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For: McGibbon AJ, Brown LM, Bleloch AL, Browning ND, Aires FC, Fallon PJ, Gaskell PH, Gilkes KW, Hansen PL, Howie A. Microscopy in solid state science. Microsc Res Tech 1993;24:299-315. [PMID: 8390313 DOI: 10.1002/jemt.1070240404] [Citation(s) in RCA: 3] [Impact Index Per Article: 0.1] [Reference Citation Analysis] [What about the content of this article? (0)] [Track Full Text] [Journal Information] [Subscribe] [Scholar Register] [Indexed: 01/30/2023]
Number Cited by Other Article(s)
1
Pennycook SJ, Lupini AR, Kadavanich A, MeBride JR, Rosenthal SJ, Puetter RC, Yahil A, Krivanek OL, Dellby N, Nellist PDL, Duscher G, Wang LG, Pantelides ST. Aberration-Corrected Scanning Transmission Electron Microscopy: The Potential for Nano- and Interface Science. ACTA ACUST UNITED AC 2003. [DOI: 10.3139/146.030350] [Citation(s) in RCA: 15] [Impact Index Per Article: 0.7] [Reference Citation Analysis] [What about the content of this article? (0)] [Track Full Text] [Journal Information] [Subscribe] [Scholar Register] [Indexed: 11/20/2022]
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