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Fevola G, Ossig C, Verezhak M, Garrevoet J, Guthrey HL, Seyrich M, Brückner D, Hagemann J, Seiboth F, Schropp A, Falkenberg G, Jørgensen PS, Slyamov A, Balogh ZI, Strelow C, Kipp T, Mews A, Schroer CG, Nishiwaki S, Carron R, Andreasen JW, Stuckelberger ME. 3D and Multimodal X-Ray Microscopy Reveals the Impact of Voids in CIGS Solar Cells. ADVANCED SCIENCE (WEINHEIM, BADEN-WURTTEMBERG, GERMANY) 2024; 11:e2301873. [PMID: 38009788 PMCID: PMC10787091 DOI: 10.1002/advs.202301873] [Citation(s) in RCA: 0] [Impact Index Per Article: 0] [Reference Citation Analysis] [Abstract] [Key Words] [Grants] [Track Full Text] [Subscribe] [Scholar Register] [Received: 03/22/2023] [Revised: 10/09/2023] [Indexed: 11/29/2023]
Abstract
Small voids in the absorber layer of thin-film solar cells are generally suspected to impair photovoltaic performance. They have been studied on Cu(In,Ga)Se2 cells with conventional laboratory techniques, albeit limited to surface characterization and often affected by sample-preparation artifacts. Here, synchrotron imaging is performed on a fully operational as-deposited solar cell containing a few tens of voids. By measuring operando current and X-ray excited optical luminescence, the local electrical and optical performance in the proximity of the voids are estimated, and via ptychographic tomography, the depth in the absorber of the voids is quantified. Besides, the complex network of material-deficit structures between the absorber and the top electrode is highlighted. Despite certain local impairments, the massive presence of voids in the absorber suggests they only have a limited detrimental impact on performance.
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Affiliation(s)
- Giovanni Fevola
- Center for X-ray and Nano Science CXNS, Deutsches Elektronen-Synchrotron DESY, Notkestr. 85, 22607, Hamburg, Germany
| | - Christina Ossig
- Center for X-ray and Nano Science CXNS, Deutsches Elektronen-Synchrotron DESY, Notkestr. 85, 22607, Hamburg, Germany
- Fachbereich Physik, Universität Hamburg, Luruper Chaussee 149, 22761, Hamburg, Germany
| | - Mariana Verezhak
- Paul Scherrer Institute PSI, Forschungsstrasse 111, Villigen, 5232, Switzerland
| | - Jan Garrevoet
- Deutsches Elektronen-Synchrotron DESY, Notkestr. 85, 22607, Hamburg, Germany
| | - Harvey L Guthrey
- National Renewable Energy Laboratory, 16253 Denver West Parkway, Golden, CO, 80401, USA
| | - Martin Seyrich
- Center for X-ray and Nano Science CXNS, Deutsches Elektronen-Synchrotron DESY, Notkestr. 85, 22607, Hamburg, Germany
| | - Dennis Brückner
- Deutsches Elektronen-Synchrotron DESY, Notkestr. 85, 22607, Hamburg, Germany
| | - Johannes Hagemann
- Center for X-ray and Nano Science CXNS, Deutsches Elektronen-Synchrotron DESY, Notkestr. 85, 22607, Hamburg, Germany
- Helmholtz Imaging, Deutsches Elektronen-Synchrotron DESY, Notkestr. 85, 22607, Hamburg, Germany
| | - Frank Seiboth
- Center for X-ray and Nano Science CXNS, Deutsches Elektronen-Synchrotron DESY, Notkestr. 85, 22607, Hamburg, Germany
| | - Andreas Schropp
- Center for X-ray and Nano Science CXNS, Deutsches Elektronen-Synchrotron DESY, Notkestr. 85, 22607, Hamburg, Germany
| | - Gerald Falkenberg
- Deutsches Elektronen-Synchrotron DESY, Notkestr. 85, 22607, Hamburg, Germany
| | - Peter S Jørgensen
- Department of Energy Conversion and Storage, Technical University of Denmark DTU, Fysikvej 310, Kongens Lyngby, 2800, Denmark
| | - Azat Slyamov
- Department of Energy Conversion and Storage, Technical University of Denmark DTU, Fysikvej 310, Kongens Lyngby, 2800, Denmark
| | - Zoltan I Balogh
- DTU Nanolab, Technical University of Denmark DTU, Ørsteds Plads 347, Kongens Lyngby, 2800, Denmark
| | - Christian Strelow
- Institut für Physikalische Chemie, Universität Hamburg, Grindelallee 117, 20146, Hamburg, Germany
| | - Tobias Kipp
- Institut für Physikalische Chemie, Universität Hamburg, Grindelallee 117, 20146, Hamburg, Germany
| | - Alf Mews
- Institut für Physikalische Chemie, Universität Hamburg, Grindelallee 117, 20146, Hamburg, Germany
| | - Christian G Schroer
- Center for X-ray and Nano Science CXNS, Deutsches Elektronen-Synchrotron DESY, Notkestr. 85, 22607, Hamburg, Germany
- Fachbereich Physik, Universität Hamburg, Luruper Chaussee 149, 22761, Hamburg, Germany
- Helmholtz Imaging, Deutsches Elektronen-Synchrotron DESY, Notkestr. 85, 22607, Hamburg, Germany
| | - Shiro Nishiwaki
- Laboratory for Thin Films and Photovoltaics, Empa, Ueberlandstrasse 129, Dübendorf, 8600, Switzerland
| | - Romain Carron
- Laboratory for Thin Films and Photovoltaics, Empa, Ueberlandstrasse 129, Dübendorf, 8600, Switzerland
| | - Jens W Andreasen
- Department of Energy Conversion and Storage, Technical University of Denmark DTU, Fysikvej 310, Kongens Lyngby, 2800, Denmark
| | - Michael E Stuckelberger
- Center for X-ray and Nano Science CXNS, Deutsches Elektronen-Synchrotron DESY, Notkestr. 85, 22607, Hamburg, Germany
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Priebe A, Michler J. Review of Recent Advances in Gas-Assisted Focused Ion Beam Time-of-Flight Secondary Ion Mass Spectrometry (FIB-TOF-SIMS). MATERIALS (BASEL, SWITZERLAND) 2023; 16:2090. [PMID: 36903205 PMCID: PMC10003971 DOI: 10.3390/ma16052090] [Citation(s) in RCA: 5] [Impact Index Per Article: 5.0] [Reference Citation Analysis] [Abstract] [Key Words] [Track Full Text] [Figures] [Subscribe] [Scholar Register] [Received: 01/26/2023] [Revised: 02/21/2023] [Accepted: 02/26/2023] [Indexed: 06/18/2023]
Abstract
Time-of-flight secondary ion mass spectrometry (TOF-SIMS) is a powerful chemical characterization technique allowing for the distribution of all material components (including light and heavy elements and molecules) to be analyzed in 3D with nanoscale resolution. Furthermore, the sample's surface can be probed over a wide analytical area range (usually between 1 µm2 and 104 µm2) providing insights into local variations in sample composition, as well as giving a general overview of the sample's structure. Finally, as long as the sample's surface is flat and conductive, no additional sample preparation is needed prior to TOF-SIMS measurements. Despite many advantages, TOF-SIMS analysis can be challenging, especially in the case of weakly ionizing elements. Furthermore, mass interference, different component polarity of complex samples, and matrix effect are the main drawbacks of this technique. This implies a strong need for developing new methods, which could help improve TOF-SIMS signal quality and facilitate data interpretation. In this review, we primarily focus on gas-assisted TOF-SIMS, which has proven to have potential for overcoming most of the aforementioned difficulties. In particular, the recently proposed use of XeF2 during sample bombardment with a Ga+ primary ion beam exhibits outstanding properties, which can lead to significant positive secondary ion yield enhancement, separation of mass interference, and inversion of secondary ion charge polarity from negative to positive. The implementation of the presented experimental protocols can be easily achieved by upgrading commonly used focused ion beam/scanning electron microscopes (FIB/SEM) with a high vacuum (HV)-compatible TOF-SIMS detector and a commercial gas injection system (GIS), making it an attractive solution for both academic centers and the industrial sectors.
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Chakrabarti P, Wildeis A, Hartmann M, Brandt R, Döhrmann R, Fevola G, Ossig C, Stuckelberger ME, Garrevoet J, Falch KV, Galbierz V, Falkenberg G, Modregger P. X-ray diffraction with micrometre spatial resolution for highly absorbing samples. JOURNAL OF SYNCHROTRON RADIATION 2022; 29:1407-1413. [PMID: 36345748 PMCID: PMC9641556 DOI: 10.1107/s1600577522008025] [Citation(s) in RCA: 0] [Impact Index Per Article: 0] [Reference Citation Analysis] [Abstract] [Key Words] [Track Full Text] [Figures] [Subscribe] [Scholar Register] [Received: 02/10/2022] [Accepted: 08/10/2022] [Indexed: 06/16/2023]
Abstract
X-ray diffraction with high spatial resolution is commonly used to characterize (poly)crystalline samples with, for example, respect to local strain, residual stress, grain boundaries and texture. However, the investigation of highly absorbing samples or the simultaneous assessment of high-Z materials by X-ray fluorescence have been limited due to the utilization of low photon energies. Here, a goniometer-based setup implemented at the P06 beamline of PETRA III that allows for micrometre spatial resolution with a photon energy of 35 keV and above is reported. A highly focused beam was achieved by using compound refractive lenses, and high-precision sample manipulation was enabled by a goniometer that allows up to 5D scans (three rotations and two translations). As experimental examples, the determination of local strain variations in martensitic steel samples with micrometre spatial resolution, as well as the simultaneous elemental distribution for high-Z materials in a thin-film solar cell, are demonstrated. The proposed approach allows users from the materials-science community to determine micro-structural properties even in highly absorbing samples.
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Affiliation(s)
- Prerana Chakrabarti
- Physics Department, University of Siegen, 57072 Siegen, Germany
- Center for X-ray and Nano Science CXNS, Deutsches Elektronen-Synchrotron DESY, 22607 Hamburg, Germany
| | - Anna Wildeis
- Mechanical Engineering Department, University of Siegen, 57076 Siegen, Germany
| | - Markus Hartmann
- Mechanical Engineering Department, University of Siegen, 57076 Siegen, Germany
| | - Robert Brandt
- Mechanical Engineering Department, University of Siegen, 57076 Siegen, Germany
| | - Ralph Döhrmann
- Center for X-ray and Nano Science CXNS, Deutsches Elektronen-Synchrotron DESY, 22607 Hamburg, Germany
| | - Giovanni Fevola
- Center for X-ray and Nano Science CXNS, Deutsches Elektronen-Synchrotron DESY, 22607 Hamburg, Germany
| | - Christina Ossig
- Center for X-ray and Nano Science CXNS, Deutsches Elektronen-Synchrotron DESY, 22607 Hamburg, Germany
- Physics Department, University of Hamburg, 22761 Hamburg, Germany
| | | | - Jan Garrevoet
- Deutsches Elektronen-Synchrotron DESY, 22607 Hamburg, Germany
| | - Ken Vidar Falch
- Deutsches Elektronen-Synchrotron DESY, 22607 Hamburg, Germany
| | | | | | - Peter Modregger
- Physics Department, University of Siegen, 57072 Siegen, Germany
- Center for X-ray and Nano Science CXNS, Deutsches Elektronen-Synchrotron DESY, 22607 Hamburg, Germany
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Ossig C, Strelow C, Flügge J, Kolditz A, Siebels J, Garrevoet J, Spiers K, Seyrich M, Brückner D, Pyrlik N, Hagemann J, Schropp A, Carron R, Falkenberg G, Mews A, Schroer CG, Kipp T, Stuckelberger ME. Four-Fold Multi-Modal X-ray Microscopy Measurements of a Cu(In,Ga)Se 2 Solar Cell. MATERIALS 2021; 14:ma14010228. [PMID: 33466442 PMCID: PMC7796438 DOI: 10.3390/ma14010228] [Citation(s) in RCA: 6] [Impact Index Per Article: 2.0] [Reference Citation Analysis] [Abstract] [Key Words] [Track Full Text] [Download PDF] [Figures] [Subscribe] [Scholar Register] [Received: 11/25/2020] [Revised: 12/24/2020] [Accepted: 12/29/2020] [Indexed: 12/16/2022]
Abstract
Inhomogeneities and defects often limit the overall performance of thin-film solar cells. Therefore, sophisticated microscopy approaches are sought to characterize performance and defects at the nanoscale. Here, we demonstrate, for the first time, the simultaneous assessment of composition, structure, and performance in four-fold multi-modality. Using scanning X-ray microscopy of a Cu(In,Ga)Se2 (CIGS) solar cell, we measured the elemental distribution of the key absorber elements, the electrical and optical response, and the phase shift of the coherent X-rays with nanoscale resolution. We found structural features in the absorber layer—interpreted as voids—that correlate with poor electrical performance and point towards defects that limit the overall solar cell efficiency.
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Affiliation(s)
- Christina Ossig
- Deutsches Elektronen-Synchrotron (DESY), Notkestr. 85, 22607 Hamburg, Germany; (C.O.); (J.G.); (K.S.); (M.S.); (D.B.); (N.P.); (J.H.); (A.S.); (G.F.); (C.G.S.)
- Fachbereich Physik, Universität Hamburg, Luruper Chaussee 149, 22761 Hamburg, Germany
| | - Christian Strelow
- Fachbereich Chemie, Universität Hamburg, Grindelallee 117, 20146 Hamburg, Germany; (C.S.); (J.F.); (A.K.); (J.S.); (A.M.); (T.K.)
| | - Jan Flügge
- Fachbereich Chemie, Universität Hamburg, Grindelallee 117, 20146 Hamburg, Germany; (C.S.); (J.F.); (A.K.); (J.S.); (A.M.); (T.K.)
| | - Andreas Kolditz
- Fachbereich Chemie, Universität Hamburg, Grindelallee 117, 20146 Hamburg, Germany; (C.S.); (J.F.); (A.K.); (J.S.); (A.M.); (T.K.)
| | - Jan Siebels
- Fachbereich Chemie, Universität Hamburg, Grindelallee 117, 20146 Hamburg, Germany; (C.S.); (J.F.); (A.K.); (J.S.); (A.M.); (T.K.)
| | - Jan Garrevoet
- Deutsches Elektronen-Synchrotron (DESY), Notkestr. 85, 22607 Hamburg, Germany; (C.O.); (J.G.); (K.S.); (M.S.); (D.B.); (N.P.); (J.H.); (A.S.); (G.F.); (C.G.S.)
| | - Kathryn Spiers
- Deutsches Elektronen-Synchrotron (DESY), Notkestr. 85, 22607 Hamburg, Germany; (C.O.); (J.G.); (K.S.); (M.S.); (D.B.); (N.P.); (J.H.); (A.S.); (G.F.); (C.G.S.)
| | - Martin Seyrich
- Deutsches Elektronen-Synchrotron (DESY), Notkestr. 85, 22607 Hamburg, Germany; (C.O.); (J.G.); (K.S.); (M.S.); (D.B.); (N.P.); (J.H.); (A.S.); (G.F.); (C.G.S.)
- Fachbereich Physik, Universität Hamburg, Luruper Chaussee 149, 22761 Hamburg, Germany
| | - Dennis Brückner
- Deutsches Elektronen-Synchrotron (DESY), Notkestr. 85, 22607 Hamburg, Germany; (C.O.); (J.G.); (K.S.); (M.S.); (D.B.); (N.P.); (J.H.); (A.S.); (G.F.); (C.G.S.)
- Fachbereich Physik, Universität Hamburg, Luruper Chaussee 149, 22761 Hamburg, Germany
| | - Niklas Pyrlik
- Deutsches Elektronen-Synchrotron (DESY), Notkestr. 85, 22607 Hamburg, Germany; (C.O.); (J.G.); (K.S.); (M.S.); (D.B.); (N.P.); (J.H.); (A.S.); (G.F.); (C.G.S.)
- Fachbereich Physik, Universität Hamburg, Luruper Chaussee 149, 22761 Hamburg, Germany
| | - Johannes Hagemann
- Deutsches Elektronen-Synchrotron (DESY), Notkestr. 85, 22607 Hamburg, Germany; (C.O.); (J.G.); (K.S.); (M.S.); (D.B.); (N.P.); (J.H.); (A.S.); (G.F.); (C.G.S.)
| | - Andreas Schropp
- Deutsches Elektronen-Synchrotron (DESY), Notkestr. 85, 22607 Hamburg, Germany; (C.O.); (J.G.); (K.S.); (M.S.); (D.B.); (N.P.); (J.H.); (A.S.); (G.F.); (C.G.S.)
| | - Romain Carron
- Empa, Überlandstrasse 129, 8600 Dübendorf, Switzerland;
| | - Gerald Falkenberg
- Deutsches Elektronen-Synchrotron (DESY), Notkestr. 85, 22607 Hamburg, Germany; (C.O.); (J.G.); (K.S.); (M.S.); (D.B.); (N.P.); (J.H.); (A.S.); (G.F.); (C.G.S.)
| | - Alf Mews
- Fachbereich Chemie, Universität Hamburg, Grindelallee 117, 20146 Hamburg, Germany; (C.S.); (J.F.); (A.K.); (J.S.); (A.M.); (T.K.)
| | - Christian G. Schroer
- Deutsches Elektronen-Synchrotron (DESY), Notkestr. 85, 22607 Hamburg, Germany; (C.O.); (J.G.); (K.S.); (M.S.); (D.B.); (N.P.); (J.H.); (A.S.); (G.F.); (C.G.S.)
- Fachbereich Physik, Universität Hamburg, Luruper Chaussee 149, 22761 Hamburg, Germany
| | - Tobias Kipp
- Fachbereich Chemie, Universität Hamburg, Grindelallee 117, 20146 Hamburg, Germany; (C.S.); (J.F.); (A.K.); (J.S.); (A.M.); (T.K.)
| | - Michael E. Stuckelberger
- Deutsches Elektronen-Synchrotron (DESY), Notkestr. 85, 22607 Hamburg, Germany; (C.O.); (J.G.); (K.S.); (M.S.); (D.B.); (N.P.); (J.H.); (A.S.); (G.F.); (C.G.S.)
- Correspondence:
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Kamikawa Y, Nishinaga J, Shibata H, Ishizuka S. Efficient Narrow Band Gap Cu(In,Ga)Se 2 Solar Cells with Flat Surface. ACS APPLIED MATERIALS & INTERFACES 2020; 12:45485-45492. [PMID: 32909729 DOI: 10.1021/acsami.0c11203] [Citation(s) in RCA: 1] [Impact Index Per Article: 0.3] [Reference Citation Analysis] [Abstract] [Key Words] [Track Full Text] [Subscribe] [Scholar Register] [Indexed: 06/11/2023]
Abstract
In this study, the influences of bromine-based etching (Br etching) of narrow band gap CuInSe2 (CIS) absorbers and Cu(In,Ga)Se2 absorbers with various single Ga gradings (CIS:Ga) on the properties of solar cells were investigated. Absorbers with narrow absorption edge energies (Eabs) of 1.0-1.02 eV, ideal for the application as a bottom cell in a tandem device, were fabricated using a modified three-stage process and subjected to Br etching. The evolution of surface flatness and their optical and electrical properties upon Br etching were investigated. Br etching typically reduced the root-mean-square deviation of the surface roughness height (Rq) for a CIS:Ga absorber from several hundreds to several tens of nanometers, whereas for some CIS absorbers, Rq reduction was limited by the remaining voids. Moreover, Br etching reduced the leakage current across the pn junction. The high shunt resistances (Rsh) typically up to >10 kΩ·cm2 were obtained by introduction of Br etching. However, etching sometimes adversely increased the VOC deficit. The investigation of the minority carrier lifetime and diode parameters revealed that back-surface recombination in CIS and low-Ga CIS:Ga solar cells increased as the absorber layer thickness decreased. A higher Ga grading significantly reduced back-surface recombination. Narrow band gap CIGS solar cells with improved surface flatness and high VOC were achieved by introducing Br etching and proper Ga grading.
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Affiliation(s)
- Yukiko Kamikawa
- National Institute of Advanced Industrial Science and Technology (AIST), Research Institute for Energy Conservation, Tsukuba, Ibaraki 305-8568, Japan
| | - Jiro Nishinaga
- National Institute of Advanced Industrial Science and Technology (AIST), Research Institute for Energy Conservation, Tsukuba, Ibaraki 305-8568, Japan
| | - Hajime Shibata
- National Institute of Advanced Industrial Science and Technology (AIST), Research Institute for Energy Conservation, Tsukuba, Ibaraki 305-8568, Japan
| | - Shogo Ishizuka
- National Institute of Advanced Industrial Science and Technology (AIST), Research Institute for Energy Conservation, Tsukuba, Ibaraki 305-8568, Japan
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Baines T, Bowen L, Mendis BG, Major JD. Microscopic Analysis of Interdiffusion and Void Formation in CdTe (1-x)Se x and CdTe Layers. ACS APPLIED MATERIALS & INTERFACES 2020; 12:38070-38075. [PMID: 32804480 PMCID: PMC7458358 DOI: 10.1021/acsami.0c09381] [Citation(s) in RCA: 1] [Impact Index Per Article: 0.3] [Reference Citation Analysis] [Abstract] [Key Words] [Track Full Text] [Figures] [Subscribe] [Scholar Register] [Received: 05/22/2020] [Accepted: 07/28/2020] [Indexed: 06/11/2023]
Abstract
The use of CdSe layers has recently emerged as a route to improving CdTe photovoltaics through the formation of a CdTe(1-x)Sex (CST) phase. However, the extent of the Se diffusion and the influence it has on the CdTe grain structure has not been widely investigated. In this study, we used transmission electron microscopy (TEM), energy-dispersive X-ray spectroscopy (EDS), and electron backscatter diffraction (EBSD) to investigate the impact of growing CdTe layers on three different window layer structures CdS, CdSe, and CdS/CdSe. We demonstrate that extensive intermixing occurs between CdS, CdSe, and CdTe layers resulting in large voids forming at the front interface, which will degrade device performance. The use of CdS/CdSe bilayer structures leads to the formation of a parasitic CdS(1-x)Sex phase. Following removal of CdS from the cell structure, effective CdTe and CdSe intermixing was achieved. However, the use of sputtered CdSe had limited success in producing Se grading in CST.
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Affiliation(s)
- Tom Baines
- Department
of Physics, Stephenson Institute for Renewable Energy, University of Liverpool, Liverpool L69 7ZF, U.K.
| | - Leon Bowen
- GJ
Russell Microscopy Facility, Department of Physics, University of Durham, South Road, Durham DH1
3LE, U.K.
| | - Budhika G. Mendis
- GJ
Russell Microscopy Facility, Department of Physics, University of Durham, South Road, Durham DH1
3LE, U.K.
| | - Jonathan D. Major
- Department
of Physics, Stephenson Institute for Renewable Energy, University of Liverpool, Liverpool L69 7ZF, U.K.
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Schropp A, Döhrmann R, Botta S, Brückner D, Kahnt M, Lyubomirskiy M, Ossig C, Scholz M, Seyrich M, Stuckelberger ME, Wiljes P, Wittwer F, Garrevoet J, Falkenberg G, Fam Y, Sheppard TL, Grunwaldt JD, Schroer CG. PtyNAMi: ptychographic nano-analytical microscope. J Appl Crystallogr 2020; 53:957-971. [PMID: 32788903 PMCID: PMC7401781 DOI: 10.1107/s1600576720008420] [Citation(s) in RCA: 13] [Impact Index Per Article: 3.3] [Reference Citation Analysis] [Abstract] [Key Words] [Track Full Text] [Download PDF] [Figures] [Journal Information] [Subscribe] [Scholar Register] [Received: 02/23/2020] [Accepted: 06/23/2020] [Indexed: 02/06/2023] Open
Abstract
Ptychographic X-ray imaging at the highest spatial resolution requires an optimal experimental environment, providing a high coherent flux, excellent mechanical stability and a low background in the measured data. This requires, for example, a stable performance of all optical components along the entire beam path, high temperature stability, a robust sample and optics tracking system, and a scatter-free environment. This contribution summarizes the efforts along these lines to transform the nanoprobe station on beamline P06 (PETRA III) into the ptychographic nano-analytical microscope (PtyNAMi).
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Affiliation(s)
- Andreas Schropp
- Deutsches Elektronen-Synchrotron DESY, Notkestrasse 85, DE-22607 Hamburg, Germany
| | - Ralph Döhrmann
- Deutsches Elektronen-Synchrotron DESY, Notkestrasse 85, DE-22607 Hamburg, Germany
| | - Stephan Botta
- Deutsches Elektronen-Synchrotron DESY, Notkestrasse 85, DE-22607 Hamburg, Germany
| | - Dennis Brückner
- Deutsches Elektronen-Synchrotron DESY, Notkestrasse 85, DE-22607 Hamburg, Germany
- Department Physik, Universität Hamburg, Luruper Chaussee 149, DE-22761 Hamburg, Germany
| | - Maik Kahnt
- Department Physik, Universität Hamburg, Luruper Chaussee 149, DE-22761 Hamburg, Germany
- MAX IV Laboratory, Fotongatan 2, SE-225 94 Lund, Sweden
| | - Mikhail Lyubomirskiy
- Deutsches Elektronen-Synchrotron DESY, Notkestrasse 85, DE-22607 Hamburg, Germany
| | - Christina Ossig
- Deutsches Elektronen-Synchrotron DESY, Notkestrasse 85, DE-22607 Hamburg, Germany
- Department Physik, Universität Hamburg, Luruper Chaussee 149, DE-22761 Hamburg, Germany
| | - Maria Scholz
- Deutsches Elektronen-Synchrotron DESY, Notkestrasse 85, DE-22607 Hamburg, Germany
- Department Physik, Universität Hamburg, Luruper Chaussee 149, DE-22761 Hamburg, Germany
| | - Martin Seyrich
- Deutsches Elektronen-Synchrotron DESY, Notkestrasse 85, DE-22607 Hamburg, Germany
- Department Physik, Universität Hamburg, Luruper Chaussee 149, DE-22761 Hamburg, Germany
| | | | - Patrik Wiljes
- Deutsches Elektronen-Synchrotron DESY, Notkestrasse 85, DE-22607 Hamburg, Germany
| | - Felix Wittwer
- Deutsches Elektronen-Synchrotron DESY, Notkestrasse 85, DE-22607 Hamburg, Germany
- Department Physik, Universität Hamburg, Luruper Chaussee 149, DE-22761 Hamburg, Germany
| | - Jan Garrevoet
- Deutsches Elektronen-Synchrotron DESY, Notkestrasse 85, DE-22607 Hamburg, Germany
| | - Gerald Falkenberg
- Deutsches Elektronen-Synchrotron DESY, Notkestrasse 85, DE-22607 Hamburg, Germany
| | - Yakub Fam
- Institute for Chemical Technology and Polymer Chemistry, Karlsruhe Institute of Technology, Engesserstrasse 20, DE-76131 Karlsruhe, Germany
| | - Thomas L. Sheppard
- Institute for Chemical Technology and Polymer Chemistry, Karlsruhe Institute of Technology, Engesserstrasse 20, DE-76131 Karlsruhe, Germany
- Institute of Catalysis Research and Technology, Karlsruhe Institute of Technology, Hermann-von-Helmholtz Platz 1, DE-76344 Eggenstein-Leopoldshafen, Germany
| | - Jan-Dierk Grunwaldt
- Institute for Chemical Technology and Polymer Chemistry, Karlsruhe Institute of Technology, Engesserstrasse 20, DE-76131 Karlsruhe, Germany
- Institute of Catalysis Research and Technology, Karlsruhe Institute of Technology, Hermann-von-Helmholtz Platz 1, DE-76344 Eggenstein-Leopoldshafen, Germany
| | - Christian G. Schroer
- Deutsches Elektronen-Synchrotron DESY, Notkestrasse 85, DE-22607 Hamburg, Germany
- Department Physik, Universität Hamburg, Luruper Chaussee 149, DE-22761 Hamburg, Germany
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8
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Priebe A, Pethö L, Michler J. Fluorine Gas Coinjection as a Solution for Enhancing Spatial Resolution of Time-of-Flight Secondary Ion Mass Spectrometry and Separating Mass Interference. Anal Chem 2019; 92:2121-2129. [DOI: 10.1021/acs.analchem.9b04647] [Citation(s) in RCA: 13] [Impact Index Per Article: 2.6] [Reference Citation Analysis] [Track Full Text] [Journal Information] [Subscribe] [Scholar Register] [Indexed: 01/27/2023]
Affiliation(s)
- Agnieszka Priebe
- Laboratory for Mechanics of Materials and Nanostructures, Empa, Swiss Federal Laboratories for Materials Science and Technology, Feuerwerkerstrasse 39, CH-3602 Thun, Switzerland
| | - Laszlo Pethö
- Laboratory for Mechanics of Materials and Nanostructures, Empa, Swiss Federal Laboratories for Materials Science and Technology, Feuerwerkerstrasse 39, CH-3602 Thun, Switzerland
| | - Johann Michler
- Laboratory for Mechanics of Materials and Nanostructures, Empa, Swiss Federal Laboratories for Materials Science and Technology, Feuerwerkerstrasse 39, CH-3602 Thun, Switzerland
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