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Hanedar BA, Onbaşlı MC. Defect dependent electronic properties of two-dimensional transition metal dichalcogenides (2H, 1T, and 1T' phases). Phys Chem Chem Phys 2025; 27:1809-1818. [PMID: 39692347 PMCID: PMC11698123 DOI: 10.1039/d4cp04017a] [Citation(s) in RCA: 0] [Impact Index Per Article: 0] [Reference Citation Analysis] [Abstract] [Grants] [Track Full Text] [Journal Information] [Subscribe] [Scholar Register] [Received: 10/19/2024] [Accepted: 12/06/2024] [Indexed: 12/19/2024]
Abstract
Transition metal dichalcogenides (TMDs) exhibit a wide range of electronic properties due to their structural diversity. Understanding their defect-dependent properties might enable the design of efficient, bright, and long-lifetime quantum emitters. Here, we use density functional theory (DFT) calculations to investigate the 2H, 1T, and 1T' phases of MoS2, WS2, MoSe2, WSe2 and the effect of defect densities on the electronic band structures, focusing on the influence of chalcogen vacancies. The 2H phase, which is thermodynamically stable, is a direct band gap semiconductor, while the 1T phase, despite its higher formation energy, exhibits metallic behavior. 1T phases with spin-orbit coupling show significant band inversions of 0.61, 0.77, 0.24 and 0.78 eV for MoS2, MoSe2, WS2 and WSe2, respectively. We discovered that for all four MX2 systems, the energy difference between 2H, 1T and 1T phases decreases with increasing concentration of vacancies (from 3.13% to 21.88%). Our findings show that the 2H phase also has minimum energy values depending on vacancies. TMDs containing W were found to have a wider bandgap compared to those containing Mo. The band gap of 2H WS2 decreased from 1.81 eV (1.54 eV with SOC included) under GGA calculations to a range of 1.37 eV to 0.79 eV, while the band gap of 2H MoSe2 reduced from 1.43 eV (1.31 eV with SOC) under GGA to a range of 0.98 eV to 0.06 eV, depending on the concentration. Our findings provide guidelines for experimental screening of 2D TMD defects, paving the way for the development of next-generation spintronic, electronic, and optoelectronic devices.
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Affiliation(s)
- Berna Akgenc Hanedar
- Department of Physics, Kirklareli University, Kirklareli, 39100, Turkey.
- Department of Physics, Koc University, Rumelifeneri Yolu, Sariyer 34450, Istanbul, Turkey.
| | - Mehmet Cengiz Onbaşlı
- Department of Physics, Koc University, Rumelifeneri Yolu, Sariyer 34450, Istanbul, Turkey.
- Department of Electrical & Electronics Engineering, Koc University, Rumelifeneri Yolu, Sariyer 34450, Istanbul, Turkey.
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Busch RT, Sun L, Austin D, Jiang J, Miesle P, Susner MA, Conner BS, Jawaid A, Becks ST, Mahalingam K, Velez MA, Torsi R, Robinson JA, Rao R, Glavin NR, Vaia RA, Pachter R, Joshua Kennedy W, Vernon JP, Stevenson PR. Exfoliation procedure-dependent optical properties of solution deposited MoS 2 films. NPJ 2D MATERIALS AND APPLICATIONS 2023; 7:12. [PMID: 38665486 PMCID: PMC11041683 DOI: 10.1038/s41699-023-00376-2] [Citation(s) in RCA: 1] [Impact Index Per Article: 0.5] [Reference Citation Analysis] [Abstract] [Key Words] [Grants] [Track Full Text] [Figures] [Subscribe] [Scholar Register] [Received: 09/28/2022] [Accepted: 02/10/2023] [Indexed: 04/28/2024]
Abstract
The development of high-precision large-area optical coatings and devices comprising low-dimensional materials hinges on scalable solution-based manufacturability with control over exfoliation procedure-dependent effects. As such, it is critical to understand the influence of technique-induced transition metal dichalcogenide (TMDC) optical properties that impact the design, performance, and integration of advanced optical coatings and devices. Here, we examine the optical properties of semiconducting MoS2 films from the exfoliation formulations of four prominent approaches: solvent-mediated exfoliation, chemical exfoliation with phase reconversion, redox exfoliation, and native redox exfoliation. The resulting MoS2 films exhibit distinct refractive indices (n), extinction coefficients (k), dielectric functions (ε1 and ε2), and absorption coefficients (α). For example, a large index contrast of Δn ≈ 2.3 is observed. These exfoliation procedures and related chemistries produce different exfoliated flake dimensions, chemical impurities, carrier doping, and lattice strain that influence the resulting optical properties. First-principles calculations further confirm the impact of lattice defects and doping characteristics on MoS2 optical properties. Overall, incomplete phase reconfiguration (from 1T to mixed crystalline 2H and amorphous phases), lattice vacancies, intraflake strain, and Mo oxidation largely contribute to the observed differences in the reported MoS2 optical properties. These findings highlight the need for controlled technique-induced effects as well as the opportunity for continued development of, and improvement to, liquid phase exfoliation methodologies. Such chemical and processing-induced effects present compelling routes to engineer exfoliated TMDC optical properties toward the development of next-generation high-performance mirrors, narrow bandpass filters, and wavelength-tailored absorbers.
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Affiliation(s)
- Robert T. Busch
- Materials and Manufacturing Directorate, Air Force Research Laboratory, Wright-Patterson Air Force Base, Dayton, OH 45433 USA
- UES, Inc., 4401 Dayton Xenia Road, Dayton, OH 45432 USA
| | - Lirong Sun
- Materials and Manufacturing Directorate, Air Force Research Laboratory, Wright-Patterson Air Force Base, Dayton, OH 45433 USA
- Azimuth Corporation, 2970 Presidential Drive, Suite 200, Beavercreek, OH 45324 USA
| | - Drake Austin
- Materials and Manufacturing Directorate, Air Force Research Laboratory, Wright-Patterson Air Force Base, Dayton, OH 45433 USA
- UES, Inc., 4401 Dayton Xenia Road, Dayton, OH 45432 USA
| | - Jie Jiang
- Materials and Manufacturing Directorate, Air Force Research Laboratory, Wright-Patterson Air Force Base, Dayton, OH 45433 USA
| | - Paige Miesle
- Materials and Manufacturing Directorate, Air Force Research Laboratory, Wright-Patterson Air Force Base, Dayton, OH 45433 USA
- UES, Inc., 4401 Dayton Xenia Road, Dayton, OH 45432 USA
| | - Michael A. Susner
- Materials and Manufacturing Directorate, Air Force Research Laboratory, Wright-Patterson Air Force Base, Dayton, OH 45433 USA
| | - Benjamin S. Conner
- National Research Council, 500 Fifth St. N.W., Washington, DC 20001 USA
- Sensors Directorate, Air Force Research Laboratory, Wright-Patterson Air Force Base, Dayton, OH 45433 USA
| | - Ali Jawaid
- Materials and Manufacturing Directorate, Air Force Research Laboratory, Wright-Patterson Air Force Base, Dayton, OH 45433 USA
- UES, Inc., 4401 Dayton Xenia Road, Dayton, OH 45432 USA
| | - Shannon T. Becks
- Materials and Manufacturing Directorate, Air Force Research Laboratory, Wright-Patterson Air Force Base, Dayton, OH 45433 USA
- UES, Inc., 4401 Dayton Xenia Road, Dayton, OH 45432 USA
| | - Krishnamurthy Mahalingam
- Materials and Manufacturing Directorate, Air Force Research Laboratory, Wright-Patterson Air Force Base, Dayton, OH 45433 USA
- UES, Inc., 4401 Dayton Xenia Road, Dayton, OH 45432 USA
| | - Michael A. Velez
- Materials and Manufacturing Directorate, Air Force Research Laboratory, Wright-Patterson Air Force Base, Dayton, OH 45433 USA
- UES, Inc., 4401 Dayton Xenia Road, Dayton, OH 45432 USA
| | - Riccardo Torsi
- Department of Materials Science and Engineering, Materials Research Institute, Center for Atomically Thin Multifunctional Coatings, The Pennsylvania State University, University Park, PA 16802 USA
| | - Joshua A. Robinson
- Department of Materials Science and Engineering, Materials Research Institute, Center for Atomically Thin Multifunctional Coatings, The Pennsylvania State University, University Park, PA 16802 USA
- Department of Chemistry, Department of Physics, Center for Atomically Thin Multifunctional Coatings, The Pennsylvania State University, University Park, PA 16802 USA
| | - Rahul Rao
- Materials and Manufacturing Directorate, Air Force Research Laboratory, Wright-Patterson Air Force Base, Dayton, OH 45433 USA
| | - Nicholas R. Glavin
- Materials and Manufacturing Directorate, Air Force Research Laboratory, Wright-Patterson Air Force Base, Dayton, OH 45433 USA
| | - Richard A. Vaia
- Materials and Manufacturing Directorate, Air Force Research Laboratory, Wright-Patterson Air Force Base, Dayton, OH 45433 USA
| | - Ruth Pachter
- Materials and Manufacturing Directorate, Air Force Research Laboratory, Wright-Patterson Air Force Base, Dayton, OH 45433 USA
| | - W. Joshua Kennedy
- Materials and Manufacturing Directorate, Air Force Research Laboratory, Wright-Patterson Air Force Base, Dayton, OH 45433 USA
| | - Jonathan P. Vernon
- Materials and Manufacturing Directorate, Air Force Research Laboratory, Wright-Patterson Air Force Base, Dayton, OH 45433 USA
| | - Peter R. Stevenson
- Materials and Manufacturing Directorate, Air Force Research Laboratory, Wright-Patterson Air Force Base, Dayton, OH 45433 USA
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Iurov A, Zhemchuzhna L, Gumbs G, Huang D, Tse WK, Blaise K, Ejiogu C. Floquet engineering of tilted and gapped Dirac bandstructure in 1T[Formula: see text]-MoS[Formula: see text]. Sci Rep 2022; 12:21348. [PMID: 36494457 PMCID: PMC9734163 DOI: 10.1038/s41598-022-25898-5] [Citation(s) in RCA: 0] [Impact Index Per Article: 0] [Reference Citation Analysis] [Abstract] [Key Words] [Grants] [Track Full Text] [Figures] [Journal Information] [Subscribe] [Scholar Register] [Received: 08/16/2022] [Accepted: 12/06/2022] [Indexed: 12/13/2022] Open
Abstract
We have developed a rigorous theoretical formalism for Floquet engineering, investigating, and subsequently tailoring most crucial electronic properties of 1T[Formula: see text]-MoS[Formula: see text] by applying an external high-frequency dressing field within the off-resonance regime. It was recently demonstrated that monolayer semiconducting 1T[Formula: see text]-MoS[Formula: see text] exhibits tunable and gapped spin- and valley-polarized tilted Dirac bands. The electron-photon dressed states depend strongly on the polarization of the applied irradiation and reflect a full complexity of the low-energy Hamiltonian for non-irradiated material. We have calculated and analyzed the properties of the electron dressed states corresponding to linear and circular polarization of a dressing field by focusing on their symmetry, anisotropy, tilting, direct and indirect band gaps. Circularly polarized dressing field is known for transition into a new electronic state with broken time-reversal symmetry and a non-zero Chern number, and therefore, the combination of these topologically non-trivial phases and transitions between them could reveal some truly unique and previously unknown phenomena and applications. We have also computed and discussed the density of states for various types of 1T[Formula: see text]-MoS[Formula: see text] materials and its modification in the presence of a dressing field.
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Affiliation(s)
- Andrii Iurov
- Department of Physics and Computer Science, Medgar Evers College of City University of New York, Brooklyn, NY 11225 USA
| | - Liubov Zhemchuzhna
- Department of Physics and Computer Science, Medgar Evers College of City University of New York, Brooklyn, NY 11225 USA
- Department of Physics and Astronomy, Hunter College of the City University of New York, 695 Park Avenue, New York, New York, 10065 USA
| | - Godfrey Gumbs
- Department of Physics and Astronomy, Hunter College of the City University of New York, 695 Park Avenue, New York, New York, 10065 USA
- Donostia International Physics Center (DIPC), P de Manuel Lardizabal, 4, 20018 San Sebastian, Basque Country Spain
| | - Danhong Huang
- US Air Force Research Laboratory, Space Vehicles Directorate, Kirtland Air Force Base, New Mexico, 87117 USA
| | - Wang-Kong Tse
- Department of Physics and Astronomy, The University of Alabama, Tuscaloosa, AL 35487 USA
| | - Kathy Blaise
- Department of Physics and Computer Science, Medgar Evers College of City University of New York, Brooklyn, NY 11225 USA
| | - Chinedu Ejiogu
- Department of Physics and Computer Science, Medgar Evers College of City University of New York, Brooklyn, NY 11225 USA
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