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For: Barton AT, Walsh LA, Smyth CM, Qin X, Addou R, Cormier C, Hurley PK, Wallace RM, Hinkle CL. Impact of Etch Processes on the Chemistry and Surface States of the Topological Insulator Bi2Se3. ACS Appl Mater Interfaces 2019;11:32144-32150. [PMID: 31416305 DOI: 10.1021/acsami.9b10625] [Citation(s) in RCA: 3] [Impact Index Per Article: 0.6] [Reference Citation Analysis] [What about the content of this article? (0)] [Track Full Text] [Subscribe] [Scholar Register] [Indexed: 06/10/2023]
Number Cited by Other Article(s)
1
Bake A, Zhang Q, Ho CS, Causer GL, Zhao W, Yue Z, Nguyen A, Akhgar G, Karel J, Mitchell D, Pastuovic Z, Lewis R, Cole JH, Nancarrow M, Valanoor N, Wang X, Cortie D. Top-down patterning of topological surface and edge states using a focused ion beam. Nat Commun 2023;14:1693. [PMID: 36973266 PMCID: PMC10042877 DOI: 10.1038/s41467-023-37102-x] [Citation(s) in RCA: 2] [Impact Index Per Article: 2.0] [Reference Citation Analysis] [Abstract] [Track Full Text] [Journal Information] [Subscribe] [Scholar Register] [Received: 06/20/2022] [Accepted: 02/27/2023] [Indexed: 03/29/2023]  Open
2
Xu H, Xi H, Gao YC. Hexagonal Zr3X (X = Al, Ga, In) Metals: High Dynamic Stability, Nodal Loop, and Perfect Nodal Surface States. Front Chem 2020;8:608398. [PMID: 33330404 PMCID: PMC7710705 DOI: 10.3389/fchem.2020.608398] [Citation(s) in RCA: 2] [Impact Index Per Article: 0.5] [Reference Citation Analysis] [Abstract] [Key Words] [Track Full Text] [Download PDF] [Figures] [Journal Information] [Subscribe] [Scholar Register] [Received: 09/20/2020] [Accepted: 09/30/2020] [Indexed: 11/25/2022]  Open
3
Xiao D, Ruan Q, Bao DL, Luo Y, Huang C, Tang S, Shen J, Cheng C, Chu PK. Effects of Ion Energy and Density on the Plasma Etching-Induced Surface Area, Edge Electrical Field, and Multivacancies in MoSe2 Nanosheets for Enhancement of the Hydrogen Evolution Reaction. SMALL (WEINHEIM AN DER BERGSTRASSE, GERMANY) 2020;16:e2001470. [PMID: 32463594 DOI: 10.1002/smll.202001470] [Citation(s) in RCA: 13] [Impact Index Per Article: 3.3] [Reference Citation Analysis] [Abstract] [Key Words] [Track Full Text] [Subscribe] [Scholar Register] [Received: 03/06/2020] [Revised: 04/24/2020] [Accepted: 04/24/2020] [Indexed: 05/12/2023]
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