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Verrier N, Debailleul M, Haeberlé O. Recent Advances and Current Trends in Transmission Tomographic Diffraction Microscopy. SENSORS (BASEL, SWITZERLAND) 2024; 24:1594. [PMID: 38475130 PMCID: PMC10934239 DOI: 10.3390/s24051594] [Citation(s) in RCA: 0] [Impact Index Per Article: 0] [Reference Citation Analysis] [Abstract] [Key Words] [Grants] [Track Full Text] [Subscribe] [Scholar Register] [Received: 01/19/2024] [Revised: 02/21/2024] [Accepted: 02/27/2024] [Indexed: 03/14/2024]
Abstract
Optical microscopy techniques are among the most used methods in biomedical sample characterization. In their more advanced realization, optical microscopes demonstrate resolution down to the nanometric scale. These methods rely on the use of fluorescent sample labeling in order to break the diffraction limit. However, fluorescent molecules' phototoxicity or photobleaching is not always compatible with the investigated samples. To overcome this limitation, quantitative phase imaging techniques have been proposed. Among these, holographic imaging has demonstrated its ability to image living microscopic samples without staining. However, for a 3D assessment of samples, tomographic acquisitions are needed. Tomographic Diffraction Microscopy (TDM) combines holographic acquisitions with tomographic reconstructions. Relying on a 3D synthetic aperture process, TDM allows for 3D quantitative measurements of the complex refractive index of the investigated sample. Since its initial proposition by Emil Wolf in 1969, the concept of TDM has found a lot of applications and has become one of the hot topics in biomedical imaging. This review focuses on recent achievements in TDM development. Current trends and perspectives of the technique are also discussed.
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Affiliation(s)
- Nicolas Verrier
- Institut Recherche en Informatique, Mathématiques, Automatique et Signal (IRIMAS UR UHA 7499), Université de Haute-Alsace, IUT Mulhouse, 61 rue Albert Camus, 68093 Mulhouse, France; (M.D.); (O.H.)
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Xu F, Wu Z, Tan C, Liao Y, Wang Z, Chen K, Pan A. Fourier Ptychographic Microscopy 10 Years on: A Review. Cells 2024; 13:324. [PMID: 38391937 PMCID: PMC10887115 DOI: 10.3390/cells13040324] [Citation(s) in RCA: 0] [Impact Index Per Article: 0] [Reference Citation Analysis] [Abstract] [Key Words] [MESH Headings] [Grants] [Track Full Text] [Journal Information] [Subscribe] [Scholar Register] [Received: 12/15/2023] [Revised: 01/31/2024] [Accepted: 02/08/2024] [Indexed: 02/24/2024] Open
Abstract
Fourier ptychographic microscopy (FPM) emerged as a prominent imaging technique in 2013, attracting significant interest due to its remarkable features such as precise phase retrieval, expansive field of view (FOV), and superior resolution. Over the past decade, FPM has become an essential tool in microscopy, with applications in metrology, scientific research, biomedicine, and inspection. This achievement arises from its ability to effectively address the persistent challenge of achieving a trade-off between FOV and resolution in imaging systems. It has a wide range of applications, including label-free imaging, drug screening, and digital pathology. In this comprehensive review, we present a concise overview of the fundamental principles of FPM and compare it with similar imaging techniques. In addition, we present a study on achieving colorization of restored photographs and enhancing the speed of FPM. Subsequently, we showcase several FPM applications utilizing the previously described technologies, with a specific focus on digital pathology, drug screening, and three-dimensional imaging. We thoroughly examine the benefits and challenges associated with integrating deep learning and FPM. To summarize, we express our own viewpoints on the technological progress of FPM and explore prospective avenues for its future developments.
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Affiliation(s)
- Fannuo Xu
- State Key Laboratory of Transient Optics and Photonics, Xi’an Institute of Optics and Precision Mechanics, Chinese Academy of Sciences, Xi’an 710119, China; (F.X.); (Z.W.); (C.T.); (Y.L.); (Z.W.); (K.C.)
- University of Chinese Academy of Sciences, Beijing 100049, China
| | - Zipei Wu
- State Key Laboratory of Transient Optics and Photonics, Xi’an Institute of Optics and Precision Mechanics, Chinese Academy of Sciences, Xi’an 710119, China; (F.X.); (Z.W.); (C.T.); (Y.L.); (Z.W.); (K.C.)
- School of Physics and Optoelectronic Engineering, Shenzhen University, Shenzhen 518060, China
| | - Chao Tan
- State Key Laboratory of Transient Optics and Photonics, Xi’an Institute of Optics and Precision Mechanics, Chinese Academy of Sciences, Xi’an 710119, China; (F.X.); (Z.W.); (C.T.); (Y.L.); (Z.W.); (K.C.)
- School of Electronics and Information Engineering, Sichuan University, Chengdu 610065, China
| | - Yizheng Liao
- State Key Laboratory of Transient Optics and Photonics, Xi’an Institute of Optics and Precision Mechanics, Chinese Academy of Sciences, Xi’an 710119, China; (F.X.); (Z.W.); (C.T.); (Y.L.); (Z.W.); (K.C.)
- University of Chinese Academy of Sciences, Beijing 100049, China
| | - Zhiping Wang
- State Key Laboratory of Transient Optics and Photonics, Xi’an Institute of Optics and Precision Mechanics, Chinese Academy of Sciences, Xi’an 710119, China; (F.X.); (Z.W.); (C.T.); (Y.L.); (Z.W.); (K.C.)
- School of Physical Science and Technology, Lanzhou University, Lanzhou 730000, China
| | - Keru Chen
- State Key Laboratory of Transient Optics and Photonics, Xi’an Institute of Optics and Precision Mechanics, Chinese Academy of Sciences, Xi’an 710119, China; (F.X.); (Z.W.); (C.T.); (Y.L.); (Z.W.); (K.C.)
- School of Automation Science and Engineering, Xi’an Jiaotong University, Xi’an 710049, China
| | - An Pan
- State Key Laboratory of Transient Optics and Photonics, Xi’an Institute of Optics and Precision Mechanics, Chinese Academy of Sciences, Xi’an 710119, China; (F.X.); (Z.W.); (C.T.); (Y.L.); (Z.W.); (K.C.)
- University of Chinese Academy of Sciences, Beijing 100049, China
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