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Number Cited by Other Article(s)
1
The impact of STEM aberration correction on materials science. Ultramicroscopy 2017;180:22-33. [DOI: 10.1016/j.ultramic.2017.03.020] [Citation(s) in RCA: 45] [Impact Index Per Article: 6.4] [Reference Citation Analysis] [Track Full Text] [Journal Information] [Subscribe] [Scholar Register] [Received: 10/12/2016] [Revised: 03/04/2017] [Accepted: 03/16/2017] [Indexed: 11/22/2022]
2
ZHANG M, MING Y, ZENG R, DING Z. Calculation of Bohmian quantum trajectories for STEM. J Microsc 2015;260:200-7. [DOI: 10.1111/jmi.12283] [Citation(s) in RCA: 6] [Impact Index Per Article: 0.7] [Reference Citation Analysis] [Track Full Text] [Journal Information] [Subscribe] [Scholar Register] [Received: 04/07/2015] [Accepted: 06/07/2015] [Indexed: 11/30/2022]
3
Findlay S, Shibata N, Ikuhara Y. What atomic resolution annular dark field imaging can tell us about gold nanoparticles on TiO2 (110). Ultramicroscopy 2009;109:1435-46. [DOI: 10.1016/j.ultramic.2009.07.006] [Citation(s) in RCA: 8] [Impact Index Per Article: 0.5] [Reference Citation Analysis] [Track Full Text] [Journal Information] [Subscribe] [Scholar Register] [Received: 04/30/2009] [Revised: 07/09/2009] [Accepted: 07/17/2009] [Indexed: 11/28/2022]
4
Pennycook S, Chisholm M, Lupini A, Varela M, van Benthem K, Borisevich A, Oxley M, Luo W, Pantelides S. Chapter 9 Materials Applications of Aberration-Corrected Scanning Transmission Electron Microscopy. ADVANCES IN IMAGING AND ELECTRON PHYSICS 2008. [DOI: 10.1016/s1076-5670(08)01009-4] [Citation(s) in RCA: 19] [Impact Index Per Article: 1.2] [Reference Citation Analysis] [Track Full Text] [Subscribe] [Scholar Register] [Indexed: 01/05/2023]
5
Borisevich AY, Lupini AR, Pennycook SJ. Depth sectioning with the aberration-corrected scanning transmission electron microscope. Proc Natl Acad Sci U S A 2006;103:3044-8. [PMID: 16492746 PMCID: PMC1413870 DOI: 10.1073/pnas.0507105103] [Citation(s) in RCA: 186] [Impact Index Per Article: 10.3] [Reference Citation Analysis] [Abstract] [Track Full Text] [Journal Information] [Subscribe] [Scholar Register] [Indexed: 11/18/2022]  Open
6
Nakanishi N, Kotaka Y, Yamazaki T. An expanded approach to noise reduction from high-resolution STEM images based on the maximum entropy method. Ultramicroscopy 2005;106:233-9. [PMID: 16125848 DOI: 10.1016/j.ultramic.2005.07.006] [Citation(s) in RCA: 6] [Impact Index Per Article: 0.3] [Reference Citation Analysis] [Abstract] [Track Full Text] [Journal Information] [Subscribe] [Scholar Register] [Received: 02/11/2005] [Revised: 06/22/2005] [Accepted: 07/13/2005] [Indexed: 11/24/2022]
7
Cosgriff EC, Oxley MP, Allen LJ, Pennycook SJ. The spatial resolution of imaging using core-loss spectroscopy in the scanning transmission electron microscope. Ultramicroscopy 2005;102:317-26. [PMID: 15694678 DOI: 10.1016/j.ultramic.2004.11.001] [Citation(s) in RCA: 55] [Impact Index Per Article: 2.9] [Reference Citation Analysis] [Abstract] [MESH Headings] [Track Full Text] [Journal Information] [Subscribe] [Scholar Register] [Received: 07/26/2004] [Revised: 11/05/2004] [Accepted: 11/12/2004] [Indexed: 11/19/2022]
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