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Meng Q, Yu F, Liu G, Zong J, Tian Q, Wang K, Qiu X, Wang C, Xi X, Zhang Y. Thickness-Dependent Evolutions of Surface Reconstruction and Band Structures in Epitaxial β-In2Se3 Thin Films. NANOMATERIALS (BASEL, SWITZERLAND) 2023; 13:nano13091533. [PMID: 37177078 PMCID: PMC10180126 DOI: 10.3390/nano13091533] [Citation(s) in RCA: 0] [Impact Index Per Article: 0] [Reference Citation Analysis] [Abstract] [Key Words] [Grants] [Track Full Text] [Subscribe] [Scholar Register] [Received: 04/09/2023] [Revised: 04/29/2023] [Accepted: 04/29/2023] [Indexed: 05/15/2023]
Abstract
Ferroelectric materials have received great attention in the field of data storage, benefiting from their exotic transport properties. Among these materials, the two-dimensional (2D) In2Se3 has been of particular interest because of its ability to exhibit both in-plane and out-of-plane ferroelectricity. In this article, we realized the molecular beam epitaxial (MBE) growth of β-In2Se3 films on bilayer graphene (BLG) substrates with precisely controlled thickness. Combining in situ scanning tunneling microscopy (STM) and angle-resolved photoemission spectroscopy (ARPES) measurements, we found that the four-monolayer β-In2Se3 is a semiconductor with a (9 × 1) reconstructed superlattice. In contrast, the monolayer β-In2Se3/BLG heterostructure does not show any surface reconstruction due to the interfacial interaction and moiré superlattice, which instead results in a folding Dirac cone at the center of the Brillouin zone. In addition, we found that the band gap of In2Se3 film decreases after potassium doping on its surface, and the valence band maximum also shifts in momentum after surface potassium doping. The successful growth of high-quality β-In2Se3 thin films would be a new platform for studying the 2D ferroelectric heterostructures and devices. The experimental results on the surface reconstruction and band structures also provide important information on the quantum confinement and interfacial effects in the epitaxial β-In2Se3 films.
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Affiliation(s)
- Qinghao Meng
- National Laboratory of Solid State Microstructure, School of Physics, Nanjing University, Nanjing 210093, China
| | - Fan Yu
- National Laboratory of Solid State Microstructure, School of Physics, Nanjing University, Nanjing 210093, China
| | - Gan Liu
- National Laboratory of Solid State Microstructure, School of Physics, Nanjing University, Nanjing 210093, China
| | - Junyu Zong
- National Laboratory of Solid State Microstructure, School of Physics, Nanjing University, Nanjing 210093, China
| | - Qichao Tian
- National Laboratory of Solid State Microstructure, School of Physics, Nanjing University, Nanjing 210093, China
| | - Kaili Wang
- National Laboratory of Solid State Microstructure, School of Physics, Nanjing University, Nanjing 210093, China
| | - Xiaodong Qiu
- National Laboratory of Solid State Microstructure, School of Physics, Nanjing University, Nanjing 210093, China
| | - Can Wang
- National Laboratory of Solid State Microstructure, School of Physics, Nanjing University, Nanjing 210093, China
- Collaborative Innovation Center of Advanced Microstructures, Nanjing University, Nanjing 210093, China
- School of Physics and Electronic Sciences, Changsha University of Science and Technology, Changsha 410114, China
| | - Xiaoxiang Xi
- National Laboratory of Solid State Microstructure, School of Physics, Nanjing University, Nanjing 210093, China
- Collaborative Innovation Center of Advanced Microstructures, Nanjing University, Nanjing 210093, China
| | - Yi Zhang
- National Laboratory of Solid State Microstructure, School of Physics, Nanjing University, Nanjing 210093, China
- Collaborative Innovation Center of Advanced Microstructures, Nanjing University, Nanjing 210093, China
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2
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Zhang H, Yan C, Ge Z, Weinert M, Li L. Impenetrable Barrier at the Metal-Mott Insulator Junction in Polymorphic 1H and 1T NbSe 2 Lateral Heterostructure. J Phys Chem Lett 2022; 13:10713-10721. [PMID: 36367815 DOI: 10.1021/acs.jpclett.2c02546] [Citation(s) in RCA: 5] [Impact Index Per Article: 1.7] [Reference Citation Analysis] [Abstract] [Track Full Text] [Journal Information] [Subscribe] [Scholar Register] [Indexed: 06/16/2023]
Abstract
When a metal makes contact with a band insulator, charge transfer occurs across the interface leading to band bending and a Schottky barrier with rectifying behavior. The nature of metal-Mott insulator junctions, however, is still debated due to challenges in experimental probes of such vertical heterojunctions with buried interfaces. Here, we grow lateral polymorphic heterostructures of single-layer metallic 1H and Mott insulating 1T NbSe2 by molecular beam epitaxy. We find a one-dimensional metallic channel along the interface due to the appearance of quasiparticle states with an intensity decay following 1/x2, indicating an impenetrable barrier. Near the interface, the Mott gap exhibits a strong spatial dependence arising from the difference in lattice constants between the two phases, consistent with our density functional theory calculations. These results provide clear experimental evidence for an impenetrable barrier at the metal-Mott insulator junction and the high tunability of a Mott insulator by strain.
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Affiliation(s)
- Huimin Zhang
- Department of Physics and Astronomy, West Virginia University, Morgantown, West Virginia 26506, United States
- State Key Laboratory of Structural Analysis for Industrial Equipment, Dalian University of Technology, Dalian 116024, China
| | - Chenhui Yan
- Department of Physics and Astronomy, West Virginia University, Morgantown, West Virginia 26506, United States
| | - Zhuozhi Ge
- Department of Physics and Astronomy, West Virginia University, Morgantown, West Virginia 26506, United States
| | - Michael Weinert
- Department of Physics, University of Wisconsin, Milwaukee, Wisconsin 53201, United States
| | - Lian Li
- Department of Physics and Astronomy, West Virginia University, Morgantown, West Virginia 26506, United States
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3
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Casotto A, Drera G, Perilli D, Freddi S, Pagliara S, Zanotti M, Schio L, Verdini A, Floreano L, Di Valentin C, Sangaletti L. π-Orbital mediated charge transfer channels in a monolayer Gr-NiPc heterointerface unveiled by soft X-ray electron spectroscopies and DFT calculations. NANOSCALE 2022; 14:13166-13177. [PMID: 36039896 DOI: 10.1039/d2nr02647c] [Citation(s) in RCA: 1] [Impact Index Per Article: 0.3] [Reference Citation Analysis] [Abstract] [Track Full Text] [Subscribe] [Scholar Register] [Indexed: 06/15/2023]
Abstract
With the aim to identify charge transfer channels underlying device development and operation, X-Ray Photoelectron Spectroscopy (XPS), Near-Edge X-Ray Absorption Fine Structure (NEXAFS), and Resonant Photoelectron Spectroscopy (ResPES) have been employed to characterize a novel heterointerface obtained by the controlled evaporation of a Nickel Phthalocyanine (NiPc) monolayer on a single layer of Graphene (Gr) on SiC substrate. Indeed, the Gr-NiPc interface could be a promising candidate for different applications in the field of photonics, optoelectronics, and sensing, provided that clear information on the charge transfer mechanisms at the Gr-NiPc interface can be obtained. The analysis of the spectroscopic data has shown the effective functionalization and the horizontally-flat disposition of the NiPc complexes over the Gr layer. With this geometry, the main intermolecular interaction experienced by the NiPc species is the coupling with the Gr substrate, through π-symmetry orbitals, as revealed by the different behaviour of the valence band photoemission at resonance with the N K-edge and Ni L3-edge. These results have been supported by the analysis of density functional theory (DFT) calculations, that allowed for a rationalization of the experimental data, showing that charge transfer at the interface occurs from the doubly degenerate eg LUMO orbital, involving mainly N and C (pyrrole ring) pz states, to the holes in the p-doped graphene layer.
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Affiliation(s)
- Andrea Casotto
- I-LAMP and Dipartimento di Matematica e Fisica, Università Cattolica del Sacro Cuore, via della Garzetta 48, 25133 Brescia, Italy.
- Department of Chemistry and Biochemistry, University of Notre Dame, Notre Dame, IN 46556, USA
| | - Giovanni Drera
- I-LAMP and Dipartimento di Matematica e Fisica, Università Cattolica del Sacro Cuore, via della Garzetta 48, 25133 Brescia, Italy.
| | - Daniele Perilli
- Dipartimento di Scienza dei Materiali, Università degli Studi di Milano-Bicocca, via R. Cozzi 55, 20125 Milano, Italy
| | - Sonia Freddi
- I-LAMP and Dipartimento di Matematica e Fisica, Università Cattolica del Sacro Cuore, via della Garzetta 48, 25133 Brescia, Italy.
- Department of Chemistry, Division of Molecular Imaging and Photonics, KU Leuven, Celestijnenlaan 200F, 3001 Leuven, Belgium
| | - Stefania Pagliara
- I-LAMP and Dipartimento di Matematica e Fisica, Università Cattolica del Sacro Cuore, via della Garzetta 48, 25133 Brescia, Italy.
| | - Michele Zanotti
- I-LAMP and Dipartimento di Matematica e Fisica, Università Cattolica del Sacro Cuore, via della Garzetta 48, 25133 Brescia, Italy.
| | - Luca Schio
- CNR-IOM, Lab. TASC, s.s. 14 km 163.5, 34149 Trieste, Italy
| | | | - Luca Floreano
- CNR-IOM, Lab. TASC, s.s. 14 km 163.5, 34149 Trieste, Italy
| | - Cristiana Di Valentin
- Dipartimento di Scienza dei Materiali, Università degli Studi di Milano-Bicocca, via R. Cozzi 55, 20125 Milano, Italy
| | - Luigi Sangaletti
- I-LAMP and Dipartimento di Matematica e Fisica, Università Cattolica del Sacro Cuore, via della Garzetta 48, 25133 Brescia, Italy.
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4
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Uemura S, Vantasin S, Kitahama Y, Tanaka YY, Suzuki T, Doujima D, Kaneko T, Ozaki Y. Interactions Between Epitaxial Graphene Grown on the Si- and C-Faces of 4H-SiC Investigated Using Raman Imaging and Tip-Enhanced Raman Scattering. APPLIED SPECTROSCOPY 2020; 74:1384-1390. [PMID: 32627577 DOI: 10.1177/0003702820944247] [Citation(s) in RCA: 2] [Impact Index Per Article: 0.4] [Reference Citation Analysis] [Abstract] [Key Words] [Track Full Text] [Subscribe] [Scholar Register] [Indexed: 06/11/2023]
Abstract
Interactions between epitaxial graphene grown on Si- and C-faces were investigated using Raman imaging and tip-enhanced Raman scattering (TERS). In the TERS spectrum, which has a spatial resolution exceeding the diffraction limit, a D band was observed not from graphene surface, but from the edges of the epitaxial graphene ribbons without a buffer layer, which interacts with SiC on the Si-face. In contrast, for a graphene micro-island on the C-face, the D band disappeared even on the edges where the C atoms were arranged in armchair configurations. The disappearance of the edge chirality via combination between the C atoms and SiC on the C-face is responsible for this phenomenon. The TERS signals from the C-face were weaker than those from the Si-face without the buffer layer. On the Si-face with a buffer layer, the graphene TERS signal was hardly observed. TERS enhancement was suppressed by interactions on the edges or by the buffer layer between the SiC and graphene on the C- or Si-face, respectively.
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Affiliation(s)
- Shohei Uemura
- School of Science and Technology, Kwansei Gakuin University, Sanda, Hyogo, Japan
| | - Sanpon Vantasin
- School of Science and Technology, Kwansei Gakuin University, Sanda, Hyogo, Japan
| | - Yasutaka Kitahama
- School of Science and Technology, Kwansei Gakuin University, Sanda, Hyogo, Japan
| | | | | | - Daichi Doujima
- School of Science and Technology, Kwansei Gakuin University, Sanda, Hyogo, Japan
| | - Tadaaki Kaneko
- School of Science and Technology, Kwansei Gakuin University, Sanda, Hyogo, Japan
| | - Yukihiro Ozaki
- School of Science and Technology, Kwansei Gakuin University, Sanda, Hyogo, Japan
- 226492Toyota Physical and Chemical Research Institute, Nagakute, Japan
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5
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Huelmo CP, Menezes MG, Capaz RB, Denis PA. Structural and magnetic properties of a defective graphene buffer layer grown on SiC(0001): a DFT study. Phys Chem Chem Phys 2020; 22:16096-16106. [PMID: 32638763 DOI: 10.1039/d0cp02167a] [Citation(s) in RCA: 5] [Impact Index Per Article: 1.0] [Reference Citation Analysis] [Abstract] [Track Full Text] [Journal Information] [Subscribe] [Scholar Register] [Indexed: 11/21/2022]
Abstract
Understanding the role of defects in the magnetic properties of the graphene buffer layer (BL) grown on substrates should be important to provide hints for manufacturing future graphene-based spintronic devices in a controlled fashion. Herein, density functional theory was applied to assess the structure and magnetic properties of defective BL on 6H-SiC(0001). Particularly, we conducted a thorough study of one and two vacancies and Stone-Wales defects in the BL. Our results reveal that the removal of a carbon atom in the BL framework that was originally bonded to a Si atom in the substrate is preferred over that of a sp2-bonded atom. As a result, a hexacoordinated silicon atom is formed with a slightly deviated octahedral geometry. A stable antiferromagnetic (AF) state was verified for the single vacancy system, with a quite different spin-density distribution to the one obtained for the perfect BL. Also, this AF state is nearly degenerate with the non-magnetic and low magnetic states. As for the Stone-Wales defect, the AF sate is almost degenerate with the most stable M = 2 μB magnetic configuration. However, the introduction of two vacancies in the carbon network of BL causes the loss of magnetism of the BL-SiC system. Our theoretical calculations support experimental predictions favoring the BL as the site for single vacancy formation rather than the epitaxial monolayer graphene, by 4.3 eV.
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Affiliation(s)
- C Pereyra Huelmo
- Computational Nanotechnology, DETEMA, Facultad de Química, Universidad de la República (UdelaR), Montevideo C.P. 11800, Uruguay.
| | - Marcos G Menezes
- Instituto de Física, Universidade Federal do Rio de Janeiro, Caixa Postal 68528, Rio de Janeiro, RJ 21941-972, Brazil
| | - Rodrigo B Capaz
- Instituto de Física, Universidade Federal do Rio de Janeiro, Caixa Postal 68528, Rio de Janeiro, RJ 21941-972, Brazil
| | - Pablo A Denis
- Computational Nanotechnology, DETEMA, Facultad de Química, Universidad de la República (UdelaR), Montevideo C.P. 11800, Uruguay.
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6
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Caccia M, Giuranno D, Molina-Jorda JM, Moral M, Nowak R, Ricci E, Sobczak N, Narciso J, Fernández Sanz J. Graphene Translucency and Interfacial Interactions in the Gold/Graphene/SiC System. J Phys Chem Lett 2018; 9:3850-3855. [PMID: 29939752 DOI: 10.1021/acs.jpclett.8b01384] [Citation(s) in RCA: 7] [Impact Index Per Article: 1.0] [Reference Citation Analysis] [Abstract] [Track Full Text] [Journal Information] [Subscribe] [Scholar Register] [Indexed: 06/08/2023]
Abstract
Integration of graphene into electronic circuits through its joining with conventional metal electrodes (i.e., gold) appears to be one of the main technological challenges nowadays. To gain insight into this junction, we have studied the physicochemical interactions between SiC-supported graphene and a drop of molten gold. Using appropriate high-temperature experimental conditions, we perform wetting experiments and determine contact angles for gold drops supported on graphene epitaxially grown on 4H-SiC. The properties of the metal/graphene interface are analyzed using a wide variety of characterization techniques, along with computational simulations based on density functional theory. In contrast with the established literature, our outcomes clearly show that graphene is translucent in the gold/graphene/SiC interface, and therefore its integration into electronic circuits primarily depends on the right choice of the support to produce favorable wetting interactions with liquid gold.
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Affiliation(s)
- Mario Caccia
- Departamento de Química Inorgánica e Instituto Universitario de Materiales de Alicante , Universidad de Alicante , 03690 San Vicente del Raspeig , Alicante , Spain
| | - Donatella Giuranno
- Institute of Condensed Matter Chemistry and Energy Technologies (ICMATE) , National Research Council (CNR) , 16149 Genoa , Italy
| | - José M Molina-Jorda
- Departamento de Química Inorgánica e Instituto Universitario de Materiales de Alicante , Universidad de Alicante , 03690 San Vicente del Raspeig , Alicante , Spain
| | - Mónica Moral
- Departamento de Química Física , Universidad de Sevilla , 41004 Sevilla , Spain
| | - Rafal Nowak
- Foundry Research Institute , 30-418 Krakow , Poland
| | - Enrica Ricci
- Institute of Condensed Matter Chemistry and Energy Technologies (ICMATE) , National Research Council (CNR) , 16149 Genoa , Italy
| | | | - Javier Narciso
- Departamento de Química Inorgánica e Instituto Universitario de Materiales de Alicante , Universidad de Alicante , 03690 San Vicente del Raspeig , Alicante , Spain
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7
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Razado-Colambo I, Avila J, Vignaud D, Godey S, Wallart X, Woodruff DP, Asensio MC. Structural determination of bilayer graphene on SiC(0001) using synchrotron radiation photoelectron diffraction. Sci Rep 2018; 8:10190. [PMID: 29976962 PMCID: PMC6033894 DOI: 10.1038/s41598-018-28402-0] [Citation(s) in RCA: 37] [Impact Index Per Article: 5.3] [Reference Citation Analysis] [Abstract] [Track Full Text] [Download PDF] [Figures] [Journal Information] [Subscribe] [Scholar Register] [Received: 03/15/2018] [Accepted: 06/14/2018] [Indexed: 11/30/2022] Open
Abstract
In recent years there has been growing interest in the electronic properties of ‘few layer’ graphene films. Twisted layers, different stacking and register with the substrate result in remarkable unconventional couplings. These distinctive electronic behaviours have been attributed to structural differences, even if only a few structural determinations are available. Here we report the results of a structural study of bilayer graphene on the Si-terminated SiC(0001) surface, investigated using synchrotron radiation-based photoelectron diffraction and complemented by angle-resolved photoemission mapping of the electronic valence bands. Photoelectron diffraction angular distributions of the graphene C 1s component have been measured at different kinetic energies and compared with the results of multiple scattering simulations for model structures. The results confirm that bilayer graphene on SiC(0001) has a layer spacing of 3.48 Å and an AB (Bernal) stacking, with a distance between the C buffer layer and the first graphene layer of 3.24 Å. Our work generalises the use of a versatile and precise diffraction method capable to shed light on the structure of low-dimensional materials.
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Affiliation(s)
- I Razado-Colambo
- Synchrotron SOLEIL & Université Paris-Saclay, 91192, L'Orme des Merisiers, Saint Aubin-BP 48, Gif sur Yvette Cedex, France. .,Institute of Mathematical Sciences and Physics, University of the Philippines Los Baños, Laguna, 4031, Philippines.
| | - J Avila
- Synchrotron SOLEIL & Université Paris-Saclay, 91192, L'Orme des Merisiers, Saint Aubin-BP 48, Gif sur Yvette Cedex, France
| | - D Vignaud
- Institut d'Electronique, de Microélectronique et de Nanotechnologie (IEMN UMR 8520), Université Lille, CNRS, Centrale Lille, ISEN, Université Valenciennes, Villeneuve d'Ascq Cedex, 59652, France
| | - S Godey
- Institut d'Electronique, de Microélectronique et de Nanotechnologie (IEMN UMR 8520), Université Lille, CNRS, Centrale Lille, ISEN, Université Valenciennes, Villeneuve d'Ascq Cedex, 59652, France
| | - X Wallart
- Institut d'Electronique, de Microélectronique et de Nanotechnologie (IEMN UMR 8520), Université Lille, CNRS, Centrale Lille, ISEN, Université Valenciennes, Villeneuve d'Ascq Cedex, 59652, France
| | - D P Woodruff
- Physics Department, University of Warwick, Coventry, CV4 7AL, United Kingdom
| | - M C Asensio
- Synchrotron SOLEIL & Université Paris-Saclay, 91192, L'Orme des Merisiers, Saint Aubin-BP 48, Gif sur Yvette Cedex, France.
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8
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Deposition of topological silicene, germanene and stanene on graphene-covered SiC substrates. Sci Rep 2017; 7:15700. [PMID: 29146916 PMCID: PMC5691050 DOI: 10.1038/s41598-017-15610-3] [Citation(s) in RCA: 13] [Impact Index Per Article: 1.6] [Reference Citation Analysis] [Abstract] [Download PDF] [Figures] [Journal Information] [Subscribe] [Scholar Register] [Received: 06/21/2017] [Accepted: 10/30/2017] [Indexed: 11/09/2022] Open
Abstract
Growth of X-enes, such as silicene, germanene and stanene, requires passivated substrates to ensure the survival of their exotic properties. Using first-principles methods, we study as-grown graphene on polar SiC surfaces as suitable substrates. Trilayer combinations with coincidence lattices with large hexagonal unit cells allow for strain-free group-IV monolayers. In contrast to the Si-terminated SiC surface, van der Waals-bonded honeycomb X-ene/graphene bilayers on top of the C-terminated SiC substrate are stable. Folded band structures show Dirac cones of the overlayers with small gaps of about 0.1 eV in between. The topological invariants of the peeled-off X-ene/graphene bilayers indicate the presence of topological character and the existence of a quantum spin Hall phase.
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9
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N Nair M, Palacio I, Celis A, Zobelli A, Gloter A, Kubsky S, Turmaud JP, Conrad M, Berger C, de Heer W, Conrad EH, Taleb-Ibrahimi A, Tejeda A. Band Gap Opening Induced by the Structural Periodicity in Epitaxial Graphene Buffer Layer. NANO LETTERS 2017; 17:2681-2689. [PMID: 28345926 DOI: 10.1021/acs.nanolett.7b00509] [Citation(s) in RCA: 13] [Impact Index Per Article: 1.6] [Reference Citation Analysis] [Abstract] [Key Words] [Track Full Text] [Subscribe] [Scholar Register] [Indexed: 06/06/2023]
Abstract
The epitaxial graphene buffer layer on the Si face of hexagonal SiC shows a promising band gap, of which the precise origin remains to be understood. In this work, we correlate the electronic to the atomic structure of the buffer layer by combining angle resolved photoemission spectroscopy (ARPES), scanning tunneling microscopy (STM), and high-resolution scanning transmission electron microscopy (HR-STEM). We show that the band structure in the buffer has an electronic periodicity related to the structural periodicity observed in STM images and published X-ray diffraction. Our HR-STEM measurements show the bonding of the buffer layer to the SiC at specific locations separated by 1.5 nm. This is consistent with the quasi 6 × 6 periodic corrugation observed in the STM images. The distance between buffer C and SiC is 1.9 Å in the bonded regions and up to 2.8 Å in the decoupled regions, corresponding to a 0.9 Å corrugation of the buffer layer. The decoupled regions are sp2 hybridized. Density functional tight binding (DFTB) calculations demonstrate the presence of a gap at the Dirac point everywhere in the buffer layer, even in the decoupled regions where the buffer layer has an atomic structure close to that of graphene. The surface periodicity also promotes band in the superperiodic Brillouin zone edges as seen by photoemission and confirmed by our calculations.
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Affiliation(s)
- Maya N Nair
- UR1 CNRS/Synchrotron SOLEIL, Saint-Aubin, 91192 Gif sur Yvette, France
- Laboratoire de Physique des Solides, CNRS, Univ. Paris-Sud, Université Paris-Saclay, Bât. 510 , F-91405 Orsay Cedex, France
| | - Irene Palacio
- UR1 CNRS/Synchrotron SOLEIL, Saint-Aubin, 91192 Gif sur Yvette, France
| | - Arlensiú Celis
- Laboratoire de Physique des Solides, CNRS, Univ. Paris-Sud, Université Paris-Saclay, Bât. 510 , F-91405 Orsay Cedex, France
- Synchrotron SOLEIL, L'Orme des Merisiers , Saint-Aubin, 91192 Gif sur Yvette, France
| | - Alberto Zobelli
- Laboratoire de Physique des Solides, CNRS, Univ. Paris-Sud, Université Paris-Saclay, Bât. 510 , F-91405 Orsay Cedex, France
| | - Alexandre Gloter
- Laboratoire de Physique des Solides, CNRS, Univ. Paris-Sud, Université Paris-Saclay, Bât. 510 , F-91405 Orsay Cedex, France
| | - Stefan Kubsky
- Synchrotron SOLEIL, L'Orme des Merisiers , Saint-Aubin, 91192 Gif sur Yvette, France
| | - Jean-Philippe Turmaud
- School of Physics, The Georgia Institute of Technology , Atlanta, Georgia 30332-0430, United States
| | - Matthew Conrad
- School of Physics, The Georgia Institute of Technology , Atlanta, Georgia 30332-0430, United States
| | - Claire Berger
- School of Physics, The Georgia Institute of Technology , Atlanta, Georgia 30332-0430, United States
- CNRS/Institut Neél, BP166 , 38042 Grenoble, France
| | - Walter de Heer
- School of Physics, The Georgia Institute of Technology , Atlanta, Georgia 30332-0430, United States
| | - Edward H Conrad
- School of Physics, The Georgia Institute of Technology , Atlanta, Georgia 30332-0430, United States
| | | | - Antonio Tejeda
- Laboratoire de Physique des Solides, CNRS, Univ. Paris-Sud, Université Paris-Saclay, Bât. 510 , F-91405 Orsay Cedex, France
- Synchrotron SOLEIL, L'Orme des Merisiers , Saint-Aubin, 91192 Gif sur Yvette, France
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10
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Engineering of the electronic structure of graphene monoxide by out of plane and in-plane strains investigated by DFT. COMPUT THEOR CHEM 2016. [DOI: 10.1016/j.comptc.2016.05.014] [Citation(s) in RCA: 2] [Impact Index Per Article: 0.2] [Reference Citation Analysis] [Track Full Text] [Journal Information] [Subscribe] [Scholar Register] [Indexed: 11/22/2022]
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11
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Electrical Detection of the Helical Spin Texture in a p-type Topological Insulator Sb2Te3. Sci Rep 2016; 6:29533. [PMID: 27404321 PMCID: PMC4941728 DOI: 10.1038/srep29533] [Citation(s) in RCA: 24] [Impact Index Per Article: 2.7] [Reference Citation Analysis] [Abstract] [Track Full Text] [Download PDF] [Figures] [Journal Information] [Subscribe] [Scholar Register] [Received: 04/15/2016] [Accepted: 06/17/2016] [Indexed: 01/27/2023] Open
Abstract
The surface states of 3D topological insulators (TIs) exhibit a helical spin texture with spin locked at right angles with momentum. The chirality of this spin texture is expected to invert crossing the Dirac point, a property that has been experimentally observed by optical probes. Here, we directly determine the chirality below the Dirac point by electrically detecting spin-momentum locking in surface states of a p-type TI, Sb2Te3. A current flowing in the Sb2Te3 surface states generates a net spin polarization due to spin-momentum locking, which is electrically detected as a voltage on an Fe/Al2O3 tunnel barrier detector. Measurements of this voltage as a function of current direction and detector magnetization indicate that hole spin-momentum locking follows the right-hand rule, opposite that of electron, providing direct confirmation that the chirality is indeed inverted below Dirac point. The spin signal is linear with current, and exhibits a temperature dependence consistent with the semiconducting nature of the TI film and freeze-out of bulk conduction below 100 K. Our results demonstrate that the chirality of the helical spin texture of TI surface states can be determined electrically, an enabling step in the electrical manipulation of spins in next generation TI-based quantum devices.
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12
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Morán-Meza JA, Cousty J, Lubin C, Thoyer F. Understanding the STM images of epitaxial graphene on a reconstructed 6H-SiC(0001) surface: the role of tip-induced mechanical distortion of graphene. Phys Chem Chem Phys 2016; 18:14264-72. [DOI: 10.1039/c5cp07571h] [Citation(s) in RCA: 3] [Impact Index Per Article: 0.3] [Reference Citation Analysis] [Abstract] [Track Full Text] [Journal Information] [Subscribe] [Scholar Register] [Indexed: 11/21/2022]
Abstract
Maxima in the STM images of epitaxial graphene (EG) on SiC(0001) (cyan) differ from topographic bumps in AFM images (green) by a separation distance of 1 nm, which is a result of two effects: the tip-induced distortion of EG and the asymmetric profile of the LDOS of the buffer layer.
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Affiliation(s)
| | - Jacques Cousty
- SPEC
- CEA
- CNRS
- Université Paris-Saclay
- CEA Saclay 91191 Gif-sur-Yvette Cedex
| | - Christophe Lubin
- SPEC
- CEA
- CNRS
- Université Paris-Saclay
- CEA Saclay 91191 Gif-sur-Yvette Cedex
| | - François Thoyer
- SPEC
- CEA
- CNRS
- Université Paris-Saclay
- CEA Saclay 91191 Gif-sur-Yvette Cedex
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13
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Theoretical Study of Graphene on SiC(11-20) a-Face. E-JOURNAL OF SURFACE SCIENCE AND NANOTECHNOLOGY 2016. [DOI: 10.1380/ejssnt.2016.113] [Citation(s) in RCA: 1] [Impact Index Per Article: 0.1] [Reference Citation Analysis] [Track Full Text] [Subscribe] [Scholar Register] [Indexed: 11/20/2022]
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14
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Meza JAM, Lubin C, Thoyer F, Cousty J. Tip induced mechanical deformation of epitaxial graphene grown on reconstructed 6H-SiC(0001) surface during scanning tunneling and atomic force microscopy studies. NANOTECHNOLOGY 2015; 26:255704. [PMID: 26040291 DOI: 10.1088/0957-4484/26/25/255704] [Citation(s) in RCA: 3] [Impact Index Per Article: 0.3] [Reference Citation Analysis] [Abstract] [Track Full Text] [Subscribe] [Scholar Register] [Indexed: 06/04/2023]
Abstract
The structural and mechanical properties of an epitaxial graphene (EG) monolayer thermally grown on top of a 6H-SiC(0001) surface were studied by combined dynamic scanning tunneling microscopy (STM) and frequency modulation atomic force microscopy (FM-AFM). Experimental STM, dynamic STM and AFM images of EG on 6H-SiC(0001) show a lattice with a 1.9 nm period corresponding to the (6 × 6) quasi-cell of the SiC surface. The corrugation amplitude of this (6 × 6) quasi-cell, measured from AFM topographies, increases with the setpoint value of the frequency shift Δf (15-20 Hz, repulsive interaction). Excitation variations map obtained simultaneously with the AFM topography shows that larger dissipation values are measured in between the topographical bumps of the (6 × 6) quasi-cell. These results demonstrate that the AFM tip deforms the graphene monolayer. During recording in dynamic STM mode, a frequency shift (Δf) map is obtained in which Δf values range from 41 to 47 Hz (repulsive interaction). As a result, we deduced that the STM tip, also, provokes local mechanical distortions of the graphene monolayer. The origin of these tip-induced distortions is discussed in terms of electronic and mechanical properties of EG on 6H-SiC(0001).
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Affiliation(s)
- José Antonio Morán Meza
- Service de Physique de l'Etat Condensé, DSM/IRAMIS/SPEC, CNRS UMR 3680, CEA Saclay, F-91191 Gif sur Yvette Cedex, France. Grupo de Materiales Nanoestructurados, Facultad de Ciencias, Universidad Nacional de Ingeniería, Av. Túpac Amaru 210, Lima 25, Peru
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15
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Liu Y, Weinert M, Li L. Determining charge state of graphene vacancy by noncontact atomic force microscopy and first-principles calculations. NANOTECHNOLOGY 2015; 26:035702. [PMID: 25549100 DOI: 10.1088/0957-4484/26/3/035702] [Citation(s) in RCA: 1] [Impact Index Per Article: 0.1] [Reference Citation Analysis] [Abstract] [Track Full Text] [Subscribe] [Scholar Register] [Indexed: 06/04/2023]
Abstract
Graphene vacancies are engineered for novel functionalities, however, the charge state of these defects, the key parameter that is vital to charge transfer during chemical reactions and carrier scattering, is generally unknown. Here, we carried out atomic resolution imaging of graphene vacancy defects created by Ar plasma using noncontact atomic force microscopy, and made the first determination of their charge state by local contact potential difference measurements. Combined with density functional theory calculations, we show that graphene vacancies are typically positively charged, with size-dependent charge states that are not necessarily integer-valued. These findings provide new insights into carrier scattering by vacancy defects in graphene, as well as its functionalization for chemical sensing and catalysis, and underline the tunability of these functions by controlling the size of vacancy defect.
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Affiliation(s)
- Y Liu
- Department of Physics, University of Wisconsin, Milwaukee, WI 53211, USA
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16
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Transmission Electron Microscopy Specimen Preparation for Layer-area Graphene by a Direct Transfer Method. Appl Microsc 2014. [DOI: 10.9729/am.2014.44.4.133] [Citation(s) in RCA: 3] [Impact Index Per Article: 0.3] [Reference Citation Analysis] [Track Full Text] [Journal Information] [Subscribe] [Scholar Register] [Indexed: 11/17/2022] Open
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17
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Merino P, Švec M, Martínez JI, Mutombo P, Gonzalez C, Martín-Gago JA, de Andres PL, Jelinek P. Ortho and para hydrogen dimers on G/SiC(0001): combined STM and DFT study. LANGMUIR : THE ACS JOURNAL OF SURFACES AND COLLOIDS 2014; 31:233-239. [PMID: 25486105 DOI: 10.1021/la504021x] [Citation(s) in RCA: 3] [Impact Index Per Article: 0.3] [Reference Citation Analysis] [Abstract] [MESH Headings] [Track Full Text] [Subscribe] [Scholar Register] [Indexed: 06/04/2023]
Abstract
The hydrogen (H) dimer structures formed upon room-temperature H adsorption on single layer graphene (SLG) grown on SiC(0001) are addressed using a combined theoretical-experimental approach. Our study includes density functional theory (DFT) calculations for the full (6√3 × 6√3)R30° unit cell of the SLG/SiC(0001) substrate and atomically resolved scanning tunneling microscopy images determining simultaneously the graphene lattice and the internal structure of the H adsorbates. We show that H atoms normally group in chemisorbed coupled structures of different sizes and orientations. We make an atomic scale determination of the most stable experimental geometries, the small dimers and ellipsoid-shaped features, and we assign them to hydrogen adsorbed in para dimers and ortho dimers configuration, respectively, through comparison with the theory.
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Affiliation(s)
- P Merino
- Centro de Astrobiología INTA-CSIC, Carretera de Ajalvir, km. 4, ES-28850 Madrid, Spain
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18
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Virgus Y, Purwanto W, Krakauer H, Zhang S. Stability, energetics, and magnetic states of cobalt adatoms on graphene. PHYSICAL REVIEW LETTERS 2014; 113:175502. [PMID: 25379922 DOI: 10.1103/physrevlett.113.175502] [Citation(s) in RCA: 18] [Impact Index Per Article: 1.6] [Reference Citation Analysis] [Abstract] [Track Full Text] [Subscribe] [Scholar Register] [Received: 07/02/2014] [Indexed: 06/04/2023]
Abstract
We investigate the stability and electronic properties of single Co atoms on graphene with near-exact many-body calculations. A frozen-orbital embedding scheme was combined with auxiliary-field quantum Monte Carlo calculations to increase the reach in system sizes. Several energy minima are found as a function of the distance h between Co and graphene. Energetics only permit the Co atom to occupy the top site at h=2.2 Å in a high-spin 3d(8)4s(1) state, and the van der Waals region at h=3.3 Å in a high-spin 3d(7)4s(2) state. The findings provide an explanation for recent experimental results with Co on free-standing graphene.
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Affiliation(s)
- Yudistira Virgus
- Department of Physics, College of William and Mary, Williamsburg, Virginia 23187-8795, USA
| | - Wirawan Purwanto
- Department of Physics, College of William and Mary, Williamsburg, Virginia 23187-8795, USA
| | - Henry Krakauer
- Department of Physics, College of William and Mary, Williamsburg, Virginia 23187-8795, USA
| | - Shiwei Zhang
- Department of Physics, College of William and Mary, Williamsburg, Virginia 23187-8795, USA
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19
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Chen MX, Weinert M. Revealing the substrate origin of the linear dispersion of silicene/Ag(111). NANO LETTERS 2014; 14:5189-5193. [PMID: 25115310 DOI: 10.1021/nl502107v] [Citation(s) in RCA: 14] [Impact Index Per Article: 1.3] [Reference Citation Analysis] [Abstract] [Key Words] [Track Full Text] [Subscribe] [Scholar Register] [Indexed: 06/03/2023]
Abstract
The band structure of the recently synthesized (3 × 3) silicene monolayer on (4 × 4) Ag(111) is investigated using density functional theory. A k-projection technique that includes the k⊥-dependence of the surface bands is used to separate the contributions arising from the silicene and the substrate, allowing a consistent comparison between the calculations and the angle-resolved photoemission experiments. Our calculations not only reproduce the observed gap and linear dispersion across the K point of (1 × 1) silicene but also demonstrate that these originate from the k⊥-dependence of Ag(111) substrate states (modified by interactions with the silicene) and not from a Dirac state.
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Affiliation(s)
- M X Chen
- Department of Physics, University of Wisconsin , Milwaukee, Wisconsin 53201, United States
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20
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Li YY, Chen MX, Weinert M, Li L. Direct experimental determination of onset of electron–electron interactions in gap opening of zigzag graphene nanoribbons. Nat Commun 2014; 5:4311. [DOI: 10.1038/ncomms5311] [Citation(s) in RCA: 79] [Impact Index Per Article: 7.2] [Reference Citation Analysis] [Track Full Text] [Journal Information] [Subscribe] [Scholar Register] [Received: 11/20/2013] [Accepted: 06/05/2014] [Indexed: 11/09/2022] Open
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21
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Szroeder P, Tsierkezos NG, Walczyk M, Strupiński W, Górska-Pukownik A, Strzelecki J, Wiwatowski K, Scharff P, Ritter U. Insights into electrocatalytic activity of epitaxial graphene on SiC from cyclic voltammetry and ac impedance spectroscopy. J Solid State Electrochem 2014. [DOI: 10.1007/s10008-014-2512-1] [Citation(s) in RCA: 7] [Impact Index Per Article: 0.6] [Reference Citation Analysis] [Track Full Text] [Journal Information] [Subscribe] [Scholar Register] [Indexed: 10/25/2022]
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22
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Silly MG, Li G, Dappe YJ. Electronic properties of zero-layer graphene on 6H-SiC(0001) substrate decoupled by silicon intercalation. SURF INTERFACE ANAL 2014. [DOI: 10.1002/sia.5574] [Citation(s) in RCA: 6] [Impact Index Per Article: 0.5] [Reference Citation Analysis] [Track Full Text] [Journal Information] [Subscribe] [Scholar Register] [Indexed: 11/06/2022]
Affiliation(s)
| | - G. Li
- Synchrotron SOLEIL; Paris France
| | - Y. J. Dappe
- Service de Physique de l'Etat Condensé (CNRS URA2464), IRAMIS; CEA Saclay; Paris France
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23
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High Electron Mobility in Epitaxial Graphene on 4H-SiC(0001) via post-growth annealing under hydrogen. Sci Rep 2014; 4:4558. [PMID: 24691055 PMCID: PMC3972502 DOI: 10.1038/srep04558] [Citation(s) in RCA: 45] [Impact Index Per Article: 4.1] [Reference Citation Analysis] [Abstract] [Track Full Text] [Download PDF] [Figures] [Journal Information] [Subscribe] [Scholar Register] [Received: 02/13/2014] [Accepted: 03/17/2014] [Indexed: 01/30/2023] Open
Abstract
We investigate the magneto-transport properties of epitaxial graphene single-layer on 4H-SiC(0001), grown by atmospheric pressure graphitization in Ar, followed by H2 intercalation. We directly demonstrate the importance of saturating the Si dangling bonds at the graphene/SiC(0001) interface to achieve high carrier mobility. Upon successful Si dangling bonds elimination, carrier mobility increases from 3 000 cm2V−1s−1 to >11 000 cm2V−1s−1 at 0.3 K. Additionally, graphene electron concentration tends to decrease from a few 1012 cm−2 to less than 1012 cm−2. For a typical large (30 × 280 μm2) Hall bar, we report the observation of the integer quantum Hall states at 0.3 K with well developed transversal resistance plateaus at Landau level filling factors of ν = 2, 6, 10, 14… 42 and Shubnikov de Haas oscillation of the longitudinal resistivity observed from about 1 T. In such a device, the Hall state quantization at ν = 2, at 19 T and 0.3 K, can be very robust: the dissipation in electronic transport can stay very low, with the longitudinal resistivity lower than 5 mΩ, for measurement currents as high as 250 μA. This is very promising in the view of an application in metrology.
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24
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Li CH, van 't Erve OMJ, Robinson JT, Liu Y, Li L, Jonker BT. Electrical detection of charge-current-induced spin polarization due to spin-momentum locking in Bi2Se3. NATURE NANOTECHNOLOGY 2014; 9:218-224. [PMID: 24561354 DOI: 10.1038/nnano.2014.16] [Citation(s) in RCA: 138] [Impact Index Per Article: 12.5] [Reference Citation Analysis] [Abstract] [Track Full Text] [Subscribe] [Scholar Register] [Received: 06/25/2013] [Accepted: 01/17/2014] [Indexed: 06/03/2023]
Abstract
Topological insulators exhibit metallic surface states populated by massless Dirac fermions with spin-momentum locking, where the carrier spin lies in-plane, locked at right angles to the carrier momentum. Here, we show that a charge current produces a net spin polarization via spin-momentum locking in Bi2Se3 films, and this polarization is directly manifested as a voltage on a ferromagnetic contact. This voltage is proportional to the projection of the spin polarization onto the contact magnetization, is determined by the direction and magnitude of the charge current, scales inversely with Bi2Se3 film thickness, and its sign is that expected from spin-momentum locking rather than Rashba effects. Similar data are obtained for two different ferromagnetic contacts, demonstrating that these behaviours are independent of the details of the ferromagnetic contact. These results demonstrate direct electrical access to the topological insulators' surface-state spin system and enable utilization of its remarkable properties for future technological applications.
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Affiliation(s)
- C H Li
- Materials Science and Technology Division, Naval Research Laboratory, Washington, District of Columbia 20375, USA
| | - O M J van 't Erve
- Materials Science and Technology Division, Naval Research Laboratory, Washington, District of Columbia 20375, USA
| | - J T Robinson
- Electronics Science and Technology Division, Naval Research Laboratory, Washington, District of Columbia 20375, USA
| | - Y Liu
- Department of Physics, University of Wisconsin, Milwaukee, Wisconsin 53211, USA
| | - L Li
- Department of Physics, University of Wisconsin, Milwaukee, Wisconsin 53211, USA
| | - B T Jonker
- Materials Science and Technology Division, Naval Research Laboratory, Washington, District of Columbia 20375, USA
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25
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Woo J, Yun KH, Cho SB, Chung YC. Defect-induced semiconductor to metal transition in graphene monoxide. Phys Chem Chem Phys 2014; 16:13477-82. [DOI: 10.1039/c4cp01518e] [Citation(s) in RCA: 10] [Impact Index Per Article: 0.9] [Reference Citation Analysis] [Abstract] [Track Full Text] [Journal Information] [Subscribe] [Scholar Register] [Indexed: 11/21/2022]
Abstract
This study investigates the influence of point defects on the geometric and electronic structure of graphene monoxide (GMO) via density functional theory calculations.
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Affiliation(s)
- Jungwook Woo
- Department of Materials Science and Engineering
- Hanyang University
- Seongdong-gu, Republic of Korea
| | - Kyung-Han Yun
- Department of Materials Science and Engineering
- Hanyang University
- Seongdong-gu, Republic of Korea
| | - Sung Beom Cho
- Department of Materials Science and Engineering
- Hanyang University
- Seongdong-gu, Republic of Korea
| | - Yong-Chae Chung
- Department of Materials Science and Engineering
- Hanyang University
- Seongdong-gu, Republic of Korea
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26
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Yoon TL, Lim TL, Min TK, Hung SH, Jakse N, Lai SK. Epitaxial growth of graphene on 6H-silicon carbide substrate by simulated annealing method. J Chem Phys 2013; 139:204702. [DOI: 10.1063/1.4832043] [Citation(s) in RCA: 13] [Impact Index Per Article: 1.1] [Reference Citation Analysis] [Track Full Text] [Journal Information] [Subscribe] [Scholar Register] [Indexed: 11/15/2022] Open
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27
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Emery JD, Detlefs B, Karmel HJ, Nyakiti LO, Gaskill DK, Hersam MC, Zegenhagen J, Bedzyk MJ. Chemically resolved interface structure of epitaxial graphene on SiC(0001). PHYSICAL REVIEW LETTERS 2013; 111:215501. [PMID: 24313501 DOI: 10.1103/physrevlett.111.215501] [Citation(s) in RCA: 19] [Impact Index Per Article: 1.6] [Reference Citation Analysis] [Abstract] [Track Full Text] [Subscribe] [Scholar Register] [Received: 07/25/2013] [Indexed: 06/02/2023]
Abstract
Atomic-layer 2D crystals have unique properties that can be significantly modified through interaction with an underlying support. For epitaxial graphene on SiC(0001), the interface strongly influences the electronic properties of the overlaying graphene. We demonstrate a novel combination of x-ray scattering and spectroscopy for studying the complexities of such a buried interface structure. This approach employs x-ray standing wave-excited photoelectron spectroscopy in conjunction with x-ray reflectivity to produce a highly resolved chemically sensitive atomic profile for the terminal substrate bilayers, interface, and graphene layers along the SiC[0001] direction.
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Affiliation(s)
- Jonathan D Emery
- Department of Materials Science and Engineering, Northwestern University, Evanston, Illinois 60208, USA
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28
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Janssen TJBM, Tzalenchuk A, Lara-Avila S, Kubatkin S, Fal'ko VI. Quantum resistance metrology using graphene. REPORTS ON PROGRESS IN PHYSICS. PHYSICAL SOCIETY (GREAT BRITAIN) 2013; 76:104501. [PMID: 24088373 DOI: 10.1088/0034-4885/76/10/104501] [Citation(s) in RCA: 13] [Impact Index Per Article: 1.1] [Reference Citation Analysis] [Abstract] [MESH Headings] [Track Full Text] [Subscribe] [Scholar Register] [Indexed: 06/02/2023]
Abstract
In this paper, we review the recent extraordinary progress in the development of a new quantum standard for resistance based on graphene. We discuss the unique properties of this material system relating to resistance metrology and discuss results of the recent highest-ever precision direct comparison of the Hall resistance between graphene and traditional GaAs. We mainly focus our review on graphene expitaxially grown on SiC, a system which so far resulted in the best results. We also briefly discuss progress in the two other graphene material systems, exfoliated graphene and chemical vapour deposition graphene, and make a critical comparison with SiC graphene. Finally, we discuss other possible applications of graphene in metrology.
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Affiliation(s)
- T J B M Janssen
- National Physical Laboratory, Hampton Road, Teddington TW11 0LW, UK
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29
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Nemec L, Blum V, Rinke P, Scheffler M. Thermodynamic equilibrium conditions of graphene films on SiC. PHYSICAL REVIEW LETTERS 2013; 111:065502. [PMID: 23971583 DOI: 10.1103/physrevlett.111.065502] [Citation(s) in RCA: 6] [Impact Index Per Article: 0.5] [Reference Citation Analysis] [Abstract] [Track Full Text] [Subscribe] [Scholar Register] [Received: 04/29/2013] [Indexed: 06/02/2023]
Abstract
First-principles surface phase diagrams reveal that epitaxial monolayer graphene films on the Si side of 3C-SiC(111) can exist as thermodynamically stable phases in a narrow range of experimentally controllable conditions, defining a path to the highest quality graphene films. Our calculations are based on a van der Waals corrected density functional. The full, experimentally observed (6sqrt[3]×6sqrt[3])-R30° supercells for zero- to trilayer graphene are essential to describe the correct interface geometries and the relative stability of surface phases and possible defects.
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Affiliation(s)
- Lydia Nemec
- Fritz-Haber-Institut der Max-Planck-Gesellschaft, Faradayweg 4-6, D-14195 Berlin, Germany
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30
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Liu Y, Li YY, Gilks D, Lazarov VK, Weinert M, Li L. Charging Dirac states at antiphase domain boundaries in the three-dimensional topological insulator Bi2Se3. PHYSICAL REVIEW LETTERS 2013; 110:186804. [PMID: 23683233 DOI: 10.1103/physrevlett.110.186804] [Citation(s) in RCA: 3] [Impact Index Per Article: 0.3] [Reference Citation Analysis] [Abstract] [Track Full Text] [Subscribe] [Scholar Register] [Received: 12/10/2012] [Indexed: 06/02/2023]
Abstract
Using scanning tunneling microscopy and transmission electron microscopy, we demonstrate the existence of antiphase boundaries between neighboring grains shifted by a fraction of a quintuple layer in epitaxial (0001) films of the three-dimensional topological insulator Bi(2)Se(3). Scanning tunneling spectroscopy and first-principles calculations reveal that these antiphase boundaries provide electrostatic fields on the order of 10(8) V/m that locally charge the Dirac states, modulating the carrier density, and shift the Dirac point by up to 120 meV. This intrinsic electric field effect, demonstrated here near interfaces between Bi(2)Se(3) grains, provides direct experimental evidence at the atomic scale that the Dirac states are indeed robust against extended structural defects and tunable by electric field. These results also shed light on the recent observation of coexistence of Dirac states and two-dimensional electron gas on Bi(2)Se(3) (0001) after adsorption of metal atoms and gas molecules.
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Affiliation(s)
- Y Liu
- Department of Physics, University of Wisconsin, Milwaukee, Wisconsin 53211, USA
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31
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Goncalves AMB, Malachias A, Mazzoni MS, Lacerda RG, Magalhães-Paniago R. Metastable phase formation and structural evolution of epitaxial graphene grown on SiC(100) under a temperature gradient. NANOTECHNOLOGY 2012; 23:175603. [PMID: 22481139 DOI: 10.1088/0957-4484/23/17/175603] [Citation(s) in RCA: 1] [Impact Index Per Article: 0.1] [Reference Citation Analysis] [Abstract] [Track Full Text] [Subscribe] [Scholar Register] [Indexed: 05/31/2023]
Abstract
Multilayer epitaxial graphene was obtained from a 6H-SiC(001) substrate subjected to a temperature gradient from 1250 to 1450 °C. Scanning tunneling microscopy and x-ray diffraction were used to identify the structure and morphology of the surface, from which the formation of a metastable phase was inferred. By a comparison between microscopy and diffraction data, we report the appearance of misoriented Si-doped graphene in cold regions (1250 °C) of the substrate. This metastable phase occurs in domains where silicon sublimation is incomplete and it coexists with small domains of epitaxial graphene. At 1350 °C this phase disappears and one observes complete graphene-like layers (although misoriented), where rotational registry between the underlying epitaxial graphene and additional layers is absent. At 1450 °C the stacking among layers is established and the formation of highly oriented single crystalline graphite is complete. The stability of this Si-rich metastable phase at 1250 °C was confirmed by first-principles calculations based on the density functional theory.
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Affiliation(s)
- A M B Goncalves
- Departamento de Física, Universidade Federal de Minas Gerais, CP 702, Belo Horizonte MG, 30123-970, Brazil
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32
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Liu Y, Weinert M, Li L. Spiral growth without dislocations: molecular beam epitaxy of the topological insulator Bi2Se3 on epitaxial graphene/SiC(0001). PHYSICAL REVIEW LETTERS 2012; 108:115501. [PMID: 22540484 DOI: 10.1103/physrevlett.108.115501] [Citation(s) in RCA: 34] [Impact Index Per Article: 2.6] [Reference Citation Analysis] [Abstract] [Track Full Text] [Subscribe] [Scholar Register] [Received: 10/10/2011] [Indexed: 05/31/2023]
Abstract
We report a new mechanism that does not require the formation of interfacial dislocations to mediate spiral growth during molecular beam epitaxy of Bi2Se3. Based on in situ scanning tunneling microscopy observations, we find that Bi2Se3 growth on epitaxial graphene/SiC(0001) initiates with two-dimensional (2D) nucleation, and that the spiral growth ensues with the pinning of the 2D growth fronts at jagged steps of the substrate or at domain boundaries created during the coalescence of the 2D islands. Winding of the as-created growth fronts around these pinning centers leads to spirals. The mechanism can be broadly applied to the growth of other van der Waals materials on weakly interacting substrates. We further confirm, using scanning tunneling spectroscopy, that the one-dimensional helical mode of a line defect is not supported in strong topological insulators such as Bi2Se3.
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Affiliation(s)
- Y Liu
- Department of Physics, University of Wisconsin, Milwaukee, Wisconsin 53211, USA
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33
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Qi Y, Eskelsen JR, Mazur U, Hipps KW. Fabrication of graphene with CuO islands by chemical vapor deposition. LANGMUIR : THE ACS JOURNAL OF SURFACES AND COLLOIDS 2012; 28:3489-3493. [PMID: 22233199 DOI: 10.1021/la2048163] [Citation(s) in RCA: 15] [Impact Index Per Article: 1.2] [Reference Citation Analysis] [Abstract] [Track Full Text] [Subscribe] [Scholar Register] [Indexed: 05/31/2023]
Abstract
Graphene prepared on Cu foil by chemical vapor deposition was studied as a function of post growth cooling conditions. CuO islands embedded in the graphene film were discovered and studied by scanning electron microscopy, atomic force microscopy, and X-ray photoemission spectroscopy. It is shown that nanostructured holes can be formed within a graphene film by reduction using hydrogen cooling immediately after film growth. We also observe the formation of symmetrical oxide islands in these holes. This study provides an easy way to fabricate a graphene + CuO composite, and the method may be extended to other graphene based structures.
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Affiliation(s)
- Yun Qi
- Materials Science and Engineering Program and Department of Chemistry, Washington State University, Pullman, Washington 99164-4630, USA.
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34
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Raman Imaging in Semiconductor Physics: Applications to Microelectronic Materials and Devices. RAMAN IMAGING 2012. [DOI: 10.1007/978-3-642-28252-2_2] [Citation(s) in RCA: 4] [Impact Index Per Article: 0.3] [Reference Citation Analysis] [Track Full Text] [Subscribe] [Scholar Register] [Indexed: 01/22/2023]
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35
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Xiao X, Michael JR, Beechem T, McDonald A, Rodriguez M, Brumbach MT, Lambert TN, Washburn CM, Wang J, Brozik SM, Wheeler DR, Burckel DB, Polsky R. Three dimensional nickel–graphene core–shell electrodes. ACTA ACUST UNITED AC 2012. [DOI: 10.1039/c2jm35506j] [Citation(s) in RCA: 42] [Impact Index Per Article: 3.2] [Reference Citation Analysis] [Track Full Text] [Journal Information] [Subscribe] [Scholar Register] [Indexed: 11/21/2022]
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36
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Qi Y, Mazur U, Hipps KW. Charge transfer induced chemical reaction of tetracyano-p-quinodimethane adsorbed on graphene. RSC Adv 2012. [DOI: 10.1039/c2ra21756b] [Citation(s) in RCA: 22] [Impact Index Per Article: 1.7] [Reference Citation Analysis] [Track Full Text] [Journal Information] [Subscribe] [Scholar Register] [Indexed: 11/21/2022] Open
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37
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Tiberj A, Camara N, Godignon P, Camassel J. Micro-Raman and micro-transmission imaging of epitaxial graphene grown on the Si and C faces of 6H-SiC. NANOSCALE RESEARCH LETTERS 2011; 6:478. [PMID: 21801347 PMCID: PMC3211991 DOI: 10.1186/1556-276x-6-478] [Citation(s) in RCA: 5] [Impact Index Per Article: 0.4] [Reference Citation Analysis] [Abstract] [Track Full Text] [Subscribe] [Scholar Register] [Received: 09/10/2010] [Accepted: 07/29/2011] [Indexed: 05/29/2023]
Abstract
Micro-Raman and micro-transmission imaging experiments have been done on epitaxial graphene grown on the C- and Si-faces of on-axis 6H-SiC substrates. On the C-face it is shown that the SiC sublimation process results in the growth of long and isolated graphene ribbons (up to 600 μm) that are strain-relaxed and lightly p-type doped. In this case, combining the results of micro-Raman spectroscopy with micro-transmission measurements, we were able to ascertain that uniform monolayer ribbons were grown and found also Bernal stacked and misoriented bilayer ribbons. On the Si-face, the situation is completely different. A full graphene coverage of the SiC surface is achieved but anisotropic growth still occurs, because of the step-bunched SiC surface reconstruction. While in the middle of reconstructed terraces thin graphene stacks (up to 5 layers) are grown, thicker graphene stripes appear at step edges. In both the cases, the strong interaction between the graphene layers and the underlying SiC substrate induces a high compressive thermal strain and n-type doping.
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Affiliation(s)
- Antoine Tiberj
- Laboratoire Charles Coulomb, UMR5221 CNRS-Université Montpellier II, Place Eugène Bataillon - cc074, 34095 Montpellier Cedex 5, France
| | - Nicolas Camara
- Laboratoire Charles Coulomb, UMR5221 CNRS-Université Montpellier II, Place Eugène Bataillon - cc074, 34095 Montpellier Cedex 5, France
| | | | - Jean Camassel
- Laboratoire Charles Coulomb, UMR5221 CNRS-Université Montpellier II, Place Eugène Bataillon - cc074, 34095 Montpellier Cedex 5, France
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38
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Miniussi E, Pozzo M, Baraldi A, Vesselli E, Zhan RR, Comelli G, Menteş TO, Niño MA, Locatelli A, Lizzit S, Alfè D. Thermal stability of corrugated epitaxial graphene grown on Re(0001). PHYSICAL REVIEW LETTERS 2011; 106:216101. [PMID: 21699318 DOI: 10.1103/physrevlett.106.216101] [Citation(s) in RCA: 20] [Impact Index Per Article: 1.4] [Reference Citation Analysis] [Abstract] [Track Full Text] [Subscribe] [Scholar Register] [Received: 02/24/2011] [Indexed: 05/31/2023]
Abstract
We report on a novel approach to determine the relationship between the corrugation and the thermal stability of epitaxial graphene grown on a strongly interacting substrate. According to our density functional theory calculations, the C single layer grown on Re(0001) is strongly corrugated, with a buckling of 1.6 Å, yielding a simulated C 1s core level spectrum which is in excellent agreement with the experimental one. We found that corrugation is closely knit with the thermal stability of the C network: C-C bond breaking is favored in the strongly buckled regions of the moiré cell, though it requires the presence of diffusing graphene layer vacancies.
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Affiliation(s)
- E Miniussi
- Physics Department and CENMAT, University of Trieste, Via Valerio 2, I-34127 Trieste, Italy
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Tiberj A, Huntzinger JR, Camassel J, Hiebel F, Mahmood A, Mallet P, Naud C, Veuillen JY. Multiscale investigation of graphene layers on 6H-SiC(000-1). NANOSCALE RESEARCH LETTERS 2011; 6:171. [PMID: 21711702 PMCID: PMC3211224 DOI: 10.1186/1556-276x-6-171] [Citation(s) in RCA: 1] [Impact Index Per Article: 0.1] [Reference Citation Analysis] [Abstract] [Track Full Text] [Figures] [Subscribe] [Scholar Register] [Received: 09/06/2010] [Accepted: 02/24/2011] [Indexed: 05/31/2023]
Abstract
In this article, a multiscale investigation of few graphene layers grown on 6H-SiC(000-1) under ultrahigh vacuum (UHV) conditions is presented. At 100-μm scale, the authors show that the UHV growth yields few layer graphene (FLG) with an average thickness given by Auger spectroscopy between 1 and 2 graphene planes. At the same scale, electron diffraction reveals a significant rotational disorder between the first graphene layer and the SiC surface, although well-defined preferred orientations exist. This is confirmed at the nanometer scale by scanning tunneling microscopy (STM). Finally, STM (at the nm scale) and Raman spectroscopy (at the μm scale) show that the FLG stacking is turbostratic, and that the domain size of the crystallites ranges from 10 to 100 nm. The most striking result is that the FLGs experience a strong compressive stress that is seldom observed for graphene grown on the C face of SiC substrates.
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Affiliation(s)
- Antoine Tiberj
- Groupe d'Etude des Semiconducteurs, UMR5650 CNRS-Université Montpellier II, cc074, Place Eugène Bataillon, 34095 Montpellier Cedex 5, France
| | - Jean-Roch Huntzinger
- Groupe d'Etude des Semiconducteurs, UMR5650 CNRS-Université Montpellier II, cc074, Place Eugène Bataillon, 34095 Montpellier Cedex 5, France
| | - Jean Camassel
- Groupe d'Etude des Semiconducteurs, UMR5650 CNRS-Université Montpellier II, cc074, Place Eugène Bataillon, 34095 Montpellier Cedex 5, France
| | - Fanny Hiebel
- Institut Néel, CNRS-UJF, Boîte Postale 166, 38042 Grenoble Cedex 9, France
| | - Ather Mahmood
- Institut Néel, CNRS-UJF, Boîte Postale 166, 38042 Grenoble Cedex 9, France
| | - Pierre Mallet
- Institut Néel, CNRS-UJF, Boîte Postale 166, 38042 Grenoble Cedex 9, France
| | - Cecile Naud
- Institut Néel, CNRS-UJF, Boîte Postale 166, 38042 Grenoble Cedex 9, France
| | - Jean-Yves Veuillen
- Institut Néel, CNRS-UJF, Boîte Postale 166, 38042 Grenoble Cedex 9, France
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