1
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Wang H, Majhi A, Tan WJ, Singhapong W, Morawe C, Sawhney K. Development of an advanced in-line multilayer deposition system at Diamond Light Source. JOURNAL OF SYNCHROTRON RADIATION 2024; 31:1050-1057. [PMID: 39120915 PMCID: PMC11371021 DOI: 10.1107/s1600577524006854] [Citation(s) in RCA: 0] [Impact Index Per Article: 0] [Reference Citation Analysis] [Abstract] [Key Words] [Track Full Text] [Subscribe] [Scholar Register] [Received: 03/14/2024] [Accepted: 07/12/2024] [Indexed: 08/10/2024]
Abstract
A state-of-the-art multilayer deposition system with a 4200 mm-long linear substrate translator housed within an ultra-high vacuum chamber has been developed. This instrument is engineered to produce single and multilayer coatings, accommodating mirrors up to 2000 mm in length through the utilization of eight rectangular cathodes. To ensure the quality and reliability of the coatings, the system incorporates various diagnostic tools for in situ thickness uniformity and stress measurement. Furthermore, the system features an annealing process capable of heating up to 700°C within the load-lock chamber. The entire operation, including pump down, deposition and venting processes, is automated through user-friendly software. In addition, all essential log data, power of sputtering source, working pressure and motion positions are automatically stored for comprehensive data analysis. Preliminary commissioning results demonstrate excellent lateral film thickness uniformity, achieving 0.26% along the translation direction over 1500 mm in dynamic mode. The multilayer deposition system is poised for use in fabricating periodic, lateral-graded and depth-graded multilayers, specifically catering to the beamlines for diverse scientific applications at Diamond Light Source.
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Affiliation(s)
| | | | | | - Wadwan Singhapong
- Diamond Light SourceDidcotUnited Kingdom
- Department of Mechanical EngineeringUniversity of BathBathUnited Kingdom
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2
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Quinn PD, Cacho-Nerin F, Gomez-Gonzalez MA, Parker JE, Poon T, Walker JM. Differential phase contrast for quantitative imaging and spectro-microscopy at a nanoprobe beamline. JOURNAL OF SYNCHROTRON RADIATION 2023; 30:200-207. [PMID: 36601938 PMCID: PMC9814065 DOI: 10.1107/s1600577522010633] [Citation(s) in RCA: 1] [Impact Index Per Article: 0.5] [Reference Citation Analysis] [Abstract] [Key Words] [Track Full Text] [Subscribe] [Scholar Register] [Received: 07/02/2022] [Accepted: 11/04/2022] [Indexed: 06/13/2023]
Abstract
The interaction of a focused X-ray beam with a sample in a scanning probe experiment can provide a variety of information about the interaction volume. In many scanning probe experiments X-ray fluorescence (XRF) is supplemented with measurements of the transmitted or scattered intensity using a pixelated detector. The automated extraction of different signals from an area pixelated detector is described, in particular the methodology for extracting differential phase contrast (DPC) is demonstrated and different processing methods are compared across a range of samples. The phase shift of the transmitted X-ray beam by the sample, extracted from DPC, is also compared with ptychography measurements to provide a qualitative and quantitative comparison. While ptychography produces a superior image, DPC can offer a simple, flexible method for phase contrast imaging which can provide fast results and feedback during an experiment; furthermore, for many science problems, such as registration of XRF in a lighter matrix, DPC can provide sufficient information to meet the experimental aims. As the DPC technique is a quantitative measurement, it can be expanded to spectroscopic studies and a demonstration of DPC for spectro-microscopy measurements is presented. Where ptychography can separate the absorption and phase shifts by the sample, quantitative interpretation of a DPC image or spectro-microscopy signal can only be performed directly when absorption is negligible or where the absorption contribution is known and the contributions can be fitted.
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Affiliation(s)
- Paul D. Quinn
- Diamond Light Source, Harwell Science and Innovation Campus, Didcot, Oxfordshire OX11 0DE, United Kingdom
| | - Fernando Cacho-Nerin
- Diamond Light Source, Harwell Science and Innovation Campus, Didcot, Oxfordshire OX11 0DE, United Kingdom
| | - Miguel A. Gomez-Gonzalez
- Diamond Light Source, Harwell Science and Innovation Campus, Didcot, Oxfordshire OX11 0DE, United Kingdom
| | - Julia E. Parker
- Diamond Light Source, Harwell Science and Innovation Campus, Didcot, Oxfordshire OX11 0DE, United Kingdom
| | - Timothy Poon
- Diamond Light Source, Harwell Science and Innovation Campus, Didcot, Oxfordshire OX11 0DE, United Kingdom
| | - Jessica M. Walker
- Diamond Light Source, Harwell Science and Innovation Campus, Didcot, Oxfordshire OX11 0DE, United Kingdom
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3
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Pattammattel A, Tappero R, Gavrilov D, Zhang H, Aronstein P, Forman HJ, O'Day PA, Yan H, Chu YS. Multimodal X-ray nano-spectromicroscopy analysis of chemically heterogeneous systems. Metallomics 2022; 14:6754152. [PMID: 36208212 PMCID: PMC9584160 DOI: 10.1093/mtomcs/mfac078] [Citation(s) in RCA: 4] [Impact Index Per Article: 1.3] [Reference Citation Analysis] [Abstract] [Key Words] [Track Full Text] [Download PDF] [Figures] [Journal Information] [Subscribe] [Scholar Register] [Received: 04/16/2022] [Accepted: 09/27/2022] [Indexed: 11/14/2022]
Abstract
Understanding the nanoscale chemical speciation of heterogeneous systems in their native environment is critical for several disciplines such as life and environmental sciences, biogeochemistry, and materials science. Synchrotron-based X-ray spectromicroscopy tools are widely used to understand the chemistry and morphology of complex material systems owing to their high penetration depth and sensitivity. The multidimensional (4D+) structure of spectromicroscopy data poses visualization and data-reduction challenges. This paper reports the strategies for the visualization and analysis of spectromicroscopy data. We created a new graphical user interface and data analysis platform named XMIDAS (X-ray multimodal image data analysis software) to visualize spectromicroscopy data from both image and spectrum representations. The interactive data analysis toolkit combined conventional analysis methods with well-established machine learning classification algorithms (e.g. nonnegative matrix factorization) for data reduction. The data visualization and analysis methodologies were then defined and optimized using a model particle aggregate with known chemical composition. Nanoprobe-based X-ray fluorescence (nano-XRF) and X-ray absorption near edge structure (nano-XANES) spectromicroscopy techniques were used to probe elemental and chemical state information of the aggregate sample. We illustrated the complete chemical speciation methodology of the model particle by using XMIDAS. Next, we demonstrated the application of this approach in detecting and characterizing nanoparticles associated with alveolar macrophages. Our multimodal approach combining nano-XRF, nano-XANES, and differential phase-contrast imaging efficiently visualizes the chemistry of localized nanostructure with the morphology. We believe that the optimized data-reduction strategies and tool development will facilitate the analysis of complex biological and environmental samples using X-ray spectromicroscopy techniques.
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Affiliation(s)
- Ajith Pattammattel
- National Synchrotron Light Source II, Brookhaven National Laboratory, Upton, NY 11973, USA
| | - Ryan Tappero
- National Synchrotron Light Source II, Brookhaven National Laboratory, Upton, NY 11973, USA
| | - Dmitri Gavrilov
- National Synchrotron Light Source II, Brookhaven National Laboratory, Upton, NY 11973, USA
| | - Hongqiao Zhang
- Leonard Davis School of Gerontology, University of Southern California, Los Angeles, CA 90089, USA
| | - Paul Aronstein
- Environmental Systems Graduate Program, University of California, Merced, CA 95343, USA
| | - Henry Jay Forman
- Leonard Davis School of Gerontology, University of Southern California, Los Angeles, CA 90089, USA
| | - Peggy A O'Day
- Environmental Systems Graduate Program, University of California, Merced, CA 95343, USA.,Life and Environmental Sciences Department and the Sierra Nevada Research Institute, University of California, Merced, CA 95343, USA
| | - Hanfei Yan
- National Synchrotron Light Source II, Brookhaven National Laboratory, Upton, NY 11973, USA
| | - Yong S Chu
- National Synchrotron Light Source II, Brookhaven National Laboratory, Upton, NY 11973, USA
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4
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Pattammattel A, Tappero R, Ge M, Chu YS, Huang X, Gao Y, Yan H. High-sensitivity nanoscale chemical imaging with hard x-ray nano-XANES. SCIENCE ADVANCES 2020; 6:eabb3615. [PMID: 32917679 PMCID: PMC11206466 DOI: 10.1126/sciadv.abb3615] [Citation(s) in RCA: 21] [Impact Index Per Article: 4.2] [Reference Citation Analysis] [Abstract] [Grants] [Track Full Text] [Subscribe] [Scholar Register] [Received: 02/18/2020] [Accepted: 07/22/2020] [Indexed: 05/22/2023]
Abstract
Resolving chemical species at the nanoscale is of paramount importance to many scientific and technological developments across a broad spectrum of disciplines. Hard x-rays with excellent penetration power and high chemical sensitivity are suitable for speciation of heterogeneous (thick) materials. Here, we report nanoscale chemical speciation by combining scanning nanoprobe and fluorescence-yield x-ray absorption near-edge structure (nano-XANES). First, the resolving power of nano-XANES was demonstrated by mapping Fe(0) and Fe(III) states of a reference sample composed of stainless steel and hematite nanoparticles with 50-nm scanning steps. Nano-XANES was then used to study the trace secondary phases in lithium iron phosphate (LFP) particles. We observed individual Fe-phosphide nanoparticles in pristine LFP, whereas partially (de)lithiated particles showed Fe-phosphide nanonetworks. These findings shed light on the contradictory reports on Fe-phosphide morphology in the literature. Nano-XANES bridges the capability gap of spectromicroscopy methods and provides exciting research opportunities across multiple disciplines.
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Affiliation(s)
- A Pattammattel
- National Synchrotron Light Source II, Brookhaven National Laboratory, Upton, NY, USA
| | - R Tappero
- National Synchrotron Light Source II, Brookhaven National Laboratory, Upton, NY, USA
| | - M Ge
- National Synchrotron Light Source II, Brookhaven National Laboratory, Upton, NY, USA
| | - Y S Chu
- National Synchrotron Light Source II, Brookhaven National Laboratory, Upton, NY, USA
| | - X Huang
- National Synchrotron Light Source II, Brookhaven National Laboratory, Upton, NY, USA
| | - Y Gao
- National Synchrotron Light Source II, Brookhaven National Laboratory, Upton, NY, USA
| | - H Yan
- National Synchrotron Light Source II, Brookhaven National Laboratory, Upton, NY, USA.
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5
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Cacho-Nerin F, Parker JE, Quinn PD. A passive hutch-cooling system for achieving high thermal-stability operation at the Nanoprobe beamline, Diamond Light Source. JOURNAL OF SYNCHROTRON RADIATION 2020; 27:912-922. [PMID: 33565999 PMCID: PMC7336176 DOI: 10.1107/s1600577520004932] [Citation(s) in RCA: 0] [Impact Index Per Article: 0] [Reference Citation Analysis] [Abstract] [Key Words] [Track Full Text] [Subscribe] [Scholar Register] [Received: 11/28/2019] [Accepted: 04/06/2020] [Indexed: 05/09/2023]
Abstract
The development of low-emittance storage rings and the rapid developments in nano-optics and imaging techniques are leading to decreasing X-ray spot sizes and increasing requirements on the environmental and mechanical stability of beamline components. In particular, temperature stability in the experimental hutches is critical to minimize uncontrolled displacements caused by thermal expansion and ensure consistent performance. Here, the design and thermal performance of the experimental hutches of the Nanoprobe beamline at Diamond Light Source are described, where a standard deviation of the room temperature down to 0.017°C over extended periods is demonstrated. The rooms are kept at constant temperature using water-cooled radiant panels which line the ceiling and walls. Radiant panels are relatively common in high-end electron microscopy rooms, but this is the first demonstration of their use for fine temperature control in an X-ray hutch and may provide a useful basis for future upgrades at upcoming low-emittance sources.
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Affiliation(s)
- Fernando Cacho-Nerin
- Diamond Light Source Ltd, Harwell Science and Innovation Campus, Didcot, Oxfordshire OX11 0DE, UK
- Correspondence e-mail:
| | - Julia E. Parker
- Diamond Light Source Ltd, Harwell Science and Innovation Campus, Didcot, Oxfordshire OX11 0DE, UK
| | - Paul D. Quinn
- Diamond Light Source Ltd, Harwell Science and Innovation Campus, Didcot, Oxfordshire OX11 0DE, UK
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6
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Hill J, Campbell S, Carini G, Chen-Wiegart YCK, Chu Y, Fluerasu A, Fukuto M, Idir M, Jakoncic J, Jarrige I, Siddons P, Tanabe T, Yager KG. Future trends in synchrotron science at NSLS-II. JOURNAL OF PHYSICS. CONDENSED MATTER : AN INSTITUTE OF PHYSICS JOURNAL 2020; 32:374008. [PMID: 32568740 DOI: 10.1088/1361-648x/ab7b19] [Citation(s) in RCA: 2] [Impact Index Per Article: 0.4] [Reference Citation Analysis] [Abstract] [Key Words] [Track Full Text] [Subscribe] [Scholar Register] [Received: 01/09/2020] [Accepted: 02/28/2020] [Indexed: 06/11/2023]
Abstract
In this paper, we summarize briefly some of the future trends in synchrotron science as seen at the National Synchrotron Light Source II, a new, low emittance source recently commissioned at Brookhaven National Laboratory. We touch upon imaging techniques, the study of dynamics, the increasing use of multimodal approaches, the vital importance of data science, and other enabling technologies. Each are presently undergoing a time of rapid change, driving the field of synchrotron science forward at an ever increasing pace. It is truly an exciting time and one in which Roger Cowley, to whom this journal issue is dedicated, would surely be both invigorated by, and at the heart of.
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Affiliation(s)
- John Hill
- National Synchrotron Light Source II (NSLS-II), Brookhaven National Laboratory, Upton, NY, United States of America
| | - Stuart Campbell
- National Synchrotron Light Source II (NSLS-II), Brookhaven National Laboratory, Upton, NY, United States of America
| | - Gabriella Carini
- Instrumentation Division (IO), Brookhaven National Laboratory, Upton, NY, United States of America
| | - Yu-Chen Karen Chen-Wiegart
- National Synchrotron Light Source II (NSLS-II), Brookhaven National Laboratory, Upton, NY, United States of America
- Materials Science & Chemical Engineering, Stony Brook University, Stony Brook, NY, United States of America
| | - Yong Chu
- National Synchrotron Light Source II (NSLS-II), Brookhaven National Laboratory, Upton, NY, United States of America
| | - Andrei Fluerasu
- National Synchrotron Light Source II (NSLS-II), Brookhaven National Laboratory, Upton, NY, United States of America
| | - Masafumi Fukuto
- National Synchrotron Light Source II (NSLS-II), Brookhaven National Laboratory, Upton, NY, United States of America
| | - Mourad Idir
- National Synchrotron Light Source II (NSLS-II), Brookhaven National Laboratory, Upton, NY, United States of America
| | - Jean Jakoncic
- National Synchrotron Light Source II (NSLS-II), Brookhaven National Laboratory, Upton, NY, United States of America
| | - Ignace Jarrige
- National Synchrotron Light Source II (NSLS-II), Brookhaven National Laboratory, Upton, NY, United States of America
| | - Peter Siddons
- National Synchrotron Light Source II (NSLS-II), Brookhaven National Laboratory, Upton, NY, United States of America
| | - Toshi Tanabe
- National Synchrotron Light Source II (NSLS-II), Brookhaven National Laboratory, Upton, NY, United States of America
| | - Kevin G Yager
- Center for Functional Nanomaterials (CFN), Brookhaven National Laboratory, Upton, NY, United States of America
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7
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Lo YH, Liao CT, Zhou J, Rana A, Bevis CS, Gui G, Enders B, Cannon KM, Yu YS, Celestre R, Nowrouzi K, Shapiro D, Kapteyn H, Falcone R, Bennett C, Murnane M, Miao J. Multimodal x-ray and electron microscopy of the Allende meteorite. SCIENCE ADVANCES 2019; 5:eaax3009. [PMID: 31555739 PMCID: PMC6754224 DOI: 10.1126/sciadv.aax3009] [Citation(s) in RCA: 8] [Impact Index Per Article: 1.3] [Reference Citation Analysis] [Abstract] [Grants] [Track Full Text] [Download PDF] [Figures] [Subscribe] [Scholar Register] [Received: 03/15/2019] [Accepted: 08/23/2019] [Indexed: 06/10/2023]
Abstract
Multimodal microscopy that combines complementary nanoscale imaging techniques is critical for extracting comprehensive chemical, structural, and functional information, particularly for heterogeneous samples. X-ray microscopy can achieve high-resolution imaging of bulk materials with chemical, magnetic, electronic, and bond orientation contrast, while electron microscopy provides atomic-scale spatial resolution with quantitative elemental composition. Here, we combine x-ray ptychography and scanning transmission x-ray spectromicroscopy with three-dimensional energy-dispersive spectroscopy and electron tomography to perform structural and chemical mapping of an Allende meteorite particle with 15-nm spatial resolution. We use textural and quantitative elemental information to infer the mineral composition and discuss potential processes that occurred before or after accretion. We anticipate that correlative x-ray and electron microscopy overcome the limitations of individual imaging modalities and open up a route to future multiscale nondestructive microscopies of complex functional materials and biological systems.
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Affiliation(s)
- Yuan Hung Lo
- Department of Physics and Astronomy and California NanoSystems Institute, University of California, Los Angeles, CA 90095, USA
- Department of Bioengineering, University of California, Los Angeles, CA 90095, USA
| | - Chen-Ting Liao
- JILA and Department of Physics, University of Colorado and National Institute of Standards and Technology (NIST), Boulder, CO 80309, USA
| | - Jihan Zhou
- Department of Physics and Astronomy and California NanoSystems Institute, University of California, Los Angeles, CA 90095, USA
| | - Arjun Rana
- Department of Physics and Astronomy and California NanoSystems Institute, University of California, Los Angeles, CA 90095, USA
| | - Charles S. Bevis
- JILA and Department of Physics, University of Colorado and National Institute of Standards and Technology (NIST), Boulder, CO 80309, USA
| | - Guan Gui
- JILA and Department of Physics, University of Colorado and National Institute of Standards and Technology (NIST), Boulder, CO 80309, USA
| | - Bjoern Enders
- Advanced Light Source, Lawrence Berkeley National Laboratory, Berkeley, CA 94720, USA
| | - Kevin M. Cannon
- Department of Physics, University of Central Florida, Orlando, FL 32816, USA
| | - Young-Sang Yu
- Advanced Light Source, Lawrence Berkeley National Laboratory, Berkeley, CA 94720, USA
| | - Richard Celestre
- Advanced Light Source, Lawrence Berkeley National Laboratory, Berkeley, CA 94720, USA
| | - Kasra Nowrouzi
- Advanced Light Source, Lawrence Berkeley National Laboratory, Berkeley, CA 94720, USA
| | - David Shapiro
- Advanced Light Source, Lawrence Berkeley National Laboratory, Berkeley, CA 94720, USA
| | - Henry Kapteyn
- JILA and Department of Physics, University of Colorado and National Institute of Standards and Technology (NIST), Boulder, CO 80309, USA
| | - Roger Falcone
- Advanced Light Source, Lawrence Berkeley National Laboratory, Berkeley, CA 94720, USA
| | - Chris Bennett
- Department of Physics, University of Central Florida, Orlando, FL 32816, USA
| | - Margaret Murnane
- JILA and Department of Physics, University of Colorado and National Institute of Standards and Technology (NIST), Boulder, CO 80309, USA
| | - Jianwei Miao
- Department of Physics and Astronomy and California NanoSystems Institute, University of California, Los Angeles, CA 90095, USA
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8
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Nanospectroscopy Captures Nanoscale Compositional Zonation in Barite Solid Solutions. Sci Rep 2018; 8:13041. [PMID: 30158629 PMCID: PMC6115454 DOI: 10.1038/s41598-018-31335-3] [Citation(s) in RCA: 13] [Impact Index Per Article: 1.9] [Reference Citation Analysis] [Abstract] [Track Full Text] [Download PDF] [Figures] [Journal Information] [Subscribe] [Scholar Register] [Received: 05/31/2018] [Accepted: 08/14/2018] [Indexed: 11/09/2022] Open
Abstract
Scientists have long suspected that compositionally zoned particles can form under far-from equilibrium precipitation conditions, but their inferences have been based on bulk solid and solution measurements. We are the first to directly observe nanoscale trace element compositional zonation in <10 µm-sized particles using X-ray fluorescence nanospectroscopy at the Hard X-ray Nanoprobe (HXN) Beamline at National Synchrotron Light Source II (NSLS-II). Through high-resolution images, compositional zonation was observed in barite (BaSO4) particles precipitated from aqueous solution, in which Sr2+ cations as well as HAsO42- anions were co-precipitated into (Ba,Sr)SO4 or Ba(SO4,HAsO4) solid solutions. Under high salinity conditions (NaCl ≥ 1.0 M), bands contained ~3.5 to ~5 times more trace element compared to the center of the particle formed in early stages of particle growth. Quantitative analysis of Sr and As fractional substitution allowed us to determine that different crystallographic growth directions incorporated trace elements to different extents. These findings provide supporting evidence that barite solid solutions have great potential for trace element incorporation; this has significant implications for environmental and engineered systems that remove hazardous substances from water.
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9
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Yan H, Huang X, Bouet N, Zhou J, Nazaretski E, Chu YS. Achieving diffraction-limited nanometer-scale X-ray point focus with two crossed multilayer Laue lenses: alignment challenges. OPTICS EXPRESS 2017; 25:25234-25242. [PMID: 29041193 DOI: 10.1364/oe.25.025234] [Citation(s) in RCA: 5] [Impact Index Per Article: 0.6] [Reference Citation Analysis] [Abstract] [Track Full Text] [Subscribe] [Scholar Register] [Received: 06/07/2017] [Accepted: 09/22/2017] [Indexed: 06/07/2023]
Abstract
We discuss misalignment-induced aberrations in a pair of crossed multilayer Laue lenses used for achieving a nanometer-scale x-ray point focus. We thoroughly investigate the impacts of two most important contributions, the orthogonality and the separation distance between two lenses. We find that misalignment in the orthogonality results in astigmatism at 45° and other inclination angles when coupled with a separation distance error. Theoretical explanation and experimental verification are provided. We show that to achieve a diffraction-limited point focus, accurate alignment of the azimuthal angle is required to ensure orthogonality between two lenses, and the required accuracy is scaled with the ratio of the focus size to the aperture size.
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10
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Feng H, Qian Y, Cochran JK, Zhu Q, Hu W, Yan H, Li L, Huang X, Chu YS, Liu H, Yoo S, Liu CJ. Nanoscale measurement of trace element distributions in Spartina alterniflora root tissue during dormancy. Sci Rep 2017; 7:40420. [PMID: 28098254 PMCID: PMC5241796 DOI: 10.1038/srep40420] [Citation(s) in RCA: 9] [Impact Index Per Article: 1.1] [Reference Citation Analysis] [Abstract] [MESH Headings] [Track Full Text] [Download PDF] [Figures] [Journal Information] [Subscribe] [Scholar Register] [Received: 03/31/2016] [Accepted: 12/06/2016] [Indexed: 01/22/2023] Open
Abstract
This paper reports a nanometer-scale investigation of trace element (As, Ca, Cr, Cu, Fe, Mn, Ni, S and Zn) distributions in the root system Spartina alterniflora during dormancy. The sample was collected on a salt marsh island in Jamaica Bay, New York, in April 2015 and the root was cross-sectioned with 10 μm resolution. Synchrotron X-ray nanofluorescence was applied to map the trace element distributions in selected areas of the root epidermis and endodermis. The sampling resolution was 60 nm to increase the measurement accuracy and reduce the uncertainty. The results indicate that the elemental concentrations in the epidermis, outer endodermis and inner endodermis are significantly (p < 0.01) different. The root endodermis has relatively higher concentrations of these elements than the root epidermis. Furthermore, this high resolution measurement indicates that the elemental concentrations in the outer endodermis are significantly (p < 0.01) higher than those in the inner endodermis. These results suggest that the Casparian strip may play a role in governing the aplastic transport of these elements. Pearson correlation analysis on the average concentrations of each element in the selected areas shows that most of the elements are significantly (p < 0.05) correlated, which suggests that these elements may share the same transport pathways.
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Affiliation(s)
- Huan Feng
- Department of Earth and Environmental Studies, Montclair State University, Montclair, New Jersey 07043, USA
| | - Yu Qian
- Department of Earth and Environmental Studies, Montclair State University, Montclair, New Jersey 07043, USA
| | - J. Kirk Cochran
- School of Marine and Atmospheric Science, State University of New York, Stony Brook, NY 11794, USA
| | - Qingzhi Zhu
- School of Marine and Atmospheric Science, State University of New York, Stony Brook, NY 11794, USA
| | - Wen Hu
- National Synchrotron Light Source II, Brookhaven National Laboratory, Upton, New York 11973, USA
| | - Hanfei Yan
- National Synchrotron Light Source II, Brookhaven National Laboratory, Upton, New York 11973, USA
| | - Li Li
- National Synchrotron Light Source II, Brookhaven National Laboratory, Upton, New York 11973, USA
| | - Xiaojing Huang
- National Synchrotron Light Source II, Brookhaven National Laboratory, Upton, New York 11973, USA
| | - Yong S. Chu
- National Synchrotron Light Source II, Brookhaven National Laboratory, Upton, New York 11973, USA
| | - Houjun Liu
- College of Land and Environment, Shenyang Agricultural University, Shenyang 110866, PRC
| | - Shinjae Yoo
- Computational Science Center, Brookhaven National Laboratory, Upton, New York 11973, USA
| | - Chang-Jun Liu
- Biological Sciences Department, Brookhaven National Laboratory, Upton, New York 11973, USA
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11
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Conley R, Bouet N, Chu YS, Huang X, Kang HC, Macrander AT, Maser J, Nazaretski E, Stephenson GB, Yan H. Multilayer Laue Lens: A Brief History and Current Status. ACTA ACUST UNITED AC 2016. [DOI: 10.1080/08940886.2016.1198669] [Citation(s) in RCA: 6] [Impact Index Per Article: 0.7] [Reference Citation Analysis] [Track Full Text] [Journal Information] [Subscribe] [Scholar Register] [Indexed: 10/21/2022]
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12
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Yan H, Nazaretski E, Lauer K, Huang X, Wagner U, Rau C, Yusuf M, Robinson I, Kalbfleisch S, Li L, Bouet N, Zhou J, Conley R, Chu YS. Multimodality hard-x-ray imaging of a chromosome with nanoscale spatial resolution. Sci Rep 2016; 6:20112. [PMID: 26846188 PMCID: PMC4742846 DOI: 10.1038/srep20112] [Citation(s) in RCA: 48] [Impact Index Per Article: 5.3] [Reference Citation Analysis] [Abstract] [Track Full Text] [Download PDF] [Figures] [Journal Information] [Subscribe] [Scholar Register] [Received: 06/26/2015] [Accepted: 12/29/2015] [Indexed: 11/17/2022] Open
Abstract
We developed a scanning hard x-ray microscope using a new class of x-ray nano-focusing optic called a multilayer Laue lens and imaged a chromosome with nanoscale spatial resolution. The combination of the hard x-ray’s superior penetration power, high sensitivity to elemental composition, high spatial-resolution and quantitative analysis creates a unique tool with capabilities that other microscopy techniques cannot provide. Using this microscope, we simultaneously obtained absorption-, phase-, and fluorescence-contrast images of Pt-stained human chromosome samples. The high spatial-resolution of the microscope and its multi-modality imaging capabilities enabled us to observe the internal ultra-structures of a thick chromosome without sectioning it.
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Affiliation(s)
- Hanfei Yan
- National Synchrotron Light Source II, Brookhaven National Laboratory, Upton, NY 11973, USA
| | - Evgeny Nazaretski
- National Synchrotron Light Source II, Brookhaven National Laboratory, Upton, NY 11973, USA
| | - Kenneth Lauer
- National Synchrotron Light Source II, Brookhaven National Laboratory, Upton, NY 11973, USA
| | - Xiaojing Huang
- National Synchrotron Light Source II, Brookhaven National Laboratory, Upton, NY 11973, USA
| | - Ulrich Wagner
- Diamond Light Source Ltd, Didcot, Oxfordshire, OX11 0DE, UK
| | - Christoph Rau
- Diamond Light Source Ltd, Didcot, Oxfordshire, OX11 0DE, UK
| | - Mohammed Yusuf
- London Centre for Nanotechnology, University College London, London, WC1H 0AH, UK.,Research Complex at Harwell, Rutherford Appleton Laboratory, Didcot, OX11 0FA, UK
| | - Ian Robinson
- London Centre for Nanotechnology, University College London, London, WC1H 0AH, UK.,Research Complex at Harwell, Rutherford Appleton Laboratory, Didcot, OX11 0FA, UK
| | - Sebastian Kalbfleisch
- National Synchrotron Light Source II, Brookhaven National Laboratory, Upton, NY 11973, USA
| | - Li Li
- National Synchrotron Light Source II, Brookhaven National Laboratory, Upton, NY 11973, USA
| | - Nathalie Bouet
- National Synchrotron Light Source II, Brookhaven National Laboratory, Upton, NY 11973, USA
| | - Juan Zhou
- National Synchrotron Light Source II, Brookhaven National Laboratory, Upton, NY 11973, USA
| | - Ray Conley
- National Synchrotron Light Source II, Brookhaven National Laboratory, Upton, NY 11973, USA.,Advanced Photon Source, Argonne National Laboratory, Argonne, Illinois 60439, USA
| | - Yong S Chu
- National Synchrotron Light Source II, Brookhaven National Laboratory, Upton, NY 11973, USA
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13
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Huang X, Conley R, Bouet N, Zhou J, Macrander A, Maser J, Yan H, Nazaretski E, Lauer K, Harder R, Robinson IK, Kalbfleisch S, Chu YS. Achieving hard X-ray nanofocusing using a wedged multilayer Laue lens. OPTICS EXPRESS 2015; 23:12496-12507. [PMID: 26074505 DOI: 10.1364/oe.23.012496] [Citation(s) in RCA: 4] [Impact Index Per Article: 0.4] [Reference Citation Analysis] [Abstract] [Track Full Text] [Subscribe] [Scholar Register] [Indexed: 06/04/2023]
Abstract
We report on the fabrication and the characterization of a wedged multilayer Laue lens for x-ray nanofocusing. The lens was fabricated using a sputtering deposition technique, in which a specially designed mask was employed to introduce a thickness gradient in the lateral direction of the multilayer. X-ray characterization shows an efficiency of 27% and a focus size of 26 nm at 14.6 keV, in a good agreement with theoretical calculations. These results indicate that the desired wedging is achieved in the fabricated structure. We anticipate that continuous development on wedged MLLs will advance x-ray nanofocusing optics to new frontiers and enrich capabilities and opportunities for hard X-ray microscopy.
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14
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da Silva JC, Trtik P, Diaz A, Holler M, Guizar-Sicairos M, Raabe J, Bunk O, Menzel A. Mass density and water content of saturated never-dried calcium silicate hydrates. LANGMUIR : THE ACS JOURNAL OF SURFACES AND COLLOIDS 2015; 31:3779-83. [PMID: 25794183 DOI: 10.1021/la504478j] [Citation(s) in RCA: 11] [Impact Index Per Article: 1.1] [Reference Citation Analysis] [Abstract] [Track Full Text] [Subscribe] [Scholar Register] [Indexed: 05/25/2023]
Abstract
Calcium silicate hydrates (C-S-H) are the most abundant hydration products in ordinary Portland cement paste. Yet, despite the critical role they play in determining mechanical and transport properties, there is still a debate about their density and exact composition. Here, the site-specific mass density and composition of C-S-H in hydrated cement paste are determined with nanoscale resolution in a nondestructive approach. We used ptychographic X-ray computed tomography in order to determine spatially resolved mass density and water content of the C-S-H within the microstructure of the cement paste. Our findings indicate that the C-S-H at the border of hydrated alite particles possibly have a higher density than the apparent inner-product C-S-H, which is contrary to the common expectations from previous works on hydrated cement paste.
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Affiliation(s)
| | - Pavel Trtik
- †Paul Scherrer Institut, Villigen PSI, 5232, Switzerland
- ‡Faculty of Civil Engineering, Czech Technical University in Prague, Prague, 166 36, Czech Republic
- §Laboratory for Concrete and Construction Chemistry, EMPA, Dübendorf, 8600, Switzerland
| | - Ana Diaz
- †Paul Scherrer Institut, Villigen PSI, 5232, Switzerland
| | - Mirko Holler
- †Paul Scherrer Institut, Villigen PSI, 5232, Switzerland
| | | | - Jörg Raabe
- †Paul Scherrer Institut, Villigen PSI, 5232, Switzerland
| | - Oliver Bunk
- †Paul Scherrer Institut, Villigen PSI, 5232, Switzerland
| | - Andreas Menzel
- †Paul Scherrer Institut, Villigen PSI, 5232, Switzerland
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15
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Nazaretski E, Lauer K, Yan H, Bouet N, Zhou J, Conley R, Huang X, Xu W, Lu M, Gofron K, Kalbfleisch S, Wagner U, Rau C, Chu YS. Pushing the limits: an instrument for hard X-ray imaging below 20 nm. JOURNAL OF SYNCHROTRON RADIATION 2015; 22:336-341. [PMID: 25723934 DOI: 10.1107/s1600577514025715] [Citation(s) in RCA: 25] [Impact Index Per Article: 2.5] [Reference Citation Analysis] [Abstract] [Key Words] [Track Full Text] [Subscribe] [Scholar Register] [Received: 08/29/2014] [Accepted: 11/24/2014] [Indexed: 06/04/2023]
Abstract
Hard X-ray microscopy is a prominent tool suitable for nanoscale-resolution non-destructive imaging of various materials used in different areas of science and technology. With an ongoing effort to push the 2D/3D imaging resolution down to 10 nm in the hard X-ray regime, both the fabrication of nano-focusing optics and the stability of the microscope using those optics become extremely challenging. In this work a microscopy system designed and constructed to accommodate multilayer Laue lenses as nanofocusing optics is presented. The developed apparatus has been thoroughly characterized in terms of resolution and stability followed by imaging experiments at a synchrotron facility. Drift rates of ∼2 nm h(-1) accompanied by 13 nm × 33 nm imaging resolution at 11.8 keV are reported.
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Affiliation(s)
| | - K Lauer
- Brookhaven National Laboratory, Upton, NY, USA
| | - H Yan
- Brookhaven National Laboratory, Upton, NY, USA
| | - N Bouet
- Brookhaven National Laboratory, Upton, NY, USA
| | - J Zhou
- Brookhaven National Laboratory, Upton, NY, USA
| | - R Conley
- Brookhaven National Laboratory, Upton, NY, USA
| | - X Huang
- Brookhaven National Laboratory, Upton, NY, USA
| | - W Xu
- Brookhaven National Laboratory, Upton, NY, USA
| | - M Lu
- Brookhaven National Laboratory, Upton, NY, USA
| | - K Gofron
- Brookhaven National Laboratory, Upton, NY, USA
| | | | - U Wagner
- Diamond Light Source Ltd, Didcot, Oxfordshire OX11 0DE, UK
| | - C Rau
- Diamond Light Source Ltd, Didcot, Oxfordshire OX11 0DE, UK
| | - Y S Chu
- Brookhaven National Laboratory, Upton, NY, USA
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16
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Osterhoff M, Eberl C, Döring F, Wilke RN, Wallentin J, Krebs HU, Sprung M, Salditt T. Towards multi-order hard X-ray imaging with multilayer zone plates. J Appl Crystallogr 2015; 48:116-124. [PMID: 26089748 PMCID: PMC4453173 DOI: 10.1107/s1600576714026016] [Citation(s) in RCA: 10] [Impact Index Per Article: 1.0] [Reference Citation Analysis] [Abstract] [Key Words] [Track Full Text] [Download PDF] [Figures] [Journal Information] [Subscribe] [Scholar Register] [Received: 08/22/2014] [Accepted: 11/27/2014] [Indexed: 11/29/2022] Open
Abstract
This article describes holographic imaging experiments using a hard X-ray multilayer zone plate (MZP) with an outermost zone width of 10 nm at a photon energy of 18 keV. An order-sorting aperture (OSA) is omitted and emulated during data analysis by a 'software OSA'. Scanning transmission X-ray microscopy usually carried out in the focal plane is generalized to the holographic regime. The MZP focus is characterized by a three-plane phase-retrieval algorithm to an FWHM of 10 nm.
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Affiliation(s)
- Markus Osterhoff
- Institut für Röntgenphysik, Georg-August-Universität Göttingen, Friedrich-Hund-Platz 1, 37077 Göttingen, Germany
| | - Christian Eberl
- Institut für Materialphysik, Georg-August-Universität Göttingen, Friedrich-Hund-Platz 1, 37077 Göttingen, Germany
| | - Florian Döring
- Institut für Materialphysik, Georg-August-Universität Göttingen, Friedrich-Hund-Platz 1, 37077 Göttingen, Germany
| | - Robin N. Wilke
- Institut für Röntgenphysik, Georg-August-Universität Göttingen, Friedrich-Hund-Platz 1, 37077 Göttingen, Germany
| | - Jesper Wallentin
- Institut für Röntgenphysik, Georg-August-Universität Göttingen, Friedrich-Hund-Platz 1, 37077 Göttingen, Germany
| | - Hans-Ulrich Krebs
- Institut für Materialphysik, Georg-August-Universität Göttingen, Friedrich-Hund-Platz 1, 37077 Göttingen, Germany
| | - Michael Sprung
- DESY Photon Science, Notkestrasse 85, 22607 Hamburg, Germany
| | - Tim Salditt
- Institut für Röntgenphysik, Georg-August-Universität Göttingen, Friedrich-Hund-Platz 1, 37077 Göttingen, Germany
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17
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Laanait N, Zhang Z, Schlepütz CM, Vila-Comamala J, Highland MJ, Fenter P. Full-field X-ray reflection microscopy of epitaxial thin-films. JOURNAL OF SYNCHROTRON RADIATION 2014; 21:1252-1261. [PMID: 25343792 DOI: 10.1107/s1600577514016555] [Citation(s) in RCA: 7] [Impact Index Per Article: 0.6] [Reference Citation Analysis] [Abstract] [Key Words] [Track Full Text] [Subscribe] [Scholar Register] [Received: 04/24/2014] [Accepted: 07/16/2014] [Indexed: 06/04/2023]
Abstract
Novel X-ray imaging of structural domains in a ferroelectric epitaxial thin film using diffraction contrast is presented. The full-field hard X-ray microscope uses the surface scattering signal, in a reflectivity or diffraction experiment, to spatially resolve the local structure with 70 nm lateral spatial resolution and sub-nanometer height sensitivity. Sub-second X-ray exposures can be used to acquire a 14 µm × 14 µm image with an effective pixel size of 20 nm on the sample. The optical configuration and various engineering considerations that are necessary to achieve optimal imaging resolution and contrast in this type of microscopy are discussed.
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Affiliation(s)
- Nouamane Laanait
- Chemical Sciences and Engineering Division, Argonne National Laboratory, Argonne, IL 60439, USA
| | - Zhan Zhang
- X-ray Science Division, Argonne National Laboratory, Argonne, IL 60439, USA
| | | | - Joan Vila-Comamala
- X-ray Science Division, Argonne National Laboratory, Argonne, IL 60439, USA
| | - Matthew J Highland
- Materials Science Division, Argonne National Laboratory, Argonne, IL 60439, USA
| | - Paul Fenter
- Chemical Sciences and Engineering Division, Argonne National Laboratory, Argonne, IL 60439, USA
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18
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Liao K, Hong Y, Sheng W. Wavefront aberrations of x-ray dynamical diffraction beams. APPLIED OPTICS 2014; 53:6362-6370. [PMID: 25322219 DOI: 10.1364/ao.53.006362] [Citation(s) in RCA: 0] [Impact Index Per Article: 0] [Reference Citation Analysis] [Abstract] [MESH Headings] [Track Full Text] [Subscribe] [Scholar Register] [Received: 07/02/2014] [Accepted: 08/18/2014] [Indexed: 06/04/2023]
Abstract
The effects of dynamical diffraction in x-ray diffractive optics with large numerical aperture render the wavefront aberrations difficult to describe using the aberration polynomials, yet knowledge of them plays an important role in a vast variety of scientific problems ranging from optical testing to adaptive optics. Although the diffraction theory of optical aberrations was established decades ago, its application in the area of x-ray dynamical diffraction theory (DDT) is still lacking. Here, we conduct a theoretical study on the aberration properties of x-ray dynamical diffraction beams. By treating the modulus of the complex envelope as the amplitude weight function in the orthogonalization procedure, we generalize the nonrecursive matrix method for the determination of orthonormal aberration polynomials, wherein Zernike DDT and Legendre DDT polynomials are proposed. As an example, we investigate the aberration evolution inside a tilted multilayer Laue lens. The corresponding Legendre DDT polynomials are obtained numerically, which represent balanced aberrations yielding minimum variance of the classical aberrations of an anamorphic optical system. The balancing of classical aberrations and their standard deviations are discussed. We also present the Strehl ratio of the primary and secondary balanced aberrations.
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19
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Thibault P, Guizar-Sicairos M, Menzel A. Coherent imaging at the diffraction limit. JOURNAL OF SYNCHROTRON RADIATION 2014; 21:1011-8. [PMID: 25177990 PMCID: PMC4181642 DOI: 10.1107/s1600577514015343] [Citation(s) in RCA: 16] [Impact Index Per Article: 1.5] [Reference Citation Analysis] [Abstract] [Key Words] [Track Full Text] [Subscribe] [Scholar Register] [Received: 03/21/2014] [Accepted: 06/30/2014] [Indexed: 05/29/2023]
Abstract
X-ray ptychography, a scanning coherent diffractive imaging technique, holds promise for imaging with dose-limited resolution and sensitivity. If the foreseen increase of coherent flux by orders of magnitude can be matched by additional technological and analytical advances, ptychography may approach imaging speeds familiar from full-field methods while retaining its inherently quantitative nature and metrological versatility. Beyond promises of high throughput, spectroscopic applications in three dimensions become feasible, as do measurements of sample dynamics through time-resolved imaging or careful characterization of decoherence effects.
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Affiliation(s)
- Pierre Thibault
- Department of Physics and Astronomy, University College London, UK
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20
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Kubec A, Braun S, Niese S, Krüger P, Patommel J, Hecker M, Leson A, Schroer CG. Ptychography with multilayer Laue lenses. JOURNAL OF SYNCHROTRON RADIATION 2014; 21:1122-1127. [PMID: 25178001 DOI: 10.1107/s1600577514014556] [Citation(s) in RCA: 2] [Impact Index Per Article: 0.2] [Reference Citation Analysis] [Abstract] [Key Words] [Track Full Text] [Subscribe] [Scholar Register] [Received: 02/13/2014] [Accepted: 06/20/2014] [Indexed: 06/03/2023]
Abstract
Two different multilayer Laue lens designs were made with total deposition thicknesses of 48 µm and 53 µm, and focal lengths of 20.0 mm and 12.5 mm at 20.0 keV, respectively. From these two multilayer systems, several lenses were manufactured for one- and two-dimensional focusing. The latter is realised with a directly bonded assembly of two crossed lenses, that reduces the distance between the lenses in the beam direction to 30 µm and eliminates the necessity of producing different multilayer systems. Characterization of lens fabrication was performed using a laboratory X-ray microscope. Focusing properties have been investigated using ptychography.
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Affiliation(s)
- Adam Kubec
- Institute for Materials Science and Max Bergmann Center of Biomaterials, Technische Universität Dresden, 01062 Dresden, Germany
| | - Stefan Braun
- Fraunhofer Institute for Material and Beam Technology, Winterbergstraße 28, 01277 Dresden, Germany
| | - Sven Niese
- Fraunhofer Institute for Ceramic Technologies and Systems, Winterbergstraße 28, 01277 Dresden, Germany
| | - Peter Krüger
- Fraunhofer Institute for Ceramic Technologies and Systems, Winterbergstraße 28, 01277 Dresden, Germany
| | - Jens Patommel
- Institute of Structural Physics, Technische Universität Dresden, 01069 Dresden, Germany
| | - Michael Hecker
- Center for Complex Analysis, GLOBALFOUNDRIES Dresden Module One LLC and Co KG, Wilschdorfer Landstraße 101, 01109 Dresden, Germany
| | - Andreas Leson
- Fraunhofer Institute for Material and Beam Technology, Winterbergstraße 28, 01277 Dresden, Germany
| | - Christian G Schroer
- Institute of Structural Physics, Technische Universität Dresden, 01069 Dresden, Germany
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21
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Hitchcock AP, Toney MF. Spectromicroscopy and coherent diffraction imaging: focus on energy materials applications. JOURNAL OF SYNCHROTRON RADIATION 2014; 21:1019-1030. [PMID: 25177991 DOI: 10.1107/s1600577514013046] [Citation(s) in RCA: 3] [Impact Index Per Article: 0.3] [Reference Citation Analysis] [Abstract] [Key Words] [MESH Headings] [Grants] [Track Full Text] [Subscribe] [Scholar Register] [Received: 03/26/2014] [Accepted: 06/04/2014] [Indexed: 06/03/2023]
Abstract
Current and future capabilities of X-ray spectromicroscopy are discussed based on coherence-limited imaging methods which will benefit from the dramatic increase in brightness expected from a diffraction-limited storage ring (DLSR). The methods discussed include advanced coherent diffraction techniques and nanoprobe-based real-space imaging using Fresnel zone plates or other diffractive optics whose performance is affected by the degree of coherence. The capabilities of current systems, improvements which can be expected, and some of the important scientific themes which will be impacted are described, with focus on energy materials applications. Potential performance improvements of these techniques based on anticipated DLSR performance are estimated. Several examples of energy sciences research problems which are out of reach of current instrumentation, but which might be solved with the enhanced DLSR performance, are discussed.
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Affiliation(s)
- Adam P Hitchcock
- Brockhouse Institute for Materials Research, McMaster University, Hamilton, Ontario, Canada L8S 4M1
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22
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Gofron KJ, Lauer K, Nazaretski E, Yan H, Kalbfleisch S, Greer A, Dalesio B, Chu YS. Piezo control for 1 nm spatial resolution synchrotron X-ray microscopy. ACTA ACUST UNITED AC 2014. [DOI: 10.1088/1742-6596/493/1/012026] [Citation(s) in RCA: 2] [Impact Index Per Article: 0.2] [Reference Citation Analysis] [Track Full Text] [Journal Information] [Subscribe] [Scholar Register] [Indexed: 11/11/2022]
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23
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Nazaretski E, Huang X, Yan H, Lauer K, Conley R, Bouet N, Zhou J, Xu W, Eom D, Legnini D, Harder R, Lin CH, Chen YS, Hwu Y, Chu YS. Design and performance of a scanning ptychography microscope. THE REVIEW OF SCIENTIFIC INSTRUMENTS 2014; 85:033707. [PMID: 24689592 DOI: 10.1063/1.4868968] [Citation(s) in RCA: 22] [Impact Index Per Article: 2.0] [Reference Citation Analysis] [Abstract] [Track Full Text] [Subscribe] [Scholar Register] [Indexed: 06/03/2023]
Abstract
We have designed and constructed a dedicated instrument to perform ptychography measurements and characterization of multilayer Laue lenses nanofocusing optics. The design of the scanning microscope provides stability of components and minimal thermal drifts, requirements for nanometer scale spatial resolution measurements. We performed thorough laboratory characterization of the instrument in terms of resolution and thermal drifts with subsequent measurements at a synchrotron. We have successfully acquired and reconstructed ptychography data yielding 11 nm line focus.
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Affiliation(s)
- E Nazaretski
- Brookhaven National Laboratory, Upton, New York 11973, USA
| | - X Huang
- Brookhaven National Laboratory, Upton, New York 11973, USA
| | - H Yan
- Brookhaven National Laboratory, Upton, New York 11973, USA
| | - K Lauer
- Brookhaven National Laboratory, Upton, New York 11973, USA
| | - R Conley
- Brookhaven National Laboratory, Upton, New York 11973, USA
| | - N Bouet
- Brookhaven National Laboratory, Upton, New York 11973, USA
| | - J Zhou
- Brookhaven National Laboratory, Upton, New York 11973, USA
| | - W Xu
- Brookhaven National Laboratory, Upton, New York 11973, USA
| | - D Eom
- Brookhaven National Laboratory, Upton, New York 11973, USA
| | - D Legnini
- Advanced Photon Source, Argonne National Laboratory, Argonne, Illinois 60439, USA
| | - R Harder
- Advanced Photon Source, Argonne National Laboratory, Argonne, Illinois 60439, USA
| | - C-H Lin
- Institute of Physics, Academia Sinica, Taipei 11529, Taiwan
| | - Y-S Chen
- Institute of Physics, Academia Sinica, Taipei 11529, Taiwan
| | - Y Hwu
- Institute of Physics, Academia Sinica, Taipei 11529, Taiwan
| | - Y S Chu
- Brookhaven National Laboratory, Upton, New York 11973, USA
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24
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Greenberg JA, Hassan M, Krishnamurthy K, Brady D. Structured illumination for tomographic X-ray diffraction imaging. Analyst 2014; 139:709-13. [DOI: 10.1039/c3an01641b] [Citation(s) in RCA: 17] [Impact Index Per Article: 1.5] [Reference Citation Analysis] [Track Full Text] [Journal Information] [Subscribe] [Scholar Register] [Indexed: 11/21/2022]
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25
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Huang X, Yan H, Nazaretski E, Conley R, Bouet N, Zhou J, Lauer K, Li L, Eom D, Legnini D, Harder R, Robinson IK, Chu YS. 11 nm hard X-ray focus from a large-aperture multilayer Laue lens. Sci Rep 2013; 3:3562. [PMID: 24356395 PMCID: PMC3868962 DOI: 10.1038/srep03562] [Citation(s) in RCA: 110] [Impact Index Per Article: 9.2] [Reference Citation Analysis] [Abstract] [Track Full Text] [Download PDF] [Figures] [Journal Information] [Subscribe] [Scholar Register] [Received: 11/13/2013] [Accepted: 11/28/2013] [Indexed: 01/21/2023] Open
Abstract
The focusing performance of a multilayer Laue lens (MLL) with 43.4 μm aperture, 4 nm finest zone width and 4.2 mm focal length at 12 keV was characterized with X-rays using ptychography method. The reconstructed probe shows a full-width-at-half-maximum (FWHM) peak size of 11.2 nm. The obtained X-ray wavefront shows excellent agreement with the dynamical calculations, exhibiting aberrations less than 0.3 wave period, which ensures the MLL capable of producing a diffraction-limited focus while offering a sufficient working distance. This achievement opens up opportunities of incorporating a variety of in-situ experiments into ultra high-resolution X-ray microscopy studies.
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Affiliation(s)
- Xiaojing Huang
- National Synchrotron Light Source II, Brookhaven National Laboratory, Upton, NY 11973, USA
| | - Hanfei Yan
- National Synchrotron Light Source II, Brookhaven National Laboratory, Upton, NY 11973, USA
| | - Evgeny Nazaretski
- National Synchrotron Light Source II, Brookhaven National Laboratory, Upton, NY 11973, USA
| | - Raymond Conley
- 1] National Synchrotron Light Source II, Brookhaven National Laboratory, Upton, NY 11973, USA [2] Advanced Photon Source, Argonne National Laboratory, Argonne, IL 60439, USA
| | - Nathalie Bouet
- National Synchrotron Light Source II, Brookhaven National Laboratory, Upton, NY 11973, USA
| | - Juan Zhou
- National Synchrotron Light Source II, Brookhaven National Laboratory, Upton, NY 11973, USA
| | - Kenneth Lauer
- National Synchrotron Light Source II, Brookhaven National Laboratory, Upton, NY 11973, USA
| | - Li Li
- National Synchrotron Light Source II, Brookhaven National Laboratory, Upton, NY 11973, USA
| | - Daejin Eom
- 1] National Synchrotron Light Source II, Brookhaven National Laboratory, Upton, NY 11973, USA [2]
| | - Daniel Legnini
- Advanced Photon Source, Argonne National Laboratory, Argonne, IL 60439, USA
| | - Ross Harder
- Advanced Photon Source, Argonne National Laboratory, Argonne, IL 60439, USA
| | - Ian K Robinson
- 1] London Centre for Nanotechnology, University College London, London, WC1H 0AH, UK [2] Research Complex at Harwell, Didcot, Oxfordshire OX11 0DE, UK
| | - Yong S Chu
- National Synchrotron Light Source II, Brookhaven National Laboratory, Upton, NY 11973, USA
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26
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Greenberg JA, Krishnamurthy K, Brady D. Snapshot molecular imaging using coded energy-sensitive detection. OPTICS EXPRESS 2013; 21:25480-25491. [PMID: 24150387 DOI: 10.1364/oe.21.025480] [Citation(s) in RCA: 20] [Impact Index Per Article: 1.7] [Reference Citation Analysis] [Abstract] [MESH Headings] [Track Full Text] [Subscribe] [Scholar Register] [Indexed: 06/02/2023]
Abstract
We demonstrate a technique for measuring the range-resolved coherent scatter form factors of different objects from a single snapshot. By illuminating the object with an x-ray pencil beam and placing a coded aperture in front of a linear array of energy-sensitive detector elements, we record the coherently scattered x-rays. This approach yields lateral, range, and momentum transfer resolutions of 1 mm, 5 mm, and 0.2 nm⁻¹, respectively, which is sufficient for the distinguishing a variety of solids and liquids. These results indicate a path toward real-time volumetric molecular imaging for non-destructive examination in a variety of applications, including medical diagnostics, quality inspection, and security detection.
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27
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Kang HC, Yan H, Chu YS, Lee SY, Kim J, Nazaretski E, Kim C, Seo O, Noh DY, Macrander AT, Stephenson GB, Maser J. Oxidation of PtNi nanoparticles studied by a scanning X-ray fluorescence microscope with multi-layer Laue lenses. NANOSCALE 2013; 5:7184-7187. [PMID: 23674261 DOI: 10.1039/c3nr00396e] [Citation(s) in RCA: 5] [Impact Index Per Article: 0.4] [Reference Citation Analysis] [Abstract] [Track Full Text] [Subscribe] [Scholar Register] [Indexed: 06/02/2023]
Abstract
We report a study of the oxidation process of individual PtNi nanoparticles (NPs) conducted with a novel scanning multi-layer Laue lens X-ray microscope. The elemental maps reveal that alloyed PtNi NPs were transformed into Pt/NiO core-shell NPs by thermal oxidation. The observations furthermore indicate that a coalescence of Pt/NiO core-shell NPs occurred during oxidation.
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Affiliation(s)
- Hyon Chol Kang
- Department of Advanced Engineering Materials, Chosun University, Gwangju 501-759, Republic of Korea.
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28
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Cocco AP, Nelson GJ, Harris WM, Nakajo A, Myles TD, Kiss AM, Lombardo JJ, Chiu WKS. Three-dimensional microstructural imaging methods for energy materials. Phys Chem Chem Phys 2013; 15:16377-407. [DOI: 10.1039/c3cp52356j] [Citation(s) in RCA: 66] [Impact Index Per Article: 5.5] [Reference Citation Analysis] [Track Full Text] [Journal Information] [Subscribe] [Scholar Register] [Indexed: 11/21/2022]
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