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Lee Y, Lee HW, Kim SJ, Park JM, Lee BH, Kang CG. Enhanced high-energy proton radiation hardness of ZnO thin-film transistors with a passivation layer. NANO CONVERGENCE 2025; 12:7. [PMID: 39883344 PMCID: PMC11782758 DOI: 10.1186/s40580-025-00474-5] [Citation(s) in RCA: 0] [Impact Index Per Article: 0] [Reference Citation Analysis] [Abstract] [Key Words] [Grants] [Track Full Text] [Subscribe] [Scholar Register] [Received: 10/05/2024] [Accepted: 01/08/2025] [Indexed: 01/31/2025]
Abstract
Metal-oxide thin-film semiconductors have been highlighted as next-generation space semiconductors owing to their excellent radiation hardness based on their dimensional advantages of very low thickness and insensitivity to crystal structure. However, thin-film transistors (TFTs) do not exhibit intrinsic radiation hardness owing to the chemical reactions at the interface exposed to ambient air. In this study, significantly enhanced radiation hardness of Al2O3-passivated ZnO TFTs against high-energy protons with energies of up to 100 MeV is obtained owing to the passivation layer blocking interactions with external reactants, thereby maintaining the chemical stability of the thin-film semiconductor. These results highlight the potential of passivated metal-oxide thin films for developing reliable radiation-hardened semiconductor devices that can be used in harsh space environments. In addition, the relationship between low-frequency noise and defects due to oxygen vacancies was revealed, which can be utilized to improve device reliability.
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Affiliation(s)
- Yongsu Lee
- Advanced Radiation Technology Institute, Korea Atomic Energy Research Institute, 29 Geumgu-gil, Jeongeup-si, Jeolabuk-do, 56212, Republic of Korea
| | - Hae-Won Lee
- Center for Semiconductor Technology Convergence, Department of Electrical Engineering, Pohang University of Science and Technology, Cheongam-ro 77, Nam-gu, Pohang, Gyeongbuk, 37673, Republic of Korea
| | - Su Jin Kim
- Advanced Radiation Technology Institute, Korea Atomic Energy Research Institute, 29 Geumgu-gil, Jeongeup-si, Jeolabuk-do, 56212, Republic of Korea
| | - Jeong Min Park
- Advanced Radiation Technology Institute, Korea Atomic Energy Research Institute, 29 Geumgu-gil, Jeongeup-si, Jeolabuk-do, 56212, Republic of Korea
| | - Byoung Hun Lee
- Center for Semiconductor Technology Convergence, Department of Electrical Engineering, Pohang University of Science and Technology, Cheongam-ro 77, Nam-gu, Pohang, Gyeongbuk, 37673, Republic of Korea.
| | - Chang Goo Kang
- Advanced Radiation Technology Institute, Korea Atomic Energy Research Institute, 29 Geumgu-gil, Jeongeup-si, Jeolabuk-do, 56212, Republic of Korea.
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2
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Li D, Yan J, Zhang Y, Wang J, Yu L. Lorentz Force-Actuated Bidirectional Nanoelectromechanical Switch with an Ultralow Operation Voltage. NANO LETTERS 2024; 24:11403-11410. [PMID: 39083658 DOI: 10.1021/acs.nanolett.4c01999] [Citation(s) in RCA: 0] [Impact Index Per Article: 0] [Reference Citation Analysis] [Abstract] [Key Words] [Track Full Text] [Subscribe] [Scholar Register] [Indexed: 08/02/2024]
Abstract
The high operating voltage of conventional nanoelectromechanical switches, typically tens of volts, is much higher than the driving voltage of the complementary metal oxide semiconductor integrated circuit (∼1 V). Though the operating voltage can be reduced by adopting a narrow air gap, down to several nanometers, this leads to formidable manufacturing challenges and occasionally irreversible switch failures due to the surface adhesive force. Here, we demonstrate a new nanowire-morphed nanoelectromechanical (NW-NEM) switch structure with ultralow operation voltages. In contrast to conventional nanoelectromechanical switches actuated by unidirectional electrostatic attraction, the NW-NEM switch is bidirectionally driven by Lorentz force to allow the use of a large air gap for excellent electrical isolation, while achieving a record-low driving voltage of <0.2 V. Furthermore, the introduction of the Lorentz force allows the NW-NEM switch to effectively overcome the adhesion force to recover to the turn-off state.
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Affiliation(s)
- Dianlun Li
- School of Electronic Science and Engineering, National Laboratory of Solid-State Microstructures, Nanjing University, 210023 Nanjing, China
| | - Jiang Yan
- School of Electronic Science and Engineering, National Laboratory of Solid-State Microstructures, Nanjing University, 210023 Nanjing, China
| | - Ying Zhang
- School of Electronic Science and Engineering, National Laboratory of Solid-State Microstructures, Nanjing University, 210023 Nanjing, China
| | - Junzhuan Wang
- School of Electronic Science and Engineering, National Laboratory of Solid-State Microstructures, Nanjing University, 210023 Nanjing, China
| | - Linwei Yu
- School of Electronic Science and Engineering, National Laboratory of Solid-State Microstructures, Nanjing University, 210023 Nanjing, China
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3
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Jin X, Baker CG, Romero E, Mauranyapin NP, Hirsch TMF, Bowen WP, Harris GI. Engineering error correcting dynamics in nanomechanical systems. Sci Rep 2024; 14:20431. [PMID: 39227726 PMCID: PMC11371924 DOI: 10.1038/s41598-024-71679-7] [Citation(s) in RCA: 0] [Impact Index Per Article: 0] [Reference Citation Analysis] [Abstract] [Grants] [Track Full Text] [Journal Information] [Subscribe] [Scholar Register] [Received: 05/29/2024] [Accepted: 08/29/2024] [Indexed: 09/05/2024] Open
Abstract
Nanomechanical oscillators are an alternative platform for computation in harsh environments. However, external perturbations arising from such environments may hinder information processing by introducing errors into the computing system. Here, we simulate the dynamics of three coupled Duffing oscillators whose multiple equilibrium states can be used for information processing and storage. Our analysis reveals that, within experimentally relevant parameters, error correcting dynamics can emerge, wherein the system's state is robust against random external impulses. We find that oscillators in this configuration have several surprising and attractive features, including dynamic isolation of resonators exposed to extreme impulses and the ability to correct simultaneous errors.
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Affiliation(s)
- Xiaoya Jin
- School of Mathematics and Physics, The University of Queensland, Brisbane, QLD, 4072, Australia.
| | - Christopher G Baker
- School of Mathematics and Physics, The University of Queensland, Brisbane, QLD, 4072, Australia
| | - Erick Romero
- School of Mathematics and Physics, The University of Queensland, Brisbane, QLD, 4072, Australia
| | - Nicolas P Mauranyapin
- School of Mathematics and Physics, The University of Queensland, Brisbane, QLD, 4072, Australia
| | - Timothy M F Hirsch
- School of Mathematics and Physics, The University of Queensland, Brisbane, QLD, 4072, Australia
| | - Warwick P Bowen
- School of Mathematics and Physics, The University of Queensland, Brisbane, QLD, 4072, Australia.
| | - Glen I Harris
- School of Mathematics and Physics, The University of Queensland, Brisbane, QLD, 4072, Australia
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Jo MS, Kim SH, Park SY, Choi KW, Kim SH, Yoo JY, Kim BJ, Yoon JB. Fast-Response and Low-Power Self-Heating Gas Sensor Using Metal/Metal Oxide/Metal (MMOM) Structured Nanowires. ACS Sens 2024; 9:1896-1905. [PMID: 38626402 DOI: 10.1021/acssensors.3c02613] [Citation(s) in RCA: 0] [Impact Index Per Article: 0] [Reference Citation Analysis] [Abstract] [Key Words] [MESH Headings] [Track Full Text] [Journal Information] [Subscribe] [Scholar Register] [Indexed: 04/18/2024]
Abstract
With the escalating global awareness of air quality management, the need for continuous and reliable monitoring of toxic gases by using low-power operating systems has become increasingly important. One of which, semiconductor metal oxide gas sensors have received great attention due to their high/fast response and simple working mechanism. More specifically, self-heating metal oxide gas sensors, wherein direct thermal activation in the sensing material, have been sought for their low power-consuming characteristics. However, previous works have neglected to address the temperature distribution within the sensing material, resulting in inefficient gas response and prolonged response/recovery times, particularly due to the low-temperature regions. Here, we present a unique metal/metal oxide/metal (MMOM) nanowire architecture that conductively confines heat to the sensing material, achieving high uniformity in the temperature distribution. The proposed structure enables uniform thermal activation within the sensing material, allowing the sensor to efficiently react with the toxic gas. As a result, the proposed MMOM gas sensor showed significantly enhanced gas response (from 6.7 to 20.1% at 30 ppm), response time (from 195 to 17 s at 30 ppm), and limit of detection (∼1 ppm) when compared to those of conventional single-material structures upon exposure to carbon monoxide. Furthermore, the proposed work demonstrated low power consumption (2.36 mW) and high thermal durability (1500 on/off cycles), demonstrating its potential for practical applications in reliable and low-power operating gas sensor systems. These results propose a new paradigm for power-efficient and robust self-heating metal oxide gas sensors with potential implications for other fields requiring thermal engineering.
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Affiliation(s)
- Min-Seung Jo
- School of Electrical Engineering, Korea Advanced Institute of Science and Technology (KAIST), 291 Daehak-ro, Yuseong-gu, Daejeon 34141, Republic of Korea
| | - Sung-Ho Kim
- School of Electrical Engineering, Korea Advanced Institute of Science and Technology (KAIST), 291 Daehak-ro, Yuseong-gu, Daejeon 34141, Republic of Korea
| | - So-Yoon Park
- School of Electrical Engineering, Korea Advanced Institute of Science and Technology (KAIST), 291 Daehak-ro, Yuseong-gu, Daejeon 34141, Republic of Korea
| | - Kwang-Wook Choi
- School of Electrical Engineering, Korea Advanced Institute of Science and Technology (KAIST), 291 Daehak-ro, Yuseong-gu, Daejeon 34141, Republic of Korea
- SAMSUNG ELECTRONICS Co., Ltd., 130 Samsungjeonja-ro, Yeongtong-gu, Suwon-si, Gyenggi-do 16678, Republic of Korea
| | - Sang-Hee Kim
- School of Electrical Engineering, Korea Advanced Institute of Science and Technology (KAIST), 291 Daehak-ro, Yuseong-gu, Daejeon 34141, Republic of Korea
- SAMSUNG ELECTRONICS Co., Ltd., 1, Samsungjeonja-ro, Hwaseong-si, Gyeonggi-do 18448, Republic of Korea
| | - Jae-Young Yoo
- Center for Bio-Integrated Electronics, Northwestern University, Evanston, Illinois 60208, United States
| | - Beom-Jun Kim
- School of Electrical Engineering, Korea Advanced Institute of Science and Technology (KAIST), 291 Daehak-ro, Yuseong-gu, Daejeon 34141, Republic of Korea
| | - Jun-Bo Yoon
- School of Electrical Engineering, Korea Advanced Institute of Science and Technology (KAIST), 291 Daehak-ro, Yuseong-gu, Daejeon 34141, Republic of Korea
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Kim SH, Choi PK, Lee YB, Kim TS, Jo MS, Lee SY, Min HW, Yoon JB. An experimental and numerical study on adhesion force at the nanoscale. NANOSCALE ADVANCES 2024; 6:2013-2025. [PMID: 38633052 PMCID: PMC11019507 DOI: 10.1039/d3na01044a] [Citation(s) in RCA: 0] [Impact Index Per Article: 0] [Reference Citation Analysis] [Abstract] [Grants] [Track Full Text] [Download PDF] [Figures] [Subscribe] [Scholar Register] [Received: 11/24/2023] [Accepted: 02/14/2024] [Indexed: 04/19/2024]
Abstract
Adhesion has attracted great interest in science and engineering especially in the field pertaining to nano-science because every form of physical contact is fundamentally a macroscopic observation of interactions between nano-asperities under the adhesion phenomenon. Despite its importance, no practical adhesion prediction model has been developed due to the complexity of examining contact between nano-asperities. Here, we scrutinized the contact phenomenon and developed a contact model, reflecting the physical sequence in which adhesion develops. For the first time ever, our model analyzes the adhesion force and contact properties, such as separation distance, contact location, actual contact area, and the physical deformation of the asperities, between rough surfaces. Through experiments using atomic force microscopy, we demonstrated a low absolute percentage error of 2.8% and 6.55% between the experimental and derived data for Si-Si and Mo-Mo contacts, respectively, and proved the accuracy and practicality of our model in the analysis of the adhesion phenomenon.
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Affiliation(s)
- Su-Hyun Kim
- School of Electrical Engineering, Korea Advanced Institute of Science and Technology (KAIST) 291 Daehak-ro, Yuseong-gu Daejeon 34141 Republic of Korea
- Samsung Electronics Co., Ltd. 1, Samsungjeonja-ro Hwaseong-si Gyeonggi-do 18448 Republic of Korea
| | - Pan-Kyu Choi
- School of Electrical Engineering, Korea Advanced Institute of Science and Technology (KAIST) 291 Daehak-ro, Yuseong-gu Daejeon 34141 Republic of Korea
- Samsung Electronics Co., Ltd. 1, Samsungjeonja-ro Hwaseong-si Gyeonggi-do 18448 Republic of Korea
| | - Yong-Bok Lee
- School of Electrical Engineering, Korea Advanced Institute of Science and Technology (KAIST) 291 Daehak-ro, Yuseong-gu Daejeon 34141 Republic of Korea
| | - Tae-Soo Kim
- School of Electrical Engineering, Korea Advanced Institute of Science and Technology (KAIST) 291 Daehak-ro, Yuseong-gu Daejeon 34141 Republic of Korea
| | - Min-Seung Jo
- School of Electrical Engineering, Korea Advanced Institute of Science and Technology (KAIST) 291 Daehak-ro, Yuseong-gu Daejeon 34141 Republic of Korea
| | - So-Young Lee
- School of Electrical Engineering, Korea Advanced Institute of Science and Technology (KAIST) 291 Daehak-ro, Yuseong-gu Daejeon 34141 Republic of Korea
| | - Hyun-Woo Min
- School of Electrical Engineering, Korea Advanced Institute of Science and Technology (KAIST) 291 Daehak-ro, Yuseong-gu Daejeon 34141 Republic of Korea
- Samsung Electronics Co., Ltd. 1, Samsungjeonja-ro Hwaseong-si Gyeonggi-do 18448 Republic of Korea
| | - Jun-Bo Yoon
- School of Electrical Engineering, Korea Advanced Institute of Science and Technology (KAIST) 291 Daehak-ro, Yuseong-gu Daejeon 34141 Republic of Korea
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6
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Sun Q, Yuan M, Wu R, Miao Y, Yuan Y, Jing Y, Qu Y, Liu X, Sun J. A Light-Programmed Rewritable Lattice-Mediated Multistate Memory for High-Density Data Storage. ADVANCED MATERIALS (DEERFIELD BEACH, FLA.) 2023; 35:e2302318. [PMID: 37165732 DOI: 10.1002/adma.202302318] [Citation(s) in RCA: 6] [Impact Index Per Article: 3.0] [Reference Citation Analysis] [Abstract] [Key Words] [Grants] [Track Full Text] [Subscribe] [Scholar Register] [Received: 03/13/2023] [Revised: 05/08/2023] [Indexed: 05/12/2023]
Abstract
Mainstream non-volatile memory (NVM) devices based on floating gate structures or phase-change/ferroelectric materials face inherent limitations that compromise their suitability for long-term data storage. To address this challenge, a novel memory device based on light-programmed lattice engineering of thin rhenium disulfide (ReS2 ) flakes is proposed. By inducing sulfur vacancies in the ReS2 channel through light illumination, the device's electrical conductivity is modified accordingly and multiple conductance states for data storage therefore are generated. The device exhibits more than 128 distinct states with linearly increasing conductance, corresponding to a sevenfold increase in storage density. Through further optimization to achieve atomic-level precision in defect creation, it is possible to achieve even higher storage densities. These states are extremely stable in vacuum or inert ambient showing long retention of >10 years, while they can be erased upon exposure to the air. The ReS2 memory device can maintain its stability over multiple program-erase operation cycles and shows superior wavelength discrimination capability for incident light in the range of 405-785 nm. This device represents a significant contribution to NVM technology by offering the ability to store information in multistate memory and enabling filter-free color image recorder applications.
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Affiliation(s)
- Qi Sun
- School of Physics and Electronics, Central South University, Changsha, 410083, China
| | - Meili Yuan
- School of Physics, Shandong University, Jinan, Shandong, 250100, China
| | - Rongqi Wu
- School of Physics and Electronics, Central South University, Changsha, 410083, China
| | - Yuan Miao
- School of Physics and Electronics, Central South University, Changsha, 410083, China
| | - Yahua Yuan
- School of Physics and Electronics, Central South University, Changsha, 410083, China
| | - Yumei Jing
- School of Physics and Electronics, Central South University, Changsha, 410083, China
| | - Yuanyuan Qu
- School of Physics, Shandong University, Jinan, Shandong, 250100, China
| | - Xiaochi Liu
- School of Physics and Electronics, Central South University, Changsha, 410083, China
| | - Jian Sun
- School of Physics and Electronics, Central South University, Changsha, 410083, China
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7
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Jo E, Kang Y, Sim S, Lee H, Kim J. High-Temperature-Operable Electromechanical Computing Units Enabled by Aligned Carbon Nanotube Arrays. ACS NANO 2023. [PMID: 37418328 DOI: 10.1021/acsnano.3c01304] [Citation(s) in RCA: 0] [Impact Index Per Article: 0] [Reference Citation Analysis] [Abstract] [Key Words] [Track Full Text] [Subscribe] [Scholar Register] [Indexed: 07/09/2023]
Abstract
Nano/micro-electromechanical (NEM/MEM) contact switches have great potential as energy-efficient and high-temperature-operable computing units to surmount those limitations of transistors. However, despite recent advances, the high-temperature operation of the mechanical switch is not fully stable nor repetitive due to the melting and softening of the contact material in the mechanical switch. Herein, MEM switches with carbon nanotube (CNT) arrays capable of operating at high temperatures are presented. In addition to the excellent thermal stability of CNT arrays, the absence of a melting point of CNTs allows the proposed switches to operate successfully at up to 550 °C, surpassing the maximum operating temperatures of state-of-the-art mechanical switches. The switches with CNTs also show a highly reliable contact lifetime of over 1 million cycles, even at a high temperature of 550 °C. Moreover, symmetrical pairs of normally open and normally closed MEM switches, whose interfaces are initially in contact and separated, respectively, are introduced. Consequently, the complementary inverters and logic gates operating at high temperatures can be easily configured such as NOT, NOR, and NAND gates. These switches and logic gates reveal the possibility for developing low-power, high-performance integrated circuits for high-temperature operations.
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Affiliation(s)
- Eunhwan Jo
- School of Mechanical Engineering, Yonsei University, 50 Yonsei-ro, Seodaemun-gu, Seoul 03722, Republic of Korea
| | - Yunsung Kang
- School of Mechanical Engineering, Yonsei University, 50 Yonsei-ro, Seodaemun-gu, Seoul 03722, Republic of Korea
| | - Sangjun Sim
- School of Mechanical Engineering, Yonsei University, 50 Yonsei-ro, Seodaemun-gu, Seoul 03722, Republic of Korea
| | - Hojoon Lee
- School of Mechanical Engineering, Yonsei University, 50 Yonsei-ro, Seodaemun-gu, Seoul 03722, Republic of Korea
| | - Jongbaeg Kim
- School of Mechanical Engineering, Yonsei University, 50 Yonsei-ro, Seodaemun-gu, Seoul 03722, Republic of Korea
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