Super-Resolution Scanning Transmission X-Ray Imaging Using Single Biconcave Parabolic Refractive Lens Array

Super-resolution acquisition and reconstruction for cone-beam SPECT with low-resolution detector

BACKGROUND AND OBJECTIVE

Single-photon emission computed tomography (SPECT) imaging, which provides information that reflects the human body's metabolic processes, has unique application value in disease diagnosis and efficacy evaluation. The imaging resolution of SPECT can be improved by exploiting high-performance detector hardware, but this exploitation generates high research and development costs. In addition, the inherent hardware structure of SPECT requires the use of a collimator, which limits the resolution in SPECT. The objective of this study is to propose a novel super-resolution (SR) reconstruction algorithm with two acquisition methods for cone-beam SPECT with low-resolution (LR) detector.

METHODS

A SR algorithm with two acquisition methods is proposed for cone-beam SPECT imaging in the projection domain. At each sampling angle, multi LR projections can be obtained by regularly moving the LR detector. For the two proposed acquisition methods, we develop a new SR reconstruction algorithm. Using our SR algorithm, a SR projection with the corresponding sampling angle can be obtained from multi LR projections via multi-iterations, and then, the SR SPECT image can be reconstructed. The peak signal-to-noise ratio (PSNR), structural similarity index measure (SSIM), signal-to-noise ratio (SNR) and contrast recovery coefficient (CRC) are used to evaluate the final reconstruction quality.

RESULTS

The simulation results obtained under clean and noisy conditions verify the effectiveness of our SR algorithm. Three different phantoms are verified separately. 16 LR projections are obtained at each sampling angle, each with 32 × 32 bins. The high-resolution (HR) projection has 128 × 128 bins. The reconstruction result of the SR algorithm obtains an evaluation value that is almost the same as that of the HR reconstruction result. Our results indicate that the resolution of the resulting SPECT image is almost four times higher.

CONCLUSIONS

The authors develop a SR reconstruction algorithm with two acquisition methods for the cone-beam SPECT system. The simulation results obtained in clean and noisy environments prove that the SR algorithm has potential value, but it needs to be further tested on real equipment.

X-ray bi-prism interferometry-A design study of proposed novel hardware

PURPOSE

Advances in X-ray phase-contrast imaging can obtain excellent soft-tissue contrast of phase-shift, attenuation, and small-angle scatter. Here, we present fringe patterns for different design parameters of X-ray bi-prism interferometry imaging systems. Our aim is to develop bi-prism interferometry imaging systems with excellent polychromatic performance that produce high-contrast fringes with spatially incoherent X-ray illumination. We also introduce a novel X-ray tube design that uses temporal multiplexing to provide simultaneous virtual "electronic phase stepping" that replace "mechanical phase stepping" popular with grating-based interferometry setups.

METHODS

In our investigation, we develop expressions for the irradiance distribution pattern of a bi-prism interferometer composed of multiple point sources and multiple bi-prisms. These expressions are used to plot fringe patterns for X-ray design parameters, including size of point source, number of point sources, and point source separation, and bi-prism design parameters including material, angle, number of bi-prisms, period, and bi-prism array to X-ray source and detector distances.

RESULTS

Results show that the fringe patterns for a bi-prism interferometry system are not longitudinally periodic as with grating interferometers that produce a Talbot-Lau carpet. It is also shown that at 59 keV X-rays the bi-prism material should be something comparable to nickel to obtain reasonable fringe visibility.

CONCLUSION

The irradiance distribution pattern demonstrates that bi-prism interferometry may provide comparable or improved fringe visibility to that of gratings. Special care is given to present our findings within the context of previous advancements. A single-shot image acquisition approach using a temporal multiplexed, high-power X-ray source provides virtual electronic phase stepping without focal spot sweeping. This provides multiple images, each at the same exposure and the same projection view, from different fringe locations that allow one to derive the attenuation, phase, and dark-field images of the sample without mechanical phase stepping of a grating.

The influence of chromatic aberration on the dose-limited spatial resolution of transmission electron microscopy

The effect of chromatic aberration (CC) on the spatial resolution in transmission electron microscopy (TEM) was studied in thick specimens in which the sample becomes the limiting factor in the resolution. The sample influences the energy spread of the electron beam, allows only a limited electron dose, and modulates electron scattering events. The experimental set-up consisted of a thin silicon nitride membrane and a silicon wedge containing gold nanoparticles. The resolution was measured as a function of electron dose and sample thickness for different sample configurations and for different microscopy modalities including regular TEM, energy filtered TEM (EFTEM) and CC-corrected TEM. Comparison with an analytical model aided the understanding of the experimental data applied over varied conditions. The general trend for all microscopy modalities was a transition from a noise-limited resolution at low electron dose to a CC-limited resolution at high-dose in the absence of beam blurring. EFTEM required an accurate energy slit offset and an optimal energy spread to energy-slit width ratio to surpass regular TEM. The key advantage of CC correction appeared to be the best possible resolution for larger sample thickness at low electron dose outperforming EFTEM by about fifty percent. Several hypothetical sample configurations relevant to liquid phase electron microscopy were evaluated as well to demonstrate the capabilities of the analytical model and to determine the most optimal microscopy modality for this type of experiment. The analytical model included an automated optimization of the EFTEM settings and may aid in optimizing the sample-limited resolution for experimental analysis and planning.

Staircase array of inclined refractive multi-lenses for large field of view pixel super-resolution scanning transmission hard X-ray microscopy

Owing to the development of X-ray focusing optics during the past decades, synchrotron-based X-ray microscopy techniques allow the study of specimens with unprecedented spatial resolution, down to 10 nm, using soft and medium X-ray photon energies, though at the expense of the field of view (FOV). One of the approaches to increase the FOV to square millimetres is raster-scanning of the specimen using a single nanoprobe; however, this results in a long data acquisition time. This work employs an array of inclined biconcave parabolic refractive multi-lenses (RMLs), fabricated by deep X-ray lithography and electroplating to generate a large number of long X-ray foci. Since the FOV is limited by the pattern height if a single RML is used by impinging X-rays parallel to the substrate, many RMLs at regular intervals in the orthogonal direction were fabricated by tilted exposure. By inclining the substrate correspondingly to the tilted exposure, 378000 X-ray line foci were generated with a length in the centimetre range and constant intervals in the sub-micrometre range. The capability of this new X-ray focusing device was first confirmed using ray-tracing simulations and then using synchrotron radiation at BL20B2 of SPring-8, Japan. Taking account of the fact that the refractive lens is effective for focusing high-energy X-rays, the experiment was performed with 35 keV X-rays. Next, by scanning a specimen through the line foci, this device was used to perform large FOV pixel super-resolution scanning transmission hard X-ray microscopy (PSR-STHXM) with a 780 ± 40 nm spatial resolution within an FOV of 1.64 cm × 1.64 cm (limited by the detector area) and a total scanning time of 4 min. Biomedical implant abutments fabricated via selective laser melting using Ti-6Al-4V medical alloy were measured by PSR-STHXM, suggesting its unique potential for studying extended and thick specimens. Although the super-resolution function was realized in one dimension in this study, it can be expanded to two dimensions by aligning a pair of presented devices orthogonally.