NVM) candidates for next-generation in-memory computing. However, the performance of FeFETs can be limited by a charge imbalance between the ferroelectric layer and the channel and, for low-dimensional semiconductors, also by a high contact resistance between the metal electrodes and the channel. Here, we report a significant enhancement in performance of contact-engineered FeFETs with a 2D MoS2 channel and a ferroelectric Al0.68Sc0.32N (AlScN) gate dielectric. Replacing Ti with In contact electrodes results in a 5-fold increase in on-state current (∼120 μA/μm at 1 V) and on-to-off ratio (∼2 × 107) in the FeFETs. In addition, the high carrier concentration in the MoS2 channel during the on-state (>1014 cm-2) owing to the large remnant polarization of AlScN facilitates the observation of a metal-to-insulator electronic phase transition in monolayer MoS2 permitting observation of high field-effect mobility (>100 cm2 V-1 s-1) at cryogenic temperatures. Our work and devices broaden the potential of FeFETs and provide a platform to implement high-carrier-density transport in a 2D channel.
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Affiliation(s)
- Seunguk Song
- Department of Electrical and Systems Engineering, University of Pennsylvania, Philadelphia, Pennsylvania 19104, United States
- Department of Energy Science, Sungkyunkwan University (SKKU), Suwon 16419, Republic of Korea
- Center for 2D Quantum Heterostructures (2DQH), Institute for Basic Science (IBS), Sungkyunkwan University (SKKU), Suwon 16419, Republic of Korea
| | - Kwan-Ho Kim
- Department of Electrical and Systems Engineering, University of Pennsylvania, Philadelphia, Pennsylvania 19104, United States
| | - Rachael Keneipp
- Department of Physics and Astronomy, University of Pennsylvania, Philadelphia, Pennsylvania 19104, United States
| | - Myeongjin Jung
- Department of Electrical and Systems Engineering, University of Pennsylvania, Philadelphia, Pennsylvania 19104, United States
- School of Advanced Materials Science and Engineering, Sungkyunkwan University (SKKU), Suwon 16419, Republic of Korea
| | - Nicholas Trainor
- Department of Materials and Science and Engineering, Pennsylvania State University, University Park, Pennsylvania 16802, United States
| | - Chen Chen
- 2D Crystal Consortium Materials Innovation Platform, Materials Research Institute, Pennsylvania State University, University Park, Philadelphia, Pennsylvania 16801, United States
| | - Jeffrey Zheng
- Department of Materials Science and Engineering, University of Pennsylvania, Philadelphia, Pennsylvania 19104, United States
| | - Joan M Redwing
- School of Advanced Materials Science and Engineering, Sungkyunkwan University (SKKU), Suwon 16419, Republic of Korea
- Department of Materials and Science and Engineering, Pennsylvania State University, University Park, Pennsylvania 16802, United States
| | - Joohoon Kang
- School of Advanced Materials Science and Engineering, Sungkyunkwan University (SKKU), Suwon 16419, Republic of Korea
- Nanophotonics Research Center, Korea Institute of Science and Technology (KIST), Seoul 02792, Republic of Korea
- KIST-SKKU Carbon-Neutral Research Center, Sungkyunkwan University (SKKU), Suwon 16419, Republic of Korea
| | - Marija Drndić
- Department of Physics and Astronomy, University of Pennsylvania, Philadelphia, Pennsylvania 19104, United States
| | - Roy H Olsson Iii
- Department of Electrical and Systems Engineering, University of Pennsylvania, Philadelphia, Pennsylvania 19104, United States
| | - Deep Jariwala
- Department of Electrical and Systems Engineering, University of Pennsylvania, Philadelphia, Pennsylvania 19104, United States
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2
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Chen C, Zhou Y, Tong L, Pang Y, Xu J. Emerging 2D Ferroelectric Devices for In-Sensor and In-Memory Computing. ADVANCED MATERIALS (DEERFIELD BEACH, FLA.) 2025; 37:e2400332. [PMID: 38739927 PMCID: PMC11733831 DOI: 10.1002/adma.202400332] [Citation(s) in RCA: 0] [Impact Index Per Article: 0] [Reference Citation Analysis] [Abstract] [Key Words] [Grants] [Track Full Text] [Subscribe] [Scholar Register] [Received: 01/08/2024] [Revised: 04/19/2024] [Indexed: 05/16/2024]
Abstract
The quantity of sensor nodes within current computing systems is rapidly increasing in tandem with the sensing data. The presence of a bottleneck in data transmission between the sensors, computing, and memory units obstructs the system's efficiency and speed. To minimize the latency of data transmission between units, novel in-memory and in-sensor computing architectures are proposed as alternatives to the conventional von Neumann architecture, aiming for data-intensive sensing and computing applications. The integration of 2D materials and 2D ferroelectric materials has been expected to build these novel sensing and computing architectures due to the dangling-bond-free surface, ultra-fast polarization flipping, and ultra-low power consumption of the 2D ferroelectrics. Here, the recent progress of 2D ferroelectric devices for in-sensing and in-memory neuromorphic computing is reviewed. Experimental and theoretical progresses on 2D ferroelectric devices, including passive ferroelectrics-integrated 2D devices and active ferroelectrics-integrated 2D devices, are reviewed followed by the integration of perception, memory, and computing application. Notably, 2D ferroelectric devices have been used to simulate synaptic weights, neuronal model functions, and neural networks for image processing. As an emerging device configuration, 2D ferroelectric devices have the potential to expand into the sensor-memory and computing integration application field, leading to new possibilities for modern electronics.
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Affiliation(s)
- Chunsheng Chen
- Department of Electronic Engineering and Materials Science and Technology Research CenterThe Chinese University of Hong KongHong Kong SARChina
| | - Yaoqiang Zhou
- Department of Electronic Engineering and Materials Science and Technology Research CenterThe Chinese University of Hong KongHong Kong SARChina
| | - Lei Tong
- Department of Electronic Engineering and Materials Science and Technology Research CenterThe Chinese University of Hong KongHong Kong SARChina
| | - Yue Pang
- Department of Electronic Engineering and Materials Science and Technology Research CenterThe Chinese University of Hong KongHong Kong SARChina
| | - Jianbin Xu
- Department of Electronic Engineering and Materials Science and Technology Research CenterThe Chinese University of Hong KongHong Kong SARChina
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3
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Feng G, Liu Y, Zhu Q, Feng Z, Luo S, Qin C, Chen L, Xu Y, Wang H, Zubair M, Qu K, Yang C, Hao S, Yue F, Duan C, Chu J, Tian B. Giant tunnel electroresistance through a Van der Waals junction by external ferroelectric polarization. Nat Commun 2024; 15:9701. [PMID: 39516220 PMCID: PMC11549478 DOI: 10.1038/s41467-024-54114-3] [Citation(s) in RCA: 0] [Impact Index Per Article: 0] [Reference Citation Analysis] [Abstract] [Key Words] [Grants] [Track Full Text] [Download PDF] [Figures] [Journal Information] [Subscribe] [Scholar Register] [Received: 07/23/2024] [Accepted: 11/02/2024] [Indexed: 11/16/2024] Open
Abstract
The burgeoning interest in two-dimensional semiconductors stems from their potential as ultrathin platforms for next-generation transistors. Nonetheless, there persist formidable challenges in fully obtaining high-performance complementary logic components and the underlying mechanisms for the polarity modulation of transistors are not yet fully understood. Here, we exploit both ferroelectric domain-based nonvolatile modulation of Fermi level in transitional metal dichalcogenides (MoS2) and quantum tunneling through nanoscale hexagonal boron nitride (h-BN). Our prototype devices, termed as vertical tunneling ferroelectric field-effect transistor, utilizes a Van der Waals MoS2/h-BN/metal tunnel junction as the channel. The Fermi level of MoS2 is bipolarly tuned by ferroelectric domains and sensitively detected by the direct quantum tunneling strength across the junction, demonstrating an impressive electroresistance ratio of up to 109 in the vertical tunneling ferroelectric field-effect transistor. It consumes only 0.16 fJ of energy to open a ratio window exceeding 104. This work not only validates the effectiveness of tailored tunnel barriers in manipulating electronic flow but also highlights a new avenue for the design flexibility and functional versatility of advanced ferroelectric memory technology.
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Affiliation(s)
- Guangdi Feng
- Key Laboratory of Polar Materials and Devices, Ministry of Education, Department of Electronics, East China Normal University, Shanghai, 200241, China
- Shanghai Center of Brain-inspired Intelligent Materials and Devices, Shanghai, 200241, China
- Chongqing Key Laboratory of Precision Optics, Chongqing Institute of East China Normal University, Chongqing, 401120, China
| | - Yifei Liu
- Key Laboratory of Polar Materials and Devices, Ministry of Education, Department of Electronics, East China Normal University, Shanghai, 200241, China
- Shanghai Center of Brain-inspired Intelligent Materials and Devices, Shanghai, 200241, China
| | - Qiuxiang Zhu
- Key Laboratory of Polar Materials and Devices, Ministry of Education, Department of Electronics, East China Normal University, Shanghai, 200241, China.
- Shanghai Center of Brain-inspired Intelligent Materials and Devices, Shanghai, 200241, China.
| | - Zhenyu Feng
- Key Laboratory of Polar Materials and Devices, Ministry of Education, Department of Electronics, East China Normal University, Shanghai, 200241, China
- Shanghai Center of Brain-inspired Intelligent Materials and Devices, Shanghai, 200241, China
| | - Shengwen Luo
- Key Laboratory of Polar Materials and Devices, Ministry of Education, Department of Electronics, East China Normal University, Shanghai, 200241, China
- Shanghai Center of Brain-inspired Intelligent Materials and Devices, Shanghai, 200241, China
| | - Cuijie Qin
- Key Laboratory of Polar Materials and Devices, Ministry of Education, Department of Electronics, East China Normal University, Shanghai, 200241, China
- Shanghai Center of Brain-inspired Intelligent Materials and Devices, Shanghai, 200241, China
| | - Luqiu Chen
- Key Laboratory of Polar Materials and Devices, Ministry of Education, Department of Electronics, East China Normal University, Shanghai, 200241, China
- Shanghai Center of Brain-inspired Intelligent Materials and Devices, Shanghai, 200241, China
| | - Yu Xu
- Key Laboratory of Polar Materials and Devices, Ministry of Education, Department of Electronics, East China Normal University, Shanghai, 200241, China
- Shanghai Center of Brain-inspired Intelligent Materials and Devices, Shanghai, 200241, China
| | - Haonan Wang
- Key Laboratory of Polar Materials and Devices, Ministry of Education, Department of Electronics, East China Normal University, Shanghai, 200241, China
- Shanghai Center of Brain-inspired Intelligent Materials and Devices, Shanghai, 200241, China
| | - Muhammad Zubair
- Key Laboratory of Polar Materials and Devices, Ministry of Education, Department of Electronics, East China Normal University, Shanghai, 200241, China
- Shanghai Center of Brain-inspired Intelligent Materials and Devices, Shanghai, 200241, China
| | - Ke Qu
- Key Laboratory of Polar Materials and Devices, Ministry of Education, Department of Electronics, East China Normal University, Shanghai, 200241, China
- Shanghai Center of Brain-inspired Intelligent Materials and Devices, Shanghai, 200241, China
| | - Chang Yang
- Key Laboratory of Polar Materials and Devices, Ministry of Education, Department of Electronics, East China Normal University, Shanghai, 200241, China
- Shanghai Center of Brain-inspired Intelligent Materials and Devices, Shanghai, 200241, China
| | - Shenglan Hao
- Key Laboratory of Polar Materials and Devices, Ministry of Education, Department of Electronics, East China Normal University, Shanghai, 200241, China
- Shanghai Center of Brain-inspired Intelligent Materials and Devices, Shanghai, 200241, China
| | - Fangyu Yue
- Key Laboratory of Polar Materials and Devices, Ministry of Education, Department of Electronics, East China Normal University, Shanghai, 200241, China
- Shanghai Center of Brain-inspired Intelligent Materials and Devices, Shanghai, 200241, China
| | - Chungang Duan
- Key Laboratory of Polar Materials and Devices, Ministry of Education, Department of Electronics, East China Normal University, Shanghai, 200241, China
- Shanghai Center of Brain-inspired Intelligent Materials and Devices, Shanghai, 200241, China
- Collaborative Innovation Center of Extreme Optics, Shanxi University, Shanxi, 030006, China
| | - Junhao Chu
- Key Laboratory of Polar Materials and Devices, Ministry of Education, Department of Electronics, East China Normal University, Shanghai, 200241, China
- Shanghai Center of Brain-inspired Intelligent Materials and Devices, Shanghai, 200241, China
- Institute of Optoelectronics, Fudan University, Shanghai, 200433, China
| | - Bobo Tian
- Key Laboratory of Polar Materials and Devices, Ministry of Education, Department of Electronics, East China Normal University, Shanghai, 200241, China.
- Shanghai Center of Brain-inspired Intelligent Materials and Devices, Shanghai, 200241, China.
- Chongqing Key Laboratory of Precision Optics, Chongqing Institute of East China Normal University, Chongqing, 401120, China.
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4
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Chen RS, Lu Y. Negative Capacitance Field Effect Transistors based on Van der Waals 2D Materials. SMALL (WEINHEIM AN DER BERGSTRASSE, GERMANY) 2024; 20:e2304445. [PMID: 37899295 DOI: 10.1002/smll.202304445] [Citation(s) in RCA: 0] [Impact Index Per Article: 0] [Reference Citation Analysis] [Abstract] [Key Words] [Grants] [Track Full Text] [Subscribe] [Scholar Register] [Received: 05/27/2023] [Revised: 09/20/2023] [Indexed: 10/31/2023]
Abstract
Steep subthreshold swing (SS) is a decisive index for low energy consumption devices. However, the SS of conventional field effect transistors (FETs) has suffered from Boltzmann Tyranny, which limits the scaling of SS to sub-60 mV dec-1 at room temperature. Ferroelectric gate stack with negative capacitance (NC) is proved to reduce the SS effectively by the amplification of the gate voltage. With the application of 2D ferroelectric materials, the NC FETs can be further improved in performance and downscaled to a smaller dimension as well. This review introduces some related concepts for in-depth understanding of NC FETs, including the NC, internal gate voltage, SS, negative drain-induced barrier lowering, negative differential resistance, single-domain state, and multi-domain state. Meanwhile, this work summarizes the recent advances of the 2D NC FETs. Moreover, the electrical characteristics of some high-performance NC FETs are expressed as well. The factors which affect the performance of the 2D NC FETs are also presented in this paper. Finally, this work gives a brief summary and outlook for the 2D NC FETs.
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Affiliation(s)
- Ruo-Si Chen
- School of Engineering, College of Engineering, Computing & Cybernetics, Australian National University, Canberra, ACT, 2602, Australia
| | - Yuerui Lu
- School of Engineering, College of Engineering, Computing & Cybernetics, Australian National University, Canberra, ACT, 2602, Australia
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5
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Xia Y, Lin N, Zha J, Huang H, Zhang Y, Liu H, Tong J, Xu S, Yang P, Wang H, Zheng L, Zhang Z, Yang Z, Chen Y, Chan HP, Wang Z, Tan C. 2D Reconfigurable Memory Device Enabled by Defect Engineering for Multifunctional Neuromorphic Computing. ADVANCED MATERIALS (DEERFIELD BEACH, FLA.) 2024; 36:e2403785. [PMID: 39007279 DOI: 10.1002/adma.202403785] [Citation(s) in RCA: 0] [Impact Index Per Article: 0] [Reference Citation Analysis] [Abstract] [Key Words] [Grants] [Track Full Text] [Subscribe] [Scholar Register] [Received: 03/14/2024] [Revised: 06/26/2024] [Indexed: 07/16/2024]
Abstract
In this era of artificial intelligence and Internet of Things, emerging new computing paradigms such as in-sensor and in-memory computing call for both structurally simple and multifunctional memory devices. Although emerging two-dimensional (2D) memory devices provide promising solutions, the most reported devices either suffer from single functionalities or structural complexity. Here, this work reports a reconfigurable memory device (RMD) based on MoS2/CuInP2S6 heterostructure, which integrates the defect engineering-enabled interlayer defects and the ferroelectric polarization in CuInP2S6, to realize a simplified structure device for all-in-one sensing, memory and computing. The plasma treatment-induced defect engineering of the CuInP2S6 nanosheet effectively increases the interlayer defect density, which significantly enhances the charge-trapping ability in synergy with ferroelectric properties. The reported device not only can serve as a non-volatile electronic memory device, but also can be reconfigured into optoelectronic memory mode or synaptic mode after controlling the ferroelectric polarization states in CuInP2S6. When operated in optoelectronic memory mode, the all-in-one RMD could diagnose ophthalmic disease by segmenting vasculature within biological retinas. On the other hand, operating as an optoelectronic synapse, this work showcases in-sensor reservoir computing for gesture recognition with high energy efficiency.
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Affiliation(s)
- Yunpeng Xia
- Department of Electrical Engineering, City University of Hong Kong, Hong Kong SAR, 999077, China
| | - Ning Lin
- Department of Electrical and Electronic Engineering, University of Hong Kong, Hong Kong SAR, 999077, China
| | - Jiajia Zha
- Department of Electrical and Electronic Engineering, University of Hong Kong, Hong Kong SAR, 999077, China
| | - Haoxin Huang
- Department of Electrical Engineering, City University of Hong Kong, Hong Kong SAR, 999077, China
| | - Yiwen Zhang
- Department of Electrical Engineering, City University of Hong Kong, Hong Kong SAR, 999077, China
| | - Handa Liu
- Department of Electrical Engineering, City University of Hong Kong, Hong Kong SAR, 999077, China
| | - Jinyi Tong
- Department of Electrical Engineering, City University of Hong Kong, Hong Kong SAR, 999077, China
| | - Songcen Xu
- Department of Electrical and Computer Engineering, Hong Kong University of Science and Technology, Hong Kong SAR, 999077, China
| | - Peng Yang
- College of Integrated Circuits and Optoelectronic Chips, Shenzhen Technology University, Shenzhen, 518118, China
| | - Huide Wang
- College of Physics and Optoelectronic Engineering, Shenzhen University, Shenzhen, 518060, China
| | - Long Zheng
- Department of Chemistry, Chinese University of Hong Kong, Hong Kong SAR, 999077, China
| | - Zhuomin Zhang
- Department of Mechanical Engineering, City University of Hong Kong, Hong Kong SAR, 999077, China
- Department of Mechanical and Aerospace Engineering, Hong Kong University of Science and Technology, Hong Kong SAR, 999077, China
| | - Zhengbao Yang
- Department of Mechanical and Aerospace Engineering, Hong Kong University of Science and Technology, Hong Kong SAR, 999077, China
| | - Ye Chen
- Department of Chemistry, Chinese University of Hong Kong, Hong Kong SAR, 999077, China
| | - Hau Ping Chan
- Department of Electrical Engineering, City University of Hong Kong, Hong Kong SAR, 999077, China
| | - Zhongrui Wang
- Department of Electrical and Electronic Engineering, University of Hong Kong, Hong Kong SAR, 999077, China
| | - Chaoliang Tan
- Department of Electrical and Electronic Engineering, University of Hong Kong, Hong Kong SAR, 999077, China
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6
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Kim KH, Oh S, Fiagbenu MMA, Zheng J, Musavigharavi P, Kumar P, Trainor N, Aljarb A, Wan Y, Kim HM, Katti K, Song S, Kim G, Tang Z, Fu JH, Hakami M, Tung V, Redwing JM, Stach EA, Olsson RH, Jariwala D. Scalable CMOS back-end-of-line-compatible AlScN/two-dimensional channel ferroelectric field-effect transistors. NATURE NANOTECHNOLOGY 2023; 18:1044-1050. [PMID: 37217764 DOI: 10.1038/s41565-023-01399-y] [Citation(s) in RCA: 53] [Impact Index Per Article: 26.5] [Reference Citation Analysis] [Abstract] [Grants] [Track Full Text] [Subscribe] [Scholar Register] [Received: 10/11/2022] [Accepted: 04/13/2023] [Indexed: 05/24/2023]
Abstract
Three-dimensional monolithic integration of memory devices with logic transistors is a frontier challenge in computer hardware. This integration is essential for augmenting computational power concurrent with enhanced energy efficiency in big data applications such as artificial intelligence. Despite decades of efforts, there remains an urgent need for reliable, compact, fast, energy-efficient and scalable memory devices. Ferroelectric field-effect transistors (FE-FETs) are a promising candidate, but requisite scalability and performance in a back-end-of-line process have proven challenging. Here we present back-end-of-line-compatible FE-FETs using two-dimensional MoS2 channels and AlScN ferroelectric materials, all grown via wafer-scalable processes. A large array of FE-FETs with memory windows larger than 7.8 V, ON/OFF ratios greater than 107 and ON-current density greater than 250 μA um-1, all at ~80 nm channel length are demonstrated. The FE-FETs show stable retention up to 10 years by extension, and endurance greater than 104 cycles in addition to 4-bit pulse-programmable memory features, thereby opening a path towards the three-dimensional heterointegration of a two-dimensional semiconductor memory with silicon complementary metal-oxide-semiconductor logic.
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Affiliation(s)
- Kwan-Ho Kim
- Department of Electrical and Systems Engineering, University of Pennsylvania, Philadelphia, PA, USA
| | - Seyong Oh
- Division of Electrical Engineering, Hanyang University ERICA, Ansan, South Korea
| | | | - Jeffrey Zheng
- Department of Materials Science and Engineering, University of Pennsylvania, Philadelphia, PA, USA
| | - Pariasadat Musavigharavi
- Department of Electrical and Systems Engineering, University of Pennsylvania, Philadelphia, PA, USA
- Department of Materials Science and Engineering, University of Pennsylvania, Philadelphia, PA, USA
| | - Pawan Kumar
- Department of Electrical and Systems Engineering, University of Pennsylvania, Philadelphia, PA, USA
| | - Nicholas Trainor
- Department of Materials Science and Engineering, Pennsylvania State University, University Park, PA, USA
| | - Areej Aljarb
- Department of Physics, King Abdulaziz University, Jeddah, Saudi Arabia
| | - Yi Wan
- Department of Physical Science and Engineering, King Abdullah University of Science and Technology, Thuwal, Saudi Arabia
| | - Hyong Min Kim
- Department of Electrical and Systems Engineering, University of Pennsylvania, Philadelphia, PA, USA
| | - Keshava Katti
- Department of Electrical and Systems Engineering, University of Pennsylvania, Philadelphia, PA, USA
| | - Seunguk Song
- Department of Electrical and Systems Engineering, University of Pennsylvania, Philadelphia, PA, USA
| | - Gwangwoo Kim
- Department of Electrical and Systems Engineering, University of Pennsylvania, Philadelphia, PA, USA
| | - Zichen Tang
- Department of Electrical and Systems Engineering, University of Pennsylvania, Philadelphia, PA, USA
| | - Jui-Han Fu
- Department of Chemical System Engineering, University of Tokyo, Tokyo, Japan
| | - Mariam Hakami
- Department of Chemical System Engineering, University of Tokyo, Tokyo, Japan
| | - Vincent Tung
- Department of Physical Science and Engineering, King Abdullah University of Science and Technology, Thuwal, Saudi Arabia
- Department of Chemical System Engineering, University of Tokyo, Tokyo, Japan
| | - Joan M Redwing
- Department of Materials Science and Engineering, Pennsylvania State University, University Park, PA, USA
| | - Eric A Stach
- Department of Materials Science and Engineering, University of Pennsylvania, Philadelphia, PA, USA
| | - Roy H Olsson
- Department of Electrical and Systems Engineering, University of Pennsylvania, Philadelphia, PA, USA.
| | - Deep Jariwala
- Department of Electrical and Systems Engineering, University of Pennsylvania, Philadelphia, PA, USA.
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7
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Singh D, Joshi B, Poddar P. Ferroelectric Polarization and Iron Substitution Synergistically Boost Electrocatalytic Oxygen Evolution Reaction in Bismuth Oxychloride Nanosheets. LANGMUIR : THE ACS JOURNAL OF SURFACES AND COLLOIDS 2023; 39:11414-11425. [PMID: 37527487 DOI: 10.1021/acs.langmuir.3c01272] [Citation(s) in RCA: 0] [Impact Index Per Article: 0] [Reference Citation Analysis] [Abstract] [Track Full Text] [Subscribe] [Scholar Register] [Indexed: 08/03/2023]
Abstract
Ferroelectric materials have gained significant interest in various kinds of water splitting, but the study of ferroelectric materials for electrocatalytic water splitting is in its infancy. Ferroelectric materials have spontaneous polarization below their Curie temperature due to dipolar alignment, which results in surface charges. In 2D ferroelectric materials, spontaneous polarization depends on thickness. Herein, we report that thickness-dependent ferroelectric polarization in 2D nanosheets can also accelerate the oxygen evolution reaction (OER) along with the tailored active surface area of exposed crystalline facets, which improves the electrocatalytic activity relatively. Iron-substituted BiOCl nanosheets of varying thickness are fabricated by varying the pH using a facile coprecipitation method. The substituted iron enhances polarization and electrochemical active sites on the surface. The findings in this study show that the exposed (001) facet and higher thickness of the nanosheets have high ferroelectric polarization and, in turn, superior electrocatalytic activity and remarkable stability, requiring low overpotentials (348 mV and 270 mV at 100 mA/cm2 and 10 mA/cm2) in alkaline (1.0 M KOH) electrolyte. As the thickness of the nanosheets is decreased from 140 to 34 nm, the electrocatalytic performance of iron-substituted BiOCl nanosheets starts to reduce due to the lower Coulomb-Coulomb interaction and the increasing depolarization.
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Affiliation(s)
| | - Bhavana Joshi
- Physical & Materials Chemistry Division, CSIR-National Chemical Laboratory, Pune 411008, India
| | - Pankaj Poddar
- Physical & Materials Chemistry Division, CSIR-National Chemical Laboratory, Pune 411008, India
- Academy of Scientific and Innovative Research (AcSIR), Sector 19, Kamla Nehru Nagar, Ghaziabad 201002, Uttar Pradesh, India
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8
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Yan Q, Cheng J, Wang W, Sun M, Yin Y, Peng Y, Zhou W, Tang D. Ferroelectric-gated MoSe 2photodetectors with high photoresponsivity. JOURNAL OF PHYSICS. CONDENSED MATTER : AN INSTITUTE OF PHYSICS JOURNAL 2022; 34:475703. [PMID: 36150377 DOI: 10.1088/1361-648x/ac94af] [Citation(s) in RCA: 0] [Impact Index Per Article: 0] [Reference Citation Analysis] [Abstract] [Key Words] [Track Full Text] [Subscribe] [Scholar Register] [Received: 07/22/2022] [Accepted: 09/23/2022] [Indexed: 06/16/2023]
Abstract
Ferroelectric transistors with semiconductors as the channel material and ferroelectrics as the gate insulator have potential applications in nanoelectronics. We report in-situ modulation of optoelectronic properties of MoSe2thin flakes on ferroelectric 0.7PbMg1/3Nb2/3O3-0.3PbTiO3(PMN-PT). Under the excitation of 638 nm laser, the photoresponsivity can be greatly boosted to 59.8 A W-1and the detectivity to 3.2 × 1010Jones, with the improvement rates of about 1500% and 450%, respectively. These results suggest hybrid structure photodetector of two-dimensional layered material and ferroelectric has great application prospects in photoelectric detector.
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Affiliation(s)
- Qijie Yan
- Synergetic Innovation Center for Quantum Effects and Application, Key Laboratory of Low-Dimensional Quantum Structures and Quantum Control of Ministry of Education, College of Physics and Electronics Science, Hunan Normal University, Changsha, Hunan 410081, People's Republic of China
| | - Jiaxin Cheng
- Synergetic Innovation Center for Quantum Effects and Application, Key Laboratory of Low-Dimensional Quantum Structures and Quantum Control of Ministry of Education, College of Physics and Electronics Science, Hunan Normal University, Changsha, Hunan 410081, People's Republic of China
| | - Weike Wang
- Synergetic Innovation Center for Quantum Effects and Application, Key Laboratory of Low-Dimensional Quantum Structures and Quantum Control of Ministry of Education, College of Physics and Electronics Science, Hunan Normal University, Changsha, Hunan 410081, People's Republic of China
- Nanchang Institute of Technology, Nanchang, Jiangxi 330044, People's Republic of China
| | - Mengjiao Sun
- Synergetic Innovation Center for Quantum Effects and Application, Key Laboratory of Low-Dimensional Quantum Structures and Quantum Control of Ministry of Education, College of Physics and Electronics Science, Hunan Normal University, Changsha, Hunan 410081, People's Republic of China
| | - Yanling Yin
- Synergetic Innovation Center for Quantum Effects and Application, Key Laboratory of Low-Dimensional Quantum Structures and Quantum Control of Ministry of Education, College of Physics and Electronics Science, Hunan Normal University, Changsha, Hunan 410081, People's Republic of China
| | - Yuehua Peng
- Synergetic Innovation Center for Quantum Effects and Application, Key Laboratory of Low-Dimensional Quantum Structures and Quantum Control of Ministry of Education, College of Physics and Electronics Science, Hunan Normal University, Changsha, Hunan 410081, People's Republic of China
| | - Weichang Zhou
- Synergetic Innovation Center for Quantum Effects and Application, Key Laboratory of Low-Dimensional Quantum Structures and Quantum Control of Ministry of Education, College of Physics and Electronics Science, Hunan Normal University, Changsha, Hunan 410081, People's Republic of China
| | - Dongsheng Tang
- Synergetic Innovation Center for Quantum Effects and Application, Key Laboratory of Low-Dimensional Quantum Structures and Quantum Control of Ministry of Education, College of Physics and Electronics Science, Hunan Normal University, Changsha, Hunan 410081, People's Republic of China
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9
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Wang P, Jin C, Zheng D, Yang T, Wang Y, Zheng R, Bai H. Engineering Co Vacancies for Tuning Electrical Properties of p-Type Semiconducting Co 3O 4 Films. ACS APPLIED MATERIALS & INTERFACES 2021; 13:26621-26629. [PMID: 34038070 DOI: 10.1021/acsami.1c05748] [Citation(s) in RCA: 3] [Impact Index Per Article: 0.8] [Reference Citation Analysis] [Abstract] [Key Words] [Track Full Text] [Subscribe] [Scholar Register] [Indexed: 06/12/2023]
Abstract
Spinel oxide Co3O4 has attracted more and more attention for energy- and environment-related applications. In order to tune the electrical properties of Co3O4, p-type semiconducting Co3O4 films were fabricated on the Pb(Mg1/3Nb2/3)0.7Ti0.3O3 (PMN-PT), MgAl2O4 (MAO), and SrTiO3 substrates by reactive magnetron sputtering. The Co3O4 film on the MAO substrate exhibits perfect epitaxial growth. However, the Co3O4 film on the PMN-PT substrate presents dislocation defects between the [011] and [112] orientations. The special ferroelectric domain shape surface and phase transition of the PMN-PT substrate induce the higher concentration of Co vacancies in the Co3O4 film, which further reduce the resistivity by several orders of magnitude. The calculated results indicate that introducing Co vacancies can enhance the electrical properties of Co3O4 by building impurity levels near the Fermi level, which is beneficial to form free-moving holes in the valence band. The free-moving holes can also be accumulated/dissipated by the ferroelectric field effect of PMN-PT substrates, leading to upward/downward bending of conduction, valence bands, and low/high-resistance states. This work helps us to tune and improve the electrical properties of Co3O4.
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Affiliation(s)
- Ping Wang
- Tianjin Key Laboratory of Low Dimensional Materials Physics and Processing Technology, School of Science, Tianjin University, Tianjin 300350, P. R. China
| | - Chao Jin
- Tianjin Key Laboratory of Low Dimensional Materials Physics and Processing Technology, School of Science, Tianjin University, Tianjin 300350, P. R. China
| | - Dongxing Zheng
- Tianjin Key Laboratory of Low Dimensional Materials Physics and Processing Technology, School of Science, Tianjin University, Tianjin 300350, P. R. China
| | - Tiebin Yang
- School of Physics, Australian Centre for Microscopy and Microanalysis, The University of Sydney, Camperdown, New South Wales 2006, Australia
| | - Yuchen Wang
- Tianjin Key Laboratory of Low Dimensional Materials Physics and Processing Technology, School of Science, Tianjin University, Tianjin 300350, P. R. China
| | - Rongkun Zheng
- School of Physics, Australian Centre for Microscopy and Microanalysis, The University of Sydney, Camperdown, New South Wales 2006, Australia
| | - Haili Bai
- Tianjin Key Laboratory of Low Dimensional Materials Physics and Processing Technology, School of Science, Tianjin University, Tianjin 300350, P. R. China
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