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For: Ho PS, Yang ES, Evans HL, Wu X. Electronic states at silicide-silicon interfaces. Phys Rev Lett 1986;56:177-180. [PMID: 10032885 DOI: 10.1103/physrevlett.56.177] [Citation(s) in RCA: 8] [Impact Index Per Article: 0.2] [Reference Citation Analysis] [What about the content of this article? (0)] [Track Full Text] [Subscribe] [Scholar Register] [Indexed: 05/23/2023]
Number Cited by Other Article(s)
1
Zhang Y, Almenabawy S, Kherani NP. Haynes-Shockley experiment analogs in surface and optoelectronics: Tunable surface electric field extracting nearly all photocarriers. Sci Adv 2023;9:eadg2454. [PMID: 37043571 PMCID: PMC10096577 DOI: 10.1126/sciadv.adg2454] [Citation(s) in RCA: 0] [Impact Index Per Article: 0] [Reference Citation Analysis] [What about the content of this article? (0)] [Affiliation(s)] [Abstract] [Grants] [Track Full Text] [Download PDF] [Figures] [Subscribe] [Scholar Register] [Received: 12/11/2022] [Accepted: 03/14/2023] [Indexed: 06/19/2023]
2
Uslu H, Altındal Ş, Tunç T, Uslu İ, Mammadov TS. The illumination intensity and applied bias voltage on dielectric properties of au/polyvinyl alcohol (Co, Zn-doped)/n-Si Schottky barrier diodes. J Appl Polym Sci 2010. [DOI: 10.1002/app.33131] [Citation(s) in RCA: 35] [Impact Index Per Article: 2.5] [Reference Citation Analysis] [What about the content of this article? (0)] [Track Full Text] [Journal Information] [Subscribe] [Scholar Register] [Indexed: 11/08/2022]
3
Taşçıoğlu İ, Uslu H, Altındal Ş, Durmuş P, Dökme İ, Tunç T. The effect of gamma irradiation on electrical characteristics of Au/polyvinyl alcohol (Co, Zn-doped)/n-Si Schottky barrier diodes. J Appl Polym Sci 2010. [DOI: 10.1002/app.32450] [Citation(s) in RCA: 17] [Impact Index Per Article: 1.2] [Reference Citation Analysis] [What about the content of this article? (0)] [Track Full Text] [Journal Information] [Subscribe] [Scholar Register] [Indexed: 11/11/2022]
4
Jun M, Jang M, Kim Y, Choi C, Kim T, Park B, Lee S. Analysis of interface trap states at Schottky diode by using equivalent circuit modeling. ACTA ACUST UNITED AC 2007;25:82. [DOI: 10.1116/1.2406066] [Citation(s) in RCA: 5] [Impact Index Per Article: 0.3] [Reference Citation Analysis] [What about the content of this article? (0)] [Track Full Text] [Journal Information] [Subscribe] [Scholar Register] [Indexed: 11/17/2022]
5
Ouennoughi Z. On the Minimum in the Forward Capacitance in MIS Tunnel Diodes. ACTA ACUST UNITED AC 1997. [DOI: 10.1002/1521-396x(199703)160:1<127::aid-pssa127>3.0.co;2-5] [Citation(s) in RCA: 33] [Impact Index Per Article: 1.2] [Reference Citation Analysis] [What about the content of this article? (0)] [Track Full Text] [Journal Information] [Subscribe] [Scholar Register] [Indexed: 11/09/2022]
6
Vrijmoeth J, Heslinga DR, Klapwijk TM. Medium-energy ion-scattering study of a possible relation between the Schottky-barrier height and the defect density at NiSi2/Si(111) interfaces. Phys Rev B Condens Matter 1990;42:9598-9608. [PMID: 9995201 DOI: 10.1103/physrevb.42.9598] [Citation(s) in RCA: 13] [Impact Index Per Article: 0.4] [Reference Citation Analysis] [What about the content of this article? (0)] [Track Full Text] [Subscribe] [Scholar Register] [Indexed: 04/12/2023]
7
Kikuchi A. Calculation of NiSi2-Si Schottky barrier height using an interface-defect model. Phys Rev B Condens Matter 1989;40:8024-8025. [PMID: 9991244 DOI: 10.1103/physrevb.40.8024] [Citation(s) in RCA: 1] [Impact Index Per Article: 0.0] [Reference Citation Analysis] [What about the content of this article? (0)] [Track Full Text] [Subscribe] [Scholar Register] [Indexed: 04/12/2023]
8
Werner JH. Electrical Characterization of Interface States at Schottky Contacts and MIS Tunnel Diodes. In: Batra IP, editor. Metallization and Metal-Semiconductor Interfaces. Boston: Springer US; 1989. pp. 235-56. [DOI: 10.1007/978-1-4613-0795-2_14] [Citation(s) in RCA: 5] [Impact Index Per Article: 0.1] [Reference Citation Analysis] [What about the content of this article? (0)] [Track Full Text] [Journal Information] [Subscribe] [Scholar Register]
9
Tung RT, Levi AFJ, Schrey F, Anzlowar M. Epitaxial NiSi2 and CoSi2 Interfaces. In: Cherns D, editor. Evaluation of Advanced Semiconductor Materials by Electron Microscopy. Boston: Springer US; 1990. pp. 167-81. [DOI: 10.1007/978-1-4613-0527-9_13] [Citation(s) in RCA: 0] [Impact Index Per Article: 0] [Reference Citation Analysis] [What about the content of this article? (0)] [Track Full Text] [Journal Information] [Subscribe] [Scholar Register] [Indexed: 04/12/2023]
10
Werner J, Levi AF, Tung RT, Anzlowar M, Pinto M. Origin of the excess capacitance at intimate Schottky contacts. Phys Rev Lett 1988;60:53-56. [PMID: 10037865 DOI: 10.1103/physrevlett.60.53] [Citation(s) in RCA: 14] [Impact Index Per Article: 0.4] [Reference Citation Analysis] [What about the content of this article? (0)] [Track Full Text] [Subscribe] [Scholar Register] [Indexed: 05/23/2023]
11
Werner J, Ploog K, Queisser HJ. Interface-state measurements at Schottky contacts: A new admittance technique. Phys Rev Lett 1986;57:1080-1083. [PMID: 10034240 DOI: 10.1103/physrevlett.57.1080] [Citation(s) in RCA: 11] [Impact Index Per Article: 0.3] [Reference Citation Analysis] [What about the content of this article? (0)] [Track Full Text] [Subscribe] [Scholar Register] [Indexed: 05/23/2023]
12
Viturro RE, Slade ML, Brillson LJ. Optical emission properties of interface states for metals on III-V semiconductor compounds. Phys Rev Lett 1986;57:487-490. [PMID: 10034072 DOI: 10.1103/physrevlett.57.487] [Citation(s) in RCA: 9] [Impact Index Per Article: 0.2] [Reference Citation Analysis] [What about the content of this article? (0)] [Track Full Text] [Subscribe] [Scholar Register] [Indexed: 05/23/2023]
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