ShadowOui: a new visual environment for X-ray optics and synchrotron beamline simulations

Wavefront analysis and phase correctors design using SHADOW

Knife-edge imaging is a successful method for determining the wavefront distortion of focusing optics such as Kirkpatrick-Baez mirrors or compound refractive lenses. In this study, the wavefront error of an imperfect elliptical mirror is predicted by developing a knife-edge program using the SHADOW/OASYS platform. It is shown that the focusing optics can be aligned perfectly by minimizing the parabolic and cubic coefficients of the wavefront error. The residual wavefront error provides precise information about the figure/height errors of the focusing optics suggesting it as an accurate method for in situ optical metrology. A Python program is developed to design a customized wavefront refractive corrector to minimize the residual wavefront error. Uniform beam at and out of focus and higher peak intensity are achieved by the wavefront correction in comparison with ideal focusing. The developed code provides a quick way for wavefront error analysis and corrector design for non-ideal optics especially for the new-generation diffraction-limited sources, and saves considerable experimental time and effort.

Increased spatial coherence length from an asymmetric crystal reflection at grazing exit

Coherent X-ray imaging is an active field at synchrotron sources. The images rely on the available coherent flux over a limited field of view. At many synchrotron beamlines a double-crystal monochromator (DCM) is employed in a standard nondispersive arrangement. For coherent diffraction imaging it is advantageous to increase the available field of view by increasing the spatial coherence length (SCL) of a beam exiting such a DCM. Here, Talbot interferometry data together with ray-tracing simulations for a (+ - - +) four-reflection experimental arrangement are presented, wherein the first two reflections are in the DCM and the final fourth reflection is asymmetric at grazing exit. Analyses of the interferometry data combined with the simulations show that compared with the beam exiting the DCM a gain of 76% in the SCL was achieved, albeit with a factor of 20 reduction in flux density, which may not be a severe penalty at a synchrotron beamline. Previous efforts reported in the literature to increase the SCL that employed asymmetric crystal diffraction at grazing incidence are also discussed. A much reduced SCL is found presently in simulations wherein the same asymmetric crystal is set for grazing incidence instead of grazing exit. In addition, the present study is compared and contrasted with two other means of increasing the SCL. These are (i) focusing the beam onto an aperture to act as a secondary source, and (ii) allowing the beam to propagate in vacuum an additional distance along the beamline.

AutoFocus: AI-driven alignment of nanofocusing X-ray mirror systems

We describe the application of an AI-driven system to autonomously align complex x-ray-focusing mirror systems, including mirrors systems with variable focus spot sizes. The system has been developed and studied on a digital twin of nanofocusing X-ray beamlines, built using advanced optical simulation tools calibrated with wavefront sensing data collected at the beamline.We experimentally demonstrated that the system is reliably capable of positioning a focused beam on the sample, both by simulating the variation of a beamline with random perturbations due to typical changes in the light source and optical elements over time, and by conducting similar tests on an actual focusing mirror system.

A fast and lightweight tool for partially coherent beamline simulations in fourth-generation storage rings based on coherent mode decomposition

A new algorithm to perform coherent mode decomposition of undulator radiation is proposed. It is based on separating the horizontal and vertical directions, reducing the problem by working with one-dimension wavefronts. The validity conditions of this approximation are discussed. Simulations require low computer resources and run interactively on a laptop. The focusing with lenses of the radiation emitted by an undulator in a fourth-generation storage ring (EBS-ESRF) is studied. Results are compared against multiple optics packages implementing a variety of methods for dealing with partial coherence: full two-dimension coherent mode decomposition, Monte Carlo combination of wavefronts from electrons entering the undulator with different initial conditions, and hybrid ray-tracing correcting geometrical optics with wave optics.

A spatial beam property analyzer based on dispersive crystal diffraction for low-emittance X-ray light sources

The advent of low-emittance synchrotron X-ray sources and free-electron lasers urges the development of novel diagnostic techniques for measuring and monitoring the spatial source properties, especially the source sizes. This work introduces an X-ray beam property analyzer based on a multi-crystal diffraction geometry, including a crystal-based monochromator and a Laue crystal in a dispersive setting to the monochromator. By measuring the flat beam and the transmitted beam profiles, the system can provide a simultaneous high-sensitivity characterization of the source size, divergence, position, and angle in the diffraction plane of the multi-crystal system. Detailed theoretical modeling predicts the system's feasibility as a versatile characterization tool for monitoring the X-ray source and beam properties. The experimental validation was conducted at a bending magnet beamline at the Swiss Light Source by varying the machine parameters. A measurement sensitivity of less than 10% of a source size of around 12 µm is demonstrated. The proposed system offers a compact setup with simple X-ray optics and can also be utilized for monitoring the electron source.

Beamline simulations using monochromators with high d-spacing crystals

Monochromators for synchrotron radiation beamlines typically use perfect crystals for the hard X-ray regime and gratings for soft X-rays. There is an intermediate range, typically 1-3 keV (tender X-rays), which common perfect crystals have difficulties covering and gratings have low efficiency, although some less common crystals with high d-spacing could be suitable. To evaluate the suitability of these crystals for a particular beamline, it is useful to evaluate the crystals' performance using tools such as ray-tracing. However, simulations for double-crystal monochromators are only available for the most used crystals such as Si, Ge or diamond. Here, an upgrade of the SHADOW ray-tracing code and complementary tools in the OASYS suite are presented to simulate high d-spacing crystals with arbitrary, and sometimes complex, structures such as beryl, YB₆₆, muscovite, etc. Isotropic and anisotropic temperature factors are also considered. The YB₆₆ crystal with 1936 atomic sites in the unit cell is simulated, and its applicability for tender X-ray monochromators is discussed in the context of new low-emittance storage rings.

Beamline commissioning for microscopic measurements with ultraviolet and soft X-ray beam at the upgraded beamline BL-13B of the Photon Factory

Beamline 13 of the Photon Factory has been in operation since 2010 as a vacuum ultraviolet and soft X-ray undulator beamline for X-ray photoelectron spectroscopy (XPS), X-ray absorption spectroscopy (XAS), and angle-resolved photoelectron spectroscopy (ARPES) experiments. The beamline and the end-station at branch B have been recently upgraded, enabling microscopic XPS, XAS, and ARPES measurements to be performed. In 2015, a planar undulator insertion device was replaced with an APPLE-II (advanced planar polarized light emitter II) undulator. This replacement allows use of linear, circular, and elliptical polarized light between 48 and 2000 eV with photon intensities of 10⁹-10¹³ photons s^-1. For microscopic measurements, a toroidal post-mirror was renewed to have more focused beam with profile sizes of 78 µm (horizontal) × 15 µm (vertical) and 84 µm × 11 µm at photon energies of 100 and 400 eV, respectively. A high-precision sample manipulator composed of an XYZ translator, a rotary feedthrough, and a newly developed goniometer, which is essential for microscopic measurements, has been used to control a sample specimen in six degrees of freedom, i.e. translation in the X, Y, and Z directions and rotation in the polar, azimuthal, and tilt directions. To demonstrate the performance of the focused beams, one- and two-dimensional XPS and XAS scan measurements of a copper grid have been performed. It was indicated from analysis of XPS and XAS intensity maps that the actual spatial resolution can be determined by the beam size.

Operational status of the X-ray powder diffraction beamline at the SESAME synchrotron

The Materials Science (MS) beamline at SESAME (Synchrotron-light for Experimental Science and Applications in the Middle East), dedicated to the X-ray powder diffraction technique, started its operational phase in December 2020 by hosting its first users. The MS endstation comprises a two-circle diffractometer coupled with a PILATUS 300K area detector, with which direct beam images are collected and compared with the initial ray-tracing simulation results. We present a detailed description of the beamline components and the experimental characterization of the main instrumental parameters relying on the instrumental profile and the angular resolution. A representative example for microstructure investigations of a nanocrystalline material is demonstrated.

Development of a versatile micro-focused angle-resolved photoemission spectroscopy system with Kirkpatrick-Baez mirror optics

Angle-resolved photoemission spectroscopy using a micro-focused beam spot [micro-angle-resolved photoemission spectroscopy (ARPES)] is becoming a powerful tool to elucidate key electronic states of exotic quantum materials. We have developed a versatile micro-ARPES system based on the synchrotron radiation beam focused with a Kirkpatrick-Baez mirror optics. The mirrors are monolithically installed on a stage, which is driven with five-axis motion, and are vibrationally separated from the ARPES measurement system. Spatial mapping of the Au photolithography pattern on Si signifies the beam spot size of 10 µm (horizontal) × 12 µm (vertical) at the sample position, which is well suited to resolve the fine structure in local electronic states. Utilization of the micro-beam and the high precision sample motion system enables the accurate spatially resolved band-structure mapping, as demonstrated by the observation of a small band anomaly associated with tiny sample bending near the edge of a cleaved topological insulator single crystal.

Reflection Efficiency and Spectra Resolutions Ray-Tracing Simulations for the VOXES HAPG Crystal Based Von Hamos Spectrometer

The VOXES collaboration at INFN National Laboratories of Frascati developed a prototype of a high resolution Von Hamos X-ray spectrometer using HAPG (Highly Annealed Pyrolytic Graphite) mosaic crystals. This technology allows the employment of extended isotropic sources and could find application in several physics fields. The capability of the spectrometer to reach energy precision and resolution below 1 and 10 eV, respectively, when used with wide sources, has been already demonstrated. Recently, the response of this device, for a ρ = 206.7 mm cylindrically bent HAPG crystal using CuKα1,2 and FeKα1,2 XRF lines, has been investigated in terms of reflection efficiency by a dedicated ray-tracing simulation. Details of the simulation procedure and the comparison with the experimental results are presented. This study is crucial in order to retrieve information on the spectrometer signal collection efficiency, especially in the energy range in which the standard calibration procedures cannot be applied.

A compact extreme ultraviolet high-throughput spectrometer based on the multilayer varied-line-spacing grating

In this paper, we propose a compact extreme ultraviolet high-throughput spectrometer covering the 50-70 eV energy band. The key element in this spectrometer is a multilayer varied-line-spacing grating that operates in near-normal incidence geometry. The spectrometer can obtain one order of magnitude higher throughput compared to the traditional grazing incidence grating spectrometer in this energy band. The spectrum collection time and sample radiation damage can be largely reduced using the presented design.

NanoMAX: the hard X-ray nanoprobe beamline at the MAX IV Laboratory

NanoMAX is the first hard X-ray nanoprobe beamline at the MAX IV laboratory. It utilizes the unique properties of the world's first operational multi-bend achromat storage ring to provide an intense and coherent focused beam for experiments with several methods. In this paper we present the beamline optics design in detail, show the performance figures, and give an overview of the surrounding infrastructure and the operational diffraction endstation.

Simulations of applications using diaboloid mirrors

The diaboloid is a reflecting surface that converts a spherical wave to a cylindrical wave. This complex surface may find application in new Advanced Light Source bending-magnet beamlines or in other beamlines that now use toroidal optics for astigmatic focusing. Here, the numerical implementation of diaboloid mirrors is described, and the benefit of this mirror in beamlines exploiting diffraction-limited storage rings is studied by ray tracing. The use of diaboloids becomes especially interesting for the new low-emittance storage rings because the reduction of aberration becomes essential for such small sources. The validity of the toroidal and other mirror surfaces approximating the diaboloid, and the effect of the mirror magnification, are discussed.

Diaboloidal mirrors: algebraic solution and surface shape approximations

A new type of optical element that can focus a cylindrical wave to a point focus (or vice versa) is analytically described. Such waves are, for example, produced in a beamline where light is collimated in one direction and then doubly focused by a single optic. A classical example in X-ray optics is the collimated two-crystal monochromator, with toroidal mirror refocusing. The element here replaces the toroid, and in such a system provides completely aberration free, point-to-point imaging of rays from the on-axis source point. We present an analytic solution for the mirror shape in its laboratory coordinate system with zero slope at the centre, and approximate solutions, based on bending an oblique circular cone and a bent right circular cylinder, that may facilitate fabrication and metrology.

The multi-optics high-resolution absorption x-ray spectrometer (HiRAXS) for studies of materials under extreme conditions

We report the development of a high-resolution spectrometer for extended x-ray absorption fine structure (EXAFS) studies of materials under extreme conditions. A curved crystal and detector in the spectrometer are replaceable such that a single body is employed to perform EXAFS measurements at different x-ray energy intervals of interest. Two configurations have been implemented using toroidal crystals with Ge 311 reflection set to provide EXAFS at the Cu K-edge (energy range 8.9-9.8 keV) and Ge 400 reflection set to provide EXAFS at the Ta L3-edge (9.8-10.7 keV). Key performance characteristics of the spectrometer were found to be consistent with design parameters. The data generated at the National Ignition Facility have shown an ≃3 eV spectral resolution for the Cu K-edge configuration and ≃6 eV for the Ta L3-edge configuration.

X-SPEC: a 70 eV to 15 keV undulator beamline for X-ray and electron spectroscopies

X-SPEC is a high-flux spectroscopy beamline at the KIT (Karlsruhe Institute of Technology) Synchrotron for electron and X-ray spectroscopy featuring a wide photon energy range. The beamline is equipped with a permanent magnet undulator with two magnetic structures of different period lengths, a focusing variable-line-space plane-grating monochromator, a double-crystal monochromator and three Kirkpatrick-Baez mirror pairs. By selectively moving these elements in or out of the beam, X-SPEC is capable of covering an energy range from 70 eV up to 15 keV. The flux of the beamline is maximized by optimizing the magnetic design of the undulator, minimizing the number of optical elements and optimizing their parameters. The beam can be focused into two experimental stations while maintaining the same spot position throughout the entire energy range. The first experimental station is optimized for measuring solid samples under ultra-high-vacuum conditions, while the second experimental station allows in situ and operando studies under ambient conditions. Measurement techniques include X-ray absorption spectroscopy (XAS), extended X-ray absorption fine structure (EXAFS), photoelectron spectroscopy (PES) and hard X-ray PES (HAXPES), as well as X-ray emission spectroscopy (XES) and resonant inelastic X-ray scattering (RIXS).

Outlook for artificial intelligence and machine learning at the NSLS-II

We describe the current and future plans for using artificial intelligence and machine learning (AI/ML) methods at the National Synchrotron Light Source II (NSLS-II), a scientific user facility at the Brookhaven National Laboratory. We discuss the opportunity for using the AI/ML tools and techniques developed in the data and computational science areas to greatly improve the scientific output of large scale experimental user facilities. We describe our current and future plans in areas including from detecting and recovering from faults, optimizing the source and instrument configurations, streamlining the pipeline from measurement to insight, through data acquisition, processing, analysis. The overall strategy and direction of the NSLS-II facility in relation to AI/ML is presented.

Tunable side-bounce monochromator

Side-bounce beamlines with fixed-exit angles have been intended to operate with only one selected energy. However, a tunable monochromator in a new geometry is presented here that will make side-bounce beamlines energy tunable. It requires the addition of two more rotations. Analytic solutions for the values of these two rotation angles are provided. The validity of the new concept was checked by ray tracing and two-dimensional searches in the additional angles. Operational details on the new scheme, including the exit offset and steering of the beams, were determined. In addition to tunability, the new monochromator will reduce the loss from the polarization factor at low energies.

Design simulations of a horizontally deflecting high-heat-load monochromator

The performance of a liquid-nitrogen-cooled high-heat-load monochromator with a horizontal scattering plane has been analysed, aiming to preserve the high quality of the X-ray beam in the vertical plane for downstream optics. Using finite-element analysis, height profiles of the crystal surface for various heat loads and the corresponding slope errors in the meridional and sagittal planes were calculated. Then the angular distortions of the reflected beam in both meridional and sagittal planes were calculated analytically and also modelled by ray tracing, revealing a good agreement of the two approaches. The results show that with increasing heat load in the crystal the slope errors of the crystal surface reach their smallest values first in the sagittal and then in the meridional plane. For the considered case of interest at a photon energy of 14.412 keV and the Si(111) reflection with a Bragg angle of 7.88°, the angular distortions of the reflected beam in the sagittal plane are an order of magnitude smaller than in the meridional one. Furthermore, they are smaller than the typical angular size of the beam source at the monochromator position. For a high-heat-load monochromator operating in the horizontal scattering plane, the sagittal angular distortions of the reflected beam appear in the vertical plane. Thus, such an instrument perfectly preserves the high quality of the X-ray beam in the vertical plane for downstream optics. Compared with vertical scattering, the throughput of the monochromatic beam with the horizontal scattering plane is reduced by only 3.3% for the new EBS source, instead of 34.3% for the old ESRF-1 machine. This identifies the horizontal-scattering high-heat-load monochromator as a device essentially free of the heat-load effects in the vertical plane and without significant loss in terms of throughput.

Fast convolution-based performance estimation method for diffraction-limited source with imperfect X-ray optics

Although optical element error analysis is always an important part of beamline design for highly coherent synchrotron radiation or free-electron laser sources, the usual wave optics simulation can be very time-consuming, which limits its application at the early stage of the beamline design. In this work, a new theoretical approach has been proposed for quick evaluations of the optical performance degradation due to optical element error. In this way, time-consuming detailed simulations can be applied only when truly necessary. This approach treats the imperfections as perturbations that convolve with the ideal performance. For simplicity, but not by necessity, the Gaussian Schell-model has been used to show the application of this theoretical approach. The influences of the finite aperture size and height error of a focusing mirror are analysed using the proposed theory. The physical explanation of the performance degradation acquired from the presented approach helps to give a better definition of the critical range of error spatial frequencies that most affect the performance of a mirror. An example comparing two mirror surface errors with identical power spectral density functions is given. These two types of mirror surface errors result in very different intensity profiles. The approach presented in this work could help beamline designers specify the error tolerances on general optical elements more accurately.

A ray-tracing algorithm for ab initio calculation of thermal load in undulator-based synchrotron beamlines

The OASYS suite and its powerful integration features are used to implement a ray-tracing algorithm to accurately calculate the thermal load in any component of an undulator-based synchrotron beamline. This is achieved by sampling and converting the SRW source of a given energy into a Shadow source and using the latter code to ray trace the full beamline. The accuracy of the algorithm is proved by reconstructing the full undulator radiation distribution through an aperture and comparing the result with direct calculaton of the total power using SRW. The algorithm is particularly suited to analyze cases with complex beamline layouts and optical elements, such as crystals, multilayers, and compound refractive lenses. Examples of its use to calculate the power load on elements of two of the feature beamlines at the Advanced Photon Source Upgrade Project and a comparison of the results with analytical calculations are presented.

Modelling phase imperfections in compound refractive lenses

A framework based on physical optics for simulating the effect of imperfect compound refractive lenses (CRLs) upon an X-ray beam is described, taking into account measured phase errors obtained from at-wavelength metrology. A CRL stack is modelled, with increasing complexity, as a single thin phase element, then as a more realistic compound element including absorption and thickness effects, and finally adding realistic optical imperfections to the CRL. Coherent and partially coherent simulations using Synchrotron Radiation Workshop (SRW) are used to evaluate the different models, the effects of the phase errors and to check the validity of the design equations and suitability of the figures of merit.

A Monte Carlo ray-tracing simulation of coherent X-ray diffractive imaging

Coherent diffractive imaging (CDI) experiments are adequately simulated assuming the thin sample approximation and using a Fresnel or Fraunhofer wavefront propagator to obtain the diffraction pattern. Although this method is used in wave-based or hybrid X-ray simulators, here the applicability and effectiveness of an alternative approach that is based solely on ray tracing of Huygens wavelets are investigated. It is shown that diffraction fringes of a grating-like source are accurately predicted and that diffraction patterns of a ptychography dataset from an experiment with realistic parameters can be sampled well enough to be retrieved by a standard phase-retrieval algorithm. Potentials and limits of this approach are highlighted. It is suggested that it could be applied to study imperfect or non-standard CDI configurations lacking a satisfactory theoretical formulation. The considerable computational effort required by this method is justified by the great flexibility provided for easy simulation of a large-parameter space.

Optimization of a phase-space beam position and size monitor for low-emittance light sources

The recently developed vertical phase-space beam position and size monitor (ps-BPM) system has proven to be able to measure the electron-source position, angle, size and divergence simultaneously in the vertical plane at a single location of a beamline. The optimization of the ps-BPM system is performed by ray-tracing simulation to maximize the instrument sensitivity and resolution. The contribution of each element is studied, including the monochromator, the K-edge filter, the detector and the source-to-detector distance. An optimized system is proposed for diffraction-limited storage rings, such as the Advanced Photon Source Upgrade project. The simulation results show that the ps-BPM system can precisely monitor the source position and angle at high speed. Precise measurements of the source size and divergence will require adequate resolution with relatively longer integration time.

A hierarchical approach for modeling X-ray beamlines: application to a coherent beamline

Different approaches to simulate a modern X-ray beamline are considered. Several methodologies with increasing complexity are applied to discuss the relevant parameters that quantify the beamline performance. Parameters such as flux, dimensions and intensity distribution of the focused beam, and coherence properties are obtained from simple analytical calculations to sophisticated computer simulations using ray-tracing and wave optics techniques. A latest-generation X-ray nanofocusing beamline for coherent applications (ID16A at the ESRF) has been chosen to study in detail the issues related to highly demagnifying synchrotron sources and exploiting the beam coherence. The performance of the beamline is studied for two storage rings: the old ESRF-1 (emittance 4000 pm) and the new ESRF-EBS (emittance 150 pm). In addition to traditional results in terms of flux and beam sizes, an innovative study on the partial coherence properties based on the propagation of coherent modes is presented. The different algorithms and methodologies are implemented in the software suite OASYS. These are discussed with emphasis placed upon the their benefits and limitations of each.

A real-time phase-space beam emittance monitoring system

An electron beam position and angle monitoring system, ps-BPM, has been shown to be able to measure the electron source position and angle at a single location in a beamline at a synchrotron source. This system uses a monochromator to prepare a photon beam whose energy is at that of the K-edge of an absorber filter. The divergence of the beam from the source gives an energy range that will encompass the K-edge of the filter. A measurement of the centre of the monochromatic beam and the K-edge location through the absorber filter gives the position and angle of the electron source. Here, it is shown that this system is also capable of measuring the source size and divergence at the same time. This capability is validated by measurement as the beam size in the storage ring was changed and by ray-tracing simulations. The system operates by measuring the photon beam spatial distribution as well as a K-edge filtered beam distribution. These additional measurements result in the ability to also determine the electron source size and divergence.

Wavefront-propagation simulations supporting the design of a time-delay compensating monochromator beamline at FLASH2

Wavefront-propagation simulations have been performed to complete the design of a monochromator beamline for FLASH2, the variable-gap undulator line at the soft X-ray free-electron laser in Hamburg (FLASH). Prior to propagation through the beamline optical elements, the parameters of the photon source were generated using the GENESIS code which includes the free-electron laser experimental data. Threshold tolerances for the misalignment of mirror angles are calculated and, since diffraction effects were included in the simulations, the minimum quality with respect to the slope errors required for the optics is determined.

Sirepo: an open-source cloud-based software interface for X-ray source and optics simulations

Sirepo, a browser-based GUI for X-ray source and optics simulations, is presented. Such calculations can be performed using SRW (Synchrotron Radiation Workshop), which is a physical optics computer code, allowing simulation of entire experimental beamlines using the concept of a `virtual beamline' with accurate treatment of synchrotron radiation generation and propagation through the X-ray optical system. SRW is interfaced with Sirepo by means of a Python application programming interface. Sirepo supports most of the optical elements currently used at beamlines, including recent developments in SRW. In particular, support is provided for the simulation of state-of-the-art X-ray beamlines, exploiting the high coherence and brightness of modern light source facilities. New scientific visualization and reporting capabilities have been recently implemented within Sirepo, as well as automatic determination of electron beam and undulator parameters. Publicly available community databases can be dynamically queried for error-free access to material characteristics. These computational tools can be used for the development and commissioning of new X-ray beamlines and for testing feasibility and optimization of experiments. The same interface can guide simulation on a local computer, a remote server or a high-performance cluster. Sirepo is available online and also within the NSLS-II firewall, with a growing number of users at other light source facilities. Our open source code is available on GitHub.

Using refractive lenses to provide a variable spot size for Kirkpatrick-Baez mirrors

For many X-ray microprobe experiments it is desirable to be able to vary the beam size: using large beams for survey scans and a small beam for the final measurements. Beryllium refractive lenses were found to be a simple and controllable method for enlarging the focus in a Kirkpatrick-Baez-based microprobe. They can provide variable spot size, can be quickly inserted or removed and do not move the beam center on the sample.

Understanding the instrumental profile of synchrotron radiation X-ray powder diffraction beamlines

A Monte Carlo algorithm has been developed to calculate the instrumental profile function of a powder diffraction synchrotron beamline. Realistic models of all optical elements are implemented in a ray-tracing software. The proposed approach and the emerging paradigm have been investigated and verified for several existing X-ray powder diffraction beamlines. The results, which can be extended to further facilities, show a new and general way of assessing the contribution of instrumental broadening to synchrotron radiation data, based on ab initio simulations.