1
|
Gong X, Zhou Y, Xia J, Zhang L, Zhang L, Yin LJ, Hu Y, Qin Z, Tian Y. Tunable non-volatile memories based on 2D InSe/ h-BN/GaSe heterostructures towards potential multifunctionality. NANOSCALE 2023; 15:14448-14457. [PMID: 37615579 DOI: 10.1039/d3nr02995f] [Citation(s) in RCA: 0] [Impact Index Per Article: 0] [Reference Citation Analysis] [Abstract] [Track Full Text] [Subscribe] [Scholar Register] [Indexed: 08/25/2023]
Abstract
Floating-gate memories based on two-dimensional van der Waal (2D vdW) heterostructures play an important role in the development of next-generation information technology. The diversity of 2D vdW materials and their heterostructures provides flexibility in the design of novel storage architectures. However, 2D InSe/h-BN/GaSe heterostructures are rarely reported in the field of tunable non-volatile memories, probably due to the quality limitation of materials and complex interfaces from stackings. Herein, a floating-gate 2D InSe/h-BN/GaSe memory with high performance and atmosphere stability is demonstrated. It exhibits both a large ON/OFF current ratio of ∼105 and a good extinction ratio of ∼103, with an estimated maximum storage capacity of 5.1 × 1012 cm-2. Moreover, the storage performance can be regulated by optimizing the thickness of the insulating h-BN layer. Different device configurations have been explored to validate the working mechanism. Furthermore, a simulation of biological synaptic behavior is achieved on the same prototype device. The enhanced non-volatile characteristics enable the exploration of the integrated 2D memory and potential multifunctionality.
Collapse
Affiliation(s)
- Xiang Gong
- Key Laboratory for Micro/Nano Optoelectronic Devices of Ministry of Education & Hunan Provincial Key Laboratory of Low-Dimensional Structural Physics and Devices, School of Physics and Electronics, Hunan University, Changsha 410082, P.R. China.
| | - Yueying Zhou
- Key Laboratory for Micro/Nano Optoelectronic Devices of Ministry of Education & Hunan Provincial Key Laboratory of Low-Dimensional Structural Physics and Devices, School of Physics and Electronics, Hunan University, Changsha 410082, P.R. China.
| | - Jiangnan Xia
- Key Laboratory for Micro/Nano Optoelectronic Devices of Ministry of Education & Hunan Provincial Key Laboratory of Low-Dimensional Structural Physics and Devices, School of Physics and Electronics, Hunan University, Changsha 410082, P.R. China.
| | - Li Zhang
- Key Laboratory for Micro/Nano Optoelectronic Devices of Ministry of Education & Hunan Provincial Key Laboratory of Low-Dimensional Structural Physics and Devices, School of Physics and Electronics, Hunan University, Changsha 410082, P.R. China.
| | - Lijie Zhang
- Key Laboratory for Micro/Nano Optoelectronic Devices of Ministry of Education & Hunan Provincial Key Laboratory of Low-Dimensional Structural Physics and Devices, School of Physics and Electronics, Hunan University, Changsha 410082, P.R. China.
| | - Long-Jing Yin
- Key Laboratory for Micro/Nano Optoelectronic Devices of Ministry of Education & Hunan Provincial Key Laboratory of Low-Dimensional Structural Physics and Devices, School of Physics and Electronics, Hunan University, Changsha 410082, P.R. China.
| | - Yuanyuan Hu
- College of Semiconductors (College of Integrated Circuits), Hunan University, Changsha 410082, China
- International Science and Technology Innovation Cooperation Base for Advanced Display Technologies of Hunan Province, China
| | - Zhihui Qin
- Key Laboratory for Micro/Nano Optoelectronic Devices of Ministry of Education & Hunan Provincial Key Laboratory of Low-Dimensional Structural Physics and Devices, School of Physics and Electronics, Hunan University, Changsha 410082, P.R. China.
| | - Yuan Tian
- Key Laboratory for Micro/Nano Optoelectronic Devices of Ministry of Education & Hunan Provincial Key Laboratory of Low-Dimensional Structural Physics and Devices, School of Physics and Electronics, Hunan University, Changsha 410082, P.R. China.
- International Science and Technology Innovation Cooperation Base for Advanced Display Technologies of Hunan Province, China
| |
Collapse
|
2
|
Liao J, Wen W, Wu J, Zhou Y, Hussain S, Hu H, Li J, Liaqat A, Zhu H, Jiao L, Zheng Q, Xie L. Van der Waals Ferroelectric Semiconductor Field Effect Transistor for In-Memory Computing. ACS NANO 2023; 17:6095-6102. [PMID: 36912657 DOI: 10.1021/acsnano.3c01198] [Citation(s) in RCA: 5] [Impact Index Per Article: 5.0] [Reference Citation Analysis] [Abstract] [Key Words] [Track Full Text] [Subscribe] [Scholar Register] [Indexed: 06/18/2023]
Abstract
In-memory computing is a highly efficient approach for breaking the bottleneck of von Neumann architectures, i.e., reducing redundant latency and energy consumption during the data transfer between the physically separated memory and processing units. Herein we have designed a in-memory computing device, a van der Waals ferroelectric semiconductor (InSe) based metal-oxide-ferroelectric semiconductor field-effect transistor (MOfeS-FET). This MOfeS-FET integrates memory and logic functions in the same material, in which the out-of-plane (OOP) ferroelectric polarization in InSe is used for data storage and the semiconducting property is used for the logic computation. The MOfeS-FET shows a long retention time with high on/off ratios (>106), high program/erase (P/E) ratios (103), and stable cyclic endurance. Moreover, inverter, programmable NAND, and NOR Boolean logic operations with nonvolatile storage of the results have all been demonstrated using our approach. These findings highlight the potential of van der Waals ferroelectric semiconductor-based MOfeS-FETs in the in-memory computing and their potential of achieving size scaling beyond Moore's law.
Collapse
Affiliation(s)
- Junyi Liao
- CAS Key Laboratory of Standardization and Measurement for Nanotechnology, National Center for Nanoscience and Technology, Beijing 100190, P.R. China
- Department of Chemistry, Tsinghua University, Beijing 100084, P.R. China
- University of Chinese Academy of Sciences, Beijing 100049, P.R. China
| | - Wen Wen
- CAS Key Laboratory of Standardization and Measurement for Nanotechnology, National Center for Nanoscience and Technology, Beijing 100190, P.R. China
| | - Juanxia Wu
- CAS Key Laboratory of Standardization and Measurement for Nanotechnology, National Center for Nanoscience and Technology, Beijing 100190, P.R. China
| | - Yaming Zhou
- Department of Chemistry, Tsinghua University, Beijing 100084, P.R. China
| | - Sabir Hussain
- CAS Key Laboratory of Standardization and Measurement for Nanotechnology, National Center for Nanoscience and Technology, Beijing 100190, P.R. China
| | - Haowen Hu
- School of Materials Science and Engineering, Tsinghua University, Beijing 100084, P.R. China
| | - Jiawei Li
- School of Materials Science and Engineering, Tsinghua University, Beijing 100084, P.R. China
| | - Adeel Liaqat
- CAS Key Laboratory of Standardization and Measurement for Nanotechnology, National Center for Nanoscience and Technology, Beijing 100190, P.R. China
| | - Hongwei Zhu
- School of Materials Science and Engineering, Tsinghua University, Beijing 100084, P.R. China
| | - Liying Jiao
- Department of Chemistry, Tsinghua University, Beijing 100084, P.R. China
| | - Qiang Zheng
- CAS Key Laboratory of Standardization and Measurement for Nanotechnology, National Center for Nanoscience and Technology, Beijing 100190, P.R. China
- University of Chinese Academy of Sciences, Beijing 100049, P.R. China
| | - Liming Xie
- CAS Key Laboratory of Standardization and Measurement for Nanotechnology, National Center for Nanoscience and Technology, Beijing 100190, P.R. China
- University of Chinese Academy of Sciences, Beijing 100049, P.R. China
| |
Collapse
|
3
|
Wang J, Yue X, Zhu J, Hu L, Liu R, Cong C, Qiu ZJ. Revealing the origin of PL evolution of InSe flake induced by laser irradiation. RSC Adv 2023; 13:7780-7788. [PMID: 36909766 PMCID: PMC9994422 DOI: 10.1039/d3ra00324h] [Citation(s) in RCA: 0] [Impact Index Per Article: 0] [Reference Citation Analysis] [Abstract] [Track Full Text] [Journal Information] [Subscribe] [Scholar Register] [Received: 01/16/2023] [Accepted: 03/01/2023] [Indexed: 03/11/2023] Open
Abstract
Two-dimensional InSe has been considered as a promising candidate for novel optoelectronic devices owing to large electron mobility and a near-infrared optical band gap. However, its widespread applications suffer from environmental instability. A lot of theoretical studies on the degradation mechanism of InSe have been reported whereas the experimental proofs are few. Meanwhile, the role of the extrinsic environment is still obscure during the degradation. As a common technique of studying the degradation mechanism of 2D materials, laser irradiation exhibits many unique advantages, such as being fast, convenient, and offering in situ compatibility. Here, we have developed a laser-treated method, which involves performing repeated measurements at the same point while monitoring the evolution of the resulting PL, to systematically study the photo-induced degradation process of InSe. Interestingly, we observe different evolution behavior of PL intensity under weak irradiation and strong irradiation. Our experimental results indicate the vacancy passivation and degrading effect simultaneously occurring in InSe under a weak laser irradiation, resulting in the PL increasing first and then decreasing during the measurement. Meanwhile we also notice that the passivation has a stronger effect on the PL than the degrading effect of weak oxidation. In contrast, under a strong laser irradiation, the InSe suffers serious destruction caused by excess heating and intense oxidation. This leads to a direct decrease of PL and corresponding oxidative products. Our work provides a reliable experimental supplement to the photo oxidation study of InSe and opens up a new avenue to regulate the PL of InSe.
Collapse
Affiliation(s)
- Jing Wang
- State Key Laboratory of ASIC & System, School of Information Science and Technology, Fudan University Shanghai 200433 China
| | - Xiaofei Yue
- State Key Laboratory of ASIC & System, School of Information Science and Technology, Fudan University Shanghai 200433 China
| | - JunQiang Zhu
- State Key Laboratory of ASIC & System, School of Information Science and Technology, Fudan University Shanghai 200433 China
| | - Laigui Hu
- State Key Laboratory of ASIC & System, School of Information Science and Technology, Fudan University Shanghai 200433 China
| | - Ran Liu
- State Key Laboratory of ASIC & System, School of Information Science and Technology, Fudan University Shanghai 200433 China
| | - Chunxiao Cong
- State Key Laboratory of ASIC & System, School of Information Science and Technology, Fudan University Shanghai 200433 China .,Yiwu Research Institute of Fudan University Yiwu City 322000 Zhejiang China
| | - Zhi-Jun Qiu
- State Key Laboratory of ASIC & System, School of Information Science and Technology, Fudan University Shanghai 200433 China
| |
Collapse
|
4
|
Singh P, Baek S, Yoo HH, Niu J, Park JH, Lee S. Two-Dimensional CIPS-InSe van der Waal Heterostructure Ferroelectric Field Effect Transistor for Nonvolatile Memory Applications. ACS NANO 2022; 16:5418-5426. [PMID: 35234041 DOI: 10.1021/acsnano.1c09136] [Citation(s) in RCA: 19] [Impact Index Per Article: 9.5] [Reference Citation Analysis] [Abstract] [Key Words] [Track Full Text] [Subscribe] [Scholar Register] [Indexed: 06/14/2023]
Abstract
Channel current conduction modulation with the spontaneous polarization of ferroelectric films in ferroelectric field-effect transistors (FeFETs) has been widely investigated. Low interface quality and thermodynamic instability owing to the presence of dangling bonds in the conventional ferroelectrics have limited the memory retention and endurance of FeFETs. This, in turn, prevents their commercialization. However, the atomically thin nature of 2D ferroelectric, semiconducting, and insulating films facilitate the achievement of trap-free interfaces as van der Waal heterostructures (vdWHs) to develop FeFETs with long data retention and endurance characteristics. Here, we demonstrate a 2D vdWH FeFET fabricated with ferroelectric CuInP2S6 (CIPS), hexagonal boron nitride (h-BN) as the dielectric, and InSe as the ferroelectric semiconductor channel. The device shows an excellent performance as nonvolatile memory (NVM) with its large memory window (4.6 V at a voltage sweep of 5 V), high drain current on/off ratio (>104), high endurance, and long data retention (>104 s). These results demonstrate the considerable potential of vdWHs for the development of FeFETs for logic and NVM applications.
Collapse
Affiliation(s)
- Prashant Singh
- SKKUAdvanced Institute of Nanotechnology (SAINT), Sungkyunkwan University, Suwon 440-746, Korea
| | - Sungpyo Baek
- SKKUAdvanced Institute of Nanotechnology (SAINT), Sungkyunkwan University, Suwon 440-746, Korea
| | - Hyun Ho Yoo
- SKKUAdvanced Institute of Nanotechnology (SAINT), Sungkyunkwan University, Suwon 440-746, Korea
| | - Jingjie Niu
- SKKUAdvanced Institute of Nanotechnology (SAINT), Sungkyunkwan University, Suwon 440-746, Korea
| | - Jin-Hong Park
- SKKUAdvanced Institute of Nanotechnology (SAINT), Sungkyunkwan University, Suwon 440-746, Korea
| | - Sungjoo Lee
- SKKUAdvanced Institute of Nanotechnology (SAINT), Sungkyunkwan University, Suwon 440-746, Korea
- Department of Nano Engineering, Sungkyunkwan University, Suwon 440-746, Korea
| |
Collapse
|
5
|
Sui F, Jin M, Zhang Y, Hong J, Cheng Y, Qi R, Yue F, Huang R. Atomic insights into the influence of Bi doping on the optical properties of two-dimensional van der Waals layered InSe. JOURNAL OF PHYSICS. CONDENSED MATTER : AN INSTITUTE OF PHYSICS JOURNAL 2022; 34:224006. [PMID: 35290970 DOI: 10.1088/1361-648x/ac5e07] [Citation(s) in RCA: 0] [Impact Index Per Article: 0] [Reference Citation Analysis] [Abstract] [Key Words] [Track Full Text] [Subscribe] [Scholar Register] [Received: 12/14/2021] [Accepted: 03/15/2022] [Indexed: 06/14/2023]
Abstract
As a narrow-gap semiconductor, III-VI two-dimensional (2D) van der Waals layered indium selenide (InSe) has attracted a lot of attention due to excellent physical properties. For potential optoelectronic applications, the tunability of the optical property is challenging, e.g., the modulation of optical bandgap commonly by element doping. However, the deep understanding of the influence of element doping on the microstructure and the optical properties lacks of systematic investigation. In this work, by using aberration-corrected high-angle annular dark-field scanning transmission electron microscopy, we investigate the influence of Bi doping on controlling of the microstructure and optical properties of InSe single crystal in detail. The results show that Bi doping can introduce additional stacking faults in InSe single crystal, and more importantly, the atomic spacing and lattice constant of Bi-doped InSe are changed a lot as compared to that of the undoped one. Further optical characterizations including photoluminescence and transmission spectra reveal that Bi-doping can broaden the transmission wavelength range of InSe and make its optical bandgap blue-shift, which can also be physically interpreted from the doping-induced structure change. Our work expands new ideas for the optical property modulation of 2D thin-layer materials and brings new possibilities for the development of thin-layer InSe optical devices.
Collapse
Affiliation(s)
- Fengrui Sui
- Key Laboratory of Polar Materials and Devices (MOE), Department of Electronics, School of Physics and Electronic Science, East China Normal University, Shanghai 200062, People's Republic of China
| | - Min Jin
- College of Materials, Shanghai Dianji University, Shanghai 201306, People's Republic of China
| | - Yuanyuan Zhang
- Key Laboratory of Polar Materials and Devices (MOE), Department of Electronics, School of Physics and Electronic Science, East China Normal University, Shanghai 200062, People's Republic of China
| | - Jin Hong
- Key Laboratory of Polar Materials and Devices (MOE), Department of Electronics, School of Physics and Electronic Science, East China Normal University, Shanghai 200062, People's Republic of China
| | - Yan Cheng
- Key Laboratory of Polar Materials and Devices (MOE), Department of Electronics, School of Physics and Electronic Science, East China Normal University, Shanghai 200062, People's Republic of China
| | - Ruijuan Qi
- Key Laboratory of Polar Materials and Devices (MOE), Department of Electronics, School of Physics and Electronic Science, East China Normal University, Shanghai 200062, People's Republic of China
| | - Fangyu Yue
- Key Laboratory of Polar Materials and Devices (MOE), Department of Electronics, School of Physics and Electronic Science, East China Normal University, Shanghai 200062, People's Republic of China
| | - Rong Huang
- Key Laboratory of Polar Materials and Devices (MOE), Department of Electronics, School of Physics and Electronic Science, East China Normal University, Shanghai 200062, People's Republic of China
| |
Collapse
|
6
|
Lee Y, Chang S, Chen S, Chen S, Chen H. Optical Inspection of 2D Materials: From Mechanical Exfoliation to Wafer-Scale Growth and Beyond. ADVANCED SCIENCE (WEINHEIM, BADEN-WURTTEMBERG, GERMANY) 2022; 9:e2102128. [PMID: 34716758 PMCID: PMC8728831 DOI: 10.1002/advs.202102128] [Citation(s) in RCA: 0] [Impact Index Per Article: 0] [Reference Citation Analysis] [Abstract] [Key Words] [Grants] [Track Full Text] [Subscribe] [Scholar Register] [Received: 05/20/2021] [Revised: 07/13/2021] [Indexed: 05/11/2023]
Abstract
Optical inspection is a rapid and non-destructive method for characterizing the properties of two-dimensional (2D) materials. With the aid of optical inspection, in situ and scalable monitoring of the properties of 2D materials can be implemented industrially to advance the development and progress of 2D material-based devices toward mass production. This review discusses the optical inspection techniques that are available to characterize various 2D materials, including graphene, transition metal dichalcogenides (TMDCs), hexagonal boron nitride (h-BN), group-III monochalcogenides, black phosphorus (BP), and group-IV monochalcogenides. First, the authors provide an introduction to these 2D materials and the processes commonly used for their fabrication. Then they review several of the important structural properties of 2D materials, and discuss how to characterize them using appropriate optical inspection tools. The authors also describe the challenges and opportunities faced when applying optical inspection to recently developed 2D materials, from mechanically exfoliated to wafer-scale-grown 2D materials. Most importantly, the authors summarize the techniques available for largely and precisely enhancing the optical signals from 2D materials. This comprehensive review of the current status and perspective of future trends for optical inspection of the structural properties of 2D materials will facilitate the development of next-generation 2D material-based devices.
Collapse
Affiliation(s)
- Yang‐Chun Lee
- Department of Materials Science and EngineeringNational Taiwan UniversityNo. 1, Sec. 4, Roosevelt RoadTaipei10617Taiwan
| | - Sih‐Wei Chang
- Department of Materials Science and EngineeringNational Taiwan UniversityNo. 1, Sec. 4, Roosevelt RoadTaipei10617Taiwan
| | - Shu‐Hsien Chen
- Department of Materials Science and EngineeringNational Taiwan UniversityNo. 1, Sec. 4, Roosevelt RoadTaipei10617Taiwan
| | - Shau‐Liang Chen
- Department of Materials Science and EngineeringNational Taiwan UniversityNo. 1, Sec. 4, Roosevelt RoadTaipei10617Taiwan
| | - Hsuen‐Li Chen
- Department of Materials Science and EngineeringNational Taiwan UniversityNo. 1, Sec. 4, Roosevelt RoadTaipei10617Taiwan
| |
Collapse
|
7
|
Synthesis and characterization of new indium gallium selenides of the InSe-GaSe system. J SOLID STATE CHEM 2021. [DOI: 10.1016/j.jssc.2021.122569] [Citation(s) in RCA: 0] [Impact Index Per Article: 0] [Reference Citation Analysis] [Track Full Text] [Journal Information] [Subscribe] [Scholar Register] [Indexed: 11/19/2022]
|
8
|
Zheng T, Niu X, Zhao H, Wang J, Zhao W, Lu J, Ni Z. Photoluminescence enhancement at a high generation rate induced by exciton localization. OPTICS LETTERS 2021; 46:2774-2777. [PMID: 34061110 DOI: 10.1364/ol.420709] [Citation(s) in RCA: 1] [Impact Index Per Article: 0.3] [Reference Citation Analysis] [Abstract] [Track Full Text] [Subscribe] [Scholar Register] [Received: 02/12/2021] [Accepted: 04/29/2021] [Indexed: 06/12/2023]
Abstract
The photoluminescence (PL) efficiency of two-dimensional (2D) transition metal dichalcogenides (TMDs) is extremely low under high power excitation, limiting its potential in display and light-emission application. This arises from the much shorter lifetime of non-radiative recombination than radiative recombination, wherein photo-carriers tend to decay through non-radiative processes. Herein, a "molecular state" near the valence band is successfully introduced into the ${{\rm MoS}_2}$ monolayer to increase the density of radiative states and speed up the exciton relaxation. This reduces the recombination lifetime of excitons by two orders of magnitude and forms vigorous competition with non-radiative decays. As a consequence, dozens of times enhancement of PL in ${{\rm MoS}_2}$ monolayers under high excitation power (${\rm G}\sim{{10}^{19}}\;{{\rm cm}^{- 2}}\cdot{{\rm S}^{- 1}}$) is realized. These results provide an effective method to improve PL efficiency under high injection levels for applications of 2D materials in light-emission industry.
Collapse
|
9
|
Li Y, Ye J, Yuan K, Zhai G, Li T, Ye Y, Wu X, Zhang X. Photo-excited carrier relaxation dynamics in two-dimensional InSe flakes. NANOTECHNOLOGY 2020; 31:095713. [PMID: 31731280 DOI: 10.1088/1361-6528/ab5835] [Citation(s) in RCA: 1] [Impact Index Per Article: 0.3] [Reference Citation Analysis] [Abstract] [Track Full Text] [Subscribe] [Scholar Register] [Indexed: 06/10/2023]
Abstract
Carrier relaxation dynamics of InSe flakes is investigated by using time-resolved pump-probe reflectivity measurement. The photocarriers associated with the P xy orbital band-edge transition at 2.40 eV, which is coupled to the in-plane polarized light, is observed to possess a lifetime of ∼19 ps at room temperature and ∼99 ps at 10 K. The temperature and power dependent carrier lifetime suggests that Shockley-Read-Hall process is the dominant nonradiative recombination mechanism responsible for the carrier relaxation. In addition, the electron scattering with a 14.5 meV optical phonon plays an active role in the carrier relaxation with increasing temperatures. A broad absorption around 1.65-1.90 eV is observed. The photocarriers associated with this broad transition show a long lifetime of ∼200 ps that is nearly independent of temperature and photon energy. This is indicative of bound carriers by defects. Our experimental results provide essential information for the characteristics of carrier dynamics and defects in InSe flakes. The experimental findings are fundamentally important for further development of microelectronics and optoelectronics based on InSe.
Collapse
Affiliation(s)
- Ying Li
- State Key Laboratory of Superlattices and Microstructures, Institute of Semiconductors, Chinese Academy of Sciences, Beijing 100083, People's Republic of China. Center of Materials Science and Optoelectronics Engineering, University of Chinese Academy of Sciences, Beijing 100049, People's Republic of China
| | | | | | | | | | | | | | | |
Collapse
|
10
|
Pan H, Cao L, Chu H, Wang Y, Zhao S, Li Y, Qi N, Sun Z, Jiang X, Wang R, Zhang H, Li D. Broadband Nonlinear Optical Response of InSe Nanosheets for the Pulse Generation From 1 to 2 μm. ACS APPLIED MATERIALS & INTERFACES 2019; 11:48281-48289. [PMID: 31834767 DOI: 10.1021/acsami.9b18632] [Citation(s) in RCA: 14] [Impact Index Per Article: 2.8] [Reference Citation Analysis] [Abstract] [Key Words] [Track Full Text] [Subscribe] [Scholar Register] [Indexed: 06/10/2023]
Abstract
Few-layered InSe nanosheets were fabricated by the simple liquid-phase exfoliation method. The morphology and crystal structure features of InSe nanosheet sample were characterized comprehensively. The photoluminescence (PL) spectrum indicated that the liquid-phase exfoliated InSe nanosheets contained variously layered nanoflakes, where eight layers nanosheets dominate. In addition, the first-principle simulation was carried out to describe the electron density of states (DOS) and the electronic band structures. Moreover, the few-layered InSe nanosheets performed excellent nonlinear absorption properties in a broad spectral band. As an application, the stable passively Q-switched (PQS) lasers with few-layered InSe nanosheets saturable absorbers (SAs) were realized with the operating wavelengths at 1.06, 1.34, and 1.91 μm. The shortest pulse durations were 599, 520, and 210 ns, respectively. Our results confirmed that the few-layered InSe nanosheets could be an excellent candidate for pulsed lasers in wide spectral bands.
Collapse
Affiliation(s)
- Han Pan
- School of Information Science and Engineering , Shandong University , Qingdao 266237 , China
| | - Lihua Cao
- School of Information Science and Engineering , Shandong University , Qingdao 266237 , China
| | - Hongwei Chu
- School of Information Science and Engineering , Shandong University , Qingdao 266237 , China
| | - Yunzheng Wang
- Collaborative Innovation Center for Optoelectronic Science & Technology, International Collaborative Laboratory of 2D Materials for Optoelectronics Science and Technology of Ministry of Education, College of Physics and Optoelectronic Engineering , Shenzhen University , Shenzhen 518060 , China
| | - Shengzhi Zhao
- School of Information Science and Engineering , Shandong University , Qingdao 266237 , China
| | - Ying Li
- Key Laboratory of Colloid and Interface Chemistry of State Education Ministry, School of Chemistry and Chemical Engineering , Shandong University , Jinan 250100 , China
| | - Na Qi
- Key Laboratory of Colloid and Interface Chemistry of State Education Ministry, School of Chemistry and Chemical Engineering , Shandong University , Jinan 250100 , China
| | - Zhenlu Sun
- School of Information Science and Engineering , Shandong University , Qingdao 266237 , China
| | - Xiantao Jiang
- Collaborative Innovation Center for Optoelectronic Science & Technology, International Collaborative Laboratory of 2D Materials for Optoelectronics Science and Technology of Ministry of Education, College of Physics and Optoelectronic Engineering , Shenzhen University , Shenzhen 518060 , China
| | - Rui Wang
- Department of Electronic Engineering , Xiamen University , Xiamen 361005 , China
| | - Han Zhang
- Collaborative Innovation Center for Optoelectronic Science & Technology, International Collaborative Laboratory of 2D Materials for Optoelectronics Science and Technology of Ministry of Education, College of Physics and Optoelectronic Engineering , Shenzhen University , Shenzhen 518060 , China
| | - Dechun Li
- School of Information Science and Engineering , Shandong University , Qingdao 266237 , China
| |
Collapse
|