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Sharstniou A, Niauzorau S, Hardison AL, Puckett M, Krueger N, Ryckman JD, Azeredo B. Roughness Suppression in Electrochemical Nanoimprinting of Si for Applications in Silicon Photonics. ADVANCED MATERIALS (DEERFIELD BEACH, FLA.) 2022; 34:e2206608. [PMID: 36075876 DOI: 10.1002/adma.202206608] [Citation(s) in RCA: 0] [Impact Index Per Article: 0] [Reference Citation Analysis] [Abstract] [Key Words] [Track Full Text] [Subscribe] [Scholar Register] [Received: 07/20/2022] [Revised: 08/29/2022] [Indexed: 06/15/2023]
Abstract
Metal-assisted electrochemical nanoimprinting (Mac-Imprint) scales the fabrication of micro- and nanoscale 3D freeform geometries in silicon and holds the promise to enable novel chip-scale optics operating at the near-infrared spectrum. However, Mac-Imprint of silicon concomitantly generates mesoscale roughness (e.g., protrusion size ≈45 nm) creating prohibitive levels of light scattering. This arises from the requirement to coat stamps with nanoporous gold catalyst that, while sustaining etchant diffusion, imprints its pores (e.g., average diameter ≈42 nm) onto silicon. In this work, roughness is reduced to sub-10 nm levels, which is in par with plasma etching, by decreasing pore size of the catalyst via dealloying in far-from equilibrium conditions. At this level, single-digit nanometric details such as grain-boundary grooves of the catalyst are imprinted and attributed to the resolution limit of Mac-Imprint, which is argued to be twice the Debye length (i.e., 1.7 nm)-a finding that broadly applies to metal-assisted chemical etching. Last, Mac-Imprint is employed to produce single-mode rib-waveguides on pre-patterned silicon-on-insulator wafers with root-mean-square line-edge roughness less than 10 nm while providing depth uniformity (i.e., 42.9 ± 5.5 nm), and limited levels of silicon defect formation (e.g., Raman peak shift < 0.1 cm-1 ) and sidewall scattering.
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Affiliation(s)
- Aliaksandr Sharstniou
- Arizona State University, School of Manufacturing Systems and Networks, 6075 S. Innovation Way West, Mesa, AZ, 85212, USA
| | - Stanislau Niauzorau
- Arizona State University, School of Manufacturing Systems and Networks, 6075 S. Innovation Way West, Mesa, AZ, 85212, USA
| | - Anna L Hardison
- Clemson University, Holcombe Department of Electrical and Computer Engineering, 91 Technology Drive, Anderson, SC, 29625, USA
| | - Matthew Puckett
- Honeywell International, Aerospace Advanced Technology Advanced Sensors & Microsystems, 21111 N. 19th Avenue, Phoenix, AZ, 85027, USA
| | - Neil Krueger
- Honeywell International, Aerospace Advanced Technology Advanced Sensors & Microsystems, 12001 State Highway 55, Plymouth, MN, 55441, USA
| | - Judson D Ryckman
- Clemson University, Holcombe Department of Electrical and Computer Engineering, 91 Technology Drive, Anderson, SC, 29625, USA
| | - Bruno Azeredo
- Arizona State University, School of Manufacturing Systems and Networks, 6075 S. Innovation Way West, Mesa, AZ, 85212, USA
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2
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Srivastava RP, Khang DY. Structuring of Si into Multiple Scales by Metal-Assisted Chemical Etching. ADVANCED MATERIALS (DEERFIELD BEACH, FLA.) 2021; 33:e2005932. [PMID: 34013605 DOI: 10.1002/adma.202005932] [Citation(s) in RCA: 12] [Impact Index Per Article: 4.0] [Reference Citation Analysis] [Abstract] [Key Words] [Track Full Text] [Subscribe] [Scholar Register] [Received: 08/31/2020] [Revised: 11/18/2020] [Indexed: 05/27/2023]
Abstract
Structuring Si, ranging from nanoscale to macroscale feature dimensions, is essential for many applications. Metal-assisted chemical etching (MaCE) has been developed as a simple, low-cost, and scalable method to produce structures across widely different dimensions. The process involves various parameters, such as catalyst, substrate doping type and level, crystallography, etchant formulation, and etch additives. Careful optimization of these parameters is the key to the successful fabrication of Si structures. In this review, recent additions to the MaCE process are presented after a brief introduction to the fundamental principles involved in MaCE. In particular, the bulk-scale structuring of Si by MaCE is summarized and critically discussed with application examples. Various approaches for effective mass transport schemes are introduced and discussed. Further, the fine control of etch directionality and uniformity, and the suppression of unwanted side etching are also discussed. Known application examples of Si macrostructures fabricated by MaCE, though limited thus far, are presented. There are significant opportunities for the application of macroscale Si structures in different fields, such as microfluidics, micro-total analysis systems, and microelectromechanical systems, etc. Thus more research is necessary on macroscale MaCE of Si and their applications.
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Affiliation(s)
- Ravi P Srivastava
- Soft Electronic Materials and Devices Laboratory, Department of Materials Science and Engineering, Yonsei University, Seoul, 03722, Korea
| | - Dahl-Young Khang
- Soft Electronic Materials and Devices Laboratory, Department of Materials Science and Engineering, Yonsei University, Seoul, 03722, Korea
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3
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Kolasinski KW. Metal-Assisted Catalytic Etching (MACE) for Nanofabrication of Semiconductor Powders. MICROMACHINES 2021; 12:776. [PMID: 34209231 PMCID: PMC8304928 DOI: 10.3390/mi12070776] [Citation(s) in RCA: 1] [Impact Index Per Article: 0.3] [Reference Citation Analysis] [Abstract] [Key Words] [Grants] [Track Full Text] [Download PDF] [Figures] [Subscribe] [Scholar Register] [Received: 06/12/2021] [Revised: 06/28/2021] [Accepted: 06/29/2021] [Indexed: 12/31/2022]
Abstract
Electroless etching of semiconductors has been elevated to an advanced micromachining process by the addition of a structured metal catalyst. Patterning of the catalyst by lithographic techniques facilitated the patterning of crystalline and polycrystalline wafer substrates. Galvanic deposition of metals on semiconductors has a natural tendency to produce nanoparticles rather than flat uniform films. This characteristic makes possible the etching of wafers and particles with arbitrary shape and size. While it has been widely recognized that spontaneous deposition of metal nanoparticles can be used in connection with etching to porosify wafers, it is also possible to produced nanostructured powders. Metal-assisted catalytic etching (MACE) can be controlled to produce (1) etch track pores with shapes and sizes closely related to the shape and size of the metal nanoparticle, (2) hierarchically porosified substrates exhibiting combinations of large etch track pores and mesopores, and (3) nanowires with either solid or mesoporous cores. This review discussed the mechanisms of porosification, processing advances, and the properties of the etch product with special emphasis on the etching of silicon powders.
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Affiliation(s)
- Kurt W Kolasinski
- Department of Chemistry, West Chester University, West Chester, PA 19383, USA
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4
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Schönekerl S, Acker J. The Role of the Molecular Hydrogen Formation in the Process of Metal-Ion Reduction on Multicrystalline Silicon in a Hydrofluoric Acid Matrix. NANOMATERIALS (BASEL, SWITZERLAND) 2021; 11:982. [PMID: 33920331 PMCID: PMC8069279 DOI: 10.3390/nano11040982] [Citation(s) in RCA: 2] [Impact Index Per Article: 0.7] [Reference Citation Analysis] [Abstract] [Key Words] [Grants] [Track Full Text] [Download PDF] [Figures] [Subscribe] [Scholar Register] [Received: 03/10/2021] [Revised: 04/08/2021] [Accepted: 04/09/2021] [Indexed: 01/20/2023]
Abstract
Metal deposition on silicon in hydrofluoric acid (HF) solutions is a well-established process for the surface patterning of silicon. The reactions behind this process, especially the formation or the absence of molecular hydrogen (H2), are controversially discussed in the literature. In this study, several batch experiments with Ag+, Cu2+, AuCl4- and PtCl62- in HF matrix and multicrystalline silicon were performed. The stoichiometric amounts of the metal depositions, the silicon dissolution and the molecular hydrogen formation were determined analytically. Based on these data and theoretical considerations of the valence transfer, four reasons for the formation of H2 could be identified. First, H2 is generated in a consecutive reaction after a monovalent hole transfer (h+) to a Si-Si bond. Second, H2 is produced due to a monovalent hole transfer to the Si-H bonds. Third, H2 occurs if Si-Si back bonds of the hydrogen-terminated silicon are attacked by Cu2+ reduction resulting in the intermediate species HSiF3, which is further degraded to H2 and SiF62-. The fourth H2-forming reaction reduces oxonium ions (H3O+) on the silver/, copper/ and gold/silicon contacts via monovalent hole transfer to silicon. In the case of (cumulative) even-numbered valence transfers to silicon, no H2 is produced. The formation of H2 also fails to appear if the equilibrium potential of the 2H3O+/H2 half-cell does not reach the energetic level of the valence bands of the bulk or hydrogen-terminated silicon. Non-hydrogen-forming reactions in silver, copper and gold deposition always occur with at least one H2-forming process. The PtCl62- reduction to Pt proceeds exclusively via even-numbered valence transfers to silicon. This also applies to the reaction of H3O+ at the platinum/silicon contact. Consequently, no H2 is formed during platinum deposition.
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Affiliation(s)
- Stefan Schönekerl
- Department of Physical Chemistry, Faculty of Environment and Natural Sciences, Brandenburg University of Technology Cottbus-Senftenberg, Universitätsplatz 1, 01968 Senftenberg, Germany;
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MATSUMOTO A, IWAMOTO K, SHIMADA Y, FURUKAWA K, MAJIMA S, YAE S. Formation and Dissolution of Mesoporous Layer during Metal-Particle-Assisted Etching of n-Type Silicon. ELECTROCHEMISTRY 2021. [DOI: 10.5796/electrochemistry.20-65159] [Citation(s) in RCA: 2] [Impact Index Per Article: 0.7] [Reference Citation Analysis] [Track Full Text] [Journal Information] [Subscribe] [Scholar Register] [Indexed: 11/20/2022] Open
Affiliation(s)
- Ayumu MATSUMOTO
- Department of Chemical Engineering and Materials Science, Graduate School of Engineering, University of Hyogo
| | - Keishi IWAMOTO
- Department of Chemical Engineering and Materials Science, Graduate School of Engineering, University of Hyogo
| | - Yuki SHIMADA
- Department of Chemical Engineering and Materials Science, Graduate School of Engineering, University of Hyogo
| | - Kyohei FURUKAWA
- Department of Chemical Engineering and Materials Science, Graduate School of Engineering, University of Hyogo
| | - Shun MAJIMA
- Department of Chemical Engineering and Materials Science, Graduate School of Engineering, University of Hyogo
| | - Shinji YAE
- Department of Chemical Engineering and Materials Science, Graduate School of Engineering, University of Hyogo
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Chen K, Isometsä J, Pasanen TP, Vähänissi V, Savin H. Efficient photon capture on germanium surfaces using industrially feasible nanostructure formation. NANOTECHNOLOGY 2021; 32:035301. [PMID: 33022667 DOI: 10.1088/1361-6528/abbeac] [Citation(s) in RCA: 0] [Impact Index Per Article: 0] [Reference Citation Analysis] [Abstract] [Track Full Text] [Subscribe] [Scholar Register] [Indexed: 06/11/2023]
Abstract
Nanostructured surfaces are known to provide excellent optical properties for various photonics devices. Fabrication of such nanoscale structures to germanium (Ge) surfaces by metal assisted chemical etching (MACE) is, however, challenging as Ge surface is highly reactive resulting often in micron-level rather than nanoscale structures. Here we show that by properly controlling the process, it is possible to confine the chemical reaction only to the vicinity of the metal nanoparticles and obtain nanostructures also in Ge. Furthermore, it is shown that controlling the density of the nanoparticles, concentration of oxidizing and dissolving agents as well as the etching time plays a crucial role in successful nanostructure formation. We also discuss the impact of high mobility of charge carriers on the chemical reactions taking place on Ge surfaces. As a result we propose a simple one-step MACE process that results in nanoscale structures with less than 10% surface reflectance in the wavelength region between 400 and 1600 nm. The method consumes only a small amount of Ge and is thus industrially viable and also applicable to thin Ge layers.
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Affiliation(s)
- Kexun Chen
- Department of Electronics and Nanoengineering, Aalto University, Tietotie 3, FI-02150 Espoo, Finland
| | - Joonas Isometsä
- Department of Electronics and Nanoengineering, Aalto University, Tietotie 3, FI-02150 Espoo, Finland
| | - Toni P Pasanen
- Department of Electronics and Nanoengineering, Aalto University, Tietotie 3, FI-02150 Espoo, Finland
| | - Ville Vähänissi
- Department of Electronics and Nanoengineering, Aalto University, Tietotie 3, FI-02150 Espoo, Finland
| | - Hele Savin
- Department of Electronics and Nanoengineering, Aalto University, Tietotie 3, FI-02150 Espoo, Finland
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7
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Tamarov K, Kiviluoto R, Swanson JD, Unger BA, Ernst AT, Aindow M, Riikonen J, Lehto VP, Kolasinski KW. Low-Load Metal-Assisted Catalytic Etching Produces Scalable Porosity in Si Powders. ACS APPLIED MATERIALS & INTERFACES 2020; 12:48969-48981. [PMID: 33052667 DOI: 10.1021/acsami.0c13980] [Citation(s) in RCA: 3] [Impact Index Per Article: 0.8] [Reference Citation Analysis] [Abstract] [Key Words] [Track Full Text] [Subscribe] [Scholar Register] [Indexed: 06/11/2023]
Abstract
The recently discovered low-load metal-assisted catalytic etching (LL-MACE) creates nanostructured Si with controllable and variable characteristics that distinguish this technique from the conventional high-load variant. LL-MACE employs 150 times less metal catalyst and produces porous Si instead of Si nanowires. In this work, we demonstrate that some of the features of LL-MACE cannot be explained by the present understanding of MACE. With mechanistic insight derived from extensive experimentation, it is demonstrated that (1) the method allows the use of not only Ag, Pd, Pt, and Au as metal catalysts but also Cu and (2) judicious combinations of process parameters such as the type of metal, Si doping levels, and etching temperatures facilitate control over yield (0.065-88%), pore size (3-100 nm), specific surface area (20-310 m2·g-1), and specific pore volume (0.05-1.05 cm3·g-1). The porous structure of the product depends on the space-charge layer, which is controlled by the Si doping and the chemical identity of the deposited metal. The porous structure was also dependent on the dynamic structure of the deposited metal. A distinctive comet-like structure of metal nanoparticles was observed after etching with Cu, Ag, Pd, and, in some cases, Pt; this structure consisted of 10-50 nm main particles surrounded by smaller (<5 nm) nanoparticles. With good scalability and precise control of structural properties, LL-MACE facilitates Si applications in photovoltaics, energy storage, biomedicine, and water purification.
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Affiliation(s)
- Konstantin Tamarov
- Department of Applied Physics, University of Eastern Finland, 70210 Kuopio, Finland
| | - Riku Kiviluoto
- Department of Applied Physics, University of Eastern Finland, 70210 Kuopio, Finland
| | - Joseph D Swanson
- Department of Chemistry, West Chester University, West Chester, Pennsylvania 19383-2115, United States
| | - Bret A Unger
- Department of Chemistry, West Chester University, West Chester, Pennsylvania 19383-2115, United States
| | - Alexis T Ernst
- Department of Materials Science and Engineering, Institute of Materials Science, University of Connecticut, Storrs, Connecticut 06269-3136, United States
| | - Mark Aindow
- Department of Materials Science and Engineering, Institute of Materials Science, University of Connecticut, Storrs, Connecticut 06269-3136, United States
| | - Joakim Riikonen
- Department of Applied Physics, University of Eastern Finland, 70210 Kuopio, Finland
| | - Vesa-Pekka Lehto
- Department of Applied Physics, University of Eastern Finland, 70210 Kuopio, Finland
| | - Kurt W Kolasinski
- Department of Chemistry, West Chester University, West Chester, Pennsylvania 19383-2115, United States
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8
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Pinna E, Le Gall S, Torralba E, Mula G, Cachet-Vivier C, Bastide S. Mesopore Formation and Silicon Surface Nanostructuration by Metal-Assisted Chemical Etching With Silver Nanoparticles. Front Chem 2020; 8:658. [PMID: 32850670 PMCID: PMC7416550 DOI: 10.3389/fchem.2020.00658] [Citation(s) in RCA: 9] [Impact Index Per Article: 2.3] [Reference Citation Analysis] [Abstract] [Key Words] [Track Full Text] [Download PDF] [Figures] [Journal Information] [Subscribe] [Scholar Register] [Received: 03/04/2020] [Accepted: 06/23/2020] [Indexed: 11/13/2022] Open
Abstract
This article presents a study on Metal-Assisted Chemical Etching (MACE) of silicon in HF-H2O2 using silver nanoparticles as catalysts. Our aim is a better understanding of the process to elaborate new 3D submicrometric surface structures useful for light management. We investigated MACE over the whole range of silicon doping, i.e., p++, p+, p, p-, n, n+, and n++. We discovered that, instead of the well-defined and straight mesopores obtained in p and n-type silicon, in p++ and n++ silicon MACE leads to the formation of cone-shaped macropores filled with porous silicon. We account for the transition between these two pore-formation regimes (straight and cone-shaped pores) by modeling (at equilibrium and under polarization) the Ag/Si/electrolyte (HF) system. The model simulates the system as two nanodiodes in series. We show that delocalized MACE is explained by a large tunnel current contribution for the p-Si/Ag and n-Si/HF diodes under reverse polarization, which increases with the doping level and when the size of the nanocontacts (Ag, HF) decreases. By analogy with the results obtained on heavily doped silicon, we finally present a method to form size-controlled cone-shaped macropores in p silicon with silver nanoparticles. This shape, instead of the usual straight mesopores, is obtained by applying an external anodic polarization during MACE. Two methods are shown to be effective for the control of the macropore cone angle: one by adjusting the potential applied during MACE, the other by changing the H2O2 concentration. Under appropriate etching conditions, the obtained macropores exhibit optical properties (reflectivity ~3 %) similar to that of black silicon.
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Affiliation(s)
- Elisa Pinna
- PoroSiLab, Dipartimento di Fisica, Università degli Studi di Cagliari, Monserrato, Italy
| | - Sylvain Le Gall
- Group of Electrical Engineering of Paris (GeePs), CNRS, Univ. Paris-Saclay, CentraleSupélec, Sorbonne Univ., Gif-sur-Yvette, France
| | | | - Guido Mula
- PoroSiLab, Dipartimento di Fisica, Università degli Studi di Cagliari, Monserrato, Italy
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9
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Matsumoto A, Son H, Eguchi M, Iwamoto K, Shimada Y, Furukawa K, Yae S. General corrosion during metal-assisted etching of n-type silicon using different metal catalysts of silver, gold, and platinum. RSC Adv 2019; 10:253-259. [PMID: 35492542 PMCID: PMC9048163 DOI: 10.1039/c9ra08728a] [Citation(s) in RCA: 6] [Impact Index Per Article: 1.2] [Reference Citation Analysis] [Abstract] [Track Full Text] [Download PDF] [Figures] [Journal Information] [Subscribe] [Scholar Register] [Received: 10/24/2019] [Accepted: 11/29/2019] [Indexed: 12/04/2022] Open
Abstract
Metal-assisted etching is a promising technique for microfabrication of semiconductors. In this method, porous silicon (Si) can be produced with a very simple procedure, and various nanostructures can be designed by changing the catalyst patterns. The kind of metal catalysts is one of the key factors to control the porous structure. In this work, we performed the etching of n-type Si (100) in a hydrofluoric acid solution containing hydrogen peroxide in the dark using silver, gold, and platinum particles electrolessly deposited at a constant coverage, and demonstrated the difference in the porous structures obtained for the different kind of metal catalysts. By comparing the mass loss of substrates with the depth of pores formed under the metal particles, we found that general corrosion occurred on the top-surface of the Si substrate around the metal particles even under the dark condition. The general corrosion depended on the metal species and it was explained by the formation and dissolution of a mesoporous layer. The kind of metal catalysts influences the dissolution of the Si surface not only under the metal catalysts but also between them. The first report on general corrosion during metal-assisted etching of silicon.![]()
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Affiliation(s)
- Ayumu Matsumoto
- Department of Chemical Engineering and Materials Science, Graduate School of Engineering, University of Hyogo 2167 Shosha Himeji Hyogo 671-2280 Japan
| | - Hikoyoshi Son
- Department of Chemical Engineering and Materials Science, Graduate School of Engineering, University of Hyogo 2167 Shosha Himeji Hyogo 671-2280 Japan
| | - Makiho Eguchi
- Department of Chemical Engineering and Materials Science, Graduate School of Engineering, University of Hyogo 2167 Shosha Himeji Hyogo 671-2280 Japan
| | - Keishi Iwamoto
- Department of Chemical Engineering and Materials Science, Graduate School of Engineering, University of Hyogo 2167 Shosha Himeji Hyogo 671-2280 Japan
| | - Yuki Shimada
- Department of Chemical Engineering and Materials Science, Graduate School of Engineering, University of Hyogo 2167 Shosha Himeji Hyogo 671-2280 Japan
| | - Kyohei Furukawa
- Department of Chemical Engineering and Materials Science, Graduate School of Engineering, University of Hyogo 2167 Shosha Himeji Hyogo 671-2280 Japan
| | - Shinji Yae
- Department of Chemical Engineering and Materials Science, Graduate School of Engineering, University of Hyogo 2167 Shosha Himeji Hyogo 671-2280 Japan
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10
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Bastide S, Torralba E, Halbwax M, Le Gall S, Mpogui E, Cachet-Vivier C, Magnin V, Harari J, Yarekha D, Vilcot JP. 3D Patterning of Si by Contact Etching With Nanoporous Metals. Front Chem 2019; 7:256. [PMID: 31106193 PMCID: PMC6494945 DOI: 10.3389/fchem.2019.00256] [Citation(s) in RCA: 11] [Impact Index Per Article: 2.2] [Reference Citation Analysis] [Abstract] [Key Words] [Track Full Text] [Download PDF] [Figures] [Journal Information] [Subscribe] [Scholar Register] [Received: 12/03/2018] [Accepted: 04/01/2019] [Indexed: 11/23/2022] Open
Abstract
Nanoporous gold and platinum electrodes are used to pattern n-type silicon by contact etching at the macroscopic scale. This type of electrode has the advantage of forming nanocontacts between silicon, the metal and the electrolyte as in classical metal assisted chemical etching while ensuring electrolyte transport to and from the interface through the electrode. Nanoporous gold electrodes with two types of nanostructures, fine and coarse (average ligament widths of ~30 and 100 nm, respectively) have been elaborated and tested. Patterns consisting in networks of square-based pyramids (10 × 10 μm2 base × 7 μm height) and U-shaped lines (2, 5, and 10 μm width × 10 μm height × 4 μm interspacing) are imprinted by both electrochemical and chemical (HF-H2O2) contact etching. A complete pattern transfer of pyramids is achieved with coarse nanoporous gold in both contact etching modes, at a rate of ~0.35 μm min−1. Under the same etching conditions, U-shaped line were only partially imprinted. The surface state after imprinting presents various defects such as craters, pores or porous silicon. Small walls are sometimes obtained due to imprinting of the details of the coarse gold nanostructure. We establish that np-Au electrodes can be turned into “np-Pt” electrodes by simply sputtering a thin platinum layer (5 nm) on the etching (catalytic) side of the electrode. Imprinting with np Au/Pt slightly improves the pattern transfer resolution. 2D numerical simulations of the valence band modulation at the Au/Si/electrolyte interfaces are carried out to explain the localized aspect of contact etching of n-type silicon with gold and platinum and the different surface state obtained after patterning. They show that n-type silicon in contact with gold or platinum is in inversion regime, with holes under the metal (within 3 nm). Etching under moderate anodic polarization corresponds to a quasi 2D hole transfer over a few nanometers in the inversion layer between adjacent metal and electrolyte contacts and is therefore very localized around metal contacts.
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Affiliation(s)
- Stéphane Bastide
- Institut de Chimie et des Matériaux Paris-Est (UMR 7182), CNRS, UPEC, Université Paris Est, Thiais, France
| | - Encarnacion Torralba
- Institut de Chimie et des Matériaux Paris-Est (UMR 7182), CNRS, UPEC, Université Paris Est, Thiais, France
| | - Mathieu Halbwax
- Institut d'Électronique de Microélectronique et de Nanotechnologie (IEMN), UMR 8520, Université de Lille, Villeneuve d'Ascq, France
| | - Sylvain Le Gall
- Group of Electrical Engineering of Paris (GeePs), CNRS, Centralesupelec, Univ. Paris-Sud, Sorbonne Université, Gif sur Yvette, France
| | - Elias Mpogui
- Institut de Chimie et des Matériaux Paris-Est (UMR 7182), CNRS, UPEC, Université Paris Est, Thiais, France
| | - Christine Cachet-Vivier
- Institut de Chimie et des Matériaux Paris-Est (UMR 7182), CNRS, UPEC, Université Paris Est, Thiais, France
| | - Vincent Magnin
- Institut d'Électronique de Microélectronique et de Nanotechnologie (IEMN), UMR 8520, Université de Lille, Villeneuve d'Ascq, France
| | - Joseph Harari
- Institut d'Électronique de Microélectronique et de Nanotechnologie (IEMN), UMR 8520, Université de Lille, Villeneuve d'Ascq, France
| | - Dmitri Yarekha
- Institut d'Électronique de Microélectronique et de Nanotechnologie (IEMN), UMR 8520, Université de Lille, Villeneuve d'Ascq, France
| | - Jean-Pierre Vilcot
- Institut d'Électronique de Microélectronique et de Nanotechnologie (IEMN), UMR 8520, Université de Lille, Villeneuve d'Ascq, France
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11
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Leontis I, Botzakaki MA, Georga SN, Nassiopoulou AG. Study of Si Nanowires Produced by Metal-Assisted Chemical Etching as a Light-Trapping Material in n-type c-Si Solar Cells. ACS OMEGA 2018; 3:10898-10906. [PMID: 31459200 PMCID: PMC6645058 DOI: 10.1021/acsomega.8b01049] [Citation(s) in RCA: 1] [Impact Index Per Article: 0.2] [Reference Citation Analysis] [Abstract] [Track Full Text] [Subscribe] [Scholar Register] [Received: 05/18/2018] [Accepted: 07/24/2018] [Indexed: 05/05/2023]
Abstract
Si nanowires (SiNWs) produced by metal-assisted chemical etching on n-type Si were investigated for their use as a light-trapping material in c-Si solar cells. The nanowires were fabricated before junction formation (on a lightly doped Si substrate) so that their core was bulk and nonporous. The above fabrication process was implemented in solar cell fabrication. The SiNW reflectivity was tested at different steps of solar cell processing and found to be lower than that of conventional random pyramids used in c-Si solar cells. Contact formation on the front side of the cell was investigated by considering metal deposition either directly on the nanowires or on bulk areas in between the nanowire areas. The superiority of this second case was demonstrated. Three different Si nanowire lengths were investigated, namely, 0.5, 1, and 1.5 μm, the case of 1 μm giving better results in terms of solar cell characteristics and external quantum efficiency. The electronic quality of the Si nanowire surface was investigated using the corresponding metal-oxide-semiconductor capacitors with atomic-layer-deposited alumina dielectric. Successful reduction of surface recombination centers at the large Si nanowire surface was achieved by reducing structural defects at their surface through a specific chemical treatment. Finally, using the determined optimized conditions for Si nanowire formation, chemical cleaning, and process implementation in solar cell fabrication, we demonstrated ∼45% increase in solar cell efficiency with 1 μm SiNWs compared to that from a flat reference cell processed under similar conditions. The above study was made on test solar cells without surface passivation.
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Affiliation(s)
- Ioannis Leontis
- Institute
of Nanoscience and Nanotechnology (INN), NCSR Demokritos, Patriarchou Grigoriou & Neapoleos 27, Aghia
Paraskevi, 153 10 Athens, Greece
| | | | | | - A. Galiouna Nassiopoulou
- Institute
of Nanoscience and Nanotechnology (INN), NCSR Demokritos, Patriarchou Grigoriou & Neapoleos 27, Aghia
Paraskevi, 153 10 Athens, Greece
- E-mail:
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12
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Torralba E, Halbwax M, El Assimi T, Fouchier M, Magnin V, Harari J, Vilcot JP, Le Gall S, Lachaume R, Cachet-Vivier C, Bastide S. 3D patterning of silicon by contact etching with anodically biased nanoporous gold electrodes. Electrochem commun 2017. [DOI: 10.1016/j.elecom.2017.01.014] [Citation(s) in RCA: 14] [Impact Index Per Article: 2.0] [Reference Citation Analysis] [Track Full Text] [Journal Information] [Subscribe] [Scholar Register] [Indexed: 11/28/2022] Open
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13
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Zhan D, Han L, Zhang J, He Q, Tian ZW, Tian ZQ. Electrochemical micro/nano-machining: principles and practices. Chem Soc Rev 2017; 46:1526-1544. [DOI: 10.1039/c6cs00735j] [Citation(s) in RCA: 48] [Impact Index Per Article: 6.9] [Reference Citation Analysis] [Abstract] [Track Full Text] [Journal Information] [Subscribe] [Scholar Register] [Indexed: 01/31/2023]
Abstract
Micro/nano-machining (MNM) is becoming the cutting-edge of high-tech manufacturing because of the ever increasing industrial demands for super smooth surfaces and functional three-dimensional micro/nano-structures in miniaturized and integrate devices, and electrochemistry plays an irreplaceable role in MNM.
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Affiliation(s)
- Dongping Zhan
- State Key Laboratory of Physical Chemistry of Solid Surfaces (PCOSS)
- Collaborative Innovation Centre of Chemistry for Energy Materials (iChEM), and Department of Chemistry
- College of Chemistry and Chemical Engineering
- Xiamen University
- Xiamen 361005
| | - Lianhuan Han
- State Key Laboratory of Physical Chemistry of Solid Surfaces (PCOSS)
- Collaborative Innovation Centre of Chemistry for Energy Materials (iChEM), and Department of Chemistry
- College of Chemistry and Chemical Engineering
- Xiamen University
- Xiamen 361005
| | - Jie Zhang
- State Key Laboratory of Physical Chemistry of Solid Surfaces (PCOSS)
- Collaborative Innovation Centre of Chemistry for Energy Materials (iChEM), and Department of Chemistry
- College of Chemistry and Chemical Engineering
- Xiamen University
- Xiamen 361005
| | - Quanfeng He
- State Key Laboratory of Physical Chemistry of Solid Surfaces (PCOSS)
- Collaborative Innovation Centre of Chemistry for Energy Materials (iChEM), and Department of Chemistry
- College of Chemistry and Chemical Engineering
- Xiamen University
- Xiamen 361005
| | - Zhao-Wu Tian
- State Key Laboratory of Physical Chemistry of Solid Surfaces (PCOSS)
- Collaborative Innovation Centre of Chemistry for Energy Materials (iChEM), and Department of Chemistry
- College of Chemistry and Chemical Engineering
- Xiamen University
- Xiamen 361005
| | - Zhong-Qun Tian
- State Key Laboratory of Physical Chemistry of Solid Surfaces (PCOSS)
- Collaborative Innovation Centre of Chemistry for Energy Materials (iChEM), and Department of Chemistry
- College of Chemistry and Chemical Engineering
- Xiamen University
- Xiamen 361005
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