1
|
Ju D, Kim S, Kim S. Artificial Synapse Emulated by Indium Tin Oxide/SiN/TaN Resistive Switching Device for Neuromorphic System. NANOMATERIALS (BASEL, SWITZERLAND) 2023; 13:2477. [PMID: 37686985 PMCID: PMC10490079 DOI: 10.3390/nano13172477] [Citation(s) in RCA: 1] [Impact Index Per Article: 1.0] [Reference Citation Analysis] [Abstract] [Key Words] [Grants] [Track Full Text] [Subscribe] [Scholar Register] [Received: 07/26/2023] [Revised: 08/23/2023] [Accepted: 08/24/2023] [Indexed: 09/10/2023]
Abstract
In this paper, we fabricate an ITO/SiN/TaN memristor device and analyze its electrical characteristics for a neuromorphic system. The device structure and chemical properties are investigated using transmission electron microscopy and X-ray photoelectron spectroscopy. Uniform bipolar switching is achieved through DC sweep under a compliance current of 5 mA. Also, the analog reset phenomenon is observed by modulating the reset voltage for long-term memory. Additionally, short-term memory characteristics are obtained by controlling the strength of the pulse response. Finally, bio-inspired synaptic characteristics are emulated using Hebbian learning rules such as spike-rate-dependent plasticity (SRDP) and spike-timing-dependent plasticity (STDP). As a result, we believe that the coexistence of short-term and long-term memories in the ITO/SiN/TaN device can provide flexibility in device design in future neuromorphic applications.
Collapse
Affiliation(s)
| | | | - Sungjun Kim
- Division of Electronics and Electrical Engineering, Dongguk University, Seoul 04620, Republic of Korea
| |
Collapse
|
2
|
Artificial Synapse Consisted of TiSbTe/SiC x:H Memristor with Ultra-high Uniformity for Neuromorphic Computing. NANOMATERIALS 2022; 12:nano12122110. [PMID: 35745449 PMCID: PMC9227692 DOI: 10.3390/nano12122110] [Citation(s) in RCA: 0] [Impact Index Per Article: 0] [Reference Citation Analysis] [Abstract] [Key Words] [Track Full Text] [Download PDF] [Figures] [Subscribe] [Scholar Register] [Received: 05/07/2022] [Revised: 06/14/2022] [Accepted: 06/14/2022] [Indexed: 02/04/2023]
Abstract
To enable a-SiCx:H-based memristors to be integrated into brain-inspired chips, and to efficiently deal with the massive and diverse data, high switching uniformity of the a-SiC0.11:H memristor is urgently needed. In this study, we introduced a TiSbTe layer into an a-SiC0.11:H memristor, and successfully observed the ultra-high uniformity of the TiSbTe/a-SiC0.11:H memristor device. Compared with the a-SiC0.11:H memristor, the cycle-to-cycle coefficient of variation in the high resistance state and the low resistance state of TiSbTe/a-SiC0.11:H memristors was reduced by 92.5% and 66.4%, respectively. Moreover, the device-to-device coefficient of variation in the high resistance state and the low resistance state of TiSbTe/a-SiC0.11:H memristors decreased by 93.6% and 86.3%, respectively. A high-resolution transmission electron microscope revealed that a permanent TiSbTe nanocrystalline conductive nanofilament was formed in the TiSbTe layer during the DC sweeping process. The localized electric field of the TiSbTe nanocrystalline was beneficial for confining the position of the conductive filaments in the a-SiC0.11:H film, which contributed to improving the uniformity of the device. The temperature-dependent I-V characteristic further confirmed that the bridge and rupture of the Si dangling bond nanopathway was responsible for the resistive switching of the TiSbTe/a-SiC0.11:H device. The ultra-high uniformity of the TiSbTe/a-SiC0.11:H device ensured the successful implementation of biosynaptic functions such as spike-duration-dependent plasticity, long-term potentiation, long-term depression, and spike-timing-dependent plasticity. Furthermore, visual learning capability could be simulated through changing the conductance of the TiSbTe/a-SiC0.11:H device. Our discovery of the ultra-high uniformity of TiSbTe/a-SiC0.11:H memristor devices provides an avenue for their integration into the next generation of AI chips.
Collapse
|
3
|
Choi S, Jang J, Kim MS, Kim ND, Kwag J, Wang G. Flexible Neural Network Realized by the Probabilistic SiO x Memristive Synaptic Array for Energy-Efficient Image Learning. ADVANCED SCIENCE (WEINHEIM, BADEN-WURTTEMBERG, GERMANY) 2022; 9:e2104773. [PMID: 35170246 PMCID: PMC9009121 DOI: 10.1002/advs.202104773] [Citation(s) in RCA: 0] [Impact Index Per Article: 0] [Reference Citation Analysis] [Abstract] [Key Words] [MESH Headings] [Grants] [Track Full Text] [Figures] [Subscribe] [Scholar Register] [Received: 10/24/2021] [Revised: 12/31/2021] [Indexed: 06/14/2023]
Abstract
The human brain's neural networks are sparsely connected via tunable and probabilistic synapses, which may be essential for performing energy-efficient cognitive and intellectual functions. In this sense, the implementation of a flexible neural network with probabilistic synapses is a first step toward realizing the ultimate energy-efficient computing framework. Here, inspired by the efficient threshold-tunable and probabilistic rod-to-rod bipolar synapses in the human visual system, a 16 × 16 crossbar array comprising the vertical form of gate-tunable probabilistic SiOx memristive synaptic barristor utilizing the Si/graphene heterojunction is designed and fabricated. Controllable stochastic switching dynamics in this array are achieved via various input voltage pulse schemes. In particular, the threshold tunability via electrostatic gating enables the efficient in situ alteration of the probabilistic switching activation (PAct ) from 0 to 1.0, and can even modulate the degree of the PAct change. A drop-connected algorithm based on the PAct is constructed and used to successfully classify the shapes of several fashion items. The suggested approach can decrease the learning energy by up to ≈2,116 times relative to that of the conventional all-to-all connected network while exhibiting a high recognition accuracy of ≈93 %.
Collapse
Affiliation(s)
- Sanghyeon Choi
- KU‐KIST Graduate School of Converging Science and TechnologyKorea University145 Anam‐ro, Seongbuk‐guSeoul02841Republic of Korea
| | - Jingon Jang
- KU‐KIST Graduate School of Converging Science and TechnologyKorea University145 Anam‐ro, Seongbuk‐guSeoul02841Republic of Korea
| | - Min Seob Kim
- Institute of Advanced Composite MaterialsKorea Institute of Science and Technology92 Chudong‐ro, Bongdong‐eupWanju‐gunJeollabuk‐do55324Republic of Korea
| | - Nam Dong Kim
- Institute of Advanced Composite MaterialsKorea Institute of Science and Technology92 Chudong‐ro, Bongdong‐eupWanju‐gunJeollabuk‐do55324Republic of Korea
| | - Jeehyun Kwag
- Department of Brain and Cognitive EngineeringKorea UniversitySeoul02841Republic of Korea
| | - Gunuk Wang
- KU‐KIST Graduate School of Converging Science and TechnologyKorea University145 Anam‐ro, Seongbuk‐guSeoul02841Republic of Korea
- Department of Integrative Energy EngineeringKorea University145 Anam‐ro, Seongbuk‐guSeoul02841Republic of Korea
| |
Collapse
|
4
|
Buckwell M, Ng WH, Mannion DJ, Cox HRJ, Hudziak S, Mehonic A, Kenyon AJ. Neuromorphic Dynamics at the Nanoscale in Silicon Suboxide RRAM. FRONTIERS IN NANOTECHNOLOGY 2021. [DOI: 10.3389/fnano.2021.699037] [Citation(s) in RCA: 0] [Impact Index Per Article: 0] [Reference Citation Analysis] [Abstract] [Track Full Text] [Journal Information] [Subscribe] [Scholar Register] [Indexed: 11/13/2022] Open
Abstract
Resistive random-access memories, also known as memristors, whose resistance can be modulated by the electrically driven formation and disruption of conductive filaments within an insulator, are promising candidates for neuromorphic applications due to their scalability, low-power operation and diverse functional behaviors. However, understanding the dynamics of individual filaments, and the surrounding material, is challenging, owing to the typically very large cross-sectional areas of test devices relative to the nanometer scale of individual filaments. In the present work, conductive atomic force microscopy is used to study the evolution of conductivity at the nanoscale in a fully CMOS-compatible silicon suboxide thin film. Distinct filamentary plasticity and background conductivity enhancement are reported, suggesting that device behavior might be best described by composite core (filament) and shell (background conductivity) dynamics. Furthermore, constant current measurements demonstrate an interplay between filament formation and rupture, resulting in current-controlled voltage spiking in nanoscale regions, with an estimated optimal energy consumption of 25 attojoules per spike. This is very promising for extremely low-power neuromorphic computation and suggests that the dynamic behavior observed in larger devices should persist and improve as dimensions are scaled down.
Collapse
|
5
|
Tappertzhofen S, Nielen L, Valov I, Waser R. Memristively programmable transistors. NANOTECHNOLOGY 2021; 33:045203. [PMID: 34670198 DOI: 10.1088/1361-6528/ac317f] [Citation(s) in RCA: 0] [Impact Index Per Article: 0] [Reference Citation Analysis] [Abstract] [Key Words] [Track Full Text] [Subscribe] [Scholar Register] [Received: 09/23/2021] [Accepted: 10/20/2021] [Indexed: 06/13/2023]
Abstract
When designing the gate-dielectric of a floating-gate-transistor, one must make a tradeoff between the necessity of providing an ultra-small leakage current behavior for long state retention, and a moderate to high tunneling-rate for fast programming speed. Here we report on a memristively programmable transistor that overcomes this tradeoff. The operation principle is comparable to floating-gate-transistors, but the advantage of the analyzed concept is that ions instead of electrons are used for programming. Since the mass of ions is significantly larger than the effective mass of electrons, gate-dielectrics with higher leakage current levels can be used. We demonstrate the practical feasibility of the device using a proof-of-concept study based on a micrometer-sized thin-film transistor and LT-Spice simulations of 32 nm transistors. Memristively programmable transistors have the potential of high programming endurance and retention times, fast programming speeds, and high scalability.
Collapse
Affiliation(s)
- S Tappertzhofen
- Chair for Micro- and Nanoelectronics, Department of Electrical Engineering and Information Technology, TU Dortmund University, Emil-Figge-Straße 68, D-44227, Dortmund, Germany
| | - L Nielen
- aixACCT Systems GmbH, Talbotstraße 25, D-52068 Aachen, Germany
| | - I Valov
- Institute for Electronic Materials (IWE 2) RWTH Aachen University, Sommerfeld Straße 24, D-52074 Aachen, Germany
- Jülich Research Center, Peter-Grünberg-Institute 7 (PGI 7), Wilhelm-Johnen-Straße 1, D-52428 Jülich, Germany
| | - R Waser
- Institute for Electronic Materials (IWE 2) RWTH Aachen University, Sommerfeld Straße 24, D-52074 Aachen, Germany
- Jülich Research Center, Peter-Grünberg-Institute 7 (PGI 7), Wilhelm-Johnen-Straße 1, D-52428 Jülich, Germany
| |
Collapse
|
6
|
Mannion DJ, Mehonic A, Ng WH, Kenyon AJ. Memristor-Based Edge Detection for Spike Encoded Pixels. Front Neurosci 2020; 13:1386. [PMID: 32009876 PMCID: PMC6978841 DOI: 10.3389/fnins.2019.01386] [Citation(s) in RCA: 9] [Impact Index Per Article: 2.3] [Reference Citation Analysis] [Abstract] [Key Words] [Track Full Text] [Download PDF] [Figures] [Journal Information] [Subscribe] [Scholar Register] [Received: 06/28/2019] [Accepted: 12/09/2019] [Indexed: 11/15/2022] Open
Abstract
Memristors have many uses in machine learning and neuromorphic hardware. From memory elements in dot product engines to replicating both synapse and neuron wall behaviors, the memristor has proved a versatile component. Here we demonstrate an analog mode of operation observed in our silicon oxide memristors and apply this to the problem of edge detection. We demonstrate how a potential divider exploiting this analog behavior can prove a scalable solution to edge detection. We confirm its behavior experimentally and simulate its performance on a standard testbench. We show good performance comparable to existing memristor based work with a benchmark score of 0.465 on the BSDS500 dataset, while simultaneously maintaining a lower component count.
Collapse
Affiliation(s)
- Daniel J. Mannion
- Department of Electronic and Electrical Engineering, University College London, London, United Kingdom
| | | | | | | |
Collapse
|
7
|
Mehonic A, Shluger AL, Gao D, Valov I, Miranda E, Ielmini D, Bricalli A, Ambrosi E, Li C, Yang JJ, Xia Q, Kenyon AJ. Silicon Oxide (SiO x ): A Promising Material for Resistance Switching? ADVANCED MATERIALS (DEERFIELD BEACH, FLA.) 2018; 30:e1801187. [PMID: 29957849 DOI: 10.1002/adma.201801187] [Citation(s) in RCA: 51] [Impact Index Per Article: 8.5] [Reference Citation Analysis] [Abstract] [Key Words] [Track Full Text] [Subscribe] [Scholar Register] [Received: 02/21/2018] [Revised: 04/30/2018] [Indexed: 06/08/2023]
Abstract
Interest in resistance switching is currently growing apace. The promise of novel high-density, low-power, high-speed nonvolatile memory devices is appealing enough, but beyond that there are exciting future possibilities for applications in hardware acceleration for machine learning and artificial intelligence, and for neuromorphic computing. A very wide range of material systems exhibit resistance switching, a number of which-primarily transition metal oxides-are currently being investigated as complementary metal-oxide-semiconductor (CMOS)-compatible technologies. Here, the case is made for silicon oxide, perhaps the most CMOS-compatible dielectric, yet one that has had comparatively little attention as a resistance-switching material. Herein, a taxonomy of switching mechanisms in silicon oxide is presented, and the current state of the art in modeling, understanding fundamental switching mechanisms, and exciting device applications is summarized. In conclusion, silicon oxide is an excellent choice for resistance-switching technologies, offering a number of compelling advantages over competing material systems.
Collapse
Affiliation(s)
- Adnan Mehonic
- Department of Electronic and Electrical Engineering, UCL, Torrington Place, London, WC1E 7JE, UK
| | - Alexander L Shluger
- Department of Physics and Astronomy, UCL, Gower Street, London, WC1E 6BT, UK
| | - David Gao
- Department of Physics and Astronomy, UCL, Gower Street, London, WC1E 6BT, UK
| | - Ilia Valov
- Institut für Werkstoffe der Elektrotechnik II, RWTH Aachen University, 52074, Aachen, Germany
| | - Enrique Miranda
- Departament d'Enginyeria Electronica, Universitat Autonoma de Barcelona, 08193, Bellaterra, Spain
| | - Daniele Ielmini
- Dipartimento di Elettronica e Informazione, Politecnico di Milano, Milan, 20133, Italy
| | - Alessandro Bricalli
- Dipartimento di Elettronica e Informazione, Politecnico di Milano, Milan, 20133, Italy
| | - Elia Ambrosi
- Dipartimento di Elettronica e Informazione, Politecnico di Milano, Milan, 20133, Italy
| | - Can Li
- Department of Electrical and Computer Engineering, University of Massachusetts, Amherst, MA, 01003, USA
| | - J Joshua Yang
- Department of Electrical and Computer Engineering, University of Massachusetts, Amherst, MA, 01003, USA
| | - Qiangfei Xia
- Department of Electrical and Computer Engineering, University of Massachusetts, Amherst, MA, 01003, USA
| | - Anthony J Kenyon
- Department of Electronic and Electrical Engineering, UCL, Torrington Place, London, WC1E 7JE, UK
| |
Collapse
|