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Schelchshorn M, Stilp F, Weiss M, Giessibl FJ. On the origin and elimination of cross coupling between tunneling current and excitation in scanning probe experiments that utilize the qPlus sensor. THE REVIEW OF SCIENTIFIC INSTRUMENTS 2023; 94:113704. [PMID: 38010157 DOI: 10.1063/5.0151615] [Citation(s) in RCA: 0] [Impact Index Per Article: 0] [Reference Citation Analysis] [Abstract] [Track Full Text] [Subscribe] [Scholar Register] [Received: 03/23/2023] [Accepted: 10/26/2023] [Indexed: 11/29/2023]
Abstract
The qPlus sensor allows for the simultaneous operation of scanning tunneling microscopy (STM) and atomic force microscopy (AFM). When operating a combined qPlus sensor STM/AFM at large tunneling currents, a hitherto unexplained tunneling current-induced cross coupling can occur, which has already been observed decades ago. Here, we study this phenomenon both theoretically and experimentally; its origin is voltage drops on the order of μV that lead to an excitation or a damping of the oscillation, depending on the sign of the current. Ideally, the voltage drops would be phase-shifted by π/2 with respect to a proper phase angle for driving and would, thus, not be a problem. However, intrinsic RC components in the current wiring lead to a phase shift that does enable drive or damping. Our theoretical model fully describes the experimental findings, and we also propose a way to prevent current-induced excitation or damping.
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Affiliation(s)
- Michael Schelchshorn
- University of Regensburg, Institute of Experimental and Applied Physics, Universitätsstrasse 31, D-93040 Regensburg, Germany
| | - Fabian Stilp
- University of Regensburg, Institute of Experimental and Applied Physics, Universitätsstrasse 31, D-93040 Regensburg, Germany
| | - Marco Weiss
- University of Regensburg, Institute of Experimental and Applied Physics, Universitätsstrasse 31, D-93040 Regensburg, Germany
| | - Franz J Giessibl
- University of Regensburg, Institute of Experimental and Applied Physics, Universitätsstrasse 31, D-93040 Regensburg, Germany
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2
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Yesilpinar D, Schulze Lammers B, Timmer A, Amirjalayer S, Fuchs H, Mönig H. High resolution noncontact atomic force microscopy imaging with oxygen-terminated copper tips at 78 K. NANOSCALE 2020; 12:2961-2965. [PMID: 31970359 DOI: 10.1039/c9nr10450j] [Citation(s) in RCA: 1] [Impact Index Per Article: 0.2] [Reference Citation Analysis] [Abstract] [Track Full Text] [Subscribe] [Scholar Register] [Indexed: 06/10/2023]
Abstract
Functionalizing atomic force microscopy (AFM) tips by picking up single inert probe particles like CO or Xe from the surface drastically increase the resolution. In particular, this approach allows imaging organic molecules with submolecular resolution revealing their internal bonding structure. However, due to the weak coupling of these probe particles to both, the surface they are picked up from and the tip apex, these experiments require liquid helium temperatures (i.e.≈5 K). In the present study we demonstrate that functionalizing an AFM tip with an atomically defined O-terminated copper tip (CuOx tip) allows performing such experiments at liquid nitrogen temperatures (i.e.≈78 K) with outstanding quality. We show that it is possible to utilize CuOx tips for chemically selective imaging of a copper oxide nanodomain on a partially oxidized Cu(110) surface in the repulsive force regime at elevated temperatures. Moreover, the high structural and chemical stability of CuOx tips allow even ex situ investigations where these tips are used to perform experiments on other, non-Cu, non-oxidized, substrates. In particular, we present results obtained from a dicoronylene (DCLN) molecule with submolecular resolution. An analysis of inner and peripheral bond lengths of the DCLN molecule shows excellent agreement with theoretical gas phase simulations emphasizing the exceptional imaging properties of CuOx tips also at elevated temperatures.
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Affiliation(s)
- Damla Yesilpinar
- Physikalisches Institut, Westfälische Wilhelms-Universität, Wilhelm-Klemm-Straße 10, 48149 Münster, Germany.
| | - Bertram Schulze Lammers
- Physikalisches Institut, Westfälische Wilhelms-Universität, Wilhelm-Klemm-Straße 10, 48149 Münster, Germany.
| | - Alexander Timmer
- Physikalisches Institut, Westfälische Wilhelms-Universität, Wilhelm-Klemm-Straße 10, 48149 Münster, Germany.
| | - Saeed Amirjalayer
- Physikalisches Institut, Westfälische Wilhelms-Universität, Wilhelm-Klemm-Straße 10, 48149 Münster, Germany.
| | - Harald Fuchs
- Physikalisches Institut, Westfälische Wilhelms-Universität, Wilhelm-Klemm-Straße 10, 48149 Münster, Germany.
| | - Harry Mönig
- Physikalisches Institut, Westfälische Wilhelms-Universität, Wilhelm-Klemm-Straße 10, 48149 Münster, Germany.
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Kirpal DJ, Pürckhauer K, Weymouth AJ, Giessibl FJ. Ion mobility and material transport on KBr in air as a function of the relative humidity. BEILSTEIN JOURNAL OF NANOTECHNOLOGY 2019; 10:2084-2093. [PMID: 31728256 PMCID: PMC6839551 DOI: 10.3762/bjnano.10.203] [Citation(s) in RCA: 1] [Impact Index Per Article: 0.2] [Reference Citation Analysis] [Abstract] [Key Words] [Track Full Text] [Figures] [Subscribe] [Scholar Register] [Received: 06/28/2019] [Accepted: 10/09/2019] [Indexed: 06/10/2023]
Abstract
Surfaces exposed to air can change their structure due to external influences such as chemical reactions or material exchange and movement. The adsorbed water layer that is present under ambient conditions plays an important role especially for highly soluble materials. Surface atoms can easily diffuse into the thin water layer and, when surface conditions are favorable, they can re-attach to the surface. We collected atomic force microscopy images of KBr surfaces in a humidity-controlled glove box at various relative humidities below 40%. By scratching and poking the surface with the AFM tip, we constructed energetically unfavorable holes or scratch sites and material accumulations and recorded the evolution of these defects as a function of the time. We observed an exponential decay of the size of the defects and material accumulations, and from this data we determined energy barriers to dissolution and aggregation of approximately 0.9 eV.
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Affiliation(s)
- Dominik J Kirpal
- Institute of Experimental and Applied Physics, University of Regensburg, 93040 Regensburg, Germany
| | - Korbinian Pürckhauer
- Institute of Experimental and Applied Physics, University of Regensburg, 93040 Regensburg, Germany
| | - Alfred J Weymouth
- Institute of Experimental and Applied Physics, University of Regensburg, 93040 Regensburg, Germany
| | - Franz J Giessibl
- Institute of Experimental and Applied Physics, University of Regensburg, 93040 Regensburg, Germany
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Giessibl FJ. The qPlus sensor, a powerful core for the atomic force microscope. THE REVIEW OF SCIENTIFIC INSTRUMENTS 2019; 90:011101. [PMID: 30709191 DOI: 10.1063/1.5052264] [Citation(s) in RCA: 156] [Impact Index Per Article: 26.0] [Reference Citation Analysis] [Abstract] [Track Full Text] [Subscribe] [Scholar Register] [Received: 08/15/2018] [Accepted: 12/25/2018] [Indexed: 05/27/2023]
Abstract
Atomic force microscopy (AFM) was introduced in 1986 and has since made its way into surface science, nanoscience, chemistry, biology, and material science as an imaging and manipulating tool with a rising number of applications. AFM can be employed in ambient and liquid environments as well as in vacuum and at low and ultralow temperatures. The technique is an offspring of scanning tunneling microscopy (STM), where the tunneling tip of the STM is replaced by using a force sensor with an attached tip. Measuring the tiny chemical forces that act between the tip and the sample is more difficult than measuring the tunneling current in STM. Therefore, even 30 years after the introduction of AFM, progress in instrumentation is substantial. Here, we focus on the core of the AFM, the force sensor with its tip and detection mechanism. Initially, force sensors were mainly micro-machined silicon cantilevers, mainly using optical methods to detect their deflection. The qPlus sensor, originally based on a quartz tuning fork and now custom built from quartz, is self-sensing by utilizing the piezoelectricity of quartz. The qPlus sensor allows us to perform STM and AFM in parallel, and the spatial resolution of its AFM channel has reached the subatomic level, exceeding the resolution of STM. Frequency modulation AFM (FM-AFM), where the frequency of an oscillating cantilever is altered by the gradient of the force that acts between the tip and the sample, has emerged over the years as the method that provides atomic and subatomic spatial resolution as well as force spectroscopy with sub-piconewton sensitivity. FM-AFM is precise; because of all physical observables, time and frequency can be measured by far with the greatest accuracy. By design, FM-AFM clearly separates conservative and dissipative interactions where conservative forces induce a frequency shift and dissipative interactions alter the power needed to maintain a constant oscillation amplitude of the cantilever. As it operates in a noncontact mode, it enables simultaneous AFM and STM measurements. The frequency stability of quartz and the small oscillation amplitudes that are possible with stiff quartz sensors optimize the signal to noise ratio. Here, we discuss the operating principles, the assembly of qPlus sensors, amplifiers, limiting factors, and applications. Applications encompass unprecedented subatomic spatial resolution, the measurement of forces that act in atomic manipulation, imaging and spectroscopy of spin-dependent forces, and atomic resolution of organic molecules, graphite, graphene, and oxides.
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Affiliation(s)
- Franz J Giessibl
- Institute of Experimental and Applied Physics, University of Regensburg, Universitätsstrasse 31, D-93040 Regensburg, Germany
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Goronzy DP, Ebrahimi M, Rosei F, Fang Y, De Feyter S, Tait SL, Wang C, Beton PH, Wee ATS, Weiss PS, Perepichka DF. Supramolecular Assemblies on Surfaces: Nanopatterning, Functionality, and Reactivity. ACS NANO 2018; 12:7445-7481. [PMID: 30010321 DOI: 10.1021/acsnano.8b03513] [Citation(s) in RCA: 161] [Impact Index Per Article: 23.0] [Reference Citation Analysis] [Abstract] [Key Words] [Track Full Text] [Subscribe] [Scholar Register] [Indexed: 05/22/2023]
Abstract
Understanding how molecules interact to form large-scale hierarchical structures on surfaces holds promise for building designer nanoscale constructs with defined chemical and physical properties. Here, we describe early advances in this field and highlight upcoming opportunities and challenges. Both direct intermolecular interactions and those that are mediated by coordinated metal centers or substrates are discussed. These interactions can be additive, but they can also interfere with each other, leading to new assemblies in which electrical potentials vary at distances much larger than those of typical chemical interactions. Earlier spectroscopic and surface measurements have provided partial information on such interfacial effects. In the interim, scanning probe microscopies have assumed defining roles in the field of molecular organization on surfaces, delivering deeper understanding of interactions, structures, and local potentials. Self-assembly is a key strategy to form extended structures on surfaces, advancing nanolithography into the chemical dimension and providing simultaneous control at multiple scales. In parallel, the emergence of graphene and the resulting impetus to explore 2D materials have broadened the field, as surface-confined reactions of molecular building blocks provide access to such materials as 2D polymers and graphene nanoribbons. In this Review, we describe recent advances and point out promising directions that will lead to even greater and more robust capabilities to exploit designer surfaces.
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Affiliation(s)
- Dominic P Goronzy
- California NanoSystems Institute , University of California, Los Angeles , Los Angeles , California 90095 , United States
- Department of Chemistry and Biochemistry , University of California, Los Angeles , Los Angeles , California 90095 , United States
| | - Maryam Ebrahimi
- INRS Centre for Energy, Materials and Telecommunications , 1650 Boul. Lionel Boulet , Varennes , Quebec J3X 1S2 , Canada
| | - Federico Rosei
- INRS Centre for Energy, Materials and Telecommunications , 1650 Boul. Lionel Boulet , Varennes , Quebec J3X 1S2 , Canada
- Institute for Fundamental and Frontier Science , University of Electronic Science and Technology of China , Chengdu 610054 , P.R. China
| | - Yuan Fang
- Department of Chemistry , McGill University , Montreal H3A 0B8 , Canada
| | - Steven De Feyter
- Department of Chemistry , KU Leuven , Celestijnenlaan 200F , Leuven 3001 , Belgium
| | - Steven L Tait
- Department of Chemistry , Indiana University , Bloomington , Indiana 47405 , United States
| | - Chen Wang
- National Center for Nanoscience and Technology , Beijing 100190 , China
| | - Peter H Beton
- School of Physics & Astronomy , University of Nottingham , Nottingham NG7 2RD , United Kingdom
| | - Andrew T S Wee
- Department of Physics , National University of Singapore , 117542 Singapore
| | - Paul S Weiss
- California NanoSystems Institute , University of California, Los Angeles , Los Angeles , California 90095 , United States
- Department of Chemistry and Biochemistry , University of California, Los Angeles , Los Angeles , California 90095 , United States
- Department of Materials Science and Engineering , University of California, Los Angeles , Los Angeles , California 90095 , United States
| | - Dmitrii F Perepichka
- California NanoSystems Institute , University of California, Los Angeles , Los Angeles , California 90095 , United States
- Department of Chemistry , McGill University , Montreal H3A 0B8 , Canada
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6
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Imaging in Biologically-Relevant Environments with AFM Using Stiff qPlus Sensors. Sci Rep 2018; 8:9330. [PMID: 29921947 PMCID: PMC6008343 DOI: 10.1038/s41598-018-27608-6] [Citation(s) in RCA: 21] [Impact Index Per Article: 3.0] [Reference Citation Analysis] [Abstract] [Track Full Text] [Download PDF] [Figures] [Journal Information] [Subscribe] [Scholar Register] [Received: 03/15/2018] [Accepted: 06/04/2018] [Indexed: 11/08/2022] Open
Abstract
High-resolution imaging of soft biological samples with atomic force microscopy (AFM) is challenging because they must be imaged with small forces to prevent deformation. Typically, AFM of those samples is performed with soft silicon cantilevers (k ≈ 0.1-10 N/m) and optical detection in a liquid environment. We set up a new microscope that uses a stiff qPlus sensor (k ≥ 1 kN/m). Several complex biologically-relevant solutions are non-transparent, and even change their optical properties over time, such as the cell culture medium we used. While this would be problematic for AFM setups with optical detection, it is no problem for our qPlus setup which uses electrical detection. The high stiffness of the qPlus sensor allows us to use small amplitudes in frequency-modulation mode and obtain high Q factors even in liquid. The samples are immersed in solution in a liquid cell and long tips are used, with only the tip apex submerged. We discuss the noise terms and compare the minimal detectable signal to that of soft cantilevers. Atomic resolution of muscovite mica was achieved in various liquids: H2O, Tris buffer and a cell culture medium. We show images of lipid membranes in which the individual head groups are resolved.
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7
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Hinaut A, Meier T, Pawlak R, Feund S, Jöhr R, Kawai S, Glatzel T, Decurtins S, Müllen K, Narita A, Liu SX, Meyer E. Electrospray deposition of structurally complex molecules revealed by atomic force microscopy. NANOSCALE 2018; 10:1337-1344. [PMID: 29296988 DOI: 10.1039/c7nr06261c] [Citation(s) in RCA: 18] [Impact Index Per Article: 2.6] [Reference Citation Analysis] [Abstract] [Track Full Text] [Subscribe] [Scholar Register] [Indexed: 05/26/2023]
Abstract
Advances in organic chemistry allow the synthesis of large, complex and highly functionalized organic molecules having potential applications in optoelectronics, molecular electronics and organic solar cells. Their integration into devices as individual components or highly ordered thin-films is of paramount importance to address these future prospects. However, conventional sublimation techniques in vacuum are usually not applicable since large organic compounds are often non-volatile and decompose upon heating. Here, we prove by atomic force microscopy and scanning tunneling microscopy, the structural integrity of complex organic molecules deposited onto an Au(111) surface using electrospray ionisation deposition. High resolution AFM measurements with CO-terminated tips unambiguously reveal their successful transfer from solution to the gold surface in ultra-high vacuum without degradation of their chemical structures. Furthermore, the formation of molecular structures from small islands to large and highly-ordered self-assemblies of those fragile molecules is demonstrated, confirming the use of electrospray ionisation to promote also on-surface polymerization reactions of highly functionalized organic compounds, biological molecules or molecular magnets.
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Affiliation(s)
- Antoine Hinaut
- Department of Physics, University of Basel, Klingelbergstrasse 82, CH 4056 Basel, Switzerland.
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9
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Hoffmann-Vogel R. Imaging prototypical aromatic molecules on insulating surfaces: a review. REPORTS ON PROGRESS IN PHYSICS. PHYSICAL SOCIETY (GREAT BRITAIN) 2018; 81:016501. [PMID: 28958993 DOI: 10.1088/1361-6633/aa8fda] [Citation(s) in RCA: 9] [Impact Index Per Article: 1.3] [Reference Citation Analysis] [Abstract] [Track Full Text] [Subscribe] [Scholar Register] [Indexed: 06/07/2023]
Abstract
Insulating substrates allow for in-plane contacted molecular electronics devices where the molecule is in contact with the insulator. For the development of such devices it is important to understand the interaction of molecules with insulating surfaces. As substrates, ionic crystals such as KBr, KCl, NaCl and CaF2 are discussed. The surface energies of these substrates are small and as a consequence intrinsic properties of the molecules, such as molecule-molecule interaction, become more important relative to interactions with the substrates. As prototypical molecules, three variants of graphene-related molecules are used, pentacene, [Formula: see text] and PTCDA. Pentacene is a good candidate for molecular electronics applications due to its high charge carrier mobility. It shows mainly an upright standing growth mode and the morphology of the islands is strongly influenced by dewetting. A new second flat-lying phase of the molecule has been observed. Studying the local work function using the Kelvin method reveals details such as line defects in the center of islands. The local work function differences between the upright-standing and flat-lying phase can only be explained by charge transfer that is unusual on ionic crystalline surfaces. [Formula: see text] nucleation and growth is explained by loosely bound molecules at kink sites as nucleation sites. The stability of [Formula: see text] islands as a function of magic numbers is investigated. Peculiar island shapes are obtained from unusual dewetting processes already at work during growth, where molecules 'climb' to the second molecular layer. PTCDA is a prototypical semiconducting molecule with strong quadrupole moment. It grows in the form of elongated islands where the top and the facets can be molecularly resolved. In this way the precise molecular arrangement in the islands is revealed.
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Affiliation(s)
- R Hoffmann-Vogel
- Physikalisches Institut, Karlsruhe Institute of Technology (KIT), D-76131 Karlsruhe, Germany. Institut für Angewandte Physik, Karlsruhe Institute of Technology (KIT), D-76131 Karlsruhe, Germany
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10
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Jelínek P. High resolution SPM imaging of organic molecules with functionalized tips. JOURNAL OF PHYSICS. CONDENSED MATTER : AN INSTITUTE OF PHYSICS JOURNAL 2017; 29:343002. [PMID: 28749786 DOI: 10.1088/1361-648x/aa76c7] [Citation(s) in RCA: 61] [Impact Index Per Article: 7.6] [Reference Citation Analysis] [Abstract] [Track Full Text] [Subscribe] [Scholar Register] [Indexed: 05/22/2023]
Abstract
One of the most remarkable and exciting achievements in the field of scanning probe microscopy (SPM) in the last years is the unprecedented sub-molecular resolution of both atomic and electronic structures of single molecules deposited on solid state surfaces. Despite its youth, the technique has already brought many new possibilities to perform different kinds of measurements, which cannot be accomplished by other techniques. This opens new perspectives in advanced characterization of physical and chemical processes and properties of molecular structures on surfaces. Here, we discuss the history and recent progress of the high resolution imaging with a functionalized probe by means of atomic force microscopy (AFM), scanning tunnelling microscopy (STM) and inelastic electron tunneling spectroscopy (IETS). We describe the mechanisms responsible for the high-resolution AFM, STM and IETS-STM contrast. The complexity of this technique requires new theoretical approaches, where a relaxation of the functionalized probe is considered. We emphasise the similarities of the mechanism driving high-resolution SPM with other imaging methods. We also summarise briefly significant achievements and progress in different branches. Finally we provide brief perspectives and remaining challenges of the further refinement of these high-resolution methods.
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Affiliation(s)
- Pavel Jelínek
- Institute of Physics, Czech Academy of Sciences, Cukrovarnická 10, 162 00, Prague, Czech Republic
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Martínez-Galera AJ, Wei Z, Nicoara N, Brihuega I, Gómez-Rodríguez JM. PTCDA growth on Ge(111)-[Formula: see text] surfaces: a scanning tunneling microscopy study. NANOTECHNOLOGY 2017; 28:095703. [PMID: 28060777 DOI: 10.1088/1361-6528/aa5783] [Citation(s) in RCA: 1] [Impact Index Per Article: 0.1] [Reference Citation Analysis] [Abstract] [Track Full Text] [Subscribe] [Scholar Register] [Indexed: 06/06/2023]
Abstract
The initial stages of growth of PTCDA (3,4,9,10 perylene tetracarboxylic dianhydride) at room temperature (RT) on Ge(111)-[Formula: see text] surfaces have been studied by means of scanning tunneling microscopy (STM) under ultrahigh vacuum conditions. The results show that PTCDA molecules have a high mobility at RT on the well ordered areas of the semiconductor substrate, since nucleation is only observed in domain walls, steps and surface defects. However, no molecular ordering has been detected at submonolayer coverage. For higher coverages, the formation of three-dimensional (3D) molecular islands has been observed. These 3D islands present a crystalline nature as demostrated by molecularly resolved STM images. According to these STM measurements, PTCDA molecules are ordered in a herringbone structure, similar to the one observed in PTCDA bulk crystals. Moreover, the 3D crystallites are grown on top of a disordered molecular layer, which acts as a passivating layer.
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Affiliation(s)
- A J Martínez-Galera
- Departamento de Física de la Materia Condensada, Universidad Autónoma de Madrid, E-28049 Madrid, Spain
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12
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Labidi H, Koleini M, Huff T, Salomons M, Cloutier M, Pitters J, Wolkow RA. Indications of chemical bond contrast in AFM images of a hydrogen-terminated silicon surface. Nat Commun 2017; 8:14222. [PMID: 28194036 PMCID: PMC5316802 DOI: 10.1038/ncomms14222] [Citation(s) in RCA: 16] [Impact Index Per Article: 2.0] [Reference Citation Analysis] [Abstract] [Track Full Text] [Download PDF] [Figures] [Journal Information] [Subscribe] [Scholar Register] [Received: 03/10/2016] [Accepted: 12/08/2016] [Indexed: 01/05/2023] Open
Abstract
The origin of bond-resolved atomic force microscope images remains controversial. Moreover, most work to date has involved planar, conjugated hydrocarbon molecules on a metal substrate thereby limiting knowledge of the generality of findings made about the imaging mechanism. Here we report the study of a very different sample; a hydrogen-terminated silicon surface. A procedure to obtain a passivated hydrogen-functionalized tip is defined and evolution of atomic force microscopy images at different tip elevations are shown. At relatively large tip-sample distances, the topmost atoms appear as distinct protrusions. However, on decreasing the tip-sample distance, features consistent with the silicon covalent bonds of the surface emerge. Using a density functional tight-binding-based method to simulate atomic force microscopy images, we reproduce the experimental results. The role of the tip flexibility and the nature of bonds and false bond-like features are discussed. Whether and under what circumstances chemical bonds could be imaged via force microscopy is a controversial topic. Here authors develop a particular combination of model surface, imaging procedures and simulation approach and discuss possible indications of chemical contrast in imaging data they obtain.
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Affiliation(s)
- Hatem Labidi
- Department of Physics, University of Alberta, Edmonton, Alberta, Canada T6G 2J1.,National Institute for Nanotechnology, National Research Council of Canada, Edmonton, Alberta, Canada T6G 2M9
| | - Mohammad Koleini
- Department of Physics, University of Alberta, Edmonton, Alberta, Canada T6G 2J1.,National Institute for Nanotechnology, National Research Council of Canada, Edmonton, Alberta, Canada T6G 2M9
| | - Taleana Huff
- Department of Physics, University of Alberta, Edmonton, Alberta, Canada T6G 2J1
| | - Mark Salomons
- National Institute for Nanotechnology, National Research Council of Canada, Edmonton, Alberta, Canada T6G 2M9
| | - Martin Cloutier
- National Institute for Nanotechnology, National Research Council of Canada, Edmonton, Alberta, Canada T6G 2M9
| | - Jason Pitters
- National Institute for Nanotechnology, National Research Council of Canada, Edmonton, Alberta, Canada T6G 2M9
| | - Robert A Wolkow
- Department of Physics, University of Alberta, Edmonton, Alberta, Canada T6G 2J1.,National Institute for Nanotechnology, National Research Council of Canada, Edmonton, Alberta, Canada T6G 2M9
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13
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Nicoara N, Méndez J, Gómez-Rodríguez JM. Growth of ordered molecular layers of PTCDA on Pb/Si(111) surfaces: a scanning tunneling microscopy study. NANOTECHNOLOGY 2016; 27:365706. [PMID: 27482876 DOI: 10.1088/0957-4484/27/36/365706] [Citation(s) in RCA: 1] [Impact Index Per Article: 0.1] [Reference Citation Analysis] [Abstract] [Track Full Text] [Subscribe] [Scholar Register] [Indexed: 06/06/2023]
Abstract
The growth of well-ordered layers of PTCDA (3,4,9,10-perylene-tetracarboxylic-dianhydride) molecules on Pb/Si(111) surfaces has been investigated by scanning tunneling microscopy (STM) under ultra-high vacuum conditions. These Pb/Si(111) substrates, which present several distinct phases with different reconstructions, have allowed the exploration of new passivation schemes for the growth of ordered organic layers on Si(111) surfaces. According to our STM measurements, the higher Pb coverage phases (namely the so-called hexagonal incommensurate and [Formula: see text] reconstructions) present rather inert surfaces that allow easy diffusion of PTCDA molecules at room temperature and the formation of a well ordered first molecular layer which displays a herringbone reconstruction. For multilayer PTCDA coverage on these Pb/Si(111) phases, the formation of three-dimensional crystallites, with structure similar to that of the bulk PTCDA crystal, has been observed, indicating that a Stranski-Krastanov growth mode is dominant. On lower Pb coverage substrates (presenting the defective [Formula: see text] and mosaic [Formula: see text] reconstructions) no long range PTCDA order has been obtained. The systematic variation of the substrate reconstruction has allowed in the present work the relation of the surface reactivity of each reconstruction to the formation of ordered layers of PTCDA on Pb/Si(111) substrates.
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Affiliation(s)
- N Nicoara
- Departamento de Física de la Materia Condensada, Universidad Autónoma de Madrid, E-28049-Madrid, Spain. International Iberian Nanotechnology Laboratory, 4715-330 Braga, Portugal
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14
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Hapala P, Švec M, Stetsovych O, van der Heijden NJ, Ondráček M, van der Lit J, Mutombo P, Swart I, Jelínek P. Mapping the electrostatic force field of single molecules from high-resolution scanning probe images. Nat Commun 2016; 7:11560. [PMID: 27230940 PMCID: PMC4894979 DOI: 10.1038/ncomms11560] [Citation(s) in RCA: 67] [Impact Index Per Article: 7.4] [Reference Citation Analysis] [Abstract] [Track Full Text] [Download PDF] [Figures] [Journal Information] [Subscribe] [Scholar Register] [Received: 11/05/2015] [Accepted: 04/08/2016] [Indexed: 01/06/2023] Open
Abstract
How electronic charge is distributed over a molecule determines to a large extent its chemical properties. Here, we demonstrate how the electrostatic force field, originating from the inhomogeneous charge distribution in a molecule, can be measured with submolecular resolution. We exploit the fact that distortions typically observed in high-resolution atomic force microscopy images are for a significant part caused by the electrostatic force acting between charges of the tip and the molecule of interest. By finding a geometrical transformation between two high-resolution AFM images acquired with two different tips, the electrostatic force field or potential over individual molecules and self-assemblies thereof can be reconstructed with submolecular resolution. The chemical properties of molecules are largely determined by the distribution of charge across them. Here, the authors demonstrate how the electrostatic force field, originating from the inhomogeneous charge distribution in a molecule, can be measured with sub-molecular resolution.
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Affiliation(s)
- Prokop Hapala
- Department of Thin Films and Nanostructures, Institute of Physics, Academy of Sciences of the Czech Republic, v.v.i., Cukrovarnická 10, 162 00 Prague, Czech Republic
| | - Martin Švec
- Department of Thin Films and Nanostructures, Institute of Physics, Academy of Sciences of the Czech Republic, v.v.i., Cukrovarnická 10, 162 00 Prague, Czech Republic
| | - Oleksandr Stetsovych
- Department of Thin Films and Nanostructures, Institute of Physics, Academy of Sciences of the Czech Republic, v.v.i., Cukrovarnická 10, 162 00 Prague, Czech Republic
| | - Nadine J van der Heijden
- Department of Chemistry, Condensed Matter and Interfaces, Debye Institute for Nanomaterials Science, Utrecht University, PO Box 80 000, 3508 TA Utrecht, The Netherlands
| | - Martin Ondráček
- Department of Thin Films and Nanostructures, Institute of Physics, Academy of Sciences of the Czech Republic, v.v.i., Cukrovarnická 10, 162 00 Prague, Czech Republic
| | - Joost van der Lit
- Department of Chemistry, Condensed Matter and Interfaces, Debye Institute for Nanomaterials Science, Utrecht University, PO Box 80 000, 3508 TA Utrecht, The Netherlands
| | - Pingo Mutombo
- Department of Thin Films and Nanostructures, Institute of Physics, Academy of Sciences of the Czech Republic, v.v.i., Cukrovarnická 10, 162 00 Prague, Czech Republic
| | - Ingmar Swart
- Department of Chemistry, Condensed Matter and Interfaces, Debye Institute for Nanomaterials Science, Utrecht University, PO Box 80 000, 3508 TA Utrecht, The Netherlands
| | - Pavel Jelínek
- Department of Thin Films and Nanostructures, Institute of Physics, Academy of Sciences of the Czech Republic, v.v.i., Cukrovarnická 10, 162 00 Prague, Czech Republic
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15
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Krawiec M. Resolving the complex structure of molecular networks. NANOTECHNOLOGY 2016; 27:032502. [PMID: 26655605 DOI: 10.1088/0957-4484/27/3/032502] [Citation(s) in RCA: 0] [Impact Index Per Article: 0] [Reference Citation Analysis] [Abstract] [Track Full Text] [Subscribe] [Scholar Register] [Indexed: 06/05/2023]
Abstract
The arrangement of molecules in molecular networks determines their physical and chemical properties. Addressing this fundamental issue requires proper structural characterization tools. Due to an overlap, interdigitation, tilting or stacking of molecules revealing the structure of the networks is challenging. Tebi et al (2015 Nanotechnology 27 025704) developed a clever approach that enables accessing the arrangement of individual molecules in complex chemical networks. The proposed method utilizes imaging and manipulation with scanning tunneling microscopy.
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Affiliation(s)
- Mariusz Krawiec
- Institute of Physics, Maria Curie-Skłodowska University, pl. M. Curie-Skłodowskiej 1, 20-031 Lublin, Poland
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Jarvis SP. Resolving Intra- and Inter-Molecular Structure with Non-Contact Atomic Force Microscopy. Int J Mol Sci 2015; 16:19936-59. [PMID: 26307976 PMCID: PMC4581333 DOI: 10.3390/ijms160819936] [Citation(s) in RCA: 35] [Impact Index Per Article: 3.5] [Reference Citation Analysis] [Abstract] [Key Words] [MESH Headings] [Track Full Text] [Download PDF] [Figures] [Journal Information] [Subscribe] [Scholar Register] [Received: 06/26/2015] [Revised: 07/24/2015] [Accepted: 07/30/2015] [Indexed: 11/25/2022] Open
Abstract
A major challenge in molecular investigations at surfaces has been to image individual molecules, and the assemblies they form, with single-bond resolution. Scanning probe microscopy, with its exceptionally high resolution, is ideally suited to this goal. With the introduction of methods exploiting molecularly-terminated tips, where the apex of the probe is, for example, terminated with a single CO, Xe or H2 molecule, scanning probe methods can now achieve higher resolution than ever before. In this review, some of the landmark results related to attaining intramolecular resolution with non-contact atomic force microscopy (NC-AFM) are summarised before focussing on recent reports probing molecular assemblies where apparent intermolecular features have been observed. Several groups have now highlighted the critical role that flexure in the tip-sample junction plays in producing the exceptionally sharp images of both intra- and apparent inter-molecular structure. In the latter case, the features have been identified as imaging artefacts, rather than real intermolecular bonds. This review discusses the potential for NC-AFM to provide exceptional resolution of supramolecular assemblies stabilised via a variety of intermolecular forces and highlights the potential challenges and pitfalls involved in interpreting bonding interactions.
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Affiliation(s)
- Samuel Paul Jarvis
- School of Physics & Astronomy, University of Nottingham, Nottingham NG7 2RD, UK.
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