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For: Vojta T, Mertig I, Zeller R. Calculation of the residual resistivity and the thermoelectric power of sp impurities in silver. Phys Rev B Condens Matter 1992;46:15761-15766. [PMID: 10003716 DOI: 10.1103/physrevb.46.15761] [Citation(s) in RCA: 10] [Impact Index Per Article: 0.3] [Reference Citation Analysis] [What about the content of this article? (0)] [Track Full Text] [Subscribe] [Scholar Register] [Indexed: 04/12/2023]
Number Cited by Other Article(s)
1
Raghunathan R, Johlin E, Grossman JC. Grain boundary engineering for improved thin silicon photovoltaics. NANO LETTERS 2014;14:4943-4950. [PMID: 24963798 DOI: 10.1021/nl501020q] [Citation(s) in RCA: 5] [Impact Index Per Article: 0.5] [Reference Citation Analysis] [Abstract] [Key Words] [Track Full Text] [Subscribe] [Scholar Register] [Indexed: 06/03/2023]
2
Khodja A, Gemmer J. Effect of short-range order on transport in one-particle tight-binding models. PHYSICAL REVIEW. E, STATISTICAL, NONLINEAR, AND SOFT MATTER PHYSICS 2013;88:042103. [PMID: 24229112 DOI: 10.1103/physreve.88.042103] [Citation(s) in RCA: 0] [Impact Index Per Article: 0] [Reference Citation Analysis] [Abstract] [Track Full Text] [Subscribe] [Scholar Register] [Received: 06/28/2013] [Indexed: 06/02/2023]
3
Khodja A, Niemeyer H, Gemmer J. Transport in topologically disordered one-particle, tight-binding models. PHYSICAL REVIEW. E, STATISTICAL, NONLINEAR, AND SOFT MATTER PHYSICS 2013;87:052133. [PMID: 23767513 DOI: 10.1103/physreve.87.052133] [Citation(s) in RCA: 0] [Impact Index Per Article: 0] [Reference Citation Analysis] [Abstract] [MESH Headings] [Track Full Text] [Subscribe] [Scholar Register] [Received: 12/21/2012] [Revised: 03/01/2013] [Indexed: 06/02/2023]
4
Hinsche NF, Mertig I, Zahn P. Thermoelectric transport in strained Si and Si/Ge heterostructures. JOURNAL OF PHYSICS. CONDENSED MATTER : AN INSTITUTE OF PHYSICS JOURNAL 2012;24:275501. [PMID: 22713229 DOI: 10.1088/0953-8984/24/27/275501] [Citation(s) in RCA: 2] [Impact Index Per Article: 0.2] [Reference Citation Analysis] [Abstract] [MESH Headings] [Track Full Text] [Subscribe] [Scholar Register] [Indexed: 06/01/2023]
5
Gather F, Heiliger C, Klar PJ. Modeling of interface roughness in thermoelectric composite materials. JOURNAL OF PHYSICS. CONDENSED MATTER : AN INSTITUTE OF PHYSICS JOURNAL 2011;23:335301. [PMID: 21811010 DOI: 10.1088/0953-8984/23/33/335301] [Citation(s) in RCA: 0] [Impact Index Per Article: 0] [Reference Citation Analysis] [Abstract] [MESH Headings] [Track Full Text] [Subscribe] [Scholar Register] [Indexed: 05/31/2023]
6
Hinsche NF, Mertig I, Zahn P. Effect of strain on the thermoelectric properties of silicon: an ab initio study. JOURNAL OF PHYSICS. CONDENSED MATTER : AN INSTITUTE OF PHYSICS JOURNAL 2011;23:295502. [PMID: 21737867 DOI: 10.1088/0953-8984/23/29/295502] [Citation(s) in RCA: 7] [Impact Index Per Article: 0.5] [Reference Citation Analysis] [Abstract] [Track Full Text] [Subscribe] [Scholar Register] [Indexed: 05/31/2023]
7
Papanikolaou N, Stefanou N, Papastaikoudis C. Calculation of the residual resistivity and the low-field Hall coefficient of 3d and 4sp impurities in aluminum. PHYSICAL REVIEW. B, CONDENSED MATTER 1994;49:16117-16122. [PMID: 10010756 DOI: 10.1103/physrevb.49.16117] [Citation(s) in RCA: 9] [Impact Index Per Article: 0.3] [Reference Citation Analysis] [Track Full Text] [Subscribe] [Scholar Register] [Indexed: 11/07/2022]
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