Hypersensitive and selective biosensing based on microfiber interferometry and molecular imprinted nanoparticles

The molecular imprinting techniques with interferometric platform are promising for next-generation optical sensors for online and remote biosensing and device applications. This technique has shown a tremendous potential to provide a highly specific detection of target analyte/molecule with artificial complementary scaffolds in the polymeric nanostructures relay with tunable aspect ratio, low cost synthesis procedure and applicability in harsh environment. To date, no molecular imprinted nanoparticles has been integrated with optical microwire platform in the literature. Here, we report the synthesis of a molecularly imprinted nanocarrier using hydrothermal process that act as receptors and combines optical microwire as transducing support. The detailed sensing process for one of the widely used pesticides (parathion methyl) in the detection range of 10^-12 to 10^-4 M with hyper-sensitivity and detection limit of 1.30 × 10¹² nm/M and 79.43 fM respectively have been achieved. The compact sensing probe tested with real water samples collected from various sources show percentage recovery of around 100%. We strongly believe that the process for probe development will open a new gateway for next generation selective biosensing for biomedical research applications.

Waveguide analysis of heat-drawn and chemically etched probe tips for scanning near-field optical microscopy

We analyze two basic aspects of a scanning near-field optical microscope (SNOM) probe's operation: (i) spot-size evolution of the electric field along the probe with and without a metal layer, and (ii) a modal analysis of the SNOM probe, particularly in close proximity to the aperture. A slab waveguide model is utilized to minimize the analytical complexity, yet provides useful quantitative results--including losses associated with the metal coating--which can then be used as design rules.

Application of evanescent wave optics to the determination of absolute distance in surface force measurements using the atomic force microscope

A combined scanning near field optical/atomic force microscope (AFM) is used to obtain surface force measurements between a near field sensing tip and a tapered optical fibre surface, whilst simultaneously detecting the intensity of the evanescent field emanating from the fibre. The tapered optical fibre acts as a compliant sample to demonstrate the possible use of the near field intensity measurement system in determining 'real' surface separations from normal AFM surface force measurements at sub-nanometer resolution between deformable surfaces.