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For: Collins R, Marsh T, Jimenez-Rodriguez J. The diffusion approximation in atomic mixing. ACTA ACUST UNITED AC 1983. [DOI: 10.1016/0167-5087(83)90793-7] [Citation(s) in RCA: 41] [Impact Index Per Article: 1.0] [Reference Citation Analysis] [What about the content of this article? (0)] [Track Full Text] [Journal Information] [Subscribe] [Scholar Register] [Indexed: 11/24/2022]
Number Cited by Other Article(s)
1
Collins R. Factors determining radiation-induced mixing at interfaces. ACTA ACUST UNITED AC 2006. [DOI: 10.1080/00337578608206092] [Citation(s) in RCA: 21] [Impact Index Per Article: 1.2] [Reference Citation Analysis] [What about the content of this article? (0)] [Affiliation(s)] [Track Full Text] [Journal Information] [Subscribe] [Scholar Register] [Indexed: 10/23/2022]
2
Shevchuk YA. Phenomenological description of the stability of a ternary alloy under irradiation. ATOM ENERGY+ 1994. [DOI: 10.1007/bf02414349] [Citation(s) in RCA: 0] [Impact Index Per Article: 0] [Reference Citation Analysis] [What about the content of this article? (0)] [Track Full Text] [Journal Information] [Subscribe] [Scholar Register] [Indexed: 11/28/2022]
3
Carter G, Katardjiev IV, Nobes MJ. The deconvolution of sputter-etching surface concentration measurements to determine impurity depth profiles. SURF INTERFACE ANAL 1989. [DOI: 10.1002/sia.740140905] [Citation(s) in RCA: 4] [Impact Index Per Article: 0.1] [Reference Citation Analysis] [What about the content of this article? (0)] [Track Full Text] [Journal Information] [Subscribe] [Scholar Register] [Indexed: 11/10/2022]
4
Carter G, Katardjiev IV, Nobes MJ. An altered layer model for sputter-profiling. SURF INTERFACE ANAL 1989. [DOI: 10.1002/sia.740140406] [Citation(s) in RCA: 11] [Impact Index Per Article: 0.3] [Reference Citation Analysis] [What about the content of this article? (0)] [Track Full Text] [Journal Information] [Subscribe] [Scholar Register] [Indexed: 11/08/2022]
5
Traxlmayr U, Stingeder G, Fallmann W, Grasserbauer M. Transient SIMS depth-profiles at the interface Si3N4/GaAs. Anal Bioanal Chem 1984;319:855-60. [DOI: 10.1007/bf01226790] [Citation(s) in RCA: 5] [Impact Index Per Article: 0.1] [Reference Citation Analysis] [What about the content of this article? (0)] [Track Full Text] [Journal Information] [Subscribe] [Scholar Register] [Indexed: 10/25/2022]
6
Littmark U, Hofer WO. The Theory of Recoil Mixing in Solids. In: Oechsner H, editor. Thin Film and Depth Profile Analysis. Berlin: Springer Berlin Heidelberg; 1984. pp. 159-200. [DOI: 10.1007/978-3-642-46499-7_8] [Citation(s) in RCA: 0] [Impact Index Per Article: 0] [Reference Citation Analysis] [What about the content of this article? (0)] [Track Full Text] [Journal Information] [Subscribe] [Scholar Register] [Indexed: 04/14/2023]
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