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For: Werner F, Cosceev A, Schmidt J. Silicon Surface Passivation by Al2O3: Recombination Parameters and Inversion Layer Solar Cells. ACTA ACUST UNITED AC 2012. [DOI: 10.1016/j.egypro.2012.07.070] [Citation(s) in RCA: 13] [Impact Index Per Article: 1.1] [Reference Citation Analysis] [What about the content of this article? (0)] [Track Full Text] [Journal Information] [Subscribe] [Scholar Register] [Indexed: 10/28/2022]
Number Cited by Other Article(s)
1
Li N, Han K, Spratt W, Bedell S, Ren J, Gunawan O, Ott J, Hopstaken M, Cabral C, Libsch F, Subramanian C, Shahidi G, Sadana D. Dust-Sized High-Power-Density Photovoltaic Cells on Si and SOI Substrates for Wafer-Level-Packaged Small Edge Computers. Adv Mater 2020;32:e2004573. [PMID: 33095497 DOI: 10.1002/adma.202004573] [Citation(s) in RCA: 0] [Impact Index Per Article: 0] [Reference Citation Analysis] [What about the content of this article? (0)] [Affiliation(s)] [Abstract] [Key Words] [Track Full Text] [Subscribe] [Scholar Register] [Received: 07/05/2020] [Revised: 08/20/2020] [Indexed: 06/11/2023]
2
Song JH, Yu HW, Ham MH, Kim IS. Tunable Ion Sieving of Graphene Membranes through the Control of Nitrogen-Bonding Configuration. Nano Lett 2018;18:5506-5513. [PMID: 30080971 DOI: 10.1021/acs.nanolett.8b01904] [Citation(s) in RCA: 17] [Impact Index Per Article: 2.8] [Reference Citation Analysis] [What about the content of this article? (0)] [Abstract] [Key Words] [Track Full Text] [Subscribe] [Scholar Register] [Indexed: 06/08/2023]
3
Singh R, Vandana V, Panigrahi J, Singh PK. Plasma assisted atomic layer deposited hafnium oxide films for silicon surface passivation. RSC Adv 2016. [DOI: 10.1039/c6ra19442g] [Citation(s) in RCA: 11] [Impact Index Per Article: 1.4] [Reference Citation Analysis] [What about the content of this article? (0)] [Affiliation(s)] [Abstract] [Track Full Text] [Journal Information] [Subscribe] [Scholar Register] [Indexed: 11/21/2022]  Open
4
Kersten F, Schmid A, Bordihn S, Müller JW, Heitmann J. Role of Annealing Conditions on Surface Passivation Properties of ALD Al2O3 Films. ACTA ACUST UNITED AC 2013;38:843-8. [DOI: 10.1016/j.egypro.2013.07.354] [Citation(s) in RCA: 41] [Impact Index Per Article: 3.7] [Reference Citation Analysis] [What about the content of this article? (0)] [Track Full Text] [Journal Information] [Subscribe] [Scholar Register] [Indexed: 11/24/2022]
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