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For: Wan Z, Liu Y, Fu Z, Li Y, Cheng T, Li F, Fan H. Visual computing in electron crystallography. ACTA ACUST UNITED AC 2009. [DOI: 10.1524/zkri.218.4.308.20739] [Citation(s) in RCA: 14] [Impact Index Per Article: 0.9] [Reference Citation Analysis] [What about the content of this article? (0)] [Track Full Text] [Journal Information] [Subscribe] [Scholar Register] [Indexed: 11/24/2022]
Number Cited by Other Article(s)
1
Moeck P. Objective crystallographic symmetry classifications of a noisy crystal pattern with strong Fedorov-type pseudosymmetries and its optimal image-quality enhancement. ACTA CRYSTALLOGRAPHICA SECTION A FOUNDATIONS AND ADVANCES 2022;78:172-199. [PMID: 35502711 PMCID: PMC9062829 DOI: 10.1107/s2053273322000845] [Citation(s) in RCA: 3] [Impact Index Per Article: 1.5] [Reference Citation Analysis] [Abstract] [Track Full Text] [Download PDF] [Figures] [Subscribe] [Scholar Register] [Received: 07/28/2021] [Accepted: 01/24/2022] [Indexed: 11/29/2022]
2
Li FH. Effect of diffraction crystallography on HREM. Z KRIST-CRYST MATER 2009. [DOI: 10.1524/zkri.218.4.279.20746] [Citation(s) in RCA: 16] [Impact Index Per Article: 1.1] [Reference Citation Analysis] [Abstract] [Track Full Text] [Journal Information] [Subscribe] [Scholar Register] [Indexed: 11/24/2022]
3
Lotsch BV, Döblinger M, Sehnert J, Seyfarth L, Senker J, Oeckler O, Schnick W. Unmasking Melon by a Complementary Approach Employing Electron Diffraction, Solid-State NMR Spectroscopy, and Theoretical Calculations—Structural Characterization of a Carbon Nitride Polymer. Chemistry 2007;13:4969-80. [PMID: 17415739 DOI: 10.1002/chem.200601759] [Citation(s) in RCA: 391] [Impact Index Per Article: 23.0] [Reference Citation Analysis] [Abstract] [Track Full Text] [Journal Information] [Subscribe] [Scholar Register] [Indexed: 11/07/2022]
4
Wang YM, Wang HB, Li FH, Jia LS, Chen XL. Maximum entropy image deconvolution applied to structure determination for crystal Nd1.85Ce0.15CuO4−δ. Micron 2005;36:393-400. [PMID: 15894484 DOI: 10.1016/j.micron.2005.03.002] [Citation(s) in RCA: 5] [Impact Index Per Article: 0.3] [Reference Citation Analysis] [Abstract] [Track Full Text] [Journal Information] [Subscribe] [Scholar Register] [Received: 05/25/2004] [Revised: 03/24/2005] [Accepted: 03/24/2005] [Indexed: 10/25/2022]
5
Kilaas R, Marks LD, Own CS. EDM 1.0: Electron direct methods. Ultramicroscopy 2005;102:233-7. [PMID: 15639355 DOI: 10.1016/j.ultramic.2004.10.004] [Citation(s) in RCA: 21] [Impact Index Per Article: 1.1] [Reference Citation Analysis] [Abstract] [MESH Headings] [Track Full Text] [Journal Information] [Subscribe] [Scholar Register] [Received: 07/21/2004] [Revised: 09/30/2004] [Accepted: 10/12/2004] [Indexed: 11/24/2022]
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