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Affiliation(s)
- Pavel Andreevich Yunin
- Department for Technology of Nanostructures and Devices; Institute for Physics of Microstructures of the Russian Academy of Sciences; GSP-105 Nizhny Novgorod 603950 Russia
- Lobachevsky State University of Nizhny Novgorod; 23 Gagarin avenue Nizhny Novgorod 603950 Russia
| | - Yurii Nikolaevich Drozdov
- Department for Technology of Nanostructures and Devices; Institute for Physics of Microstructures of the Russian Academy of Sciences; GSP-105 Nizhny Novgorod 603950 Russia
| | - Mikhail Nikolaevich Drozdov
- Department for Technology of Nanostructures and Devices; Institute for Physics of Microstructures of the Russian Academy of Sciences; GSP-105 Nizhny Novgorod 603950 Russia
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Demanet CM, Sankar KV, Malherbe JB. Atomic force microscopy investigation of ion-bombarded InP: Effect of angle of ion bombardment. SURF INTERFACE ANAL 1996. [DOI: 10.1002/sia.740240805] [Citation(s) in RCA: 1] [Impact Index Per Article: 0.0] [Reference Citation Analysis] [What about the content of this article? (0)] [Track Full Text] [Journal Information] [Subscribe] [Scholar Register] [Indexed: 11/12/2022]
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Demanet CM, Malherbe JB, van der Berg NG, Sankar V. Atomic force microscopy investigation of argon-bombarded InP: Effect of ion dose density. SURF INTERFACE ANAL 1995. [DOI: 10.1002/sia.740230702] [Citation(s) in RCA: 40] [Impact Index Per Article: 1.4] [Reference Citation Analysis] [What about the content of this article? (0)] [Track Full Text] [Journal Information] [Subscribe] [Scholar Register] [Indexed: 11/06/2022]
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Bujdosó E. Analysis by absorption and scattering of radiation. J Radioanal Nucl Chem 1985. [DOI: 10.1007/bf02065403] [Citation(s) in RCA: 0] [Impact Index Per Article: 0] [Reference Citation Analysis] [What about the content of this article? (0)] [Track Full Text] [Journal Information] [Subscribe] [Scholar Register] [Indexed: 10/25/2022]
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Mathieu HJ. Depth Profile and Interface Analysis of Thin Films by AES and XPS. In: Oechsner H, editor. Thin Film and Depth Profile Analysis. Berlin: Springer Berlin Heidelberg; 1984. pp. 39-61. [DOI: 10.1007/978-3-642-46499-7_3] [Citation(s) in RCA: 9] [Impact Index Per Article: 0.2] [Reference Citation Analysis] [What about the content of this article? (0)] [Track Full Text] [Journal Information] [Subscribe] [Scholar Register]
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Duncan S, Smith R, Sykes DE, Walls JM. Sputter-depth profiling in AES: Dependence of depth resolution on electron and ion beam geometry. SURF INTERFACE ANAL 1983. [DOI: 10.1002/sia.740050204] [Citation(s) in RCA: 5] [Impact Index Per Article: 0.1] [Reference Citation Analysis] [What about the content of this article? (0)] [Track Full Text] [Journal Information] [Subscribe] [Scholar Register] [Indexed: 11/09/2022]
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Mathieu HJ, Landolt D. On the influence of crater geometry on depth resolution of AES and XPS profiles of tantalum oxide films. SURF INTERFACE ANAL 1983. [DOI: 10.1002/sia.740050205] [Citation(s) in RCA: 34] [Impact Index Per Article: 0.8] [Reference Citation Analysis] [What about the content of this article? (0)] [Track Full Text] [Journal Information] [Subscribe] [Scholar Register] [Indexed: 11/06/2022]
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Seah MP, Hunt CP. The depth dependence of the depth resolution in composition-depth profiling with Auger Electron Spectroscopy. SURF INTERFACE ANAL 1983; 5:33-7. [DOI: 10.1002/sia.740050108] [Citation(s) in RCA: 102] [Impact Index Per Article: 2.5] [Reference Citation Analysis] [What about the content of this article? (0)] [Track Full Text] [Journal Information] [Subscribe] [Scholar Register] [Indexed: 11/07/2022]
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