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For: Conde-Rubio A, Liu X, Boero G, Brugger J. Edge-Contact MoS2 Transistors Fabricated Using Thermal Scanning Probe Lithography. ACS Appl Mater Interfaces 2022;14:42328-42336. [PMID: 36070441 PMCID: PMC9501915 DOI: 10.1021/acsami.2c10150] [Citation(s) in RCA: 3] [Impact Index Per Article: 1.5] [Reference Citation Analysis] [What about the content of this article? (0)] [Track Full Text] [Download PDF] [Figures] [Subscribe] [Scholar Register] [Received: 06/07/2022] [Accepted: 08/16/2022] [Indexed: 06/15/2023]
Number Cited by Other Article(s)
1
Erbas B, Conde-Rubio A, Liu X, Pernollet J, Wang Z, Bertsch A, Penedo M, Fantner G, Banerjee M, Kis A, Boero G, Brugger J. Combining thermal scanning probe lithography and dry etching for grayscale nanopattern amplification. MICROSYSTEMS & NANOENGINEERING 2024;10:28. [PMID: 38405129 PMCID: PMC10891065 DOI: 10.1038/s41378-024-00655-y] [Citation(s) in RCA: 0] [Impact Index Per Article: 0] [Reference Citation Analysis] [Abstract] [Key Words] [Track Full Text] [Figures] [Subscribe] [Scholar Register] [Received: 08/25/2023] [Revised: 01/03/2024] [Accepted: 01/07/2024] [Indexed: 02/27/2024]
2
Zhou H, Zhang C, Gao A, Shi E, Guo Y. Patterned growth of two-dimensional atomic layer semiconductors. Chem Commun (Camb) 2024;60:943-955. [PMID: 38168791 DOI: 10.1039/d3cc04866g] [Citation(s) in RCA: 0] [Impact Index Per Article: 0] [Reference Citation Analysis] [Abstract] [Track Full Text] [Journal Information] [Subscribe] [Scholar Register] [Indexed: 01/05/2024]
3
Ramò L, Giordano MC, Ferrando G, Canepa P, Telesio F, Repetto L, Buatier de Mongeot F, Canepa M, Bisio F. Thermal Scanning-Probe Lithography for Broad-Band On-Demand Plasmonic Nanostructures on Transparent Substrates. ACS APPLIED NANO MATERIALS 2023;6:18623-18631. [PMID: 37854851 PMCID: PMC10580238 DOI: 10.1021/acsanm.3c04398] [Citation(s) in RCA: 0] [Impact Index Per Article: 0] [Reference Citation Analysis] [Abstract] [Key Words] [Grants] [Track Full Text] [Figures] [Subscribe] [Scholar Register] [Received: 09/14/2023] [Accepted: 09/21/2023] [Indexed: 10/20/2023]
4
Batool S, Idrees M, Han ST, Roy VAL, Zhou Y. Electrical Contacts With 2D Materials: Current Developments and Future Prospects. SMALL (WEINHEIM AN DER BERGSTRASSE, GERMANY) 2023;19:e2206550. [PMID: 36587964 DOI: 10.1002/smll.202206550] [Citation(s) in RCA: 0] [Impact Index Per Article: 0] [Reference Citation Analysis] [Abstract] [Key Words] [Track Full Text] [Subscribe] [Scholar Register] [Received: 10/24/2022] [Revised: 12/07/2022] [Indexed: 06/17/2023]
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