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Chen WJ, Ma HP, Gu L, Shen Y, Yang RY, Cao XY, Yang M, Zhang QC. Influence of annealing pretreatment in different atmospheres on crystallization quality and UV photosensitivity of gallium oxide films. RSC Adv 2024; 14:4543-4555. [PMID: 38312726 PMCID: PMC10836329 DOI: 10.1039/d3ra07568k] [Citation(s) in RCA: 0] [Impact Index Per Article: 0] [Reference Citation Analysis] [Abstract] [Track Full Text] [Figures] [Journal Information] [Subscribe] [Scholar Register] [Received: 11/06/2023] [Accepted: 12/26/2023] [Indexed: 02/06/2024] Open
Abstract
Due to their high wavelength selectivity and strong anti-interference capability, solar-blind UV photodetectors hold broad and important application prospects in fields like flame detection, missile warnings, and secure communication. Research on solar-blind UV detectors for amorphous Ga2O3 is still in its early stages. The presence of intrinsic defects related to oxygen vacancies significantly affects the photodetection performance of amorphous Ga2O3 materials. This paper focuses on growing high quality amorphous Ga2O3 films on silicon substrates through atomic layer deposition. The study investigates the impact of annealing atmospheres on Ga2O3 films and designs a blind UV detector for Ga2O3. Characterization techniques including atomic force microscopy (AFM), X-ray diffraction (XRD) and X-ray photoelectron spectroscopy (XPS) are used for Ga2O3 film analysis. Ga2O3 films exhibit a clear transition from amorphous to polycrystalline after annealing, accompanied by a decrease in oxygen vacancy concentration from 21.26% to 6.54%. As a result, the response time of the annealed detector reduces from 9.32 s to 0.47 s at an external bias of 10 V. This work demonstrates that an appropriate annealing process can yield high-quality Ga2O3 films, and holds potential for advancing high-performance solar blind photodetector (SBPD) development.
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Affiliation(s)
- Wen-Jie Chen
- Institute of Wide Bandgap Semiconductors and Future Lighting, Academy for Engineering & Technology, Fudan University Shanghai 200433 China
- Shanghai Research Center for Silicon Carbide Power Devices Engineering & Technology, Fudan University Shanghai 200433 China
| | - Hong-Ping Ma
- Institute of Wide Bandgap Semiconductors and Future Lighting, Academy for Engineering & Technology, Fudan University Shanghai 200433 China
- Shanghai Research Center for Silicon Carbide Power Devices Engineering & Technology, Fudan University Shanghai 200433 China
- Institute of Wide Bandgap Semiconductor Materials and Devices, Research Institute of Fudan University in Ningbo Zhejiang 315327 China
| | - Lin Gu
- Institute of Wide Bandgap Semiconductors and Future Lighting, Academy for Engineering & Technology, Fudan University Shanghai 200433 China
- Shanghai Research Center for Silicon Carbide Power Devices Engineering & Technology, Fudan University Shanghai 200433 China
| | - Yi Shen
- Institute of Wide Bandgap Semiconductors and Future Lighting, Academy for Engineering & Technology, Fudan University Shanghai 200433 China
- Shanghai Research Center for Silicon Carbide Power Devices Engineering & Technology, Fudan University Shanghai 200433 China
| | - Ruo-Yun Yang
- Institute of Wide Bandgap Semiconductors and Future Lighting, Academy for Engineering & Technology, Fudan University Shanghai 200433 China
- Shanghai Research Center for Silicon Carbide Power Devices Engineering & Technology, Fudan University Shanghai 200433 China
| | - Xi-Yuan Cao
- Key Laboratory of Instrumentation Science & Dynamic Measurement, School of Instrument and Electronics, North University of China Taiyuan 030051 China
| | - Mingyang Yang
- Key Laboratory of Marine Materials and Related Technologies, Zhejiang Key Laboratory of Marine Materials and Protective Technologies, Ningbo Institute of Materials Technology and Engineering, Chinese Academy of Sciences Ningbo 315201 China
| | - Qing-Chun Zhang
- Institute of Wide Bandgap Semiconductors and Future Lighting, Academy for Engineering & Technology, Fudan University Shanghai 200433 China
- Shanghai Research Center for Silicon Carbide Power Devices Engineering & Technology, Fudan University Shanghai 200433 China
- Institute of Wide Bandgap Semiconductor Materials and Devices, Research Institute of Fudan University in Ningbo Zhejiang 315327 China
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Ma Y, Chen T, Zhang X, Tang W, Feng B, Hu Y, Zhang L, Zhou X, Wei X, Xu K, Mudiyanselage D, Fu H, Zhang B. High-Photoresponsivity Self-Powered a-, ε-, and β-Ga 2O 3/p-GaN Heterojunction UV Photodetectors with an In Situ GaON Layer by MOCVD. ACS APPLIED MATERIALS & INTERFACES 2022; 14:35194-35204. [PMID: 35877929 DOI: 10.1021/acsami.2c06927] [Citation(s) in RCA: 7] [Impact Index Per Article: 3.5] [Reference Citation Analysis] [Abstract] [Key Words] [Track Full Text] [Subscribe] [Scholar Register] [Indexed: 06/15/2023]
Abstract
In this paper, self-powered ultraviolet (UV) photodetectors with high response performance based on Ga2O3/p-GaN were fabricated by metal-organic chemical vapor deposition (MOCVD). The effects of different crystal phases of Ga2O3 (including a, ε, ε/β, and β) grown on p-GaN films on the performance of photodetectors were systematically studied. Moreover, an in situ GaON dielectric layer improved the responsivity of Ga2O3/p-GaN photodetectors by 20 times. All Ga2O3/p-GaN photodetectors showed self-power capability without bias. An ultralow dark current of 3.08 pA and a Iphoto/Idark ratio of 4.1 × 103 (1.8 × 103) under 254 nm (365 nm) light were obtained for the β-Ga2O3/p-GaN photodetector at 0 V bias. Furthermore, the β-Ga2O3/p-GaN photodetector showed excellent sensitivity with a high responsivity of 3.8 A/W (0.83 A/W), a fast response speed of 66/36 ms (36/73 ms), and a high detectivity of 1.12 × 1014 Jones (2.44 × 1013 Jones) under 254 nm (365 nm) light at 0 V bias. The carrier transport mechanism of the Ga2O3/p-GaN self-powered photodetector was also analyzed through the device energy band diagram. This work provides critical information for the design and fabrication of high-performance self-powered Ga2O3/p-GaN UV photodetectors, opening the door to a variety of photonic systems and applications without an external power supply.
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Affiliation(s)
- Yongjian Ma
- School of Nano-Tech and Nano-Bionics, University of Science and Technology of China, 230026 Hefei, China
- Nanofabrication facility, Suzhou Institute of Nano-Tech and Nano-Bionics, Chinese Academy of Sciences, Suzhou, Jiangsu 215123, China
| | - Tiwei Chen
- School of Nano-Tech and Nano-Bionics, University of Science and Technology of China, 230026 Hefei, China
- Nanofabrication facility, Suzhou Institute of Nano-Tech and Nano-Bionics, Chinese Academy of Sciences, Suzhou, Jiangsu 215123, China
| | - Xiaodong Zhang
- School of Nano-Tech and Nano-Bionics, University of Science and Technology of China, 230026 Hefei, China
- Nanofabrication facility, Suzhou Institute of Nano-Tech and Nano-Bionics, Chinese Academy of Sciences, Suzhou, Jiangsu 215123, China
| | - Wenbo Tang
- School of Nano-Tech and Nano-Bionics, University of Science and Technology of China, 230026 Hefei, China
- Nanofabrication facility, Suzhou Institute of Nano-Tech and Nano-Bionics, Chinese Academy of Sciences, Suzhou, Jiangsu 215123, China
| | - Boyuan Feng
- School of Nano-Tech and Nano-Bionics, University of Science and Technology of China, 230026 Hefei, China
- Vacuum Interconnected Nanotech Workstation, Suzhou Institute of Nano-Tech and Nano-Bionics, CAS, 215123 Suzhou, China
| | - Yu Hu
- Nanofabrication facility, Suzhou Institute of Nano-Tech and Nano-Bionics, Chinese Academy of Sciences, Suzhou, Jiangsu 215123, China
| | - Li Zhang
- Nanofabrication facility, Suzhou Institute of Nano-Tech and Nano-Bionics, Chinese Academy of Sciences, Suzhou, Jiangsu 215123, China
| | - Xin Zhou
- Nanofabrication facility, Suzhou Institute of Nano-Tech and Nano-Bionics, Chinese Academy of Sciences, Suzhou, Jiangsu 215123, China
| | - Xing Wei
- School of Nano-Tech and Nano-Bionics, University of Science and Technology of China, 230026 Hefei, China
- Nanofabrication facility, Suzhou Institute of Nano-Tech and Nano-Bionics, Chinese Academy of Sciences, Suzhou, Jiangsu 215123, China
| | - Kun Xu
- Nanofabrication facility, Suzhou Institute of Nano-Tech and Nano-Bionics, Chinese Academy of Sciences, Suzhou, Jiangsu 215123, China
| | - Dinusha Mudiyanselage
- Department of Electrical and Computer Engineering, Iowa State University, Ames, Iowa 50011, United States
| | - Houqiang Fu
- Department of Electrical and Computer Engineering, Iowa State University, Ames, Iowa 50011, United States
| | - Baoshun Zhang
- School of Nano-Tech and Nano-Bionics, University of Science and Technology of China, 230026 Hefei, China
- Nanofabrication facility, Suzhou Institute of Nano-Tech and Nano-Bionics, Chinese Academy of Sciences, Suzhou, Jiangsu 215123, China
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Deng Z. Predicting the Raman spectra of ferroelectric phases in two-dimensional Ga 2O 3 monolayer. Phys Chem Chem Phys 2022; 24:13671-13677. [PMID: 35611966 DOI: 10.1039/d2cp00757f] [Citation(s) in RCA: 1] [Impact Index Per Article: 0.5] [Reference Citation Analysis] [Abstract] [Track Full Text] [Journal Information] [Subscribe] [Scholar Register] [Indexed: 11/21/2022]
Abstract
We investigate the vibrational properties and Raman spectra of the two-dimensional Ga2O3 monolayer, using density functional theory. Two ferroelectric (FE) phases of the Ga2O3 monolayer with wurtzite (WZ) and zinc blende (ZB) structures (FE-WZ and FE-ZB, respectively) are considered. The Raman tensor and angle-dependent Raman intensities of two major Raman peaks (A11 and A21) in both FE-WZ (497, and 779 cm-1) and FE-ZB (481, and 772 cm-1) Ga2O3 monolayers, are calculated for the polarization of scattered light, parallel and perpendicular to that of the incident light. The characteristics of angle-dependent Raman intensities are analyzed. The average non-resonant Raman spectra of the minor peaks in FE-WZ (E1) and FE-BZ (E1 and E2) are compared with those of major peaks A11 and A21. These predictions of the Raman spectra of the Ga2O3 monolayer may guide the rational design of two-dimensional optical devices.
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Affiliation(s)
- Zexiang Deng
- School of Science, Guilin University of Aerospace Technology, Guilin 541004, People's Republic of China.
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4
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Huang G, Chu C, Guo L, Liu Z, Jiang K, Zhang Y, Sun X, Zhang ZH, Li D. Hybrid metal/Ga 2O 3/GaN ultraviolet detector for obtaining low dark current and high responsivity. OPTICS LETTERS 2022; 47:1561-1564. [PMID: 35290364 DOI: 10.1364/ol.454717] [Citation(s) in RCA: 0] [Impact Index Per Article: 0] [Reference Citation Analysis] [Abstract] [Track Full Text] [Subscribe] [Scholar Register] [Received: 01/31/2022] [Accepted: 02/16/2022] [Indexed: 06/14/2023]
Abstract
In this work, we have proposed and fabricated a metal/Ga2O3/GaN hybrid structure metal-semiconductor-metal ultraviolet photodetector with low dark current and high responsivity. The Schottky contact of Ni/Ga2O3 makes the Ga2O3 layer fully depleted. The strong electric field in the Ga2O3 depletion region can push the photo-induced electrons from the Ga2O3 layer into the GaN layer for more efficient carrier transport. Therefore, the hybrid structure simultaneously utilizes the advantage of the absorption to solar-blind ultraviolet light by the Ga2O3 layer and the high electron mobility of the GaN layer. Thus, the dark current and the photocurrent for the proposed device can be greatly improved. As a result, an extremely high photo-to-dark-current ratio of 1.46 × 106 can be achieved. Furthermore, quick rise and fall times of 0.213 s and 0.027 s at the applied bias of 6 V are also obtained, respectively.
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Zhou W, Zheng L, Ning Z, Cheng X, Wang F, Xu K, Xu R, Liu Z, Luo M, Hu W, Guo H, Zhou W, Yu Y. Silicon: quantum dot photovoltage triodes. Nat Commun 2021; 12:6696. [PMID: 34795284 PMCID: PMC8602655 DOI: 10.1038/s41467-021-27050-9] [Citation(s) in RCA: 7] [Impact Index Per Article: 2.3] [Reference Citation Analysis] [Abstract] [Key Words] [Grants] [Track Full Text] [Download PDF] [Figures] [Journal Information] [Subscribe] [Scholar Register] [Received: 04/15/2021] [Accepted: 10/26/2021] [Indexed: 11/09/2022] Open
Abstract
Silicon is widespread in modern electronics, but its electronic bandgap prevents the detection of infrared radiation at wavelengths above 1,100 nanometers, which limits its applications in multiple fields such as night vision, health monitoring and space navigation systems. It is therefore of interest to integrate silicon with infrared-sensitive materials to broaden its detection wavelength. Here we demonstrate a photovoltage triode that can use silicon as the emitter but is also sensitive to infrared spectra owing to the heterointegrated quantum dot light absorber. The photovoltage generated at the quantum dot base region, attracting holes from silicon, leads to high responsivity (exceeding 410 A·W-1 with Vbias of -1.5 V), and a widely self-tunable spectral response. Our device has the maximal specific detectivity (4.73 × 1013 Jones with Vbias of -0.4 V) at 1,550 nm among the infrared sensitized silicon detectors, which opens a new path towards infrared and visible imaging in one chip with silicon technology compatibility.
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Affiliation(s)
- Wen Zhou
- State Key Laboratory of Functional Materials for Informatics, Shanghai Institute of Microsystem and Information Technology, Chinese Academy of Sciences, Shanghai, 200050, P. R. China
| | - Li Zheng
- State Key Laboratory of Functional Materials for Informatics, Shanghai Institute of Microsystem and Information Technology, Chinese Academy of Sciences, Shanghai, 200050, P. R. China.
| | - Zhijun Ning
- School of Physical Science and Technology, ShanghaiTech University, Shanghai, 201210, P. R. China.
| | - Xinhong Cheng
- State Key Laboratory of Functional Materials for Informatics, Shanghai Institute of Microsystem and Information Technology, Chinese Academy of Sciences, Shanghai, 200050, P. R. China
| | - Fang Wang
- State Key Laboratory of Infrared Physics, Shanghai Institute of Technical Physics, Chinese Academy of Sciences, Shanghai, 200083, P. R. China
| | - Kaimin Xu
- School of Physical Science and Technology, ShanghaiTech University, Shanghai, 201210, P. R. China
| | - Rui Xu
- School of Physical Science and Technology, ShanghaiTech University, Shanghai, 201210, P. R. China
| | - Zhongyu Liu
- School of Physical Science and Technology, ShanghaiTech University, Shanghai, 201210, P. R. China
| | - Man Luo
- State Key Laboratory of Infrared Physics, Shanghai Institute of Technical Physics, Chinese Academy of Sciences, Shanghai, 200083, P. R. China
| | - Weida Hu
- State Key Laboratory of Infrared Physics, Shanghai Institute of Technical Physics, Chinese Academy of Sciences, Shanghai, 200083, P. R. China
| | - Huijun Guo
- State Key Laboratory of Infrared Physics, Shanghai Institute of Technical Physics, Chinese Academy of Sciences, Shanghai, 200083, P. R. China
| | - Wenjia Zhou
- School of Physical Science and Technology, ShanghaiTech University, Shanghai, 201210, P. R. China
| | - Yuehui Yu
- State Key Laboratory of Functional Materials for Informatics, Shanghai Institute of Microsystem and Information Technology, Chinese Academy of Sciences, Shanghai, 200050, P. R. China
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Chen J, Tang H, Li Z, Zhu Z, Gu M, Xu J, Ouyang X, Liu B. Highly sensitive X-ray detector based on a β-Ga 2O 3:Fe single crystal. OPTICS EXPRESS 2021; 29:23292-23299. [PMID: 34614597 DOI: 10.1364/oe.435366] [Citation(s) in RCA: 2] [Impact Index Per Article: 0.7] [Reference Citation Analysis] [Abstract] [Track Full Text] [Subscribe] [Scholar Register] [Received: 06/28/2021] [Accepted: 06/29/2021] [Indexed: 06/13/2023]
Abstract
β-Ga2O3 semiconductor crystal is of wide band gap and high radiation resistance, which shows great potential for applications such as medical imaging, radiation detections, and nuclear physical experiments. However, developing β-Ga2O3-based X-ray radiation detectors with high sensitivity, fast response speed, and excellent stability remains a challenge. Here we demonstrate a high-performance X-ray detector based on a Fe doped β-Ga2O3 (β-Ga2O3:Fe) crystal grown by the float-zone growth method, which consists of two vertical Ti/Au electrodes and a β-Ga2O3:Fe crystal with high resistivity. The resistivity of the β-Ga2O3:Fe crystal exceeds 1012 Ω cm owed to the compensation of the Fe ions and the free electrons. The detector shows short response time (0.2 s), high sensitivity (75.3 µC Gyair -1 cm-2), and high signal-to-noise ratio (100), indicating great potential for X-ray radiation detection.
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7
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Bryushinin MA, Kulikov VV, Petrov AA, Sokolov IA, Romashko RV, Kulchin YN. Non-steady-state photo-EMF in β-Ga 2O 3 crystals at λ = 457 nm. OPTICS EXPRESS 2020; 28:39067-39075. [PMID: 33379464 DOI: 10.1364/oe.413482] [Citation(s) in RCA: 0] [Impact Index Per Article: 0] [Reference Citation Analysis] [Abstract] [Track Full Text] [Subscribe] [Scholar Register] [Received: 10/27/2020] [Accepted: 12/01/2020] [Indexed: 06/12/2023]
Abstract
The non-steady-state photoelectromotive force is excited in a monoclinic gallium oxide crystal at wavelength λ = 457 nm. The crystal grown in an oxygen atmosphere is insulating and highly transparent for a visible light, nevertheless, the formation of dynamic space-charge gratings and observation of the photo-EMF signal is achieved without application of any electric field to the sample. The dependencies of the signal amplitude on the frequency of phase modulation, light intensity, spatial frequency and light polarization are measured. The material demonstrates the anisotropy along the [100] and [010] directions, namely, there is a small difference in the transport parameters and a pronounced polarization dependence of the signal. The crystal's photoconductivity, responsivity and diffusion length of electrons are estimated for the chosen light wavelength and compared with the ones for other wide-bandgap crystals.
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8
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Tunable Optical Properties of Amorphous-Like Ga 2O 3 Thin Films Deposited by Electron-Beam Evaporation with Varying Oxygen Partial Pressures. NANOMATERIALS 2020; 10:nano10091760. [PMID: 32899985 PMCID: PMC7558287 DOI: 10.3390/nano10091760] [Citation(s) in RCA: 8] [Impact Index Per Article: 2.0] [Reference Citation Analysis] [Abstract] [Key Words] [Track Full Text] [Download PDF] [Figures] [Subscribe] [Scholar Register] [Received: 08/01/2020] [Revised: 09/03/2020] [Accepted: 09/03/2020] [Indexed: 12/28/2022]
Abstract
Ga2O3 thin films were fabricated by the electron-beam evaporation technique at a varying oxygen partial pressure from 0 to 2.0 × 10−2 Pa. The effect of oxygen partial pressure on the crystalline structure and optical properties of the Ga2O3 films was analyzed using sophisticated techniques including X-ray photoelectron spectroscopy (XPS), X-ray diffraction (XRD), Raman spectroscopy, spectroscopic ellipsometry, ultraviolet-visible spectroscopy and a laser-induced damage test system. The correlation between the oxygen partial pressure and the film’s properties in optics and materials were investigated. XRD and Raman revealed that all films were amorphous in spite of applying a varying oxygen partial pressure. With the change of oxygen partial pressure, XPS data indicated that the content of oxygen in the Ga2O3 films could be broadly modulable. As a result, a changeable refractive index of the Ga2O3 film is realizable and a variable blue-shift of absorption edges in transmittance spectra of the films is achievable. Moreover, the damage threshold value varied from 0.41 to 7.51 J/cm2 according to the rise of oxygen partial pressure. These results demonstrated that the optical properties of Ga2O3 film can be broadly tunable by controlling the oxygen content in the film.
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9
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Zhang T, Shen Y, Feng Q, Tian X, Cai Y, Hu Z, Yan G, Feng Z, Zhang Y, Ning J, Xu Y, Lian X, Sun X, Zhang C, Zhou H, Zhang J, Hao Y. The Investigation of Hybrid PEDOT:PSS/β-Ga 2O 3 Deep Ultraviolet Schottky Barrier Photodetectors. NANOSCALE RESEARCH LETTERS 2020; 15:163. [PMID: 32797318 PMCID: PMC7427831 DOI: 10.1186/s11671-020-03397-8] [Citation(s) in RCA: 2] [Impact Index Per Article: 0.5] [Reference Citation Analysis] [Abstract] [Key Words] [Grants] [Track Full Text] [Figures] [Subscribe] [Scholar Register] [Received: 10/31/2019] [Accepted: 08/05/2020] [Indexed: 06/11/2023]
Abstract
In this paper, the hybrid β-Ga2O3 Schottky diodes were fabricated with PEDOT:PSS as the anode. The electrical characteristics were investigated when the temperature changes from 298 K to 423 K. The barrier height ϕb increases, and the ideality factor n decreases as the temperature increases, indicating the presence of barrier height inhomogeneity between the polymer and β-Ga2O3 interface. The mean barrier height and the standard deviation are 1.57 eV and 0.212 eV, respectively, after taking the Gaussian barrier height distribution model into account. Moreover, a relatively fast response speed of less than 320 ms, high reponsivity of 0.6 A/W, and rejection ratio of R254 nm/R400 nm up to 1.26 × 103 are obtained, suggesting that the hybrid PEDOT:PSS/β-Ga2O3 Schottky barrier diodes can be used as deep ultraviolet (DUV) optical switches or photodetectors.
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Affiliation(s)
- Tao Zhang
- State Key Discipline Laboratory of Wide Band Gap Semiconductor Technology, School of Microelectronics, Xidian University, Xi’an, 710071 China
- Shaanxi Joint Key Laboratory of Graphene, School of Microelectronics, Xidian University, Xi’an, 710071 China
| | - Yixian Shen
- State Key Discipline Laboratory of Wide Band Gap Semiconductor Technology, School of Microelectronics, Xidian University, Xi’an, 710071 China
- Shaanxi Joint Key Laboratory of Graphene, School of Microelectronics, Xidian University, Xi’an, 710071 China
| | - Qian Feng
- State Key Discipline Laboratory of Wide Band Gap Semiconductor Technology, School of Microelectronics, Xidian University, Xi’an, 710071 China
- Shaanxi Joint Key Laboratory of Graphene, School of Microelectronics, Xidian University, Xi’an, 710071 China
| | - Xusheng Tian
- State Key Discipline Laboratory of Wide Band Gap Semiconductor Technology, School of Microelectronics, Xidian University, Xi’an, 710071 China
- Shaanxi Joint Key Laboratory of Graphene, School of Microelectronics, Xidian University, Xi’an, 710071 China
| | - Yuncong Cai
- State Key Discipline Laboratory of Wide Band Gap Semiconductor Technology, School of Microelectronics, Xidian University, Xi’an, 710071 China
- Shaanxi Joint Key Laboratory of Graphene, School of Microelectronics, Xidian University, Xi’an, 710071 China
| | - Zhuangzhuang Hu
- State Key Discipline Laboratory of Wide Band Gap Semiconductor Technology, School of Microelectronics, Xidian University, Xi’an, 710071 China
- Shaanxi Joint Key Laboratory of Graphene, School of Microelectronics, Xidian University, Xi’an, 710071 China
| | - Guangshuo Yan
- State Key Discipline Laboratory of Wide Band Gap Semiconductor Technology, School of Microelectronics, Xidian University, Xi’an, 710071 China
- Shaanxi Joint Key Laboratory of Graphene, School of Microelectronics, Xidian University, Xi’an, 710071 China
| | - Zhaoqing Feng
- State Key Discipline Laboratory of Wide Band Gap Semiconductor Technology, School of Microelectronics, Xidian University, Xi’an, 710071 China
- Shaanxi Joint Key Laboratory of Graphene, School of Microelectronics, Xidian University, Xi’an, 710071 China
| | - Yachao Zhang
- State Key Discipline Laboratory of Wide Band Gap Semiconductor Technology, School of Microelectronics, Xidian University, Xi’an, 710071 China
- Shaanxi Joint Key Laboratory of Graphene, School of Microelectronics, Xidian University, Xi’an, 710071 China
| | - Jing Ning
- State Key Discipline Laboratory of Wide Band Gap Semiconductor Technology, School of Microelectronics, Xidian University, Xi’an, 710071 China
- Shaanxi Joint Key Laboratory of Graphene, School of Microelectronics, Xidian University, Xi’an, 710071 China
| | - Yongkuan Xu
- China Electronics Technology Group Corporation No. 46 Research Institute, Tianjin, 300220 China
| | - Xiaozheng Lian
- China Electronics Technology Group Corporation No. 46 Research Institute, Tianjin, 300220 China
| | - Xiaojuan Sun
- State Key Laboratory of Luminescence and Applications, Changchun Institute of Opeics, Chinese Academy of Sciences, Changchun, 130033 China
| | - Chunfu Zhang
- State Key Discipline Laboratory of Wide Band Gap Semiconductor Technology, School of Microelectronics, Xidian University, Xi’an, 710071 China
- Shaanxi Joint Key Laboratory of Graphene, School of Microelectronics, Xidian University, Xi’an, 710071 China
| | - Hong Zhou
- State Key Discipline Laboratory of Wide Band Gap Semiconductor Technology, School of Microelectronics, Xidian University, Xi’an, 710071 China
- Shaanxi Joint Key Laboratory of Graphene, School of Microelectronics, Xidian University, Xi’an, 710071 China
| | - Jincheng Zhang
- State Key Discipline Laboratory of Wide Band Gap Semiconductor Technology, School of Microelectronics, Xidian University, Xi’an, 710071 China
- Shaanxi Joint Key Laboratory of Graphene, School of Microelectronics, Xidian University, Xi’an, 710071 China
| | - Yue Hao
- State Key Discipline Laboratory of Wide Band Gap Semiconductor Technology, School of Microelectronics, Xidian University, Xi’an, 710071 China
- Shaanxi Joint Key Laboratory of Graphene, School of Microelectronics, Xidian University, Xi’an, 710071 China
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Vu TKO, Lee DU, Kim EK. The enhancement mechanism of photo-response depending on oxygen pressure for Ga 2O 3 photo detectors. NANOTECHNOLOGY 2020; 31:245201. [PMID: 32066119 DOI: 10.1088/1361-6528/ab76f5] [Citation(s) in RCA: 0] [Impact Index Per Article: 0] [Reference Citation Analysis] [Abstract] [Track Full Text] [Subscribe] [Scholar Register] [Indexed: 06/10/2023]
Abstract
We have optimized the responsivity and response speed of a β-Ga2O3-based photodetector. The β-Ga2O3 thin films were deposited on a glass substrate under various oxygen partial pressures from 0 to 50 mTorr using pulsed laser deposition. Time-response measurements show that the as-grown β-Ga2O3 at an oxygen partial pressure of 50 mTorr has the fastest response speed and decay times of 33 and 100 ms, which are better than those prepared at lower oxygen pressures. This sample also showed a high photoresponsivity of 5 A W-1 and detectivity of 1012 cmHz1/2/W. The high performance of the β-Ga2O3 detector grown at the oxygen partial pressure of 50 mTorr might be due to the reduction of oxygen vacancies caused by the increase in oxygen content during deposition. The results reveal the importance of the oxygen processing gas in promoting photodetector performance.
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11
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Zhang X, Wang L, Wang X, Chen Y, Shao Q, Wu G, Wang X, Lin T, Shen H, Wang J, Meng X, Chu J. High-performance β-Ga 2O 3 thickness dependent solar blind photodetector. OPTICS EXPRESS 2020; 28:4169-4177. [PMID: 32122074 DOI: 10.1364/oe.385470] [Citation(s) in RCA: 1] [Impact Index Per Article: 0.3] [Reference Citation Analysis] [Abstract] [Track Full Text] [Subscribe] [Scholar Register] [Received: 12/11/2019] [Accepted: 01/18/2020] [Indexed: 06/10/2023]
Abstract
Gallium oxide (Ga2O3) has been studied as one of the most promising wide bandgap semiconductors during the past decade. Here, we prepared high quality β-Ga2O3 films by pulsed laser deposition. β-Ga2O3 films of different thicknesses were achieved and their crystal properties were comprehensively studied. As thickness increases, grain size and surface roughness are both increased. Based on these β-Ga2O3 films, a series of ultraviolet (UV) photodetectors with interdigital electrodes structure were prepared. These devices embrace an ultralow dark current of 100 fA, and high photocurrent on/off ratio of 10E8 under UV light illumination. The photoresponse time is 4 ms which is faster than most of previous works. This work paves the way for the potential application of Ga2O3 in the field of UV detection.
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Fast Response Solar-Blind Photodetector with a Quasi-Zener Tunneling Effect Based on Amorphous In-Doped Ga 2O 3 Thin Films. SENSORS 2019; 20:s20010129. [PMID: 31878186 PMCID: PMC6982943 DOI: 10.3390/s20010129] [Citation(s) in RCA: 7] [Impact Index Per Article: 1.4] [Reference Citation Analysis] [Abstract] [Key Words] [Track Full Text] [Download PDF] [Figures] [Subscribe] [Scholar Register] [Received: 11/12/2019] [Revised: 12/10/2019] [Accepted: 12/20/2019] [Indexed: 11/16/2022]
Abstract
A high-performance solar-blind photodetector with a metal–semiconductor–metal structure was fabricated based on amorphous In-doped Ga2O3 thin films prepared at room temperature by radio frequency magnetron sputtering. The photodetector shows a high responsivity (18.06 A/W) at 235 nm with a fast rise time (4.9 μs) and a rapid decay time (230 μs). The detection range was broadened compared with an individual Ga2O3 photodetector because of In doping. In addition, the uneven In distribution at different areas in the film results in different resistances, which causes a quasi-Zener tunneling internal gain mechanism. The quasi-Zener tunneling internal gain mechanism has a positive impact on the fast response speed and high responsivity.
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Lin C, Lu Y, Tian Y, Gao C, Fan M, Yang X, Dong L, Shan C. Diamond based photodetectors for solar-blind communication. OPTICS EXPRESS 2019; 27:29962-29971. [PMID: 31684251 DOI: 10.1364/oe.27.029962] [Citation(s) in RCA: 4] [Impact Index Per Article: 0.8] [Reference Citation Analysis] [Abstract] [Track Full Text] [Subscribe] [Scholar Register] [Received: 07/22/2019] [Accepted: 09/16/2019] [Indexed: 06/10/2023]
Abstract
High performance solar-blind photodetectors have been fabricated from diamond wafers. The peak responsivity is 13.0 A/W at 222 nm with a dark current of 0.93 nA under 60 V bias. The rise and decay times of the photodetector are about 1.3 µs and 203 µs, respectively. The responsivity and response time of the device are both among the best values ever reported for diamond-based photodetectors. A solar-blind optical communication system has been constructed by employing the diamond photodetector as a signal receiver for the first time. Benefiting from the high spectral selectivity of the diamond photodetector, the communication system has excellent anti-interference ability. The results reported in this paper may pave the way for the future application of diamond-based solar-blind photodetectors in confidential communications.
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Li W, Zhan X, Song X, Si S, Chen R, Liu J, Wang Z, He J, Xiao X. A Review of Recent Applications of Ion Beam Techniques on Nanomaterial Surface Modification: Design of Nanostructures and Energy Harvesting. SMALL (WEINHEIM AN DER BERGSTRASSE, GERMANY) 2019; 15:e1901820. [PMID: 31166661 DOI: 10.1002/smll.201901820] [Citation(s) in RCA: 22] [Impact Index Per Article: 4.4] [Reference Citation Analysis] [Abstract] [Key Words] [Track Full Text] [Subscribe] [Scholar Register] [Received: 04/10/2019] [Revised: 05/13/2019] [Indexed: 05/23/2023]
Abstract
Nanomaterials have gained plenty of research interest because of their excellent performance, which is derived from their small size and special structure. In practical applications, to acquire nanomaterials with high performance, many methods have been used to modulate the structure and components of materials. To date, ion beam techniques have extensively been applied for modulating the performance of various nanomaterials. Energetic ion beams can modulate the surface morphology and chemical components of nanomaterials. In addition, ion beam techniques have also been used to fabricate nanomaterials, including 2D materials, nanoparticles, and nanowires. Compared with conventional methods, ion beam techniques, including ion implantation, ion irradiation, and focused ion beam, are all pure physical processes; these processes do not introduce any impurities into the target materials. In addition, ion beam techniques exhibit high controllability and repeatability. Here, recent progress in ion beam techniques for nanomaterial surface modification is systematically summarized and existing challenges and potential solutions are presented.
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Affiliation(s)
- Wenqing Li
- Department of Physics and Key Laboratory of Artificial Micro- and Nano-structures of Ministry of Education, Hubei Nuclear Solid Physics Key Laboratory and Center for Ion Beam Application, Wuhan University, Wuhan, 430072, P. R. China
| | - Xueying Zhan
- CAS Key Laboratory of Nanosystem and Hierarchical Fabrication, National Center for Nanoscience and Technology, Beijing, 100190, P. R. China
| | - Xianyin Song
- Department of Physics and Key Laboratory of Artificial Micro- and Nano-structures of Ministry of Education, Hubei Nuclear Solid Physics Key Laboratory and Center for Ion Beam Application, Wuhan University, Wuhan, 430072, P. R. China
| | - Shuyao Si
- Department of Physics and Key Laboratory of Artificial Micro- and Nano-structures of Ministry of Education, Hubei Nuclear Solid Physics Key Laboratory and Center for Ion Beam Application, Wuhan University, Wuhan, 430072, P. R. China
| | - Rui Chen
- Department of Physics and Key Laboratory of Artificial Micro- and Nano-structures of Ministry of Education, Hubei Nuclear Solid Physics Key Laboratory and Center for Ion Beam Application, Wuhan University, Wuhan, 430072, P. R. China
| | - Jing Liu
- Department of Physics and Key Laboratory of Artificial Micro- and Nano-structures of Ministry of Education, Hubei Nuclear Solid Physics Key Laboratory and Center for Ion Beam Application, Wuhan University, Wuhan, 430072, P. R. China
| | - Zhenxing Wang
- CAS Key Laboratory of Nanosystem and Hierarchical Fabrication, National Center for Nanoscience and Technology, Beijing, 100190, P. R. China
| | - Jun He
- CAS Key Laboratory of Nanosystem and Hierarchical Fabrication, National Center for Nanoscience and Technology, Beijing, 100190, P. R. China
| | - Xiangheng Xiao
- Department of Physics and Key Laboratory of Artificial Micro- and Nano-structures of Ministry of Education, Hubei Nuclear Solid Physics Key Laboratory and Center for Ion Beam Application, Wuhan University, Wuhan, 430072, P. R. China
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Chen M, Ma J, Li P, Xu H, Liu Y. Zero-biased deep ultraviolet photodetectors based on graphene/cleaved (100) Ga 2O 3 heterojunction. OPTICS EXPRESS 2019; 27:8717-8726. [PMID: 31052684 DOI: 10.1364/oe.27.008717] [Citation(s) in RCA: 4] [Impact Index Per Article: 0.8] [Reference Citation Analysis] [Abstract] [Track Full Text] [Subscribe] [Scholar Register] [Received: 01/09/2019] [Accepted: 02/28/2019] [Indexed: 06/09/2023]
Abstract
In this paper, fast response, zero-biased, solar-blind UV photodetectors based on graphene/β-Ga2O3 heterojunctions were fabricated by transferring a monolayer graphene onto fresh cleaved β-Ga2O3 (100) single crystal substrate. At zero bias, the photo responsivity at 254 nm and the UV/visible rejection ratio (R235 nm/R400 nm) and the response time are obtained to be 10.3 mA/W and 2.28 × 102 and 2.24 μs, respectively, for the graphene/β-Ga2O3 (100) detector. The fast response and the high sensitivity can be attributed to the high mobility and UV transparency of graphene top-electrode and the low defect density of the β-Ga2O3 (100) cleaved surface. Such zero-biased detectors are very promising for next-generation solar-blind UV photodetection.
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Li Y, Zhang D, Lin R, Zhang Z, Zheng W, Huang F. Graphene Interdigital Electrodes for Improving Sensitivity in a Ga 2O 3:Zn Deep-Ultraviolet Photoconductive Detector. ACS APPLIED MATERIALS & INTERFACES 2019; 11:1013-1020. [PMID: 30520294 DOI: 10.1021/acsami.8b14380] [Citation(s) in RCA: 5] [Impact Index Per Article: 1.0] [Reference Citation Analysis] [Abstract] [Key Words] [Track Full Text] [Subscribe] [Scholar Register] [Indexed: 06/09/2023]
Abstract
Graphene (Gr) has been widely used as a transparent electrode material for photodetectors because of its high conductivity and high transmittance in recent years. However, the current low-efficiency manipulation of Gr has hindered the arraying and practical use of such detectors. We invented a multistep method of accurately tailoring graphene into interdigital electrodes for fabricating a sensitive, stable deep-ultraviolet photodetector based on Zn-doped Ga2O3 films. The fabricated photodetector exhibits a series of excellent performance, including extremely low dark current (∼10-11 A), an ultrahigh photo-to-dark ratio (>105), satisfactory responsivity (1.05 A/W), and excellent selectivity for the deep-ultraviolet band, compared to those with ordinary metal electrodes. The raise of photocurrent and responsivity is attributed to the increase of incident photons through Gr and separated carriers caused by the built-in electric field formed at the interface of Gr and Ga2O3:Zn films. The proposed ideas and methods of tailoring Gr can not only improve the performance of devices but more importantly contribute to the practical development of graphene.
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Affiliation(s)
- Yuqiang Li
- State Key Laboratory of Optoelectronic Materials and Technologies, School of Materials , Sun Yat-sen University , Guangzhou 510275 , P. R. China
| | - Dan Zhang
- State Key Laboratory of Optoelectronic Materials and Technologies, School of Materials , Sun Yat-sen University , Guangzhou 510275 , P. R. China
| | - Richeng Lin
- State Key Laboratory of Optoelectronic Materials and Technologies, School of Materials , Sun Yat-sen University , Guangzhou 510275 , P. R. China
| | - Zhaojun Zhang
- State Key Laboratory of Optoelectronic Materials and Technologies, School of Materials , Sun Yat-sen University , Guangzhou 510275 , P. R. China
| | - Wei Zheng
- State Key Laboratory of Optoelectronic Materials and Technologies, School of Materials , Sun Yat-sen University , Guangzhou 510275 , P. R. China
| | - Feng Huang
- State Key Laboratory of Optoelectronic Materials and Technologies, School of Materials , Sun Yat-sen University , Guangzhou 510275 , P. R. China
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Huan YW, Sun SM, Gu CJ, Liu WJ, Ding SJ, Yu HY, Xia CT, Zhang DW. Recent Advances in β-Ga 2O 3-Metal Contacts. NANOSCALE RESEARCH LETTERS 2018; 13:246. [PMID: 30136254 PMCID: PMC6104468 DOI: 10.1186/s11671-018-2667-2] [Citation(s) in RCA: 8] [Impact Index Per Article: 1.3] [Reference Citation Analysis] [Abstract] [Key Words] [Grants] [Track Full Text] [Figures] [Subscribe] [Scholar Register] [Received: 06/23/2018] [Accepted: 08/10/2018] [Indexed: 06/08/2023]
Abstract
Ultra-wide bandgap beta-gallium oxide (β-Ga2O3) has been attracting considerable attention as a promising semiconductor material for next-generation power electronics. It possesses excellent material properties such as a wide bandgap of 4.6-4.9 eV, a high breakdown electric field of 8 MV/cm, and exceptional Baliga's figure of merit (BFOM), along with superior chemical and thermal stability. These features suggest its great potential for future applications in power and optoelectronic devices. However, the critical issue of contacts between metal and Ga2O3 limits the performance of β-Ga2O3 devices. In this work, we have reviewed the advances on contacts of β-Ga2O3 MOSFETs. For improving contact properties, four main approaches are summarized and analyzed in details, including pre-treatment, post-treatment, multilayer metal electrode, and introducing an interlayer. By comparison, the latter two methods are being studied intensively and more favorable than the pre-treatment which would inevitably generate uncontrollable damages. Finally, conclusions and future perspectives for improving Ohmic contacts further are presented.
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Affiliation(s)
- Ya-Wei Huan
- State Key Laboratory of ASIC and System, School of Microelectronics, Fudan University, Shanghai, 200433 China
| | - Shun-Ming Sun
- State Key Laboratory of ASIC and System, School of Microelectronics, Fudan University, Shanghai, 200433 China
| | - Chen-Jie Gu
- Division of Microelectronics, School of Science, Ningbo University, Ningbo, 315211 China
| | - Wen-Jun Liu
- State Key Laboratory of ASIC and System, School of Microelectronics, Fudan University, Shanghai, 200433 China
| | - Shi-Jin Ding
- State Key Laboratory of ASIC and System, School of Microelectronics, Fudan University, Shanghai, 200433 China
| | - Hong-Yu Yu
- Department of Electrical and Electronic Engineering, Southern University of Science and Technology, Shenzhen, 518055 China
| | - Chang-Tai Xia
- Key Laboratory of Materials for High Power Laser, Shanghai Institute of Optics and Fine Mechanics, Chinese Academy of Science, Shanghai, 201800 China
| | - David Wei Zhang
- State Key Laboratory of ASIC and System, School of Microelectronics, Fudan University, Shanghai, 200433 China
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