Surface roughness and adsorption isotherms of molecularly thin liquid films: an x-ray reflectivity study

A large-volume gas cell for high-energy X-ray reflectivity investigations of interfaces under pressure

A cell for the investigation of interfaces under pressure is presented. Given the pressure and temperature specifications of the cell, P ≤ 100 bar and 253 K ≤ T ≤ 323 K, respectively, high-energy X-rays are required to penetrate the thick Al(2)O(3) windows. The CH(4)(gas)/H(2)O(liquid) interface has been chosen to test the performance of the new device. The measured dynamic range of the high-energy X-ray reflectivity data exceeds 10(-8), thereby demonstrating the validity of the entire experimental set-up.

Investigation of multiphase liquid roughness using an atomic force microscope

The roughness of a multiphase interface and the associated topography between silicone oil and an alcohol-based fluid were measured with an atomic force microscope (AFM) and compared with the results of calculations based upon a capillary-wave model. According to this theory, the interfacial roughness of a liquid-liquid interface depends on the density, interfacial tension, and temperature of the liquids. Test samples prepared with both silicone oil and an alcohol-based fluid at various volumetric ratios and controlled temperatures were carefully measured. The experimental results indicate that the interfacial roughness measured with an AFM was consistent with the capillary-wave model. The measured interfacial roughness is influenced mainly by the interfacial tension between the liquids and the temperature-driven Brownian motion of the molecules. Three-dimensional topographical pictures of the interfaces were constructed and archived digitally for subsequent investigation. By employing the outlined method, we examined the microscopic details of interfacial properties, with prospective applications in biochemical and biophysical research.

Molecular ordering and phase behavior of surfactants at water-oil interfaces as probed by X-ray surface scattering

Surfactants have their primary utility, both scientific and industrial, at the liquid-liquid interface. We review recent X-ray surface scattering experiments that probe the molecular ordering and phase behavior of surfactants at the water-oil interface. The presence of the oil modifies the interfacial ordering in a manner that cannot be understood simply from analogies with studies of Langmuir monolayers of surfactants at the water-vapor interface or from the traditional view that the solvent is fully mixed with the interfacial surfactants. These studies explored the role of chain flexibility and head group interactions on the ordering of long-chain alkanols and alkanoic acids. Small changes in the surfactant may produce large changes in the interfacial ordering. The interfacial monolayer can be spatially homogeneous or inhomogeneous. Investigators have observed interfacial phase transitions as a function of temperature between homogenous phases, as well as between homogeneous and inhomogeneous phases. Finally, varying the solvent chain length can alter the fundamental character of the phase transitions and lead to the formation of multilayer interfacial structures.

Fluctuation forces and wetting layers in colloid-polymer mixtures

We present confocal microscopy experiments on the wetting of phase-separated colloid-polymer mixtures. We observe that an unusually thick wetting layer of the colloid-rich phase forms at the walls of the glass container that holds the mixture. Because of the ultralow interfacial tension between the colloid-rich and the polymer-rich phases, the thermally activated roughness of the interfaces becomes very big and measurable. We observe that close to the critical point the roughness of the interface between the wetting layer and the polymer-rich phase decreases with decreasing layer thickness: large excursions of the interface are confined in the wetting layer. The measured relationship between the roughness and the thickness of the wetting layer is in qualitative agreement with the predictions of renormalization group theory for short-range forces and complete wetting.

Capillary wave fluctuations and intrinsic widths of coupled fluid-fluid interfaces: an x-ray scattering study of a wetting film on bulk liquid

An x-ray specular reflectivity (XR) and off-specular diffuse scattering (XDS) study of the coupled thermal capillary fluctuations and the intrinsic profiles of two interacting fluid-fluid interfaces is presented. The measurements are carried out on complete wetting films of perfluoromethylcyclohexane (PFMC) on the surface of bulk liquid eicosane (C20), as a function of film thickness 30<D<160 A. In order to facilitate the analysis and interpretation of the data with minimal complexity, approximate methods for calculating scattering intensities are developed to take into account the subtleties of thermal diffuse scattering from layered liquid surfaces. With these methods, the calculations of XR/XDS intensities are reduced to a single numerical integration of simple functions in real space. In addition, an analytic expression is derived for small-angle XR that contains Debye-Waller-like factors with effective capillary roughness and takes into account the partial correlations of the two interfaces. The expression for the XR is quantitatively accurate so long as the reflection angle is small enough that the scattering from interfaces is distinguishable from bulk scattering. The results of the XR and XDS data analysis indicate that the capillary fluctuations at the two interfaces of the wetting films are partially correlated and their coupling is consistent with the van der Waals interactions. The relatively large intrinsic width (4 approximately 6A) of the liquid-liquid interface observed for thicker films (D greater than or similar to 50 A) is comparable to the value expected for the bulk liquid-liquid interface (D-->infinity), determined by either the radius of gyration (5.3 A) or the bulk correlation length (4.8 A) of the alkane C20. The intrinsic liquid-vapor interfacial width is sharper (approximately 2 A) and remains essentially constant over the entire probed range of D .